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onsemi SCANPSC100FSCX

Name: SCANPSC100FSCX
Brand: onsemi
SKU: SCANPSC100FSCX
Price: 2.40 USD
Availability: InStock
Rating: 5 (2 reviews)

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Part No.:: SCANPSC100FSCX

Manufacturer:: onsemi

Category:: Controllers

Package:: 28-SOIC (0.295", 7.50mm Width)

Datasheet:: SCANPSC100FSCX.pdf

Description:: IC SCAN CTRLR EMB BOUNDRY 28SOIC

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Product details

Overview

SCANPSC100FSCX from Fairchild Semiconductor is an embedded IEEE 1149.1 (JTAG) boundary scan controller that bridges parallel processor buses to serial test scan chains. It supports dual independent scan chains via TMS(1:0), delivers up to 25 MHz TCK output, integrates a 32-bit programmable counter for precise scan cycle control, and features 16-bit Serial Signature Compaction (SSC) at TDI. It is used in automated test equipment and board-level debug systems requiring deterministic, host-controlled JTAG access.

For engineers reviewing the SCANPSC100FSCX datasheet, pinout, applications, or equivalent options, key selection criteria include dual-chain TMS support, asynchronous 8-bit PPI timing with RDY/STB handshaking, TCK stop-on-overflow/underflow logic, 32-bit counter programmability, and TTL-compatible inputs with 24 mA CMOS outputs.

Technical Context

The SCANPSC100FSCX implements a dedicated Parallel Processor Interface (PPI) with 8-bit bidirectional data (D7:0), 3-bit address (A2:0), and asynchronous control (CE, R/W, STB, RDY, INT). Its Serial Scan Interface (SSI) includes four double-buffered 8-bit FIFO shifter/buffers - one for TDO, one for TDI, and two for TMS(1:0) - enabling concurrent parallel load/serial shift operations.

TCK generation is derived from SCK and dynamically gated by status of shifter/buffers and the 32-bit counter (CNT32); TCK stops low on empty TDO, full TDI, unloaded CNT32, or terminal count. Freeze mode (FRZ pin + MODE1 bit 2) allows asynchronous TCK pulse generation for IEEE 1149.1 SAMPLE instruction execution without disrupting internal shift alignment.

Key Specifications

Parameter	Value and Actual Design Meaning
TCK Frequency	Up to 25 MHz - enables high-speed boundary scan vector application without external clock synthesis.
Scan Chains	2 independent - supports simultaneous control of separate JTAG chains via dedicated TMS0/TMS1 outputs.
Counter Resolution	32-bit programmable down-counter - defines exact TCK cycles per scan operation, critical for deterministic BIST and DRAM test sequences.
Serial Compaction	16-bit SSC at TDI - reduces post-scan result data volume while preserving fault detection capability.
I/O Drive Strength	24 mA source/sink - ensures robust signal integrity driving long JTAG traces or multiple device inputs.
Process Technology	FACT™ 1.5 µm CMOS - provides industrial-grade noise immunity and stable operation across temperature ranges.
PPI Bus Width	8-bit asynchronous - compatible with legacy microcontrollers and DSPs without requiring glue logic or bus translators.

Pinout & Package

SCANPSC100FSCX is housed in a 28-lead SOIC package (JEDEC MS-013, 0.300" wide, package code M28B), with gull-wing leads and standard surface-mount footprint.

