Infineon Technologies S70GL02GT11FHB010
- Part No.:
- S70GL02GT11FHB010
- Manufacturer:
- Infineon Technologies
- Category:
- Memory
- Package:
- 64-LBGA
- Datasheet:
-
S70GL02GT11FHB010.pdf
- Description:
- IC FLASH 2GBIT PARALLEL 64FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:4,041
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
S70GL02GT11FHB010 from Infineon is a 2 Gb (256 MB) parallel NOR flash memory IC built on 45-nm MIRRORBIT™ technology, featuring 110 ns random access time, 20 ns page access time, and 512-byte programming buffer. It integrates two 1-Gb S29GL01GT dies in a single fortified-BGA package and supports industrial (–40°C to +85°C) and automotive AEC-Q100 grade 3 operation for embedded boot code storage.
For engineers reviewing the S70GL02GT11FHB010 datasheet, S70GL02GT11FHB010 pinout, S70GL02GT11FHB010 application, or S70GL02GT11FHB010 equivalent, key selection criteria include uniform 128-KB sector erase architecture, dual-die stack configuration, VIO range of 1.65 V to VCC, ×8/×16 bus width support, and OTP array with two lockable regions.
Technical Context
This device implements a dual-die stacked architecture where each die is functionally identical to the S29GL01GT, sharing common control logic and address decoding across A0–A26. It uses asynchronous parallel interface with CE#, OE#, and WE# control signals and supports byte/word mode via BYTE# input.
Embedded algorithms handle program and erase operations with suspend/resume capability; status reporting is available via RY/BY# open-drain output, data polling, and Status Register read. Sector protection includes volatile and non-volatile ASP plus hardware WP# protection for the highest 128-KB sector.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory density | 2 Gb (256 MB), realized as dual 1-Gb die stack |
| Access time (tACC) | 110 ns max at –40°C to +85°C - determines minimum CPU wait states for random reads |
| Page access time (tPACC) | 20 ns max - enables burst-like sequential reads from 16-word buffer |
| Programming buffer | 512 bytes - allows single-command write of full page, reducing host overhead vs. byte-by-byte writes |
| Sector size & count | Uniform 128 KB × 2048 sectors - simplifies firmware partitioning and OTA update management |
| Endurance & retention | 100,000 program-erase cycles / 20-year data retention - validated for long-life industrial control logging |
| Supply voltage | VCC = 2.7–3.6 V; VIO = 1.65–VCC - supports mixed-voltage SoC interfacing without level shifters |
Pinout & Package
Package: 64-ball LSH fortified BGA, 13 mm × 11 mm, RoHS-compliant, with thermal pad exposed on bottom side per Infineon spec LSH064.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ0–DQ14, DQ15/A-1 | Data I/O / LSB address in byte mode | 16-bit bidirectional data bus; DQ15 doubles as A-1 only when BYTE# = LOW |
| A0–A26 | Address inputs | 27-bit address bus supporting full 2-Gb linear addressing (up to 7FFFFFFh) |
| CE#, OE#, WE# | Chip, Output, Write Enable controls | Standard asynchronous SRAM-like control timing; all active-low, TTL-compatible |
| RY/BY# | Open-drain ready/busy indicator | Active-low during embedded operations; requires external pull-up; supports wired-OR multi-device monitoring |
| WP#, RESET#, BYTE# | Function control inputs | WP# protects top 128-KB sector; RESET# forces standby state; BYTE# selects ×8/×16 bus width |
| VCC, VIO, VSS, VSSQ | Power and ground terminals | VCC powers core logic; VIO powers I/O drivers; VSSQ isolates I/O ground from core ground for noise reduction |
Key Features
| Feature | Design Value |
|---|---|
| Dual-die stacked architecture | Single-package 2-Gb capacity replaces two discrete 1-Gb chips, saving PCB area and interconnect complexity |
| 512-byte programming buffer | Enables 1.114 MBps effective write throughput - reduces firmware update time by >8× vs. single-word programming |
| Uniform 128-KB sector erase | Eliminates need for complex erase scheduling; supports deterministic OTA patching with sector-level atomicity |
| Advanced sector protection (ASP) | Per-sector lock/unlock via software commands plus hardware WP# override - prevents accidental corruption of boot loader region |
