Texas Instruments SCAN926260TUFX/NOPB

Overview

SCAN926260TUFX/NOPB from Texas Instruments is a six-channel 1:10 Bus LVDS deserializer IC with integrated PLL clock recovery, IEEE 1149.1 (JTAG) compliance, and at-speed Built-In Self-Test (BIST). It accepts up to six independent 660 Mbps LVDS serial streams-each embedded with clock bits-and delivers synchronized 10-bit parallel outputs (ROUTn[0:9]) with recovered clocks (RCLKn) and lock-detect signals (LOCKn). Designed for high-reliability backplane and board-to-board interconnects in industrial imaging and test equipment.

For engineers reviewing the SCAN926260TUFX/NOPB datasheet, SCAN926260TUFX/NOPB pinout, SCAN926260TUFX/NOPB application, or SCAN926260TUFX/NOPB equivalent, key selection criteria include per-channel powerdown control, JTAG/BIST test coverage for interconnect validation, 16–66 MHz parallel clock rate support, 196-pin NFBGA package compatibility, and noise margin performance (±50 mV differential threshold) under real-world jitter conditions.

Technical Context

The SCAN926260TUFX/NOPB implements six independent deserializer blocks, each with its own PLL-based clock recovery circuitry, lock-detection logic, and dedicated PWRDWNn control. Each channel operates autonomously: it locks to incoming Bus LVDS data (e.g., from DS92LV1021/SCAN921025), recovers the embedded clock, and drives ROUTn[0:9] and RCLKn only when LOCKn is asserted low-ensuring data validity is strictly gated by lock status.

It supports dual test modes: IEEE 1149.1 boundary-scan (with EXTEST and RUNBIST instructions) and BIST Alone mode via dedicated pins (BIST_SEL[0:2], BIST_ACT, BISTMODE_REQ), enabling continuous BER testing on selected channels without disrupting live traffic on others. The device uses a single +3.3 V supply and features high-impedance inputs at VCC = 0 V.

Key Specifications

Pinout & Package

SCAN926260TUFX/NOPB is housed in a 196-pin Low-Profile Ball Grid Array (NFBGA) package with 0.8 mm pitch and 12 mm × 12 mm footprint. Thermal resistance θJA = 34°C/W and θJC = 8°C/W support industrial thermal management.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar Bus LVDS deserializer applications.

Compared with SCAN926260TUFX/NOPB, SCAN921260TUR trades BIST Alone flexibility for simpler control signaling, while DS92LV1260MTDX offers hardware redundancy at the expense of modern test infrastructure support-making SCAN926260TUFX/NOPB optimal for new designs demanding both speed and field-diagnosability.

Availability

SCAN926260TUFX/NOPB is available at Aetrix Electronics and suitable for medical imaging backplanes, automated test equipment, industrial machine vision systems, and defense radar signal processing requiring stable component supply, long-term lifecycle assurance, and traceable sourcing.

Supply support for SCAN926260TUFX/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with decades of expertise in high-speed interface ICs and industrial-grade reliability.

The SCAN926260TUFX/NOPB belongs to TI's Bus LVDS serializer/deserializer product line, engineered specifically for deterministic, low-jitter, high-density digital interconnects in mission-critical industrial and test instrumentation systems.

FAQ

What is the maximum serial data rate supported by SCAN926260TUFX/NOPB?

The SCAN926260TUFX/NOPB supports a maximum serial data rate of 660 Mbps, achieved when the parallel clock (TCLK) operates at 66 MHz and the serializer transmits 12-bit frames (10 data + 2 embedded clock bits). This rate is confirmed in the Electrical Characteristics table under "Deserializer Switching Characteristics" with tRCP = 15.15 ns minimum period, corresponding to 66 MHz RCLK operation.

Does SCAN926260TUFX/NOPB require an external reference clock, and what is its valid frequency range?

Yes, SCAN926260TUFX/NOPB requires a single-ended CMOS/LVTTL REFCLK input, specified for 16–66 MHz operation. This reference clock is used by each channel's internal PLL to synthesize a local clock before locking to the incoming LVDS data stream. The Recommended Operating Conditions table explicitly lists REFCLK frequency range and duty cycle (30–70%) requirements.

How does SCAN926260TUFX/NOPB indicate valid data output, and what happens when lock is lost?

SCAN926260TUFX/NOPB asserts LOCKn LOW only when its PLL has successfully locked to the incoming LVDS stream; ROUTn[0:9] and RCLKn outputs are guaranteed valid only during this state. Upon loss of lock-detected after two consecutive invalid clock edges-LOCKn goes HIGH and ROUTn[0:9]/RCLKn are driven HIGH (not tri-stated), providing fail-safe signaling for downstream logic to discard potentially corrupted data.

Can SCAN926260TUFX/NOPB perform built-in self-test without a JTAG controller?

Yes, SCAN926260TUFX/NOPB supports BIST Alone mode using dedicated pins (BIST_SEL[0:2], BIST_ACT, BISTMODE_REQ), allowing continuous or on-demand BER testing on one or all channels without engaging the JTAG TAP controller. This capability is documented in the "BIST Alone Test Modes" section and enables real-time diagnostics during live system operation.

What package type and thermal characteristics apply to SCAN926260TUFX/NOPB?

SCAN926260TUFX/NOPB uses a 196-pin NFBGA package (12 mm × 12 mm, 0.8 mm pitch) with θJA = 34°C/W and θJC = 8°C/W. These values are specified in the Absolute Maximum Ratings table and support industrial thermal design; the package is RoHS-compliant and marked with "TUFX/NOPB" per TI's packaging nomenclature.