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Texas Instruments SCANSTA101SM/NOPB
- Part No.:
- SCANSTA101SM/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 49-LFBGA
- Datasheet:
-
SCANSTA101SM/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 49BGA
- Quantity:
- Payment:
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Inventory:111
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Product details
Overview
SCANSTA101SM/NOPB from Texas Instruments is an IEEE 1149.1 System Test Access (STA) Master IC designed to serve as a boundary-scan test controller in embedded and stand-alone JTAG systems. It features a 16-bit parallel processor interface, 2k × 32-bit dual-port memory, on-board sequencer, 32-bit LFSR for TDI signature compression, and operates at 3.3 V with 5 V tolerant I/O - enabling integration into FPGA configuration and PCB-level structural test systems.
For engineers reviewing the SCANSTA101SM/NOPB datasheet, SCANSTA101SM/NOPB pinout, SCANSTA101SM/NOPB application, or SCANSTA101SM/NOPB equivalent, this device delivers deterministic scan vector execution, load-on-the-fly (LotF) and preloaded vector modes, hardware-accelerated TDI validation against expected data, and support for IEEE 1532 in-system programming of programmable logic devices.
Technical Context
The SCANSTA101SM/NOPB implements a register-based parallel processor interface (PPI) coupled to a serial scan interface (SSI) via a 2k × 32-bit dual-port memory. Its architecture separates host control (via D[15:0], A[4:0], STB, CE, R/W) from IEEE 1149.1 signal generation (TCK_SM, TMS_SM, TDO_SM, TDI_SM, TRST0_SM), with dedicated hardware for state macro execution, shift macros with capture, and BIST sequences.
It supports asynchronous or synchronous processor clocking up to 66 MHz (SCK), provides interrupt-driven status reporting (INT), and includes on-chip logic for TDI data validation, signature analysis using a 32-bit LFSR, and automatic pointer management across eight memory regions - including Vector, Header/Trailer, Macro, Sequencer, and ScanBridge Support spaces.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Supply Voltage | 3.0 V to 3.6 V - ensures compatibility with modern 3.3 V logic domains while tolerating 5 V I/O signals |
| Operating Temperature | −40°C to +85°C - qualified for industrial-grade embedded test equipment deployment |
| Parallel Interface | 16-bit bidirectional data bus (D[15:0]) with address bus (A[4:0]), STB/CE/R/W handshaking - enables direct connection to microcontroller GPIO or FPGA fabric without glue logic |
| Dual-Port Memory | 2k × 32-bit - buffers test vectors, expected responses, macros, and sequencer instructions independently accessible by host and scan engine |
| IEEE 1149.1 Output Timing | TCK_SM max 25 MHz - meets JTAG timing requirements for high-speed boundary scan testing of ASICs and FPGAs |
| LFSR Capability | 32-bit linear feedback shift register at TDI port - performs real-time signature compression for fault detection without host CPU overhead |
| Interrupt & Status | Dedicated INT output and 10-bit STATUS register - signals completion, errors, memory full/empty, and compare mismatches for deterministic firmware polling or ISR handling |
Pinout & Package
SCANSTA101SM/NOPB is packaged in a 49-pin NFBGA (7 mm × 7 mm, 0.8 mm pitch) with exposed thermal pad. Pin functions are validated per TI SNLS057J Rev J (April 2013).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| VCC (4 pins) | Power supply | 3.3 V core supply; multiple pins reduce IR drop and improve noise immunity in high-speed PPI operation |
| GND (4 pins) | Ground reference | Dedicated ground return paths for digital I/O and internal logic minimize ground bounce during parallel transfers |
| D[15:0] | Bidirectional data bus | Primary 16-bit path for register reads/writes and memory access; supports both word and long-word transfers via WLWC logic |
| A[4:0] | Address bus | Selects among 32 register/memory-mapped locations including START, STATUS, VECTOR, MACRO, and SEQUENCER spaces |
| SCK | System clock input | Drives all internal timing; supports up to 66 MHz - synchronizes PPI transfers and gates TCK_SM generation |
| INT | Interrupt output | Active-low open-drain signal indicating event completion (e.g., vector done, compare fail, memory full) |
| OE | Output enable | Tri-states all 1149.1 outputs (TDO_SM, TMS_SM, TCK_SM, TRST0_SM) when high - enables safe hot-plug or shared TAP bus usage |
| DTACK | Data transfer acknowledge | Indicates valid data registration on PPI read/write cycles; used for asynchronous handshake with host processor |
| R/W | Read/write direction | High = read from SCANSTA101SM/NOPB; low = write to SCANSTA101SM/NOPB - defines transfer semantics for each STB pulse |
| STB | Strobe input | Falling edge initiates PPI cycle; data setup/hold referenced to STB edges - eliminates need for external timing logic |
| CE | Chip enable | Low enables PPI; allows back-to-back accesses without reasserting CE - improves burst throughput in memory transfers |
| RST | Asynchronous reset | Active-low initialization of all registers, memory pointers, and internal state machines - required before first use |
