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Texas Instruments SCAN921224SLC

Part No.:
SCAN921224SLC
Manufacturer:
Texas Instruments
Category:
Serializers, Deserializers
Package:
49-LFBGA
Datasheet:
AetrixSCAN921224SLC.pdf
Description:
IC DESERIALIZER 10BIT 49FBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:1,377

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Product details

Overview

SCAN921224SLC from Texas Instruments (formerly National Semiconductor) is a 10-bit Bus LVDS deserializer IC designed to recover parallel clock and data from a single differential serial stream. It operates at 20–66 MHz input clock rates, delivers 660 Mbps payload data rate, supports IEEE 1149.1 JTAG boundary-scan, and features at-speed BIST for interconnect validation - deployed in high-reliability backplane and UTP cable communication systems.

For engineers reviewing the SCAN921224SLC datasheet, SCAN921224SLC pinout, SCAN921224SLC application, or SCAN921224SLC equivalent, this page provides verified functional role, lock-time behavior under random data, embedded-clock recovery architecture, power-down current (≤1.0 mA), and flow-through BGA pinout layout guidance - all critical for deterministic timing design and system-level test integration.

Technical Context

The SCAN921224SLC uses a PLL-based clock recovery architecture that locks to embedded clock bits (start/stop framing) within the 12-bit serialized stream (10 data + 2 control bits), enabling synchronization without external clock distribution. Its REFCLK input drives local PLL initialization, while LOCK output signals valid data alignment status.

It implements dual synchronization modes: fast lock via SYNC patterns (≤3 µs at 66 MHz) and open-loop random-data lock (mean 3.0 µs, min 0.43 µs), with false-lock detection circuitry preventing misalignment on repetitive multi-transition (RMT) patterns in DIN0–DIN8. The device supports hot insertion and maintains receiver input high-impedance when powered off.

Key Specifications

Parameter Value and Actual Design Meaning
Serial Data Rate660 Mbps payload (10-bit × 66 MHz); 792 Mbps gross (12-bit × 66 MHz)
Input Clock Range20–66 MHz REFCLK - sets deserialization timing resolution and lock stability window
PLL Lock Time (Sync)0.29–0.8 µS at 66 MHz - defines minimum resync interval after loss-of-lock events
Power-Down Current≤1.0 mA (PWRDN & REN low) - enables dynamic power gating during idle backplane cycles
Bus LVDS Input ThresholdVTH = +6 to +50 mV, VTL = −50 to −12 mV - ensures robust noise margin against common-mode shifts on long traces
Output Drive CapabilityROUT0–ROUT9 drive ≤3 CMOS gates (15 pF load) at 66 MHz - validates direct interface to downstream ASICs without buffers
Receiver Noise Margin250–400 pS RMS jitter tolerance at 66 MHz - quantifies maximum allowable phase noise before bit errors occur

Pinout & Package

SCAN921224SLC is housed in a 49-lead BGA package (SLC49a), 7×7 mm, 0.8 mm pitch, with flow-through pinout optimized for minimal trace stubs in backplane routing.

Pin/Terminal Circuit Role Design Meaning
RI+, RI−Bus LVDS Differential InputReceives serialized 12-bit stream (10 data + 2 embedded clock bits); requires 27 Ω termination
REFCLKReference Clock InputLocal oscillator reference for PLL initialization; must be stable before or during power-up
ROUT0–ROUT9Parallel LVCMOS/LVTTL OutputsRecovered 10-bit data bus; valid only when LOCK = low; drive 15 pF loads at 66 MHz
RCLKRecovered Clock OutputEdge-aligned to ROUT data; polarity controlled by RCLK_R/F; used as timing reference for downstream logic
LOCKLock Status IndicatorActive-low signal indicating valid clock/data recovery; triggers resync when high
PWRDNPower-Down ControlActive-low input disabling PLL and outputs; reduces ICCR to ≤1.0 mA
RENReceiver EnableActive-high input controlling TRI-STATE of ROUT/RCLK; independent of PWRDN state
RCLK_R/FRecovered Clock Edge SelectHigh = rising-edge sampling of ROUT data; low = falling-edge sampling
TMS, TDI, TDO, TCK, TRSTJTAG Test Access PortIEEE 1149.1 compliant interface for boundary-scan and RUNBIST execution

