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Home > Products > Integrated Circuits (ICs) > Interface > Specialized

Texas Instruments SCANSTA101SMX

Name: SCANSTA101SMX
Brand: Texas Instruments
SKU: SCANSTA101SMX
Price: 2.40 USD
Availability: InStock
Rating: 5 (2 reviews)

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Part No.:: SCANSTA101SMX

Manufacturer:: Texas Instruments

Category:: Specialized

Package:: 49-LFBGA

Datasheet:: SCANSTA101SMX.pdf

Description:: IC INTERFACE SPECIALIZED 49BGA

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Product details

Overview

SCANSTA101SMX from Texas Instruments is an IEEE 1149.1 System Test Access (STA) Master IC designed to serve as a boundary-scan test controller in embedded and stand-alone JTAG systems. It features a 16-bit parallel processor interface, 2k × 32-bit dual-port memory, on-board sequencer, 32-bit LFSR for TDI signature compression, and operates at 3.3 V with 5 V–tolerant I/O - enabling integration into FPGA configuration and PCB-level diagnostic subsystems.

For engineers reviewing the SCANSTA101SMX datasheet, SCANSTA101SMX pinout, SCANSTA101SMX application, or SCANSTA101SMX equivalent, this device delivers deterministic scan vector execution, load-on-the-fly (LotF) and preloaded vector modes, hardware-accelerated BIST macro support, and register-based host control - critical for high-reliability manufacturing test and in-system programmable logic configuration.

Technical Context

The SCANSTA101SMX implements a three-interface architecture centered on a 2048 × 32-bit dual-port memory: Parallel Processor Interface (PPI) for host CPU access, Serial Scan Interface (SSI) for IEEE 1149.1 TAP generation, and Test & Debug Interface supporting BIST, state macros, and shift-with-capture operations. Its asynchronous processor interface uses STB/CE handshaking with DTACK synchronization and supports both 16-bit and scalable 32-bit data paths.

Internally, it integrates dedicated hardware blocks including a sequencer for multi-vector execution, on-chip LFSR for TDI data compression, comparator logic for TDI validation against expected data, and TRST/TCK_SM/TMS_SM/TDO_SM output generation synchronized to SCK. All timing-critical outputs (TCK_SM, TMS_SM, TDO_SM, TRST0_SM) are buffered and gated versions of the system clock SCK.

Key Specifications

Parameter	Value and Actual Design Meaning
Supply Voltage	3.0 V to 3.6 V - ensures compatibility with modern 3.3 V logic domains while tolerating 5 V I/O signals without level shifters.
Operating Temperature	−40°C to +85°C - qualified for industrial-grade embedded test infrastructure and automated test equipment environments.
Parallel Interface	16-bit bidirectional data bus (D[15:0]) with address bus A[4:0], R/W, CE, STB, DTACK, and INT - enables direct connection to microcontroller or FPGA fabric without glue logic.
Dual-Port Memory	2048 × 32-bit - provides dedicated buffer space for TDO_SM, TDI_SM, Expected, Mask, Vector, Header/Trailer, Macro, Sequencer, and ScanBridge Support regions.
TAP Output Timing	TCK_SM max 25 MHz - meets IEEE 1149.1 timing requirements for production boundary-scan testing at full speed.
System Clock (SCK)	Up to 66 MHz - determines maximum PPI throughput and internal timing resolution for register reads/writes and memory transfers.
LFSR Capability	32-bit linear feedback shift register at TDI port - enables real-time signature analysis for test data integrity verification without host CPU overhead.

Pinout & Package

SCANSTA101SMX is packaged in a 49-pin NFBGA (5 mm × 5 mm, 0.8 mm pitch), optimized for high-density PCB layouts in test instrumentation and embedded diagnostics modules.

