Renesas R1QGA4418RBG-25IB0

Overview

R1QGA4418RBG-25IB0 from Renesas Electronics is a 144-Mbit QDR™II+ SRAM with 8,388,608-word × 18-bit organization, 2.5 ns cycle time, 400 MHz clock frequency, and 2.0-cycle read latency. It operates at 1.8 V core and 1.4–1.5 V I/O supply, features separate read/write ports, HSTL I/O, and is designed for high-bandwidth packet buffering in network switches and routers.

For engineers reviewing the R1QGA4418RBG-25IB0 datasheet, R1QGA4418RBG-25IB0 pinout, R1QGA4418RBG-25IB0 application, or R1QGA4418RBG-25IB0 equivalent, key selection criteria include burst-4 QDR timing, industrial temperature range (−40°C to +85°C), Pb-free 165-pin FBGA (15 × 17 mm), programmable output impedance via ZQ, and JTAG 1149.1 test access support.

Technical Context

This device implements a synchronous quad data rate architecture with dual-clock inputs (K and /K) registering all control, address, and data on rising edges only. Its internal burst counter enables four-word bursts, reducing address bus frequency by 4× while maintaining full DDR bandwidth utilization on both read and write ports.

The integrated PLL supports stable high-speed operation up to 400 MHz, with echo clocks (CQ and /CQ) tightly aligned to data outputs for simplified capture. A dedicated QVLD signal provides half-cycle-advanced valid-data indication synchronized to CQ edges, and /DOFF allows PLL bypass for low-frequency operation.

Key Specifications

Pinout & Package

Package: 165-pin plastic FBGA (15 × 17 mm, 1.4 mm height), Pb-free, RoHS-compliant (6/6).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar QDR-II+ SRAM applications.

Compared with CY7C2663KV18-250BAXI, R1QGA4418RBG-25IB0 offers superior thermal stability across −40°C to +85°C and integrated impedance tuning; compared with AS7C3256A-25JCIN, it delivers >100× higher effective bandwidth and deterministic latency essential for modern networking.

Availability

R1QGA4418RBG-25IB0 is available at Aetrix Electronics and suitable for network packet buffering, switch fabric interfaces, telecom baseband processing, and industrial real-time control requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for R1QGA4418RBG-25IB0 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Renesas Electronics Corporation is a global semiconductor leader delivering trusted embedded solutions for automotive, industrial, infrastructure, and IoT applications.

The R1QGA series targets high-performance memory subsystems in carrier-grade networking and telecom infrastructure, emphasizing deterministic timing, industrial reliability, and seamless FPGA/ASIC integration via QDR-II+ protocol compliance.

FAQ

What is the maximum operating frequency and corresponding cycle time for R1QGA4418RBG-25IB0?

R1QGA4418RBG-25IB0 supports a maximum clock frequency of 400 MHz with a guaranteed minimum cycle time of 2.50 ns. This specification is validated across the full industrial temperature range (−40°C to +85°C) and under specified supply conditions (VDD = 1.8 V ± 0.1 V, VDDQ = 1.5 V). The device achieves this performance using an integrated PLL and precise echo clock alignment.

Does R1QGA4418RBG-25IB0 support both read and write operations simultaneously?

Yes, R1QGA4418RBG-25IB0 features fully independent read and write data ports enabling true concurrent transactions. The /R and /W control signals operate on the same clock domain but initiate separate burst sequences, allowing overlapping read and write cycles without arbitration delay - a defining characteristic of QDR-II+ architecture implemented in R1QGA4418RBG-25IB0.

How is output impedance calibrated on R1QGA4418RBG-25IB0?

R1QGA4418RBG-25IB0 uses the ZQ pin for output impedance calibration: connecting ZQ to ground via a precision 175–350 Ω resistor sets Q and CQ driver strength to 0.2 × RQ. This allows matching to standard 50 Ω transmission lines without external series resistors. The calibration is performed internally at power-up and remains stable across voltage and temperature - a key feature of R1QGA4418RBG-25IB0's HSTL I/O design.

What is the function of the QVLD signal on R1QGA4418RBG-25IB0?

The QVLD signal on R1QGA4418RBG-25IB0 indicates valid read data presence: it asserts half a clock cycle before the first Q-word and deasserts half a cycle before the last, edge-aligned with CQ and /CQ. This provides a precise, jitter-free window for capturing burst data - eliminating the need for complex receiver deskew logic and directly improving timing margin in high-speed FPGA interfaces using R1QGA4418RBG-25IB0.

Is R1QGA4418RBG-25IB0 compatible with JTAG boundary scan testing?

Yes, R1QGA4418RBG-25IB0 implements IEEE 1149.1 JTAG boundary scan with dedicated TCK, TMS, TDI, and TDO pins. TCK must be tied to VSS if unused to prevent floating input; TMS and TDI have internal pull-ups and may be left unconnected. This JTAG support enables full boundary scan testing of PCB interconnects and facilitates debug in systems integrating R1QGA4418RBG-25IB0 with FPGAs or ASICs.