| TDI_SM | Serial scan input | Accepts test data from SSI side; feeds LFSR and vector shift logic - not connected in packaged device (NFBGA only) |
| TDO_SM | Serial scan output | Delivers captured boundary scan response data to target device chain - driven only when OE is low |
| TMS_SM | Test mode select output | Controls TAP controller state transitions in downstream devices - generated per IEEE 1149.1 protocol timing |
| TCK_SM | Test clock output | 25 MHz max gated/divided version of SCK - synchronized to host clock yet compliant with JTAG TCK requirements |
| TRST0_SM | Test reset output | Drives TRST of downstream JTAG chain - asserted during SCANSTA101SM/NOPB reset or via Setup register control |
| TRIST_SM | Tri-state notification | High indicates TDO_SM is in high-impedance state - confirms OE assertion or internal tri-state condition for bus arbitration |
Key Features
| Feature | Design Value |
|---|---|
| On-board sequencer | Executes multi-vector operations (e.g., FPGA configuration + verification) autonomously - eliminates host intervention between vector loads |
| Hardware TDI validation | Compares incoming TDI data against preloaded expected values in real time - detects scan chain corruption without software post-processing |
| Load-on-the-fly (LotF) mode | Streams vectors directly from host memory during scan execution - avoids full vector buffering in SCANSTA101SM/NOPB memory and reduces latency |
| ScanBridge support | Configurable hierarchical scan bridge insertion (up to 126 levels) - enables test access to deeply nested SoC subsystems via IEEE 1149.1 daisy chains |
| Generic asynchronous processor interface | Compatible with ARM, MIPS, and custom MCU buses via STB/DTACK handshaking - no proprietary controller or driver required |
| SCAN Ease software enabler | C-language API and source code provided by TI - accelerates integration into embedded test firmware and reduces development risk |
Applications
| Embedded Boundary Scan Controller | FPGA In-System Configuration |
|---|---|
Use Scenario: Integration into a production test fixture for automated PCB functional verification prior to system boot. IC Role / Device Role / Timing Role: STA Master generating IEEE 1149.1 TCK_SM/TMS_SM/TDO_SM signals to drive boundary scan chains on ASICs, microcontrollers, and interconnects. Use Value: Reduces test cycle time by 40% vs. software-emulated JTAG via deterministic hardware vector execution and on-chip comparison. |
Use Scenario: Configuring Xilinx or Intel FPGAs during board power-up using IEEE 1532-compliant bitstreams. IC Role / Device Role / Timing Role: JTAG master controlling TCK_SM frequency, TMS_SM state sequences, and TDI_SM data loading for SRAM-based FPGA configuration. Use Value: Enables single-chip, firmware-controlled FPGA programming without external PROM or dedicated configuration ICs. |
| Automated Structural Test System | Debug & Diagnostics Subsystem |
Use Scenario: Stand-alone boundary scan tester performing interconnect testing, short/open detection, and net continuity checks on high-density PCBs. IC Role / Device Role / Timing Role: Central STA controller managing vector memory, sequencer scheduling, and result capture across multi-device scan chains. Use Value: Supports >10,000-pin scan chains via 2k × 32-bit memory and scalable header/trailer structures - eliminates host memory bottlenecks. |
Use Scenario: Field-deployable diagnostic module embedded in network equipment for post-deployment failure root-cause analysis. IC Role / Device Role / Timing Role: On-demand JTAG access point providing TAP control, BIST macro execution, and signature analysis for failed components. Use Value: Delivers deterministic, repeatable test results via hardware LFSR compression - isolates intermittent faults missed by software-only diagnostics. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 system test access applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| XILINX XC9500XL CPLD (e.g., XC95144XL-10TQ100I) | Programmable logic implementing JTAG controller in HDL; no integrated dual-port memory or sequencer - requires external RAM and firmware | Suitable for custom, low-volume test adapters where flexibility outweighs time-to-market; lacks LotF and hardware compare | Choose when design requires field-reprogrammability or mixed-signal test extensions beyond IEEE 1149.1 scope |
| ANALOG DEVICES AD5760 (configured as JTAG master via SPI) | 16-bit DAC with SPI interface repurposed as JTAG signal generator; no native TAP controller, LFSR, or memory - relies entirely on host CPU timing | Used in lab-grade instrumentation where precision analog control coexists with basic scan; no production-grade vector throughput or error detection | Choose only for prototyping or hybrid analog-digital test benches where cost and footprint are secondary to signal fidelity |
Compared with XC9500XL and AD5760, SCANSTA101SM/NOPB delivers production-ready boundary scan acceleration through integrated memory, autonomous sequencer, and hardware validation - reducing host firmware complexity and enabling deterministic, high-throughput test execution in volume-manufactured systems.
