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Texas Instruments SCANSTA101SMX/NOPB
- Part No.:
- SCANSTA101SMX/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 49-LFBGA
- Datasheet:
-
SCANSTA101SMX/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 49BGA
- Quantity:
- Payment:
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Product details
Overview
SCANSTA101SMX/NOPB from Texas Instruments is an IEEE 1149.1 System Test Access (STA) Master IC designed to serve as a boundary-scan test controller in embedded and stand-alone JTAG systems. It features a 16-bit parallel processor interface, 2k × 32-bit dual-port memory, on-board sequencer, 32-bit LFSR for signature analysis, and operates at 3.3 V with 5 V tolerant I/O - enabling high-throughput test vector execution in FPGA configuration and PCB-level diagnostics.
For engineers reviewing the SCANSTA101SMX/NOPB datasheet, SCANSTA101SMX/NOPB pinout, SCANSTA101SMX/NOPB application, or SCANSTA101SMX/NOPB equivalent, this device delivers deterministic TAP control, load-on-the-fly vector execution, hardware-accelerated compare validation, and register-based host interfacing - critical for production test automation, in-system programmable logic configuration, and debug infrastructure in industrial and telecom equipment.
Technical Context
The SCANSTA101SMX/NOPB implements a three-interface architecture: Parallel Processor Interface (PPI) for host CPU access, Serial Scan Interface (SSI) for IEEE 1149.1 TAP generation, and Test & Debug Interface supporting BIST, boundary scan, and internal scan. Its dual-port memory acts as a synchronous buffer between PPI and SSI, enabling concurrent host data loading and serial test execution.
It supports both asynchronous and synchronous processor timing via STB/CE handshaking, includes dedicated registers for vector indexing, macro sequencing, header/trailer handling, and LFSR seed/result management, and provides hardware-assisted TDI validation against expected data - reducing software overhead in embedded test firmware.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Supply Voltage | 3.0 V to 3.6 V - ensures compatibility with modern 3.3 V logic domains while tolerating 5 V I/O signals |
| Operating Temperature | −40°C to +85°C - qualified for industrial-grade embedded deployment without derating |
| Parallel Interface | 16-bit bidirectional data bus (D[15:0]) with address (A[4:0]), R/W, CE, STB, DTACK, INT - enables direct microcontroller connection without glue logic |
| Dual-Port Memory | 2048 × 32-bit - buffers test vectors, expected results, masks, macros, and sequencer instructions for pipelined execution |
| TAP Clock Support | Up to 25 MHz TCK - meets IEEE 1149.1 timing requirements for high-speed boundary scan testing |
| System Clock (SCK) | Up to 66 MHz - determines maximum PPI throughput and internal state machine speed |
| LFSR Engine | 32-bit linear feedback shift register at TDI port - performs real-time signature compression for test response validation |
Pinout & Package
SCANSTA101SMX/NOPB is housed in a 49-pin NFBGA package (7 mm × 7 mm, 0.8 mm pitch), optimized for high-density PCB layouts in test instrumentation and embedded controllers.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| VCC | Power supply input | 3.3 V core supply; four pins ensure low-impedance power delivery and noise immunity |
| GND | Ground reference | Four dedicated ground pins minimize ground bounce during high-speed TAP transitions |
| D[15:0] | Bidirectional data bus | 16-bit parallel path for register/memory read/write; supports 16-bit microcontroller interfaces directly |
| A[4:0] | Address bus | 5-bit address space selects 32 registers and memory-mapped regions including Vector, Macro, Sequencer tables |
| SCK | System clock input | Drives all internal timing; gated/divided version (TCK_SM) feeds JTAG TAP controller |
| INT | Interrupt output | Active-low signal alerts host CPU upon completion of vector execution or error condition |
| OE | Output enable | Tri-states all 1149.1 outputs (TDO_SM, TMS_SM, TCK_SM, TRST0_SM) when high - enables shared TAP bus operation |
| DTACK | Data transfer acknowledge | Handshake signal confirms PPI register/memory access completion; supports asynchronous host timing |
| R/W | Read/write control | Determines direction of D[15:0] bus; high = read, low = write - eliminates need for external direction logic |
| STB | Strobe input | Edge-triggered control for PPI transfers; falling edge initiates access, rising edge completes setup/hold timing |
| CE | Chip enable | Enables PPI interface; allows back-to-back accesses without reassertion - improves burst throughput |
| RST | Asynchronous reset | Initializes all internal registers and state machines; required before first test sequence execution |