Pin/Terminal	Circuit Role	Design Meaning
VCC	Power supply input	3.3 V core supply; four pins ensure low-impedance power delivery and decoupling stability.
GND	Ground reference	Four dedicated ground pins minimize noise coupling across analog and digital sections of the TAP interface.
D[15:0]	Bidirectional data bus	Primary 16-bit path for register/memory read/write between host processor and SCANSTA101SMX dual-port memory.
A[4:0]	Address bus	Selects among 32 registers and memory-mapped regions (e.g., START, STATUS, VECTOR, MACRO) via PPI decoding.
SCK	System clock input	Drives all internal timing; TCK_SM, TMS_SM, and other outputs are derived and synchronized to this clock.
INT	Interrupt output	Active-low signal indicates completion of vector execution, sequencer stop, or error condition requiring host attention.
OE	Output enable	Tri-states all 1149.1 outputs (TDO_SM, TMS_SM, TCK_SM, TRST0_SM) when high - essential for shared JTAG chain isolation.
DTACK	Data transfer acknowledge	Handshake signal confirming valid data registration during asynchronous PPI cycles; driven only when CE is low.
R/W	Read/write direction control	Defines PPI cycle type: high = read from SCANSTA101SMX, low = write to SCANSTA101SMX registers or memory.
STB	Strobe input	Edge-triggered timing reference for PPI transfers; data setup/hold referenced to falling/rising edges respectively.
CE	Chip enable	Activates PPI interface; DTACK and D[15:0] tristated when high - allows multiple devices on same bus.
RST	Asynchronous reset	Initializes internal state machines, clears registers, and resets memory pointers upon power-up or fault recovery.
TDI	Test Data In	Serial input to SCANSTA101SMX's internal TAP controller - receives instruction/data from upstream JTAG device or host emulator.
TMS	Test Mode Select	Controls TAP controller state transitions per IEEE 1149.1; sampled synchronously with TCK.
TCK	Test Clock Input	Provides timing reference for external JTAG chain; SCANSTA101SMX generates its own TCK_SM internally.
TRST	Test Reset	Pull-down required to hold TAP in Test-Logic-Reset during power ramp; prevents metastability in scan chain initialization.
TDI_SM	STA Master TDI output	Drives serial test data to downstream JTAG devices in the scan chain - sourced from dual-port memory TDI_SM region.
TDO_SM	STA Master TDO input	Captures serial response data from downstream JTAG devices - stored in dual-port memory TDO_SM region for host readback.
TMS_SM	STA Master TMS output	Generates TMS sequences for state control of downstream devices - programmed via macro or sequencer logic.
TCK_SM	STA Master TCK output	Provides synchronized clock to downstream JTAG devices; derived from SCK with precise delay matching per AC specs.
TRST0_SM	STA Master TRST output	Asserts test reset to downstream devices; generated under software control or sequencer macro execution.
TRIST_SM	Tri-state notification	Indicates when TDO_SM is actively driven (low) or tri-stated (high) - used by host to manage bus contention.

Key Features

Feature	Design Value
On-board sequencer	Executes multi-vector sequences (e.g., FPGA configuration + BIST + verification) autonomously without host intervention between vectors.
Load-on-the-Fly (LotF) mode	Enables streaming of test vectors directly from host memory into SCANSTA101SMX during execution - eliminates need for full preloading and reduces latency.
Hardware comparator	Compares incoming TDO_SM data against preloaded expected values in real time - flags mismatches via interrupt without CPU polling.
32-bit LFSR at TDI_SM	Performs signature compression on serial input stream - enables compact pass/fail verification of long test sequences using single 32-bit result register pair.
State, Shift, and BIST macros	Predefined hardware-accelerated operations reduce firmware complexity - e.g., "Shift Macro with Capture" automates data capture while shifting out TMS/TDI patterns.
5 V–tolerant I/O	Allows direct interfacing with legacy 5 V JTAG chains or mixed-voltage systems without external level translators - simplifies board design and improves signal integrity.

Applications

Automated PCB Test Systems	FPGA In-System Configuration
Use Scenario: High-volume manufacturing line performing structural interconnect testing on populated PCBs before functional test. IC Role / Device Role / Timing Role: STA Master controlling IEEE 1149.1 scan chain to drive and capture test vectors across multiple ASICs, FPGAs, and CPLDs. Use Value: Reduces test time by offloading vector sequencing and comparison to hardware, enabling >10× faster go/no-go decisions versus software-only JTAG controllers.	Use Scenario: Field-upgradable embedded system reprogramming FPGA configuration bitstreams over JTAG during maintenance or feature activation. IC Role / Device Role / Timing Role: Boundary-scan master generating compliant IEEE 1532 programming sequences and verifying configuration integrity via TDO_SM capture and LFSR compression. Use Value: Eliminates need for external programming hardware; supports secure, authenticated, and verified bitstream loading using on-chip comparators and sequencer macros.
Embedded Diagnostic Subsystems	Stand-Alone Boundary-Scan Testers
Use Scenario: Rack-mounted telecom chassis performing periodic self-test of backplane interconnects and module presence detection. IC Role / Device Role / Timing Role: Integrated test controller executing scheduled BIST routines and reporting faults via INT signal to host supervisor MCU. Use Value: Enables autonomous health monitoring without host CPU involvement - critical for fail-safe operation in unattended infrastructure.	Use Scenario: Benchtop JTAG tester used by design validation labs to verify board-level connectivity and component functionality prior to release. IC Role / Device Role / Timing Role: Core STA engine providing deterministic, repeatable, and scriptable scan chain control with full register-level debug visibility. Use Value: Delivers lab-grade timing precision (±11.5 ns SCK-to-TCK_SM propagation) and comprehensive memory-mapped register access for root-cause analysis.

