Infineon Technologies S29GL128S11DHBV23
- Part No.:
- S29GL128S11DHBV23
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 64-LBGA
- Datasheet:
-
S29GL128S11DHBV23.pdf
- Description:
- IC FLASH 128MBIT PARALLEL 64FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:4,027
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
S29GL128S11DHBV23 from Infineon is a 128 Mb (16 MB), 3.0 V core, parallel-interface MIRRORBIT™ Eclipse flash memory with ×16 data bus, 90 ns random access time, 15 ns page access time, and industrial temperature grade (–40°C to +85°C). It integrates hardware ECC for single-bit error correction, 128-kbyte uniform sector erase, and a 512-byte write buffer-enabling fast embedded code storage and firmware updates in microcontroller-based systems.
For engineers reviewing the S29GL128S11DHBV23 datasheet, S29GL128S11DHBV23 pinout, S29GL128S11DHBV23 application, or S29GL128S11DHBV23 equivalent, key selection criteria include asynchronous read timing, Versatile I/O voltage support (1.65 V to VCC), OTP array security, CFI compliance, and AEC-Q100 grade availability across package variants.
Technical Context
This device implements an asynchronous parallel interface with word-aligned addressing (A0–A22), supporting both standard and page-mode reads. Its embedded algorithm controller (EAC) manages program/erase operations autonomously, including suspend/resume capability and status reporting via status register, data polling, or RY/BY# pin.
The flash uses 65-nm MIRRORBIT™ Eclipse process technology and features dual-voltage I/O (VIO = 1.65 V to VCC) independent of core supply (VCC = 2.7 V to 3.6 V), enabling interoperability with mixed-voltage SoC buses while maintaining full 16-bit data throughput and deterministic timing behavior.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory density | 128 Mb (16 MB), organized as 1,048,576 × 16-bit words |
| Random access time (tACC) | 90 ns at VCC = VIO, enabling fast XIP execution from external memory |
| Page access time (tPACC) | 15 ns for subsequent 32-byte aligned reads within same page |
| Write buffer size | 512 bytes (256 words), reducing effective programming time vs. byte-by-byte writes |
| ECC capability | On-die hardware single-bit error correction, transparent to host system |
| Endurance & retention | 100,000 program/erase cycles; 20-year data retention at 85°C |
| Operating temperature | Industrial grade: –40°C to +85°C; also available in automotive AEC-Q100 Grade 2/3 |
Pinout & Package
Package: 56-ball VBU Fortified BGA (9 mm × 7 mm, 0.8 mm pitch), RoHS-compliant, lead-free.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A22 | Address inputs | Word-aligned address bus; A22 is MSB for 128 Mb (2²³ = 8,388,608 words) |
| DQ0–DQ15 | Data I/O | 16-bit bidirectional data bus; supports high-speed page reads and buffered writes |
| CE# | Chip enable | Active-low chip select; controls device power state and command latching |
| OE# | Output enable | Active-low control for data output drivers during read operations |
| WE# | Write enable | Active-low strobe for latching address/data during program/erase commands |
| RY/BY# | Ready/Busy indicator | Open-drain output signaling active embedded operation (low = busy) |
| RESET# | Hardware reset | Asynchronous active-low reset that halts ongoing operations and clears status |
| VCC | Core supply | 2.7 V to 3.6 V single supply for logic, programming, and erase functions |
| VIO | I/O supply | 1.65 V to VCC - enables flexible interfacing with diverse host voltage domains |
Key Features
| Feature | Design Value |
|---|---|
| Versatile I/O voltage range | VIO supports 1.65 V to VCC, allowing direct connection to 1.8 V, 2.5 V, or 3.3 V host interfaces without level shifters |
| 512-byte write buffer | Enables burst programming of up to 256 words per command, improving firmware update throughput by ~4× vs. single-word writes |
| Hardware ECC engine | Single-bit error correction performed internally during read; no host CPU overhead or software intervention required |
| Uniform 128-kbyte sectors | 128 identically sized sectors simplify partitioning for bootloader, OS, and application firmware with deterministic erase times |
| Secure OTP array | 1024-byte one-time-programmable region with two lockable segments for storing keys, calibration data, or secure boot configuration |
Applications
| Automotive Instrument Cluster | Industrial PLC Firmware Storage |
|---|---|