| TDI, TMS, TCK, TRST | JTAG primary interface | Standard IEEE 1149.1 inputs driving the Test & Debug Interface; TRST tied to GND via 1 kΩ resistor for safe power-up |
| TDI_SM, TDO_SM, TMS_SM, TCK_SM, TRST0_SM | STA Master TAP outputs | Generated JTAG signals driven to target scan chain; TRST0_SM is active-low reset for downstream devices |
| TRIST_SM | Tri-state notification | High when TDO_SM is tri-stated (e.g., during OE high) - enables safe bus sharing with other JTAG masters |
Key Features
| Feature | Design Value |
|---|---|
| On-board sequencer | Executes multi-vector operations (e.g., FPGA configuration sequences) without host CPU intervention - reduces test cycle time by >70% vs. software-driven TAP control |
| Hardware compare engine | Validates TDI data against preloaded expected values in real time - eliminates software polling and enables fail-fast detection |
| Load-on-the-fly (LotF) mode | Allows test vectors to be streamed into memory during execution - supports unlimited-length test sequences within available memory |
| State, Shift, and BIST macros | Predefined instruction sets for common JTAG operations (e.g., IDCODE capture, BYPASS entry) - simplifies firmware development and improves repeatability |
| 32-bit LFSR at TDI port | Performs signature compression on incoming test responses - enables compact pass/fail verification without storing full result streams |
Applications
| Automated PCB Functional Test | FPGA In-System Configuration |
|---|---|
Use Scenario: High-volume manufacturing line performing post-reflow continuity, shorts, and component presence checks on complex backplanes. IC Role / Device Role / Timing Role: SCANSTA101SMX/NOPB acts as the boundary-scan master, generating precise TCK/TMS/TTDI sequences synchronized to board-level clocks and validating TDO responses against golden signatures. Use Value: Reduces test fixture complexity by eliminating bed-of-nails probes for BGA packages and enables 100% net coverage on dense interconnects. |
Use Scenario: Field-upgradable telecom base station where FPGAs must be reconfigured without system reboot or physical access. IC Role / Device Role / Timing Role: SCANSTA101SMX/NOPB serves as the IEEE 1532-compliant configuration controller, loading bitstreams over JTAG using preloaded vectors and verifying CRC checksums via LFSR compression. Use Value: Enables secure, verified, and deterministic FPGA programming independent of host OS or driver stack - critical for carrier-grade reliability. |
| Embedded Debug Infrastructure | Multi-DUT JTAG Test Rack |
Use Scenario: Industrial PLC with integrated boundary-scan capability for runtime diagnostics and fault isolation during maintenance windows. IC Role / Device Role / Timing Role: SCANSTA101SMX/NOPB operates in embedded mode, executing diagnostic vectors triggered by watchdog timeout or user command via its register interface. Use Value: Provides deterministic, low-overhead visibility into ASIC and FPGA I/O states without requiring debug ports or JTAG adapters. |
Use Scenario: ATE system testing up to 8 PCBs simultaneously using shared JTAG resources and per-board SCANSTA101SMX/NOPB instances. IC Role / Device Role / Timing Role: SCANSTA101SMX/NOPB functions as a dedicated, isolated JTAG master per DUT, with OE-controlled TAP outputs preventing bus contention. Use Value: Eliminates multiplexer latency and signal integrity degradation in daisy-chained JTAG chains - improves test repeatability and throughput. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 system test access applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Xilinx XAPP1079 IP Core | Soft IP for FPGA implementation only; no standalone NFBGA package; requires synthesis and integration into PL fabric | Targeted for designs where test logic must reside inside same FPGA being tested - not suitable for external test controller role | Select when test infrastructure must be fully embedded and reconfigurable; avoid when discrete, certified, and pin-defined STA master is required |
| Intellitech EmbeddedScan Controller | Supports IEEE 1149.1 and 1149.6; includes built-in ATPG support and higher-level test language (TDL); larger footprint and higher cost | Used in high-end ATE and automotive ECU validation where advanced diagnostics and failure analysis are mandatory | Select for mission-critical safety applications needing ISO 26262 tool qualification; avoid for cost-sensitive industrial or telecom use cases |
Compared with XAPP1079 and Intellitech EmbeddedScan, SCANSTA101SMX/NOPB offers fixed-function, silicon-proven STA control in a compact NFBGA with minimal host software dependency - making it optimal for deterministic, low-latency, and production-deployable boundary-scan systems where flexibility is secondary to reliability and ease of integration.
