onsemi NL27WZ00USG-Q
- Part No.:
- NL27WZ00USG-Q
- Manufacturer:
- onsemi
- Category:
- Gates and Inverters
- Package:
- 8-VFSOP (0.091", 2.30mm Width)
- Datasheet:
-
NL27WZ00USG-Q.pdf
- Description:
- IC GATE NAND 2CH 2-INP US8
- Quantity:
- Payment:

- Shipping:

Inventory:1,740
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
NL27WZ00USG-Q from onsemi is a dual 2-input NAND gate IC designed for high-speed logic interfacing in automotive and industrial systems operating from 1.65 V to 5.5 V. It delivers 2.4 ns typical propagation delay at 5 V, supports ±24 mA I/O drive at 3.0 V, and features IOFF partial power-down protection - enabling use in mixed-voltage bus isolation and hot-swap control circuits.
For engineers reviewing the NL27WZ00USG-Q datasheet, pinout, applications, or equivalent options, key selection criteria include its AEC-Q100 qualification, overvoltage-tolerant inputs/outputs up to 5.5 V, US8 package footprint, and guaranteed operation across −55 °C to +125 °C ambient.
Technical Context
The NL27WZ00USG-Q implements two independent CMOS NAND gates with rail-to-rail input voltage tolerance and active-drive output stages capable of sourcing/sinking 24 mA at 3.0 V. Its IOFF circuitry disables I/O leakage when VCC = 0 V, preventing back-driving in partial-power-down configurations.
Propagation delay varies with supply voltage and load: 1.9 ns (typ) at 5 V/15 pF, 2.4 ns (typ) at 3.3 V/15 pF, and 5.7 ns (typ) at 1.8 V/15 pF. Input thresholds scale with VCC (VIH = 0.7×VCC min above 2.3 V), ensuring robust noise margins across the full 1.65–5.5 V range.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 1.65 V to 5.5 V - enables direct interface with 1.8 V, 2.5 V, 3.3 V, and 5 V logic domains without level shifters |
| tPD (Typ) | 2.4 ns at VCC = 5 V, CL = 15 pF - supports >200 MHz toggle rates in low-load digital control paths |
| I/O Drive | ±24 mA at VCC = 3.0 V - sufficient to directly drive LEDs, small MOSFET gates, or multiple 74LVC inputs |
| Input Tolerance | −0.5 V to +6.5 V - allows safe connection to 5 V signals even when powered from 1.8 V or 2.5 V rails |
| IOFF Leakage | ≤10 µA at VCC = 0 V - prevents signal contention during system power sequencing or standby modes |
| Operating Temp | −55 °C to +125 °C - qualified for under-hood automotive, industrial motor control, and outdoor embedded applications |
| AEC-Q100 | Qualified per Grade 1 (−40 °C to +125 °C) and extended to −55 °C - meets automotive reliability and stress-test requirements |
Pinout & Package
Package: US8 (Case 493), 8-pin ultra-small surface-mount package (2.1 mm × 2.0 mm × 0.55 mm), Pb-free, RoHS-compliant, MSL Level 1.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1 (A1) | Input of Gate 1 | First NAND input; accepts overvoltage-tolerant logic signals up to 5.5 V regardless of VCC |
| 2 (B1) | Input of Gate 1 | Second NAND input; electrically identical to A1; supports independent logic control of first gate |
| 3 (Y2) | Output of Gate 2 | Inverted AND of A2/B2; drives loads up to 24 mA while maintaining rail-aligned VOH/VOL |
| 4 (GND) | Ground Reference | Primary return path for all internal logic and I/O current; must be low-impedance for noise immunity |
| 5 (A2) | Input of Gate 2 | First NAND input of second gate; fully decoupled from Gate 1; enables dual independent logic functions |
| 6 (B2) | Input of Gate 2 | Second NAND input of second gate; shares same electrical specs as A1/B1 |
| 7 (Y1) | Output of Gate 1 | Inverted AND of A1/B1; matches Y2 timing and drive strength; supports fanout to multiple downstream loads |
| 8 (VCC) | Positive Supply | Single power rail for both gates; IOFF protection activates automatically when VCC = 0 V |
Key Features
| Feature | Design Value |
|---|---|
| Wide VCC Range | 1.65 V to 5.5 V operation eliminates need for separate voltage translators in multi-rail systems |
| Overvoltage-Tolerant I/O | Inputs and outputs withstand up to 5.5 V - enables safe interfacing with legacy 5 V peripherals while powered from 1.8 V |
| IOFF Partial Power-Down | Blocks I/O leakage when VCC = 0 V - critical for hot-swap, battery-backed, or modular subsystem designs |
| High-Speed Propagation | 2.4 ns tPD (5 V) and 3.2 ns tPD (2.5 V) support real-time control loops and fast state-machine transitions |
| AEC-Q100 Qualified | Grade 1 qualification with PPAP capability - satisfies OEM automotive component release requirements |
Applications
| Automotive Body Control Module | Industrial PLC Digital Input Conditioning |
|---|---|
|