Automated PCB Test Systems

FPGA In-System Configuration

Use Scenario: High-volume manufacturing line performing structural interconnect testing on populated PCBs before functional test.

IC Role / Device Role / Timing Role: STA Master controlling IEEE 1149.1 scan chain to drive and capture test vectors across multiple ASICs, FPGAs, and CPLDs.

Use Value: Reduces test time by offloading vector sequencing and comparison to hardware, enabling >10× faster go/no-go decisions versus software-only JTAG controllers.

Use Scenario: Field-upgradable embedded system reprogramming FPGA configuration bitstreams over JTAG during maintenance or feature activation.

IC Role / Device Role / Timing Role: Boundary-scan master generating compliant IEEE 1532 programming sequences and verifying configuration integrity via TDO_SM capture and LFSR compression.

Use Value: Eliminates need for external programming hardware; supports secure, authenticated, and verified bitstream loading using on-chip comparators and sequencer macros.

Embedded Diagnostic Subsystems

Stand-Alone Boundary-Scan Testers

Use Scenario: Rack-mounted telecom chassis performing periodic self-test of backplane interconnects and module presence detection.

IC Role / Device Role / Timing Role: Integrated test controller executing scheduled BIST routines and reporting faults via INT signal to host supervisor MCU.

Use Value: Enables autonomous health monitoring without host CPU involvement - critical for fail-safe operation in unattended infrastructure.

Use Scenario: Benchtop JTAG tester used by design validation labs to verify board-level connectivity and component functionality prior to release.

IC Role / Device Role / Timing Role: Core STA engine providing deterministic, repeatable, and scriptable scan chain control with full register-level debug visibility.

Use Value: Delivers lab-grade timing precision (±11.5 ns SCK-to-TCK_SM propagation) and comprehensive memory-mapped register access for root-cause analysis.

Equivalent & Alternatives

The following parts are listed as comparable options for similar IEEE 1149.1 system test access applications.

Alternative Part	Technical Difference	Application Difference	Selection Advice
Xilinx XA3S200A-4VQG100I	Integrated JTAG controller within Spartan-3A FPGA fabric; no external memory or sequencer - requires soft-core firmware implementation.	Best suited for designs where boundary-scan is secondary to primary logic function; lacks dedicated dual-port memory and LotF capability.	Choose when FPGA resources permit custom JTAG controller development and cost-per-function favors SoC integration over discrete STA masters.
Intellitech EmbeddedScan ES1000	Software-defined STA engine with ARM Cortex-M4 host; supports wider protocol set (IEEE 1149.1/1149.4/1532) but requires external RAM and OS layer.	Targeted at flexible, upgradable test platforms with Ethernet/USB host interfaces - not pin-compatible and demands higher BOM and firmware effort.	Choose when future protocol expansion, remote diagnostics, or field-upgradable test scripts are mandatory requirements.

Compared with XA3S200A-4VQG100I and EmbeddedScan ES1000, SCANSTA101SMX delivers deterministic hardware-accelerated scan execution, zero-host-latency vector processing, and minimal external component count - making it optimal for cost-sensitive, high-reliability embedded test controllers where firmware simplicity and timing predictability are critical.

Availability

SCANSTA101SMX is available at Aetrix Electronics and suitable for automated PCB test systems, FPGA in-system configuration, embedded diagnostic subsystems, and stand-alone boundary-scan testers requiring stable component supply and long-term industrial lifecycle support.

Supply support for SCANSTA101SMX includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with decades of leadership in test and debug IP for programmable logic and complex SoCs.

The SCANSTA101SMX belongs to TI's System Test Access product line, engineered specifically to accelerate boundary-scan adoption in resource-constrained embedded systems and reduce reliance on PC-based JTAG emulators.

