Microchip Technology MCP3562RT-E/NC

Overview

MCP3562RT-E/NC from Microchip Technology is a dual-channel, 24-bit delta-sigma analog-to-digital converter (ADC) with programmable gain (0.33x–64x), up to 153.6 ksps data rate, and integrated 2.4V voltage reference (15 ppm/°C drift). It supports differential or single-ended inputs, features internal temperature sensing and burnout current sources, and operates across –40°C to +125°C for high-accuracy sensor signal conditioning in industrial transmitters.

For engineers reviewing the MCP3562RT-E/NC datasheet, MCP3562RT-E/NC pinout, MCP3562RT-E/NC application, or MCP3562RT-E/NC equivalent, key selection criteria include its 106.7 dB SINAD at 4800 SPS (gain = 1x), ultra-low 90 nVRMS noise at 12.5 SPS (gain = 16x), 24-bit digital calibration registers, SCAN-mode internal sequencer, and 20 MHz SPI interface with CRC-secured communications.

Technical Context

The MCP3562RT-E/NC implements a 2nd-order delta-sigma modulator with analog gain stage followed by SINC³ and SINC¹ digital filters, supporting OSR from 32 to 98304. Its internal sequencer (SCAN mode) enables autonomous multiplexed conversions across two input channels without MCU intervention, using a 24-bit timer for cycle timing.

It integrates dual power domains (AVDD: 2.7–3.6 V; DVDD: 1.8–3.6 V), selectable clock source (internal RC oscillator: 3.3–6.6 MHz or external up to 20 MHz), and advanced security features including 16-bit CRC on SPI commands and register map lock with 8-bit secure key - all validated for operation over –40°C to +125°C.

Key Specifications

Pinout & Package

Package: 20-Lead UQFN (3 mm × 3 mm × 0.55 mm) with exposed thermal pad (EP). Pin count and function mapping are identical to the MCP3562R family; NC pins are not internally connected and should be tied to AGND per datasheet recommendation for EMI immunity.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-resolution delta-sigma ADC applications.

Compared with ADS1263IPW and MCP3564R-E/ST, the MCP3562RT-E/NC uniquely balances dual-channel capability, ultra-low power shutdown, integrated burnout diagnostics, and compact UQFN packaging-making it optimal for space-constrained, battery-aware industrial sensor nodes where channel count and embedded intelligence are prioritized over maximum bit depth.

Availability

MCP3562RT-E/NC is available at Aetrix Electronics and suitable for precision sensor transducers, factory automation I/O modules, and portable instrumentation requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for MCP3562RT-E/NC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Microchip Technology Inc. is a leading provider of microcontrollers, analog devices, and Flash-IP solutions, serving industrial, automotive, and consumer markets with high-reliability silicon and development tools.

The MCP356xR product line was designed specifically for high-accuracy, low-power sensor signal acquisition in harsh environments-integrating reference, oscillator, temperature sensing, and diagnostics to minimize external components in industrial and portable measurement systems.

FAQ

What is the maximum achievable effective resolution of the MCP3562RT-E/NC?

The MCP3562RT-E/NC achieves up to 23.3 bits of RMS effective resolution at low data rates (e.g., 12.5 SPS with gain = 16x), verified by measured 90 nVRMS noise performance. This exceeds its nominal 24-bit no-missing-code resolution in practical signal-to-noise terms and is enabled by oversampling and digital filtering within the SINC³ architecture. The MCP3562RT-E/NC maintains this performance across its full –40°C to +125°C operating range.

Does the MCP3562RT-E/NC support both internal and external voltage references?

Yes, the MCP3562RT-E/NC supports either its internal 2.4V reference (±2% initial accuracy, 15 ppm/°C drift) or an external differential reference applied to REFIN+/OUT and REFIN– pins (0.6V to AVDD range). Reference selection is controlled by the VREF_SEL bit. When using the internal reference, a 1 µF bypass capacitor on REFIN+/OUT is required for 12 ms settling to 10 ppm. The MCP3562RT-E/NC's dual-reference flexibility simplifies design across varying accuracy and power requirements.

How does the SCAN mode sequencer operate on the MCP3562RT-E/NC?

The SCAN mode sequencer in the MCP3562RT-E/NC autonomously cycles through configured input channels (CH0 and CH1) using an internal 24-bit timer, eliminating the need for continuous SPI polling or host MCU intervention. Each conversion sequence can include monitor channels and user-defined delays (TDLY_SCAN and TTIMER_SCAN), enabling synchronized multi-sensor sampling. This feature is fully implemented in the MCP3562RT-E/NC's register map and requires no external timing components.

What are the power consumption characteristics of the MCP3562RT-E/NC in shutdown mode?

The MCP3562RT-E/NC draws less than 2.4 µA total current in full shutdown mode (CONFIG0 = 0x00 with Full-Shutdown Fast-CMD), comprising ≤0.4 µA analog and ≤2 µA digital domains. Partial shutdown modes reduce current to ≤22 µA (analog) or ≤17 µA (digital). These ultra-low values enable multi-year battery operation in portable instrumentation and wireless sensor nodes - a core design objective confirmed in the MCP3562RT-E/NC's electrical specifications table.

Can the MCP3562RT-E/NC perform open-circuit detection on connected sensors?

Yes, the MCP3562RT-E/NC integrates dedicated burnout current sources that inject programmable current into CH0 and CH1 inputs to detect open or short conditions on resistive sensors (e.g., RTDs, strain gauges). This functionality is enabled via register control and operates independently of conversion cycles. The MCP3562RT-E/NC's burnout feature eliminates the need for external current sources or discrete fault-detection circuitry, directly supporting predictive maintenance in industrial sensor systems.