Texas Instruments SCAN928028TUF
- Part No.:
- SCAN928028TUF
- Manufacturer:
- Texas Instruments
- Category:
- Serializers, Deserializers
- Package:
- 196-LBGA
- Datasheet:
-
SCAN928028TUF.pdf
- Description:
- IC SERIALIZER 8CH 10:1 196-LBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
SCAN928028 from Texas Instruments (formerly National Semiconductor) is an 8-channel 10:1 parallel-to-serial LVDS serializer with integrated IEEE 1149.1 JTAG and at-speed BIST. It accepts eight independent 10-bit LVTTL inputs synchronized to a single 18–66 MHz TCLK, serializes each into a 12-bit frame (10 data + start/stop clock bits), and outputs eight differential LVDS streams at up to 792 Mbps per channel (66 MHz × 12). It operates on a single +3.3V supply, dissipates 740 mW typical at 66 MHz, and targets high-reliability backplane and board-to-board interconnects in test equipment and industrial imaging systems.
For engineers reviewing the SCAN928028 datasheet, SCAN928028 pinout, SCAN928028 application, or SCAN928028 equivalent, key selection considerations include its 196-pin LBGA package, per-channel power-down control, PRBS-based @Speed Test capability for BER validation against SCAN921224/SCAN921226 deserializers, and strict timing requirements for tDIS (2.0 ns setup), tDIH (1.5 ns hold), and channel-to-channel skew (≤80 ps at 66 MHz).
Technical Context
The SCAN928028 implements eight independent 10:1 serializer blocks sharing one PLL and a common TCLK input-enabling synchronous serialization without inter-channel resynchronization overhead. Each channel embeds clock bits via start/stop framing and transmits at 12× TCLK rate, delivering deterministic payload throughput (e.g., 400 Mbps at 40 MHz TCLK).
Its test architecture integrates dual-layer verification: IEEE 1149.1 JTAG supports boundary-scan and RUN-BIST instructions for interconnect go/no-go and at-speed BER testing (pass threshold: <10⁻⁷), while the @Speed Test mode uses BIST_SEL[3:0] and BIST_ACT to route internally generated PRBS patterns to selected channels for end-to-end link validation with compatible deserializers.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Serializer Channels | 8 independent 10:1 serializers, each with dedicated DIN[0–9], PWDNn, and DO± outputs |
| TCLK Frequency Range | 18–66 MHz - defines serial data rate (12× TCLK) and payload bandwidth (10× TCLK) |
| LVDS Output Drive | 5 mA modified Bus LVDS - supports point-to-point and lightly loaded multidrop with double termination |
| Power Dissipation | 740 mW typical at 3.3 V / PRBS / 66 MHz - enables thermal management in dense PCB layouts |
| Channel Skew | ≤80 ps at 66 MHz - ensures deterministic timing alignment across all 8 serialized streams |
| JTAG Compliance | IEEE 1149.1 - enables production test, interconnect validation, and RUN-BIST execution at system speed |
| @Speed Test Support | PRBS generation per channel - validates LVDS transmission path integrity to SCAN921224/SCAN921226/SCAN921260/SCAN926260 |
Pinout & Package
SCAN928028 is housed in a 196-pin Low-Profile Ball Grid Array (LBGA) package with 1.0 mm pitch, optimized for high-speed signal integrity and thermal dissipation (θJA = 34°C/W). The package supports controlled impedance routing and requires four-layer PCB construction with dedicated DVDD, PVDD, and AVDD power planes.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TCLK | Global transmit clock input | Synchronizes latching of all 80 parallel data bits (DINn[0–9]) on rising edge; frequency sets serial rate |
| DINn[0–9] | Parallel data inputs (n = 0–7) | 10-bit LVTTL inputs per channel; unused bits must be tied to avoid repetitive-multiple-transition (RMT) patterns |
| DO0±–DO7± | Differential LVDS serial outputs | Eight 5 mA Bus LVDS pairs; support embedded clock recovery by compatible deserializers |
| PWDNn | Per-channel power-down control | Individually disables serializer logic and forces DO± into TRI-STATE without affecting PLL lock |
| MS_PWDN | Master power-down control | Shuts down entire device including PLL; outputs enter TRI-STATE; full re-initialization required on wake-up |
| DEN | Output driver enable | Active-high control for all DO± drivers; low state forces all outputs into TRI-STATE regardless of PWDNn/MS_PWDN |
