Renesas R1Q2A7209ABG-40IB0

Overview

R1Q2A7209ABG-40IB0 from Renesas Electronics is a 8,388,608-word × 9-bit (72-Mbit) synchronous Quad Data Rate II (QDR-II) SRAM with burst-of-two operation, 1.8 V core supply (VDD), 1.5 V I/O supply (VDDQ), and 165-pin FBGA (15 × 17 mm) packaging. It features dual input clocks (K and /K), echo clocks (CQ and /CQ), JTAG 1149.1 test access, and clock-stop capability - designed for high-bandwidth packet buffering in network switches and routers.

For engineers reviewing the R1Q2A7209ABG-40IB0 datasheet, R1Q2A7209ABG-40IB0 pinout, R1Q2A7209ABG-40IB0 application, or R1Q2A7209ABG-40IB0 equivalent, this page delivers verified specifications, validated pin functions, industrial-temperature (-40°C to +85°C) operation, HSTL I/O compatibility, and real-world use context for telecom infrastructure and high-speed memory subsystems.

Technical Context

This QDR-II SRAM implements full CMOS six-transistor memory cells with synchronous peripheral circuitry and an internal burst counter. All address, control, and data inputs are registered on the rising edges of K and /K, enabling precise DDR timing without skew-sensitive single-clock dependencies.

It supports concurrent read/write operations via independent ports, uses DLL/PLL circuitry for wide output data valid windows, and provides programmable output impedance via ZQ termination. The device operates at up to 250 MHz (4 ns cycle time) with 1.5-cycle read latency and includes /DOFF for DLL/PLL bypass during low-frequency operation.

Key Specifications

Pinout & Package

Package: 165-pin plastic FBGA (15 × 17 × 1.4 mm), ball pitch 0.8 mm, RoHS-compliant Pb-free construction.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar QDR-II SRAM applications.

Compared with CY7C2665KV18-400BZXC, R1Q2A7209ABG-40IB0 offers identical functionality in a smaller 165-ball package and industrial temperature range, while AS7C3256A-15JCIN lacks QDR timing, burst capability, and concurrent port support - making it unsuitable for high-throughput packet buffering.

Availability

R1Q2A7209ABG-40IB0 is available at Aetrix Electronics and suitable for network switch buffering, telecom baseband processing, and high-performance test equipment requiring stable component supply, long-term lifecycle support, and industrial-temperature qualification.

Supply support for R1Q2A7209ABG-40IB0 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Renesas Electronics is a global semiconductor leader specializing in microcontrollers, analog, power, and memory solutions for automotive, industrial, and infrastructure markets.

The R1Q2A7209ABG-40IB0 belongs to Renesas' QDR-II SRAM product line, engineered specifically for high-speed, low-latency packet buffering in carrier-grade networking and telecom equipment.

FAQ

What is the maximum operating frequency of the R1Q2A7209ABG-40IB0?

The R1Q2A7209ABG-40IB0 is rated for a maximum clock frequency of 250 MHz, corresponding to a 4 ns minimum cycle time. This enables 500 million transfers per second (MT/s) on each of its 9 data lines using burst-of-two QDR-II operation. The device meets this specification across the full industrial temperature range (−40°C to +85°C) under recommended DC conditions (VDD = 1.8 V ±0.1 V, VDDQ = 1.5 V).

Does the R1Q2A7209ABG-40IB0 support concurrent read and write operations?

Yes, the R1Q2A7209ABG-40IB0 supports true concurrent read and write operations via separate address and data paths. Its architecture allows initiation of a read cycle (/R low) and a write cycle (/W low) in the same clock period, provided addresses and control signals meet setup/hold timing relative to K and /K. This eliminates arbitration delays and is essential for real-time packet buffering in network switches.

What is the function of the ZQ pin on the R1Q2A7209ABG-40IB0?

The ZQ pin on the R1Q2A7209ABG-40IB0 is used for output driver impedance calibration. When terminated to ground via a precision 250 Ω resistor, it configures the Q and CQ output drivers to deliver approximately 50 Ω differential impedance (0.2 × RQ). This enables direct impedance matching to standard PCB transmission lines without external series or parallel terminators, simplifying high-speed layout and improving signal integrity.

How does the /DOFF pin affect operation of the R1Q2A7209ABG-40IB0?

The /DOFF pin on the R1Q2A7209ABG-40IB0 disables the internal DLL/PLL when pulled low. In this mode, the device operates with reduced timing margin but greater stability at frequencies below 120 MHz or during power-up sequencing. When /DOFF is high, the DLL/PLL is active, enabling full 250 MHz performance with tight output skew control and wide data valid windows - required for reliable operation in high-speed systems.

Is the R1Q2A7209ABG-40IB0 compatible with JTAG boundary-scan testing?

Yes, the R1Q2A7209ABG-40IB0 integrates a fully compliant IEEE 1149.1 JTAG test access port (TAP) with dedicated TMS, TCK, TDI, and TDO pins. It supports boundary-scan instruction register loading, data register access, and device identification - enabling in-circuit verification, interconnect testing, and debug during manufacturing and field service. All JTAG signals operate at 1.8 V I/O levels.