Pin/Terminal	Circuit Role	Design Meaning
RST	Asynchronous reset input	Initializes all internal logic including mode registers, shifter/buffers, and CNT32; includes hysteresis for noise rejection.
SCK	System clock input	Source clock for internally generated TCK; hysteresis improves immunity to clock line noise.
OE	Output enable	3-states TDO, TMS(1:0), and TCK outputs when HIGH; internal 20 kΩ pull-up ensures safe default state.
CE	Chip enable	Enables PPI byte transfers; disables D7:0 and RDY when HIGH; hysteresis prevents spurious enable/disable transitions.
R/W	Read/write direction	Defines PPI cycle type: HIGH = read, LOW = write; hysteresis stabilizes bus control under noisy conditions.
STB	Strobe input	Latches address and data on rising edge; synchronizes all PPI transfers with SCK falling edge for timing predictability.
A2:A0	Address inputs	Selects among 16 internal registers including TDO/TDI/TMS FIFOs, CNT32 segments, and MODE0–MODE2.
D7:D0	Bidirectional data bus	Transfers parallel data between host and shifter/buffers; 3-stated when CE HIGH or during internal shift operations.
INT	Interrupt output	Active-HIGH signal triggered by TDO ready, TDI not-empty, or CNT32 terminal count - enables event-driven host polling.
RDY	Ready handshake	Signals register readiness for PPI access; remains HIGH until addressed FIFO/register is available, preventing bus lockup.
TDO	Test Data Out	Serial scan output from TDO shifter/buffer; enabled only when OE is LOW; supports loop-around testing when MODE0 bit 0 = 1.
TMS1:TMS0	Test Mode Select outputs	Dual independent serial control outputs for separate scan chains; 3-stated when OE HIGH; initialized HIGH on RST.
TCK	Test Clock output	Gated, buffered version of SCK; stops LOW to prevent overflow/underflow; controlled by shifter/buffer status and CNT32.
TDI	Test Data In	Serial input to TDI shifter/buffer; internal 20 kΩ pull-up forces logic 1 when floating - eliminates need for external termination.
FRZ	Freeze input	Asynchronously forces TCK HIGH when MODE1 bit 2 = 1 - enables precise sampling during IEEE 1149.1 SAMPLE instruction.

Key Features

Feature	Design Value
Dual independent TMS outputs	Enables concurrent control of two physically separate JTAG scan chains without multiplexing or software arbitration.
32-bit programmable counter (CNT32)	Allows exact specification of TCK cycles per scan operation - essential for repeatable BIST, memory test, and protocol-constrained debugging.
Double-buffered 8-bit FIFO shifter/buffers	Permits overlapping host writes/reads with ongoing serial shifting - eliminates pipeline stalls and maximizes scan throughput.
Hardware TCK gating logic	Automatically halts TCK on shifter/buffer overflow/underflow or CNT32 terminal count - prevents data corruption without host intervention.
16-bit Serial Signature Compaction (SSC)	Reduces post-scan result bandwidth by compressing response data while maintaining diagnostic resolution for stuck-at and bridging faults.
Asynchronous PPI with RDY/STB handshake	Supports integration with diverse processors (8051, Z80, custom ASICs) without clock domain matching or FIFO buffering.

Applications

Board-Level Manufacturing Test	Embedded System Debug Interface
Use Scenario: Automated optical inspection (AOI) and in-circuit test (ICT) of populated PCBs with mixed-technology components. IC Role / Device Role / Timing Role: Acts as JTAG master controller interfacing test system CPU to UUT's boundary scan chain; generates precise TCK sequences synchronized to PPI strobes. Use Value: Eliminates need for external JTAG controllers or FPGA-based scan logic - reduces test fixture complexity and accelerates vector application by 3× vs. software-bit-banged solutions.	Use Scenario: Real-time debugging of field-deployed industrial controllers where JTAG access must coexist with normal operation. IC Role / Device Role / Timing Role: Provides non-intrusive SAMPLE instruction support via FRZ pin, allowing live capture of I/O states without halting CPU execution. Use Value: Enables accurate pass/fail assessment during functional operation - critical for safety-critical systems where runtime visibility cannot disrupt control loops.
FPGA Configuration Verification	Multi-Processor SoC Validation
Use Scenario: Post-configuration validation of Xilinx/Altera FPGAs using boundary scan to verify I/O pin states and interconnect integrity. IC Role / Device Role / Timing Role: Drives TDI/TDO/TMS/TCK signals directly to FPGA JTAG port; uses CNT32 to time configuration register reads within strict setup/hold windows. Use Value: Guarantees deterministic read-back timing - avoids metastability issues common with software-controlled JTAG interfaces during high-speed config verification.	Use Scenario: Coordinated JTAG access across heterogeneous processor clusters (ARM + DSP + microcontroller) on single board. IC Role / Device Role / Timing Role: Manages two independent scan chains via TMS0/TMS1, allowing simultaneous debug of ARM core and companion DSP without bus contention. Use Value: Reduces total debug session time by 40% compared to sequential chain access - accelerates bring-up of complex multi-core platforms.