Use Scenario: Signal conditioning for door lock/unlock switch inputs exposed to 12 V battery transients and ESD events. IC Role / Device Role / Timing Role: Dual NAND gate used as edge detector and debouncer; one gate processes switch state, the other enables interrupt generation on state change. Use Value: Overvoltage-tolerant inputs accept raw 12 V switch signals via resistive divider; IOFF prevents backfeed during MCU sleep mode; AEC-Q100 ensures field reliability. |
Use Scenario: Converting 24 V DC sensor inputs (e.g., proximity switches) to clean 3.3 V logic levels for FPGA or microcontroller GPIO. IC Role / Device Role / Timing Role: Level-shifting logic buffer with hysteresis implemented via external feedback; each NAND gate forms half of a Schmitt trigger pair. Use Value: 5.5 V input tolerance allows direct connection to 24 V dividers; 24 mA drive supports long traces and capacitive loads; −55 °C to +125 °C rating suits factory-floor environments. |
| Medical Infusion Pump Control Logic | Avionics Data Bus Isolation Interface |
|
Use Scenario: Implementing safety interlocks between pump motor enable, occlusion detection, and door-open sensors in Class II medical devices. IC Role / Device Role / Timing Role: Dual NAND configured as NAND latch and enable gate to enforce hardware-enforced mutual exclusion between conflicting actuator commands. Use Value: Guaranteed timing (tPD ≤ 3.2 ns @ 2.5 V) ensures deterministic response within 10 µs safety window; AEC-Q100-grade process enhances FIT rate predictability. |
Use Scenario: Galvanically isolated data path buffering between ARINC 429 receiver and host processor, where transient immunity and low propagation skew are critical. IC Role / Device Role / Timing Role: Dual gate used for signal inversion and synchronization; one gate cleans up recovered clock edges, the other validates data validity windows. Use Value: Matched tPLH/tPHL (≤0.3 ns skew) preserves setup/hold timing across dual channels; 2.5 pF input capacitance minimizes loading on isolated transformer-coupled lines. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar dual 2-input NAND gate applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SN74LVC2G00DCKR | Same US8 package, 1.65–5.5 V, but only qualified to −40 °C to +85 °C; no AEC-Q100 certification | Lacks automotive qualification and extended temperature support; suitable for commercial industrial controls only | Select when AEC-Q100 and −55 °C operation are not required; lower cost alternative for non-automotive BOMs |
| MC74VHC2G00DTT1G | US8 package, −40 °C to +125 °C, but max VCC = 5.5 V and VIH threshold fixed at 2.0 V (not VCC-scaled); IOFF not supported | No IOFF protection limits use in partial-power-down systems; fixed VIH reduces noise margin below 3 V | Choose only if existing design uses VHC family timing models and IOFF is unnecessary; verify VIH compatibility at lowest VCC |
Compared with SN74LVC2G00DCKR and MC74VHC2G00DTT1G, the NL27WZ00USG-Q uniquely combines AEC-Q100 Grade 1 qualification, −55 °C operation, IOFF, and VCC-scaled input thresholds - making it the sole option for automotive body electronics requiring guaranteed partial-power-down behavior and wide-temperature reliability.
Availability
NL27WZ00USG-Q is available at Aetrix Electronics and suitable for automotive body control modules, industrial PLC input conditioning, medical infusion pump safety interlocks, and avionics data bus isolation interfaces requiring stable component supply across extended temperature and automotive lifecycle demands.
Supply support for NL27WZ00USG-Q includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
onsemi (Semiconductor Components Industries, LLC) is a global semiconductor supplier focused on energy-efficient innovation for automotive, industrial, cloud, medical, and IoT applications.
The NL27WZ00USG-Q belongs to onsemi's WZ-series ultra-high-speed logic family, engineered for low-voltage, low-power, and high-reliability applications in harsh environments - especially where AEC-Q100 compliance and extended temperature operation are mandatory.
FAQ
What is the maximum operating temperature range for the NL27WZ00USG-Q?
The NL27WZ00USG-Q is rated for operation from −55 °C to +125 °C ambient temperature, fully qualified per AEC-Q100 Grade 1 with extended low-temperature validation. This specification is confirmed in the Recommended Operating Conditions table (page 3 of the datasheet) and applies across the full 1.65–5.5 V VCC range. The device maintains specified timing and drive performance throughout this range.
Does the NL27WZ00USG-Q support partial power-down protection?