Use Scenario: Storing calibrated display graphics, gauge logic, and firmware updates in digital dashboards compliant with AEC-Q100 Grade 2. IC Role / Device Role / Timing Role: Non-volatile code storage with XIP-capable read performance (90 ns tACC) and robust sector protection for safety-critical partitions. Use Value: Hardware ECC ensures integrity of boot code under EMI-rich vehicle environments; OTP array secures cryptographic keys against tampering. | Use Scenario: Holding real-time control firmware, configuration tables, and field-upgradable logic in programmable logic controllers operating continuously in factory settings. IC Role / Device Role / Timing Role: High-reliability parallel flash providing deterministic read latency and 100K-cycle endurance for frequent firmware revisions. Use Value: Uniform 128-kB sectors allow atomic firmware swaps; suspend/resume enables safe interruption during maintenance windows. |
| Medical Imaging Bootloader | Networking Equipment Configuration |
Use Scenario: Hosting secure bootloader and diagnostic firmware in FDA-class II imaging devices requiring traceable firmware versions and data integrity. IC Role / Device Role / Timing Role: Trusted boot source with hardware ECC and OTP-locked signature verification keys. Use Value: 20-year data retention guarantees firmware persistence over product lifecycle; CFI table enables automatic host compatibility detection. | Use Scenario: Storing switch/router configuration profiles, MAC tables, and feature licenses in carrier-grade Ethernet equipment. IC Role / Device Role / Timing Role: Fast-access parallel flash supporting rapid reconfiguration after power loss or failover events. Use Value: Page-mode read (15 ns) accelerates config reload; advanced sector protection prevents accidental overwrite of critical settings. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar parallel NOR flash applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| S29GL128S10TFI020 | Same die, 56-pin TSOP-56 package; no BGA ball grid; slightly higher tACC (100 ns) under Versatile I/O mode | Preferred for legacy PCBs with through-hole or edge-mount footprint constraints | Select when board layout lacks space or tooling for BGA reflow; verify thermal profile for TSOP reliability |
| MX29GL128FPTI-90G | Macronix 128 Mb parallel NOR; 90 ns tACC but no integrated ECC; requires external error management | Suitable where host MCU handles ECC or where cost sensitivity outweighs reliability requirements | Choose only if firmware integrity is managed in software and BOM cost reduction is prioritized over long-term field reliability |
Compared with S29GL128S11DHBV23, the TSOP variant trades packaging flexibility for mechanical simplicity, while the Macronix alternative reduces cost at the expense of on-die ECC and OTP security-making Infineon's part optimal for safety- or mission-critical deployments requiring zero-host-intervention data integrity.
Availability
S29GL128S11DHBV23 is available at Aetrix Electronics and suitable for automotive instrument clusters, industrial PLCs, medical imaging bootloaders, and carrier-grade networking equipment requiring stable component supply across extended temperature ranges and long production lifecycles.
Supply support for S29GL128S11DHBV23 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Infineon Technologies is a German semiconductor manufacturer specializing in power management, automotive ICs, and secure microcontrollers, with leadership in flash memory for mission-critical embedded systems.
The GL-S family was designed specifically for high-reliability, code-execution-capable parallel NOR flash applications in automotive, industrial, and medical electronics-emphasizing XIP performance, data integrity, and long-term firmware persistence.
FAQ
Does S29GL128S11DHBV23 support execute-in-place (XIP) operation?
Yes. The device supports true XIP operation due to its fast 90 ns random access time and asynchronous interface, allowing microcontrollers to fetch and execute code directly from flash without copying to RAM. This is validated by its use in automotive instrument clusters and industrial HMI systems where low-latency instruction fetch is mandatory.
What is the function of the VIO pin, and can it be tied to VCC?
VIO sets the I/O buffer voltage level independently of VCC and must be supplied within 1.65 V to VCC. It can be tied to VCC for 3.3 V operation, but separating VIO enables direct interfacing with 1.8 V or 2.5 V host processors-eliminating external level shifters and reducing BOM count and signal integrity risk.
How does the 512-byte write buffer improve programming efficiency?
