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Texas Instruments SCANSTA111MT
- Part No.:
- SCANSTA111MT
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 48-TFSOP (0.240", 6.10mm Width)
- Datasheet:
-
SCANSTA111MT.pdf
- Description:
- IC INTERFACE SPECIALIZED 48TSSOP
- Quantity:
- Payment:
- Shipping:
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Product details
Overview
SCANSTA111MT from Texas Instruments is an IEEE 1149.1-compliant enhanced scan bridge IC enabling multidrop JTAG test architecture. It supports up to 3 configurable local scan ports (LSP0–LSP2), 7-slot addressable addressing for up to 121 unique devices, and hierarchical scan tree construction. It is used in high-density backplane systems requiring board-level isolation and concurrent scan testing of multiple modules.
For engineers reviewing the SCANSTA111MT datasheet, SCANSTA111MT pinout, SCANSTA111MT application, or SCANSTA111MT equivalent, key selection criteria include its Level 1/Level 2 protocol support, 32-bit TCK counter for BIST, 16-bit LFSR signature compactor, TRST on all local ports, and transparent mode for backplane-to-local port buffering.
Technical Context
The SCANSTA111MT implements three tightly coupled state machines: a TAP controller compliant with IEEE 1149.1, a selection controller handling Level 1 addressing (direct/multicast/broadcast), and three independent local scan port controllers managing park/unpark states per LSP. Address matching occurs via 7-bit slot inputs (S0–S6) against instruction register LSBs during Update-IR.
Its Level 2 protocol enables dynamic insertion/removal of local scan chains into the active serial path using instructions like UNPARK, PARKRTI, and MODESEL. Each LSP supports full IEEE 1149.1 signals (TCK/TMS/TDI/TDO/TRST), with TCK(0–2) buffered from TCKB and LSP_ACTIVE(0–2) outputs enabling IEEE 1149.4 analog bus control.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - ensures compatibility with 3.3-V system logic and stable operation across industrial voltage tolerances. |
| Local Scan Ports | 3 independent LSPs (LSP0–LSP2) - each provides full boundary-scan interface to local devices, supporting individual or grouped serial chaining. |
| Address Slots | 7-bit slot inputs (S0–S6) - enables up to 121 unique addresses including interrogation, broadcast, and 4 multicast groups. |
| TCK Counter | 32-bit counter - allows precise clock-gated built-in self-test (BIST) execution on one port while others remain active. |
| LFSR Compactor | 16-bit linear feedback shift register - compresses serial test response data into compact signatures for pass/fail evaluation without full data capture. |
| TRST Support | Asynchronous TRSTB input + TRST(0–2) outputs - provides synchronized reset to all local TAP controllers, ensuring deterministic power-up and test initialization. |
| Live Insertion | Power-off high-impedance I/O - permits hot-plug operation in backplane systems without damaging adjacent circuitry or causing bus contention. |
Pinout & Package
The SCANSTA111MT is housed in a 48-pin TSSOP (Thin Shrink Small Outline Package) with 0.5-mm pitch, thermally enhanced for high-density PCB layouts in test-accessible systems.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG Interface | Primary IEEE 1149.1 signals connecting to system test master; TDOB has 24 mA drive for robust backplane fanout. |
| S0–S6 | Slot Address Inputs | Static 7-bit hardware address configuration; determines device identity in multidrop network. | OE | Local Port Output Enable | Active-low control that tri-states all LSP outputs (TDO0–2, TMS0–2, etc.) to allow alternate test masters access to local scan chains. |
| TCK0–2, TMS0–2, TDI0–2, TDO0–2 | Local Scan Port Signals | Full JTAG interface per port; TCKn are buffered copies of TCKB; all outputs rated for 24 mA drive. |
| LSP_ACTIVE0–2 | Analog Bus Enable | Open-drain outputs driving IEEE 1149.4 analog test bus enable lines; support mixed-signal test layer integration. |
| TRISTB, TRIST0–2 | Tri-State Notification | Indicate when associated TDO outputs enter high-impedance state - critical for coordinating bus arbitration in shared test environments. |
Key Features
| Feature | Design Value |
|---|---|
| True Multidrop Addressing | Enables selective activation of individual SCANSTA111MT devices on shared backplane without physical reconfiguration or daisy-chain rewiring. |