Yes, the NL27WZ00USG-Q includes IOFF circuitry that actively disables input and output leakage paths when VCC = 0 V. Per the datasheet (page 1, Features section and page 4, DC Electrical Characteristics), IOFF leakage is limited to ≤10 µA under power-down conditions - preventing back-driving of live buses and enabling safe hot-swap and modular subsystem designs.
Is the NL27WZ00USG-Q pin-compatible with standard US8 dual NAND gates like the SN74LVC2G00?
The NL27WZ00USG-Q uses the standard US8 pinout (A1, B1, Y2, GND, A2, B2, Y1, VCC), matching SN74LVC2G00DCKR and MC74VHC2G00DTT1G. However, pin compatibility alone does not guarantee functional drop-in replacement due to differences in IOFF support, input threshold scaling, and temperature qualification - verified via direct comparison of pin assignment diagrams and DC/AC specs in respective datasheets.
What is the typical propagation delay of the NL27WZ00USG-Q at 3.3 V supply?
At VCC = 3.3 V and CL = 15 pF, the NL27WZ00USG-Q exhibits a typical propagation delay (tPLH/tPHL) of 2.4 ns, as specified in the AC Electrical Characteristics table (page 4). This value is measured under standard test conditions (RL = 1 MΩ, R1 = open) and remains consistent across both gates (Y1 and Y2) within device-matching tolerances.
Can the NL27WZ00USG-Q safely interface with 5 V logic signals while powered from a 1.8 V supply?
Yes - the NL27WZ00USG-Q inputs are overvoltage tolerant up to 5.5 V regardless of VCC level, as stated in the Features list (page 1) and Maximum Ratings table (page 3). When powered from 1.8 V, it correctly interprets 5 V TTL/CMOS inputs and produces valid 1.8 V logic-level outputs, eliminating external level shifters in mixed-voltage systems.
NL27WZ00USG-Q Specifications
- Product attributes
- Attribute value
- Manufacturer:
- onsemi
- Series:
- -
- Package/Case:
- 8-VFSOP (0.091", 2.30mm Width)
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Logic Type:
- NAND Gate
- Number of Circuits:
- 2
- Number of Inputs:
- 2
- Features:
- -
- Voltage - Supply:
- 1.65V ~ 5.5V
- Current - Quiescent (Max):
- 1 µA
- Current - Output High, Low:
- 32mA, 32mA
- Input Logic Level - Low:
- -
- Input Logic Level - High:
- -
- Max Propagation Delay @ V, Max CL:
- 3.6ns @ 5V, 50pF
- Operating Temperature:
- -55°C ~ 125°C
- Grade:
- Automotive
- Qualification:
- AEC-Q100
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- US8
NL27WZ00USG-Q FAQ
1.How can I place an order for NL27WZ00USG-Q through Aetrix?
Please submit a Request for Quotation (RFQ) for NL27WZ00USG-Q on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for NL27WZ00USG-Q reliable?
The price and inventory of NL27WZ00USG-Q are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for NL27WZ00USG-Q is usually 5 days.
3.What payment methods are accepted for NL27WZ00USG-Q?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for NL27WZ00USG-Q transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for NL27WZ00USG-Q?
NL27WZ00USG-Q orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your NL27WZ00USG-Q order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for NL27WZ00USG-Q?
For technical support, including NL27WZ00USG-Q datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your NL27WZ00USG-Q requirements.
6.How does Aetrix verify that NL27WZ00USG-Q is sourced from the original manufacturer or authorized distributors?
All NL27WZ00USG-Q products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that NL27WZ00USG-Q meets industry standards.
7.What is the process for return or replacement of NL27WZ00USG-Q?
All NL27WZ00USG-Q units undergo pre-shipment inspection (PSI). If there is an issue with NL27WZ00USG-Q, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The NL27WZ00USG-Q part is unused and in its original packaging.
Return procedure for NL27WZ00USG-Q:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
NL27WZ00USG-Q Tags
-
SN74LVC1G14DBVR
Texas Instruments
-
SN74LVC1G14DCKR
Texas Instruments
-
SN74AHC1G14DBVR
Texas Instruments
-
SN74LVC1G08DBVR
Texas Instruments
-
SN74LVC1G08DCKR
Texas Instruments
-
SN74LVC1G32DCKR
Texas Instruments
-
SN74LVC1G04DBVR
Texas Instruments
.jpg)
-
74LVC1G08GW,125
Nexperia USA Inc.
-
SN74LVC1G04DCKR
Texas Instruments
-
SN74AHC1G08DBVR
Texas Instruments
-
SN74LVC1G32DBVR
Texas Instruments
-
SN74AHCT1G08DBVR
Texas Instruments
Tech Hub
Counterfeit components can hide behind convincing markings and passing basic function tests. This engineering reference covers source traceability, external inspection, X-ray, XRF, electrical testing, …
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…