Board-Level Manufacturing Test

Embedded System Debug Interface

Use Scenario: Automated optical inspection (AOI) and in-circuit test (ICT) of populated PCBs with mixed-technology components.

IC Role / Device Role / Timing Role: Acts as JTAG master controller interfacing test system CPU to UUT's boundary scan chain; generates precise TCK sequences synchronized to PPI strobes.

Use Value: Eliminates need for external JTAG controllers or FPGA-based scan logic - reduces test fixture complexity and accelerates vector application by 3× vs. software-bit-banged solutions.

Use Scenario: Real-time debugging of field-deployed industrial controllers where JTAG access must coexist with normal operation.

IC Role / Device Role / Timing Role: Provides non-intrusive SAMPLE instruction support via FRZ pin, allowing live capture of I/O states without halting CPU execution.

Use Value: Enables accurate pass/fail assessment during functional operation - critical for safety-critical systems where runtime visibility cannot disrupt control loops.

FPGA Configuration Verification

Multi-Processor SoC Validation

Use Scenario: Post-configuration validation of Xilinx/Altera FPGAs using boundary scan to verify I/O pin states and interconnect integrity.

IC Role / Device Role / Timing Role: Drives TDI/TDO/TMS/TCK signals directly to FPGA JTAG port; uses CNT32 to time configuration register reads within strict setup/hold windows.

Use Value: Guarantees deterministic read-back timing - avoids metastability issues common with software-controlled JTAG interfaces during high-speed config verification.

Use Scenario: Coordinated JTAG access across heterogeneous processor clusters (ARM + DSP + microcontroller) on single board.

IC Role / Device Role / Timing Role: Manages two independent scan chains via TMS0/TMS1, allowing simultaneous debug of ARM core and companion DSP without bus contention.

Use Value: Reduces total debug session time by 40% compared to sequential chain access - accelerates bring-up of complex multi-core platforms.

Equivalent & Alternatives

The following parts are listed as comparable options for similar boundary scan controller applications.

Alternative Part	Technical Difference	Application Difference	Selection Advice
XILINX XC9500XL CPLD (configured as JTAG controller)	Requires HDL implementation of TAP controller and shifter logic; no native CNT32 or SSC; relies on external microcontroller for PPI.	Used where programmable logic resources are already allocated; lacks integrated PPI timing control and hardware TCK gating.	Choose when design already contains XC9500XL and flexibility to implement custom scan logic outweighs need for deterministic timing.
TI TMS320C6748 DSP (with integrated JTAG controller)	On-chip JTAG controller lacks dual-TMS outputs, 32-bit counter, and SSC; requires software-managed TCK generation limiting max frequency to 10 MHz.	Deployed in DSP-centric systems where JTAG is secondary to signal processing; no dedicated scan chain isolation capability.	Choose only if existing C6748 platform mandates reuse and scan throughput >15 MHz is not required.

Compared with XC9500XL and TMS320C6748, SCANPSC100FSCX delivers guaranteed 25 MHz TCK, hardware-enforced dual-chain isolation, and autonomous TCK gating - making it the only option supporting production-grade, high-volume board test with zero host CPU overhead.

Availability

SCANPSC100FSCX is available at Aetrix Electronics and suitable for board-level manufacturing test, embedded debug interface design, FPGA configuration verification, and multi-processor SoC validation requiring stable component supply and long-term lifecycle support.

Supply support for SCANPSC100FSCX includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Fairchild Semiconductor was a leading analog and power IC manufacturer, acquired by ON Semiconductor in 2016; its legacy products remain widely deployed in industrial and test equipment.

The SCANPSC100FSCX belongs to Fairchild's SCAN Ease ecosystem and was designed specifically for embedded JTAG master applications requiring deterministic, low-overhead scan chain control in resource-constrained systems.

FAQ

What is the maximum supported TCK frequency for SCANPSC100FSCX?

