NXP Semiconductors MC56F82748VLH

Overview

MC56F82748VLH from NXP Semiconductors is a 32-bit digital signal controller (DSC) based on the 56800EX core, operating at up to 100 MHz in fast mode. It integrates 64 KB flash, 8 KB dual-port RAM, two 12-bit ADCs with x1/x2/x4 programmable gain amplifiers, four analog comparators with 6-bit DAC references, and one eFlexPWM module supporting up to 8 high-resolution PWM outputs. It targets motor control (BLDC/PMSM), switched-mode power supplies, and industrial automation.

For engineers reviewing the MC56F82748VLH datasheet, MC56F82748VLH pinout, MC56F82748VLH application, or MC56F82748VLH equivalent, key selection criteria include its 64-pin LQFP package, -40°C to 105°C V-temp grade, AEC-Q100 qualification, 3.0–3.6 V supply, and integrated MSCAN, QSCI, QSPI, and I²C interfaces for real-time embedded control systems.

Technical Context

The MC56F82748VLH implements a unified 32-bit 56800EX DSC architecture combining DSP computational efficiency (100 MIPS) with MCU peripheral integration. Its dual-Harvard memory system enables concurrent instruction fetch and data access, while the inter-module crossbar allows flexible routing between ADCs, eFlexPWM, comparators, timers, and communication peripherals.

Core timing relies on a programmable PLL (200–400 MHz output) fed by an external 4–16 MHz crystal or internal 8 MHz ROSC, with backup 200 kHz oscillator for COP/EWM/PIT operation. Safety features include windowed COP watchdog, external watchdog monitor (EWM), CRC generator, and memory protection unit (MRP) for secure firmware execution.

Key Specifications

Pinout & Package

MC56F82748VLH is housed in a 64-pin LQFP package (10 mm × 10 mm, 0.5 mm pitch) with exposed thermal pad. Pin functions are multiplexed via GPIO and SIM registers; primary reset state assigns pins to JTAG, power, analog, and peripheral roles as defined in the MC56F827xx datasheet Rev. 4.1.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar digital signal controller applications.

Compared with MC56F82748VLH, the MLH variant extends thermal range without altering functionality, while the VLF variant trades package size and peripheral count for lower cost-making MC56F82748VLH the optimal balance of capability, qualification, and footprint for mainstream industrial DSC applications.

Availability

MC56F82748VLH is available at Aetrix Electronics and suitable for motor control systems, switched-mode power supplies, industrial PLC modules, and photovoltaic inverters requiring stable component supply across long production lifecycles.

Supply support for MC56F82748VLH includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor leader specializing in secure connectivity solutions for automotive, industrial, and IoT applications, with deep expertise in microcontrollers and digital signal processors.

The MC56F827xx family was designed specifically for high-performance, safety-aware embedded control in motor drives, power conversion, and industrial automation-combining DSP throughput with MCU usability and automotive-grade robustness.

FAQ

What is the maximum operating frequency of the MC56F82748VLH core?

The MC56F82748VLH core operates at up to 100 MHz in fast mode, delivering 100 MIPS performance. This frequency is achieved using the internal PLL locked to an external 4–16 MHz crystal or resonator. The device also supports 50 MHz operation in normal mode for lower-power applications. All timing-critical peripherals-including eFlexPWM, ADC, and timers-are fully synchronized to this clock domain, ensuring deterministic real-time behavior in the MC56F82748VLH.

Does the MC56F82748VLH support CAN communication?

Yes, the MC56F82748VLH integrates a Modular/Scalable Controller Area Network (MSCAN) module compliant with CAN 2.0A/B protocol, supporting standard and extended frames, bit rates up to 1 Mbit/s, and message buffering with individual Rx mask registers. It includes time-stamping, loopback mode, and wakeup-on-bus-activity-making it suitable for automotive body control and industrial networked systems. The MC56F82748VLH's MSCAN is hardware-verified and AEC-Q100 qualified.

What are the analog input capabilities of the MC56F82748VLH?

The MC56F82748VLH features two independent 12-bit cyclic ADCs, each with 8 external input channels and dynamic x1/x2/x4 programmable gain amplifiers. Each ADC supports single-ended and differential (including unipolar) conversions, sequential/parallel scanning, and hardware synchronization to PWM or timer events via the inter-module crossbar. Conversion time is 10 ADC clock cycles (minimum 100 ns period), enabling high-fidelity current/voltage sensing in motor control and power supply applications using the MC56F82748VLH.

Is the MC56F82748VLH pin-compatible with other members of the MC56F827xx family?

No-MC56F82748VLH is not universally pin-compatible across the MC56F827xx family. It uses a 64-pin LQFP package, whereas variants like MC56F82746VLF use 48-pin LQFP and MC56F82743VFM use 32-pin QFN. Even within the 64-pin group (e.g., MC56F82748MLH), pinouts match, but thermal grade differs. Always verify pin assignments against Table 2 in the MC56F827xx datasheet Rev. 4.1 before substituting, as signal multiplexing and peripheral enable registers vary by part number.

What debug interfaces does the MC56F82748VLH support?

The MC56F82748VLH supports JTAG-based debugging via TDI, TDO, TCK, and TMS pins (pins 64, 62, 1, 63 in 64-pin LQFP), enabling full boundary-scan, flash programming, and real-time emulation using NXP's EOnCE (Enhanced On-Chip Emulation) technology. This allows non-intrusive, cycle-accurate debugging independent of CPU speed. No SWD or serial-wire debug is supported-the MC56F82748VLH relies exclusively on standard 4-pin JTAG for development and production test.