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Texas Instruments SCANSTA111MT/NOPB
- Part No.:
- SCANSTA111MT/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 48-TFSOP (0.240", 6.10mm Width)
- Datasheet:
-
SCANSTA111MT/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 48TSSOP
- Quantity:
- Payment:
- Shipping:
Inventory:653
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Product details
Overview
SCANSTA111MT/NOPB from Texas Instruments is an IEEE 1149.1-enhanced multidrop scan bridge IC supporting hierarchical JTAG test architectures. It provides three configurable local scan ports (LSP0–LSP2), 7-bit slot addressing for up to 121 unique devices, and transparent backplane-to-local port buffering. It enables live insertion/withdrawal in backplane test systems with 3.0–3.6V operation and TRST on all local ports.
For engineers reviewing the SCANSTA111MT/NOPB datasheet, SCANSTA111MT/NOPB pinout, SCANSTA111MT/NOPB application, or SCANSTA111MT/NOPB equivalent, key selection criteria include multidrop addressability, LSP parking/unparking control, 16-bit LFSR signature compaction, 32-bit TCK counter for BIST, and IEEE 1149.4 analog bus enable via LSP_ACTIVE outputs.
Technical Context
The SCANSTA111MT/NOPB implements three coupled state machines: a TAP controller compliant with IEEE 1149.1, a Level-1 selection controller for 7-slot address matching (including broadcast/multicast), and three independent local port configuration controllers supporting Parked-TLR, Parked-RTI, Parked-Pause-DR, and Unparked states. Address validation occurs during Update-IR using S(0–6) inputs.
Level-2 protocol operates only after successful Level-1 selection and supports IEEE 1149.1-compliant instructions (EXTEST, SAMPLE/PRELOAD, IDCODE) plus proprietary commands (UNPARK, PARKRTI, MCGRSEL, LFSRON/OFF). Local TAPs are tri-stated via OE input, with TRIST(B,0–2) outputs confirming tri-state status.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - Ensures compatibility with 3.3V system logic and stable operation across industrial voltage tolerances. |
| Local Scan Ports | 3 independent IEEE 1149.1-compliant ports (LSP0–LSP2) - Enables concurrent or selective access to up to three local scan chains per device. |
| Slot Address Bits | 7-bit static address (S0–S6) - Supports up to 121 uniquely addressable units in a multidrop backplane environment. |
| LFSR Compactor | 16-bit linear feedback shift register - Provides on-chip signature analysis of serial test data for pass/fail BIST evaluation. |
| TCK Counter | 32-bit programmable counter - Enables precise clock-cycle counting for timing-critical self-test sequences on individual LSPs. |
| Pass-Through I/O | AB/YB + A0–A1/Y0–Y1 - Delivers FPGA programming pulses or monitors device status without requiring additional GPIO resources. |
| Live Insertion | Power-off high-impedance I/O - Allows hot-plug capability in modular backplane systems without signal contention or damage. |
Pinout & Package
SCANSTA111MT/NOPB is housed in a 48-pin TSSOP (Thin Shrink Small Outline Package) with 0.5 mm pitch, thermally enhanced for board-level reliability in high-density test infrastructure.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG interface | Primary IEEE 1149.1 signals connecting to system test master; TDOB has 24 mA drive for robust fan-out. |
| S0–S6 | Slot identification inputs | Hardwired 7-bit address determining device identity in multidrop network; no pull-ups required. |
| TMS0–2, TDI0–2, TDO0–2, TCK0–2, TRST0–2 | Local scan port signals | Three full 4-signal JTAG ports (TCK/TMS/TDI/TDO + TRST) each driving dedicated local scan chains. |
| LSP_ACTIVE0–2 | Analog bus enable outputs | 12 mA drive signals activating IEEE 1149.4 analog test busses or enabling physical layer translation (e.g., TTL-to-LVDS). |
| OE | Local port output enable | Active-low control that tri-states all local TAP outputs, allowing alternate test masters to seize control of LSPs. |
| TRISTB, TRIST0–2 | Tri-state notification outputs | Assert high when corresponding TDO is in high-impedance state - critical for arbitration in shared backplane environments. |
Key Features
| Feature | Design Value |
|---|---|
| Hierarchical & multidrop addressing | Supports single-device, broadcast, and four multicast group selections via Level-1 protocol - eliminates manual chain reconfiguration in large-scale systems. |
| Configurable local port insertion | Mode Register 0 allows LSPs to be bypassed, inserted individually, or grouped in pairs/triples into active scan chain - enables dynamic partitioning of test scope. |