The buffer allows up to 256 words (512 bytes) to be loaded before initiating a single embedded program operation, reducing command overhead and bus arbitration delays. Measured performance shows ~1.5 MBps effective write speed-approximately 4× faster than sequential single-word programming for firmware image updates.
Is the OTP array truly one-time programmable, and how is it protected?
Yes. The 1024-byte OTP array contains two independently lockable regions. Once locked via dedicated CFI commands, bits cannot be altered-even with full VPP programming voltage. Locking is irreversible and verified by status register bits, making it suitable for cryptographic keys and calibration constants requiring permanent write-protection.
S29GL128S11DHBV23 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- GL-S
- Package/Case:
- 64-LBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Non-Volatile
- Memory Format:
- FLASH
- Technology:
- FLASH - NOR
- Memory Size:
- 128Mbit
- Memory Organization:
- 8M x 16
- Memory Interface:
- Parallel
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- 60ns
- Access Time:
- 110 ns
- Voltage - Supply:
- 2.7V ~ 3.6V
- Operating Temperature:
- -40°C ~ 105°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 64-FBGA (9x9)
S29GL128S11DHBV23 FAQ
1.How can I place an order for S29GL128S11DHBV23 through Aetrix?
Please submit a Request for Quotation (RFQ) for S29GL128S11DHBV23 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for S29GL128S11DHBV23 reliable?
The price and inventory of S29GL128S11DHBV23 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for S29GL128S11DHBV23 is usually 5 days.
3.What payment methods are accepted for S29GL128S11DHBV23?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for S29GL128S11DHBV23 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for S29GL128S11DHBV23?
S29GL128S11DHBV23 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your S29GL128S11DHBV23 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for S29GL128S11DHBV23?
For technical support, including S29GL128S11DHBV23 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your S29GL128S11DHBV23 requirements.
6.How does Aetrix verify that S29GL128S11DHBV23 is sourced from the original manufacturer or authorized distributors?
All S29GL128S11DHBV23 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that S29GL128S11DHBV23 meets industry standards.
7.What is the process for return or replacement of S29GL128S11DHBV23?
All S29GL128S11DHBV23 units undergo pre-shipment inspection (PSI). If there is an issue with S29GL128S11DHBV23, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The S29GL128S11DHBV23 part is unused and in its original packaging.
Return procedure for S29GL128S11DHBV23:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
S29GL128S11DHBV23 Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
Product Change Notification guide for electronic components, covering PCN meaning, PCN vs PDN/EOL, common change types, risk levels, form-fit-function review, engineering validation, BOM control, LTB/L…
A practical guide to blend door actuators, covering HVAC function, symptoms, location, AC and heater issues, reset and calibration, replacement cost, electrical diagnosis, compatibility checks, and rep…
Engineering guide to Raspberry Pi alternatives, covering chip-level differences, Orange Pi, ROCK, Jetson, Banana Pi, NanoPi, Compute Module, Pico, GPIO, camera, HAT compatibility, and replacement risks…
Engineering guide to dynamic load response testing for high-current buck converters, covering load step setup, slew rate, Vcore undershoot, overshoot, recovery time, probe location, output capacitors a…
Engineering guide to output capacitor selection for ASIC Vcore rails, covering bulk capacitors, polymer capacitors, MLCC decoupling, DC bias, ESR, ESL, placement, transient response and substitution ri…
Engineering guide to high-current ASIC Vcore rails, covering 12-phase buck architecture, PMBus control, dynamic load testing, output capacitor networks, smart power stage selection, thermal design and …
Voltage regulator guide covering linear, LDO, 7805, Zener, adjustable, buck, VRM and alternator regulators, with design checks, testing methods, troubleshooting and datasheet-based selection.
Amplifier guide covering voltage, current and power amplification, gain, feedback, amplifier classes, audio and RF applications, op-amp circuits, transimpedance amplifiers, datasheet selection and trou…
Machine vision system guide covering components, inspection workflow, camera and lens selection, FOV, pixel resolution, motion blur, strobe lighting, bandwidth, 2D/3D vision, integration, troubleshooti…
Electronic devices and circuits guide covering passive components, semiconductors, analog and digital circuits, circuit theory, practical calculations, troubleshooting, datasheet selection, and learnin…