| Park/Unpark Local TAPs | Allows stable parking of local scan chains in TLR, RTI, Pause-DR, or Pause-IR states - isolates inactive modules while preserving their TAP state for rapid re-engagement. |
| Transparent Mode | Single-instruction activation routes backplane JTAG signals directly to one selected LSP - simplifies debug and FPGA programming without scan chain reconfiguration. |
| IEEE 1149.4 Support | LSP_ACTIVE outputs and analog bus coordination enable compliance with mixed-signal test standards - extends boundary-scan to analog components and sensor interfaces. |
| General-Purpose Pass-Through | A/B/Y pins provide bidirectional signal routing between backplane and local ports - useful for delivering FPGA configuration pulses or monitoring device status flags. |
Applications
| Backplane-Based Modular Systems | High-Availability Telecom Chassis |
|---|---|
Use Scenario: Multiple plug-in cards with independent ASICs/FPGAs share a common JTAG backplane for system-level test. IC Role / Device Role / Timing Role: SCANSTA111MT acts as a hierarchical scan bridge, assigning unique addresses to each card and enabling selective activation of local scan chains without disrupting others. Use Value: Enables concurrent board-level diagnostics and firmware updates while maintaining system uptime - reduces test time by >60% versus serial daisy-chained scanning. | Use Scenario: Carrier-grade telecom equipment requires hot-swap capability and field-upgradable line cards with guaranteed test access. IC Role / Device Role / Timing Role: SCANSTA111MT provides live-insertion-safe JTAG bridging with TRST synchronization and power-off high-Z I/O - ensures no bus contention during card replacement. Use Value: Eliminates need for manual jumper settings or external multiplexers - supports automated test orchestration across 100+ line cards in a single chassis. |
| Automated Test Equipment (ATE) Integration | FPGA-Based Prototyping Platforms |
Use Scenario: ATE systems must validate complex multi-board assemblies with varying scan chain topologies across production lots. IC Role / Device Role / Timing Role: SCANSTA111MT serves as a programmable scan topology manager - uses Level 1/Level 2 protocols to dynamically reconfigure active scan paths per UUT. Use Value: Reduces fixture complexity and test program maintenance - one ATE setup handles 12+ board variants via software-addressed scan routing. | Use Scenario: FPGA development boards integrate multiple FPGAs, ADCs, and memory devices requiring coordinated boundary-scan and configuration verification. IC Role / Device Role / Timing Role: SCANSTA111MT bridges host JTAG controller to three independent local scan domains - supports simultaneous FPGA bitstream loading and analog sensor calibration. Use Value: Enables single-cable debug and programming across heterogeneous peripherals - eliminates need for separate JTAG headers or manual switching. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop scan bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112MT | Same pinout and core functionality; adds 8th address bit support (HDL version only) and expanded GPIO registers. | Required only when >121 device addressing or dedicated/shared GPIO control beyond SCANSTA111MT's capability is needed. | Select SCANSTA112MT if future scalability to 256 addresses or advanced GPIO routing is mandated in system architecture. |
| SN74ABT16244DGGR | Non-JTAG octal buffer with 3-state control - lacks IEEE 1149.1 compliance, addressing logic, LSP control, or protocol awareness. | Only suitable for basic signal buffering where no scan chain management, park/unpark, or hierarchical test is required. | Choose SN74ABT16244DGGR only for simple level-shifting or fanout extension - not a functional substitute for SCANSTA111MT's test infrastructure role. |
Compared with SCANSTA111MT, SCANSTA112MT offers extended addressing headroom and GPIO flexibility but identical scan bridge behavior, while SN74ABT16244DGGR provides only passive signal conditioning without any JTAG protocol intelligence or test system integration capability.
Availability
SCANSTA111MT is available at Aetrix Electronics and suitable for backplane-based modular systems, high-availability telecom chassis, and automated test equipment requiring stable component supply, long-term lifecycle support, and traceable sourcing.