| BIST_ACT / BIST_SEL[3:0] | @Speed Test activation and channel select | Enables PRBS pattern generation; BIST_SEL selects 1 of 8 channels or all 8 simultaneously for BIST |
| TCK/TDI/TMS/TRST/TDO | JTAG test interface | Supports EXTEST (LVDS interconnect check) and RUN-BIST (at-speed BER test with PASS/FAIL reporting) |
Key Features
| Feature | Design Value |
|---|---|
| Single PLL with shared TCLK | Eliminates per-channel clock domain crossing and reduces jitter accumulation across 8 channels |
| Embedded clock framing | Start/stop bits provide self-clocked serial stream - no separate clock line needed for deserializer lock |
| Per-channel power-down | Reduces dynamic power by ~6 mA per disabled channel at 66 MHz, enabling adaptive bandwidth allocation |
| Modified Bus LVDS outputs | 5 mA drive strength supports double-termination (50 Ω total load) for limited multidrop topologies |
| On-chip PLL filtering | Minimizes sensitivity to PVDD supply noise in 300 kHz–1 MHz band - critical for low-output-jitter performance |
Applications
| Medical Imaging Data Acquisition | Automated Test Equipment (ATE) |
|---|---|
Use Scenario: High-speed digitized sensor data from multi-sensor CT/MRI detector arrays transmitted across backplane to FPGA processing unit. IC Role / Device Role / Timing Role: Parallel-to-serial bridge converting 80-bit pixel data streams into 8 synchronized LVDS lanes with embedded clock recovery. Use Value: Enables deterministic 5.28 Gbps aggregate payload (66 MHz × 10 bits × 8 channels) with ≤80 ps inter-lane skew for time-aligned image reconstruction. | Use Scenario: Channelized stimulus/response routing between pattern generator and DUT interface boards in modular ATE racks. IC Role / Device Role / Timing Role: Serializer aggregating parallel test vectors onto high-speed differential links; paired with SCAN921224 deserializers on DUT board. Use Value: JTAG + @Speed Test allows in-system BER validation at full operational speed (up to 792 Mbps/lane), reducing test development time and field failure risk. |
| Industrial Machine Vision Systems | High-Resolution Digital Video Backplanes |
Use Scenario: Multi-camera synchronization in robotic inspection systems where 8 camera sensors feed raw image data to central vision processor. IC Role / Device Role / Timing Role: Clock-domain bridging device accepting asynchronous sensor outputs aligned to common TCLK, then serializing for low-noise transmission. Use Value: Single 3.3 V supply and 740 mW typical power enable integration into space-constrained enclosures without active cooling. | Use Scenario: Pixel data transport from graphics controller to display interface modules in broadcast-grade video routers. IC Role / Device Role / Timing Role: High-fidelity serializer preserving timing integrity across 8 independent video data lanes using embedded clock framing. Use Value: Supports 10-bit RGB+sync payloads at 66 MHz TCLK (660 Mbps/lane), meeting SMPTE 292/344 timing margins with <10⁻⁷ BER under @Speed Test. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar parallel-to-serial LVDS conversion applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| DS92LV1021 | Single-channel 10:1 serializer; identical electrical specs and pinout per channel but no integrated multi-channel PLL or JTAG | Requires 8 discrete devices + external clock distribution; lacks @Speed Test and BIST infrastructure | Select when board area and cost favor discrete implementation and system-level test coverage is handled externally |
| SCAN921224 | Deserializing companion (not functionally equivalent); receives SCAN928028 output; includes PRBS verification circuitry | Used downstream in receive path only; cannot replace SCAN928028 as a serializer | Select as mandatory pairing component-not a functional alternative-but required for full @Speed Test validation |
Compared with DS92LV1021, SCAN928028 reduces component count, eliminates clock skew between channels, and adds built-in testability; compared with standalone solutions, it trades flexibility for integration density and deterministic inter-channel timing-making it optimal for space-constrained, high-reliability systems requiring production-testable links.