| 1024-byte OTP array | Two independently lockable regions store immutable keys or calibration data - immune to field reprogramming |
Applications
| Automotive Instrument Cluster | Industrial PLC Firmware Storage |
|---|---|
Use Scenario: Storing boot code, GUI assets, and calibration tables in digital dashboards requiring AEC-Q100 compliance. IC Role / Device Role / Timing Role: Primary parallel NOR flash for XIP-capable microcontroller boot ROM with deterministic 110 ns read latency. Use Value: AEC-Q100 grade 3 qualification ensures reliability at –40°C to +85°C; 20-year data retention avoids recalibration drift over vehicle lifetime. | Use Scenario: Holding firmware images and configuration parameters in programmable logic controllers deployed in factory automation. IC Role / Device Role / Timing Role: Nonvolatile storage for dual-image fail-safe updates with sector-level erase isolation. Use Value: Uniform 128-KB sectors enable atomic firmware swap; ASP prevents unauthorized modification of safety-critical control logic. |
| Medical Diagnostic Imaging Boot | Avionics Display System |
Use Scenario: Secure boot image storage in MRI/CT scanner mainboards where regulatory traceability and data integrity are mandated. IC Role / Device Role / Timing Role: Trusted boot source verified via CFI and OTP-stored cryptographic keys. Use Value: Common Flash Interface (CFI) enables standardized driver integration; OTP lockable regions meet IEC 62304 software lifecycle requirements. | Use Scenario: Storing display firmware and font assets in DO-178C-certified cockpit displays operating in extended temperature environments. IC Role / Device Role / Timing Role: High-reliability parallel flash with suspend/resume for real-time interrupt handling during erase cycles. Use Value: Suspend/resume capability ensures no missed interrupts during 245 KBps sector erases; industrial-plus grade supports –40°C to +105°C operation. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar parallel NOR flash applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Cypress S29GL01GT11FHIV10 | Single 1-Gb die, same 45-nm process, identical pinout and command set but half capacity | Used where 1-Gb density suffices and board layout lacks space for dual-die thermal profile | Select when system memory map requires only 128 MB and cost-per-bit optimization is prioritized |
| Macronix MX29GL256FHTI-90G | 2-Gb, 90 nm process, 90 ns tACC, no OTP array, supports only VIO = VCC (not 1.65 V) | Targeted at cost-sensitive consumer electronics with less stringent data retention or security needs | Choose for legacy designs already using MX29GL family; avoid if OTP or wide VIO range is required |
Compared with S29GL01GT11FHIV10, the S70GL02GT11FHB010 delivers double density in same footprint and adds OTP security; versus MX29GL256FHTI-90G, it offers superior timing (110 ns vs. 90 ns is misstated - actual is 110 ns vs. 90 ns, but S70GL02GT provides tighter tPACC and wider VIO), guaranteed 20-year retention, and AEC-Q100 qualification.
Availability
S70GL02GT11FHB010 is available at Aetrix Electronics and suitable for automotive instrument clusters, industrial PLCs, and avionics display systems requiring stable component supply across extended temperature ranges and long product lifecycles.
Supply support for S70GL02GT11FHB010 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Infineon Technologies is a German semiconductor manufacturer specializing in power management, automotive MCUs, and nonvolatile memory solutions, with global manufacturing and quality certifications including IATF 16949.
The GL-T series targets high-reliability embedded systems requiring parallel NOR flash with AEC-Q100 qualification, deterministic timing, and robust data integrity - designed specifically for automotive, industrial, and medical boot memory applications.
FAQ
What is the purpose of the DQ15/A-1 pin?
DQ15/A-1 serves dual function: as data bit DQ15 in word mode (BYTE# = HIGH), and as address bit A-1 (LSB) in byte mode (BYTE# = LOW). This enables flexible 8-bit or 16-bit bus interfacing without external multiplexing, reducing PCB routing complexity while maintaining full 27-bit address space coverage.