Availability
SCANSTA101SMX/NOPB is available at Aetrix Electronics and suitable for automated PCB functional test, FPGA in-system configuration, embedded debug infrastructure, and multi-DUT JTAG test rack applications requiring stable component supply, long-term lifecycle assurance, and traceable sourcing.
Supply support for SCANSTA101SMX/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity solutions, with decades of investment in test and debug infrastructure for programmable logic and complex SoCs.
The SCANSTA101SMX/NOPB belongs to TI's System Test Access product line, engineered specifically to accelerate IEEE 1149.1 adoption in cost-sensitive, high-reliability embedded systems - bridging the gap between software-driven JTAG tools and full-featured ATE platforms.
FAQ
What is the primary function of the SCANSTA101SMX/NOPB in a JTAG test system?
The SCANSTA101SMX/NOPB functions as a dedicated IEEE 1149.1 System Test Access (STA) Master, generating precise TAP controller signals (TCK_SM, TMS_SM, TDI_SM, TDO_SM) and managing test vector execution independently of the host processor. It offloads boundary-scan protocol timing and sequencing from software, enabling deterministic, high-throughput test execution in SCANSTA101SMX/NOPB-based systems.
Does the SCANSTA101SMX/NOPB support both 16-bit and 32-bit host interfaces?
The SCANSTA101SMX/NOPB implements a native 16-bit parallel processor interface (D[15:0], A[4:0]) with full register and memory mapping. While its internal dual-port memory is 32-bit wide and the IP macro version supports 32-bit expansion (D[31:16]), the packaged SCANSTA101SMX/NOPB device does not expose D[31:16] pins - confirming strict 16-bit host interface operation per its NFBGA pinout and datasheet specifications.
How does the SCANSTA101SMX/NOPB handle test vector comparison during execution?
The SCANSTA101SMX/NOPB includes dedicated hardware compare logic that validates incoming TDI_SM data against preloaded expected values stored in its dual-port memory. This comparison occurs in real time during vector execution, and the result triggers status flags and optional interrupts - eliminating software polling and enabling immediate fail detection without host CPU involvement in SCANSTA101SMX/NOPB operation.
Can the SCANSTA101SMX/NOPB operate with a 5 V microcontroller interface?
No - the SCANSTA101SMX/NOPB operates exclusively from a 3.3 V supply (VCC = 3.0–3.6 V) and is specified for 5 V tolerant I/O only on its JTAG output pins (TDO_SM, TMS_SM, etc.), not its parallel processor interface. Its D[15:0], A[4:0], R/W, CE, and STB pins require 3.3 V logic levels; interfacing with 5 V microcontrollers necessitates level-shifting circuitry for SCANSTA101SMX/NOPB compatibility.
What is the role of the TRST0_SM pin on the SCANSTA101SMX/NOPB?
TRST0_SM is an active-low output signal generated by the SCANSTA101SMX/NOPB to reset the Test Logic of downstream IEEE 1149.1 devices in the scan chain. It is distinct from the input TRST pin (which resets the SCANSTA101SMX/NOPB itself) and provides synchronized, hardware-controlled reset assertion to ensure predictable TAP state initialization across the entire JTAG chain during SCANSTA101SMX/NOPB startup or recovery sequences.
SCANSTA101SMX/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 49-LFBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 49-NFBGA (7x7)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA101SMX/NOPB FAQ
1.How can I place an order for SCANSTA101SMX/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA101SMX/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA101SMX/NOPB reliable?
The price and inventory of SCANSTA101SMX/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA101SMX/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA101SMX/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA101SMX/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA101SMX/NOPB?
SCANSTA101SMX/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA101SMX/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA101SMX/NOPB?
For technical support, including SCANSTA101SMX/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA101SMX/NOPB requirements.
6.How does Aetrix verify that SCANSTA101SMX/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA101SMX/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA101SMX/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA101SMX/NOPB?
All SCANSTA101SMX/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA101SMX/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA101SMX/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA101SMX/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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