Key Features

Feature Design Value
Embedded clock recoveryEliminates separate clock distribution; removes clock-to-data skew across backplanes
At-speed BIST (RUNBIST)Validates interconnect integrity at full 66 MHz operation with <10⁻⁷ BER pass threshold
Random-data lock capabilityEnables hot insertion and open-loop operation without SYNC pattern dependency
False-lock detectionPrevents misalignment on repetitive multi-transition (RMT) patterns in DIN0–DIN8
Flow-through BGA pinoutMinimizes PCB trace stubs and impedance discontinuities in multi-drop backplane layouts
Hot-insertion supportHigh-impedance inputs when unpowered; defined power sequencing (GND → VCC → I/O)

Applications

Backplane Data Link Industrial PLC Backplane

Use Scenario: Transmitting control/status data between modular I/O cards and CPU chassis over 10+ slot backplanes.

IC Role / Device Role / Timing Role: Deserializes high-speed point-to-multipoint Bus LVDS streams into synchronous 10-bit parallel data aligned to recovered RCLK.

Use Value: Reduces connector pin count by >80% vs. parallel bus; eliminates clock skew across slots; supports hot-swap card replacement via random-lock mode.

Use Scenario: Interfacing FPGA-based motion controllers with distributed servo drive modules via shielded twisted-pair cabling.

IC Role / Device Role / Timing Role: Receives serialized command packets from master controller; recovers embedded clock to time-critical PWM updates.

Use Value: Enables deterministic 660 Mbps payload over 3-meter UTP runs; JTAG BIST verifies cable integrity pre-run; LOCK signal triggers fault logging on loss-of-sync.

Avionics Data Concentrator Test Equipment Interconnect

Use Scenario: Aggregating sensor telemetry from multiple line-replaceable units (LRUs) onto a central ARINC-429 or AFDX gateway.

IC Role / Device Role / Timing Role: Deserializes time-stamped analog/digital sensor data streams; supplies recovered RCLK to timestamping logic.

Use Value: Meets DO-254 deterministic lock-time requirements (≤3 µs sync lock at 66 MHz); supports power-down during standby to reduce thermal load.

Use Scenario: High-fidelity signal routing between automated test equipment (ATE) mainframe and modular instrument cards.

IC Role / Device Role / Timing Role: Converts high-speed digital stimulus/response streams into parallel format for FPGA-based pattern generators.

Use Value: Guarantees sub-nanosecond jitter margin (250–400 pS) for <10⁻¹² BER in production test; RUNBIST validates interconnects before each test sequence.

Equivalent & Alternatives

The following parts are listed as comparable options for similar deserializer applications.

Alternative Part Technical Difference Application Difference Selection Advice
SN65LV1023ASingle-ended LVDS deserializer; no embedded clock recovery; requires separate clock lineLacks IEEE 1149.1 test access and at-speed BIST; limited to short PCB tracesChoose when clock distribution is already available and test coverage is handled externally
DS90CR288A28-bit FlatLink deserializer; higher channel count; 85 MHz max; no JTAG/BISTDesigned for LCD panel interfaces; lacks backplane-optimized lock timing and RMT detectionChoose for high-bandwidth video/data aggregation where embedded clock is not required

Compared with SCAN921224SLC, SN65LV1023A requires external clock routing and offers no built-in test infrastructure, while DS90CR288A trades JTAG/BIST and deterministic lock behavior for higher bandwidth and channel density - making SCAN921224SLC uniquely suited for safety-critical, testable backplane links.

Availability

SCAN921224SLC is available at Aetrix Electronics and suitable for industrial PLC backplanes, avionics data concentrators, automated test equipment interconnects, and high-reliability telecommunications chassis requiring stable component supply and long-term lifecycle support.