The SCANPSC100FSCX supports a maximum TCK frequency of 25 MHz, derived from its internal SCK-to-TCK clock buffer and gating logic. This value is specified under recommended operating conditions in the original Fairchild datasheet DS010968 and verified across temperature and voltage ranges. The SCANPSC100FSCX achieves this rate without external PLLs or clock multipliers, relying instead on direct SCK buffering and synchronous TCK enable control.

Does SCANPSC100FSCX support dual JTAG scan chains simultaneously?

Yes, SCANPSC100FSCX supports two independent JTAG scan chains via dedicated TMS0 and TMS1 outputs, each with its own shifter/buffer and status control. These outputs operate concurrently and can be enabled/disabled independently through MODE0 bits 4 and 3. The dual-chain architecture eliminates software arbitration overhead and enables true parallel test execution - a capability confirmed in the "Dual Independent TMS Outputs" section of the SCANPSC100FSCX datasheet.

How does SCANPSC100FSCX prevent TCK overflow or underflow during scan operations?

SCANPSC100FSCX prevents TCK overflow and underflow using hardware-implemented gating logic that monitors shifter/buffer status and CNT32 state in real time. TCK is automatically stopped LOW when TDO is empty, TDI is full, TMS0/TMS1 buffers are empty, or CNT32 is unloaded/reaches terminal count. This behavior is implemented entirely in silicon and requires no host intervention - a feature explicitly documented in the "TCK CONTROL" section of the DS010968 datasheet.

What is the function of the FRZ pin on SCANPSC100FSCX?

The FRZ (Freeze) pin on SCANPSC100FSCX enables asynchronous generation of a single TCK pulse for IEEE 1149.1 SAMPLE instruction execution. When MODE1 bit 2 is set, asserting FRZ HIGH forces TCK HIGH regardless of internal counter or buffer status - allowing precise capture of I/O states during live system operation. This functionality is distinct from normal TCK generation and is validated in Figure 9 ("TCK Logic") and the "FREEZE MODE" subsection of the datasheet.

Is SCANPSC100FSCX compatible with standard 8-bit microcontrollers?

Yes, SCANPSC100FSCX features a fully asynchronous 8-bit Parallel Processor Interface (PPI) with CE, R/W, STB, RDY, and D7:D0 signals - compatible with 8051, Z80, PIC18, and other legacy microcontrollers without requiring clock domain synchronization. Timing is defined relative to SCK and STB edges, and RDY handshake eliminates timing dependency on processor speed. This compatibility is demonstrated in Figures 2–7 and the "PPI Timing Waveforms" section of DS010968.

SCANPSC100FSCX Specifications

Product attributes: Attribute value

Manufacturer:: onsemi

Package/Case:: 28-SOIC (0.295", 7.50mm Width)

Programmable:: Not Verified

Protocol:: -

Function:: Controller

Interface:: Parallel

Standards:: IEEE 1149.1

Voltage - Supply:: 4.5V ~ 5.5V

Current - Supply:: 8µA

Operating Temperature:: -40°C ~ 85°C

Supplier Device Package:: 28-SOIC

Grade:: -

Qualification:: -

SCANPSC100FSCX FAQ

1.How can I place an order for SCANPSC100FSCX through Aetrix?

Please submit a Request for Quotation (RFQ) for SCANPSC100FSCX on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for SCANPSC100FSCX reliable?

The price and inventory of SCANPSC100FSCX are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANPSC100FSCX is usually 5 days.

3.What payment methods are accepted for SCANPSC100FSCX?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANPSC100FSCX transactions.

Note: Certain payment methods may incur a processing fee.

4.How is shipping managed for SCANPSC100FSCX?

SCANPSC100FSCX orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your SCANPSC100FSCX order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for SCANPSC100FSCX?

For technical support, including SCANPSC100FSCX datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANPSC100FSCX requirements.

6.How does Aetrix verify that SCANPSC100FSCX is sourced from the original manufacturer or authorized distributors?

All SCANPSC100FSCX products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANPSC100FSCX meets industry standards.

7.What is the process for return or replacement of SCANPSC100FSCX?

All SCANPSC100FSCX units undergo pre-shipment inspection (PSI). If there is an issue with SCANPSC100FSCX, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The SCANPSC100FSCX part is unused and in its original packaging.

Return procedure for SCANPSC100FSCX:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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