Does S70GL02GT11FHB010 support common flash interface (CFI)?
Yes, the device fully implements the Common Flash Interface per JEDEC JESD68, enabling automatic detection of geometry, timing, and command sets by host BIOS or bootloader. CFI query is accessed via standard autoselect commands at base address +00h through +0Fh, returning manufacturer ID 0001h and device IDs 227Eh/2248h/2201h.
How does the 512-byte programming buffer improve system performance?
The buffer allows up to 512 bytes to be loaded into an internal latch before initiating a single embedded program operation, achieving 1.114 MBps effective write speed. This reduces host CPU intervention by ~256× compared to byte-wise programming, minimizing bus occupancy and enabling concurrent processing during flash writes.
What is the role of VSSQ and how does it differ from VSS?
VSSQ is the dedicated ground return for I/O drivers (DQ pins), electrically isolated from core ground (VSS) to suppress switching noise coupling into sensitive analog or core logic circuits. This separation maintains signal integrity during high-speed reads and meets EMI requirements for automotive and medical applications per CISPR 25 Class 5.
S70GL02GT11FHB010 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Infineon Technologies
- Series:
- GL-T
- Package/Case:
- 64-LBGA
- Packaging:
- Tray
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Non-Volatile
- Memory Format:
- FLASH
- Technology:
- FLASH - NOR
- Memory Size:
- 2Gbit
- Memory Organization:
- 256M x 8, 128M x 16
- Memory Interface:
- Parallel
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 110 ns
- Voltage - Supply:
- 2.7V ~ 3.6V
- Operating Temperature:
- -40°C ~ 105°C (TA)
- Grade:
- Automotive
- Qualification:
- AEC-Q100
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 64-FBGA (11x13)
S70GL02GT11FHB010 FAQ
1.How can I place an order for S70GL02GT11FHB010 through Aetrix?
Please submit a Request for Quotation (RFQ) for S70GL02GT11FHB010 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for S70GL02GT11FHB010 reliable?
The price and inventory of S70GL02GT11FHB010 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for S70GL02GT11FHB010 is usually 5 days.
3.What payment methods are accepted for S70GL02GT11FHB010?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for S70GL02GT11FHB010 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for S70GL02GT11FHB010?
S70GL02GT11FHB010 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your S70GL02GT11FHB010 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for S70GL02GT11FHB010?
For technical support, including S70GL02GT11FHB010 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your S70GL02GT11FHB010 requirements.
6.How does Aetrix verify that S70GL02GT11FHB010 is sourced from the original manufacturer or authorized distributors?
All S70GL02GT11FHB010 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that S70GL02GT11FHB010 meets industry standards.
7.What is the process for return or replacement of S70GL02GT11FHB010?
All S70GL02GT11FHB010 units undergo pre-shipment inspection (PSI). If there is an issue with S70GL02GT11FHB010, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The S70GL02GT11FHB010 part is unused and in its original packaging.
Return procedure for S70GL02GT11FHB010:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
S70GL02GT11FHB010 Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
LDO regulator guide covering low dropout voltage, power dissipation, thermal design, PSRR, output noise, capacitor stability, adjustable LDO circuits, LDO vs buck converter and datasheet selection chec…
Conditional Access Module guide covering CAM meaning, CI/CI+ interface, smart card authorization, DVB security workflow, TV and set-top box compatibility, internal electronics, ESD protection, connecto…
Guide to electronic component obsolescence covering EOL risk, PCN/PDN notices, last-time buy planning, replacement options, form-fit-function validation, counterfeit risk and BOM lifecycle management.
18650 battery guide covering lithium-ion cell basics, 3.6V/3.7V voltage, 4.2V charging, mAh and Wh capacity, protected cells, chargers, BMS, series-parallel packs, holders, welding and sourcing checks.…
Hall effect sensor guide covering working principle, linear and digital sensors, Arduino circuits, current sensing, speed detection, automotive applications, A3144 examples, signal filtering and datash…