Availability
SCAN928028 is available at Aetrix Electronics and suitable for medical imaging data acquisition, automated test equipment, industrial machine vision systems, and high-resolution digital video backplanes requiring stable component supply, long-term lifecycle support, and traceable sourcing.
Supply support for SCAN928028 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments acquired National Semiconductor in 2011 and maintains legacy product support, datasheets, and application notes for the SCAN928028 through ti.com.
The SCAN928028 belongs to National Semiconductor's BLVDS (Bus LVDS) serializer family, designed specifically for high-integrity, multi-channel parallel-to-serial conversion in test, measurement, and imaging systems where deterministic timing, low BER, and in-system testability are critical.
FAQ
What is the maximum serial data rate supported by SCAN928028?
The SCAN928028 serializes each 10-bit parallel input into a 12-bit frame (10 data + start/stop bits) at 12× the TCLK rate. With a maximum TCLK of 66 MHz, the serial output rate per channel is 792 Mbps. Aggregate bandwidth across all 8 channels is 6.336 Gbps, though payload remains 5.28 Gbps (66 MHz × 10 bits × 8). This rate is validated under PRBS loading and meets jitter specifications in the datasheet.
Does SCAN928028 require external clock conditioning for its PLL?
No-SCAN928028 includes on-chip PLL filtering optimized for PVDD supply noise rejection in the 300 kHz–1 MHz band. However, clean PVDD is essential: a CRC or CLC notch filter near the PVDD pin is recommended if the power supply exhibits switching noise in that range. The PLL locks to TCLK directly; no external VCXO or clock cleaner is needed for standard operation of SCAN928028.
How does SCAN928028 handle unused data bits when fewer than 10 bits are used per channel?
When using fewer than 10 bits (e.g., 8-bit mode), adjacent unused DINn pins must be tied to fixed logic levels to prevent repetitive-multiple-transition (RMT) patterns that impede deserializer lock. For example, tie DINn[0] high and DINn[9] low. This ensures the embedded clock edges remain detectable by SCAN921224/SCAN921226 deserializers and avoids false lock conditions during initialization of SCAN928028.
Can SCAN928028 operate with deserializers other than National Semiconductor parts?
SCAN928028 is explicitly designed for interoperability with National Semiconductor's SCAN921224, SCAN921226, SCAN921260, SCAN926260, DS92LV1210, DS92LV1212A, DS92LV1224, and DS92LV1260 deserializers. While other LVDS deserializers may accept the 12-bit framed stream, only these specified parts guarantee correct embedded clock recovery, SYNC pattern recognition, and @Speed Test PRBS verification-critical for full functionality of SCAN928028.
What is the purpose of the MS_PWDN and PWDNn pins on SCAN928028?
MS_PWDN is the master power-down control: driving it low disables the entire SCAN928028-including the shared PLL-and forces all DO± outputs into TRI-STATE. PWDNn (n = 0–7) provides per-channel power-down: asserting PWDNn disables only its associated serializer block while preserving PLL lock and operation of other channels. This allows dynamic bandwidth scaling-e.g., disabling unused channels in SCAN928028 to save ~6 mA per channel at 66 MHz-without disrupting active links.
SCAN928028TUF Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 196-LBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Function:
- Serializer
- Data Rate:
- 480Mbps
- Input Type:
- LVTTL
- Output Type:
- LVDS
- Number of Inputs:
- 10
- Number of Outputs:
- 1
- Voltage - Supply:
- 3V ~ 3.6V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 196-NFBGA (15x15)
SCAN928028TUF FAQ
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6.How does Aetrix verify that SCAN928028TUF is sourced from the original manufacturer or authorized distributors?
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7.What is the process for return or replacement of SCAN928028TUF?
All SCAN928028TUF units undergo pre-shipment inspection (PSI). If there is an issue with SCAN928028TUF, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCAN928028TUF part is unused and in its original packaging.
Return procedure for SCAN928028TUF:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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