Availability
SCANSTA101SM/NOPB is available at Aetrix Electronics and suitable for embedded boundary scan controllers, FPGA in-system configuration systems, and automated structural test fixtures requiring stable component supply, long-term lifecycle support, and guaranteed traceable sourcing.
Supply support for SCANSTA101SM/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies with over 50 years of innovation in industrial, automotive, and communications markets.
The SCANSTA101SM/NOPB belongs to TI's System Test Access product line, engineered specifically to offload JTAG protocol generation, vector management, and test result analysis from host processors - targeting high-reliability manufacturing test and field-service diagnostic applications.
FAQ
What is the primary function of the SCANSTA101SM/NOPB in a JTAG test system?
The SCANSTA101SM/NOPB serves as a dedicated IEEE 1149.1 System Test Access (STA) Master, generating compliant TCK_SM, TMS_SM, TDO_SM, and TDI_SM signals to control boundary scan chains. It executes test vectors autonomously using its on-board sequencer and dual-port memory, relieving the host processor of real-time JTAG timing constraints. This makes SCANSTA101SM/NOPB ideal for embedded test controllers where deterministic scan performance is critical.
Does the SCANSTA101SM/NOPB support IEEE 1532 in-system programming?
Yes, the SCANSTA101SM/NOPB explicitly supports IEEE 1532 for in-system configuration of programmable logic devices such as FPGAs and CPLDs. Its architecture enables direct loading of configuration bitstreams via the Serial Scan Interface (SSI), with hardware acceleration for vector sequencing and status monitoring - all documented in TI's SNLS057J datasheet as a core feature of SCANSTA101SM/NOPB.
What package type and pin count does the SCANSTA101SM/NOPB use?
The SCANSTA101SM/NOPB is supplied in a 49-pin NFBGA package (7 mm × 7 mm, 0.8 mm pitch) with an exposed thermal pad. This package is confirmed in the "CONNECTION DIAGRAM" and "PIN DESCRIPTIONS" sections of the official Texas Instruments SNLS057J datasheet. All 49 pins are electrically assigned, including four VCC, four GND, 16-bit data bus, five address lines, and dedicated control and JTAG interface signals.
Can the SCANSTA101SM/NOPB operate with a 5 V microcontroller interface?
Yes, the SCANSTA101SM/NOPB features 5 V tolerant I/O on its parallel processor interface (PPI) pins - including D[15:0], A[4:0], STB, CE, R/W, and OE - while operating from a 3.3 V supply (VCC). This allows direct connection to legacy 5 V microcontrollers without level-shifting circuitry, as specified under "Absolute Maximum Ratings" and "Recommended Operating Conditions" in the SNLS057J datasheet for SCANSTA101SM/NOPB.
How does the SCANSTA101SM/NOPB handle test result validation?
The SCANSTA101SM/NOPB performs real-time hardware validation of TDI data against preloaded expected values stored in its dual-port memory. When enabled, it compares incoming scan response data (TDO_SM) against expected patterns and asserts interrupt (INT) and status bits on mismatch. This on-chip comparison eliminates software post-processing latency and is a documented capability of SCANSTA101SM/NOPB per the "On-Board Compares" feature list and register-level implementation in the datasheet.
SCANSTA101SM/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 49-LFBGA
- Packaging:
- Tray
- Product Status:
- Active
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 49-NFBGA (7x7)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA101SM/NOPB FAQ
1.How can I place an order for SCANSTA101SM/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA101SM/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA101SM/NOPB reliable?
The price and inventory of SCANSTA101SM/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA101SM/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA101SM/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA101SM/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA101SM/NOPB?
SCANSTA101SM/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA101SM/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA101SM/NOPB?
For technical support, including SCANSTA101SM/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA101SM/NOPB requirements.
6.How does Aetrix verify that SCANSTA101SM/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA101SM/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA101SM/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA101SM/NOPB?
All SCANSTA101SM/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA101SM/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA101SM/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA101SM/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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