Supply support for SCANSTA111MT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies with over 50 years of innovation in test and measurement ICs.
The SCANSTA111MT belongs to TI's IEEE 1149.x test infrastructure product line, designed specifically to solve multidrop JTAG scalability, hierarchical scan tree construction, and live-insertion-capable board-level test challenges in carrier-grade and industrial systems.
FAQ
What is the primary function of the SCANSTA111MT in a JTAG test system?
The SCANSTA111MT functions as an IEEE 1149.1-compliant multidrop scan bridge that extends standard JTAG into hierarchical, addressable backplane environments. It enables selective activation of up to 121 uniquely addressed devices, manages three independent local scan ports (LSP0–LSP2), and supports park/unpark operations to isolate or engage local scan chains dynamically. Its Level 1/Level 2 protocol architecture makes SCANSTA111MT essential for scalable, high-throughput system-level test in modular electronics.
Does the SCANSTA111MT support IEEE 1149.4 mixed-signal test standards?
Yes, the SCANSTA111MT supports IEEE 1149.4 through its LSP_ACTIVE(0–2) outputs, which serve as analog bus enable signals for mixed-signal test bus implementation. These open-drain outputs coordinate timing and activation of analog test resources alongside digital boundary-scan, allowing synchronized stimulus and measurement across hybrid signal domains - a capability confirmed in the official SNLS060K datasheet section "LSP ACTIVE Outputs Provide Local Port Enable Signals for Analog Busses Supporting IEEE 1149.4."
How does the SCANSTA111MT handle power sequencing and live insertion?
The SCANSTA111MT supports live insertion/withdrawal via power-off high-impedance inputs and outputs - all I/O pins enter high-Z state when VCC = 0 V or floating, preventing bus contention or latch-up during hot-swap events. Its known power-up state ensures deterministic initialization, and TRSTB provides asynchronous reset for reliable recovery. This behavior is explicitly specified in the "Features" and "Pin Descriptions" sections of the SNLS060K datasheet, making SCANSTA111MT suitable for carrier-class telecom and modular server applications.
Can the SCANSTA111MT operate in transparent mode, and how is it enabled?
Yes, the SCANSTA111MT supports transparent mode, which buffers backplane JTAG signals (TMSB, TDIB, TCKB, TRSTB) directly to a single selected local scan port without scan chain insertion. It is enabled via a dedicated instruction (as documented in the Level 2 instruction set), eliminating the need for reconfiguration when performing FPGA programming or real-time debug. This mode leverages the device's internal multiplexing logic and is distinct from normal scan-path operation - a verified feature in the "FEATURES" list and "APPLICATION OVERVIEW" section of the SCANSTA111MT datasheet.
What is the role of the 32-bit TCK counter and 16-bit LFSR in the SCANSTA111MT?
The 32-bit TCK counter enables precise clock-gated built-in self-test (BIST) execution on one local scan port while other ports remain active - critical for concurrent test operations. The 16-bit LFSR signature compactor generates compact pass/fail signatures from serial test response data, reducing post-processing overhead and memory requirements. Both features are integral to SCANSTA111MT's test efficiency architecture and are explicitly listed in the "FEATURES" section and "REGISTER SET" table of the SNLS060K datasheet.
SCANSTA111MT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 48-TFSOP (0.240", 6.10mm Width)
- Packaging:
- Tube
- Product Status:
- Obsolete
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 48-TSSOP
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111MT FAQ
1.How can I place an order for SCANSTA111MT through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111MT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111MT reliable?
The price and inventory of SCANSTA111MT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111MT is usually 5 days.
3.What payment methods are accepted for SCANSTA111MT?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111MT transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111MT?
SCANSTA111MT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111MT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111MT?
For technical support, including SCANSTA111MT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111MT requirements.
6.How does Aetrix verify that SCANSTA111MT is sourced from the original manufacturer or authorized distributors?
All SCANSTA111MT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111MT meets industry standards.
7.What is the process for return or replacement of SCANSTA111MT?
All SCANSTA111MT units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111MT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111MT part is unused and in its original packaging.
Return procedure for SCANSTA111MT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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