FAQ

What is the primary function of the SCANSTA101SMX in a JTAG test system?

The SCANSTA101SMX functions as an IEEE 1149.1 System Test Access (STA) Master, acting as the central controller that generates TCK_SM, TMS_SM, TDI_SM, and TRST0_SM signals to drive and monitor downstream JTAG devices. It executes test vectors, performs real-time TDO_SM comparison, and manages scan chain state transitions - eliminating the need for host CPU involvement in low-level JTAG timing. The SCANSTA101SMX handles all protocol compliance, making it ideal for embedded and stand-alone test infrastructure.

Does the SCANSTA101SMX support both 16-bit and 32-bit host processor interfaces?

Yes, the SCANSTA101SMX supports a 16-bit parallel processor interface (D[15:0]) as standard, with internal architecture scalable to 32-bit operation. While D[31:16] signals are not bonded out in the 49-pin NFBGA package (SCANSTA101SMX), they are available in the IP macro version for synthesis into programmable logic. The Setup register controls 16/32-bit mode selection, and the Word/Long Word Converter block manages data alignment and conversion transparently to the host.

How does the SCANSTA101SMX handle test vector execution - is it fully autonomous?

Yes, the SCANSTA101SMX includes an on-board sequencer that executes multi-vector operations autonomously after initial setup. Using programmed macro and sequencer memory regions, it can perform chained actions such as loading configuration data into an FPGA, executing BIST, capturing responses, and validating results - all without host CPU intervention between steps. This autonomy is enabled by the dual-port memory and dedicated sequencer logic, and is a defining capability of the SCANSTA101SMX.

Can the SCANSTA101SMX be used for IEEE 1532 in-system configuration of programmable devices?

Yes, the SCANSTA101SMX explicitly supports IEEE 1532 for in-system configuration of programmable logic devices. Its Serial Scan Interface (SSI) generates compliant programming sequences, and the dual-port memory stores configuration bitstreams and associated header/trailer structures defined in Table 5. The device's Load-on-the-Fly (LotF) mode allows streaming of large bitstreams directly from host memory, and the on-board sequencer coordinates handshake protocols required by IEEE 1532-compliant targets - all documented in the SCANSTA101SMX datasheet SNLS057J.

What is the role of the 32-bit LFSR in the SCANSTA101SMX, and where is it applied?

The 32-bit Linear Feedback Shift Register (LFSR) in the SCANSTA101SMX is located at the TDI_SM port and performs real-time signature compression on incoming serial test data. It reduces multi-megabit test streams to a compact 32-bit result stored in LSB/MSB Result registers (LSRESR/MSRESR). This enables efficient pass/fail verification without storing or comparing full response data - a key feature for high-throughput manufacturing test. The LFSR is hardware-accelerated and operates independently of the host processor, directly contributing to the SCANSTA101SMX's test throughput advantage.

SCANSTA101SMX Specifications

Product attributes: Attribute value

Manufacturer:: Texas Instruments

Series:: -

Package/Case:: 49-LFBGA

Packaging:: Tape & Reel (TR)

Product Status:: Not For New Designs

Applications:: Testing Equipment

Interface:: IEEE 1149.1

Voltage - Supply:: 3V ~ 3.6V

Supplier Device Package:: 49-NFBGA (7x7)

Grade:: -

Qualification:: -

Mounting Type:: Surface Mount

SCANSTA101SMX FAQ

1.How can I place an order for SCANSTA101SMX through Aetrix?

Please submit a Request for Quotation (RFQ) for SCANSTA101SMX on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for SCANSTA101SMX reliable?

The price and inventory of SCANSTA101SMX are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA101SMX is usually 5 days.

3.What payment methods are accepted for SCANSTA101SMX?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA101SMX transactions.

Note: Certain payment methods may incur a processing fee.

4.How is shipping managed for SCANSTA101SMX?

SCANSTA101SMX orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your SCANSTA101SMX order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for SCANSTA101SMX?

For technical support, including SCANSTA101SMX datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA101SMX requirements.

6.How does Aetrix verify that SCANSTA101SMX is sourced from the original manufacturer or authorized distributors?

All SCANSTA101SMX products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA101SMX meets industry standards.

7.What is the process for return or replacement of SCANSTA101SMX?

All SCANSTA101SMX units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA101SMX, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The SCANSTA101SMX part is unused and in its original packaging.

Return procedure for SCANSTA101SMX:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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