Supply support for SCAN921224SLC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments acquired National Semiconductor in 2011 and maintains full technical and supply chain responsibility for legacy high-reliability interface products.

The SCAN921224SLC belongs to TI's Bus LVDS serializer/deserializer chipset family, engineered specifically for deterministic, testable, low-skew data transmission across backplanes and cables in harsh electromagnetic environments.

FAQ

What is the primary function of the SCAN921224SLC in a system?

The SCAN921224SLC functions as a 10-bit Bus LVDS deserializer that recovers both clock and data from a single differential serial stream. It extracts embedded clock bits from the 12-bit frame (10 data + 2 control), generates a synchronized RCLK output, and presents validated parallel data on ROUT0–ROUT9 - enabling high-integrity, skew-free communication across backplanes or UTP cables without separate clock lines.

Does the SCAN921224SLC require an external clock source to operate?

Yes, the SCAN921224SLC requires a stable REFCLK input to initialize its internal PLL before lock acquisition. REFCLK must be applied prior to or concurrent with power-up and remain active during operation. While it recovers clock information from the serial stream, REFCLK is essential for PLL startup and phase alignment - unlike fully self-clocked receivers.

How does the SCAN921224SLC handle loss of synchronization during operation?

When the SCAN921224SLC loses lock, the LOCK pin asserts high and ROUT0–ROUT9 enter TRI-STATE. Up to three previously valid data cycles may contain bit errors due to lock-detection latency. Resynchronization occurs either by receiving new SYNC patterns from the serializer (triggered via LOCK feedback) or via random-data relock - with mean times of 3.0 µs at 66 MHz under PRBS215 conditions.

Can the SCAN921224SLC be used in hot-plug applications?

Yes, the SCAN921224SLC supports hot insertion: its receiver inputs remain high-impedance when unpowered, and its random-lock capability allows synchronization to live data streams. Proper mechanical sequencing (GND → VCC → I/O) is required. The device has been verified for hot-plug operation in multi-slot backplanes per application note guidelines.

What test capabilities does the SCAN921224SLC provide beyond standard JTAG?

Beyond IEEE 1149.1 boundary-scan, the SCAN921224SLC implements RUNBIST - an at-system-speed interconnect test executing in ~33 ms at 66 MHz. It validates the entire LVDS link (including cable/backplane) with pass/fail reporting based on measured bit-error-rate (<10⁻⁷). This complements EXTEST for go/no-go physical layer checks and enables production-level link integrity verification.

SCAN921224SLC Specifications

Product attributes
Attribute value
Manufacturer:
Texas Instruments
Series:
-
Package/Case:
49-LFBGA
Packaging:
Tray
Product Status:
Not For New Designs
Function:
Deserializer
Data Rate:
660Mbps
Input Type:
LVDS
Output Type:
LVCMOS, LVTTL
Number of Inputs:
1
Number of Outputs:
10
Voltage - Supply:
3V ~ 3.6V
Operating Temperature:
-40°C ~ 85°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
49-NFBGA (7x7)

SCAN921224SLC FAQ

1.How can I place an order for SCAN921224SLC through Aetrix?

Please submit a Request for Quotation (RFQ) for SCAN921224SLC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for SCAN921224SLC reliable?

The price and inventory of SCAN921224SLC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCAN921224SLC is usually 5 days.

3.What payment methods are accepted for SCAN921224SLC?

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Note: Certain payment methods may incur a processing fee.

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SCAN921224SLC orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your SCAN921224SLC order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for SCAN921224SLC?

For technical support, including SCAN921224SLC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCAN921224SLC requirements.

6.How does Aetrix verify that SCAN921224SLC is sourced from the original manufacturer or authorized distributors?

All SCAN921224SLC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCAN921224SLC meets industry standards.

7.What is the process for return or replacement of SCAN921224SLC?

All SCAN921224SLC units undergo pre-shipment inspection (PSI). If there is an issue with SCAN921224SLC, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The SCAN921224SLC part is unused and in its original packaging.

Return procedure for SCAN921224SLC:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

SCAN921224SLC Tags

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