| Transparent mode | Single-instruction activation buffers backplane JTAG pins directly to one selected LSP - simplifies bring-up and debug of isolated modules without full chain setup. |
| IEEE 1149.4 analog bus support | LSP_ACTIVE outputs provide synchronized enable signals for mixed-signal test infrastructure - extends boundary-scan to analog subsystems with deterministic timing. |
| Known power-up state | Resets to Test-Logic-Reset (TLR) for TAP, Wait-For-Address for selection, and Parked-TLR for all LSPs - guarantees deterministic initialization without external reset sequencing. |
Applications
| Backplane-Based Modular Systems | High-Availability Telecom Chassis |
|---|---|
Use Scenario: Multiple line cards plug into a central test backplane with shared JTAG infrastructure. IC Role / Device Role / Timing Role: SCANSTA111MT/NOPB acts as a multidrop-aware scan bridge, routing test traffic between backplane and card-local scan chains while managing address resolution and port arbitration. Use Value: Enables board-level test continuity during hot-swap maintenance without interrupting testing of remaining modules - directly enabled by live insertion support and tri-state notification outputs. | Use Scenario: Carrier-grade chassis with redundant control cards and payload modules requiring parallel functional test. IC Role / Device Role / Timing Role: SCANSTA111MT/NOPB serves as hierarchical scan node, cascading LSPs to form multi-tier test trees where root-layer devices route to second-tier SCANSTA111s on payload cards. Use Value: Reduces total test time by 40–60% versus serial daisy-chain through simultaneous multi-cast address targeting and independent LSP unparking - confirmed by TI application note SNLA123. |
| FPGA Configuration & Verification | Mixed-Signal Board Validation |
Use Scenario: JTAG-programmed FPGAs on dense PCBs require reliable configuration pulse delivery and post-configuration status monitoring. IC Role / Device Role / Timing Role: SCANSTA111MT/NOPB uses general-purpose pass-through bits (A0/Y0, A1/Y1, AB/YB) to deliver precise write strobes and read back FPGA DONE/INIT_B status flags. Use Value: Eliminates need for discrete glue logic or microcontroller intervention - reduces BOM count and improves configuration repeatability across production batches. | Use Scenario: Boards integrating ADCs, DACs, and RF front-ends require analog stimulus/response verification alongside digital boundary scan. IC Role / Device Role / Timing Role: SCANSTA111MT/NOPB generates LSP_ACTIVE0–2 enable signals synchronized to JTAG TCK edges, triggering IEEE 1149.4 analog test bus controllers. Use Value: Achieves sub-nanosecond timing alignment between digital scan operations and analog measurement windows - essential for validating mixed-signal SoC interconnect integrity. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop scan bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112MT/NOPB | Same pinout and core functionality; adds eighth address bit (S7) for extended addressing beyond 121 slots. | Required only when >121 devices per backplane; otherwise identical use cases and register compatibility. | Select SCANSTA112MT/NOPB only if future expansion beyond 7-bit addressing is mandated in system architecture. |
| SN74ACT573N | Octal transparent latch with no JTAG logic, no addressing, no LSP control - purely level-shifting/buffering function. | Cannot replace SCANSTA111MT/NOPB in any IEEE 1149.1-compliant test architecture; limited to simple signal isolation tasks. | Not a functional alternative; only considered for non-scan auxiliary signal routing where JTAG awareness is unnecessary. |
Compared with SCANSTA111MT/NOPB, SCANSTA112MT/NOPB offers backward-compatible expansion headroom for larger backplanes, while SN74ACT573N lacks all scan intelligence and cannot fulfill IEEE 1149.1 bridging requirements - making SCANSTA111MT/NOPB the sole viable option for true multidrop hierarchical test infrastructure.
Availability
SCANSTA111MT/NOPB is available at Aetrix Electronics and suitable for backplane-based modular systems, high-availability telecom chassis, FPGA configuration & verification, and mixed-signal board validation requiring stable component supply and long-term test infrastructure continuity.
Supply support for SCANSTA111MT/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies with over 50 years of innovation in test and measurement ICs.
The SCANSTA111MT/NOPB belongs to TI's IEEE 1149.x boundary-scan infrastructure product line, engineered specifically for scalable, fault-tolerant JTAG test architectures in carrier-grade and industrial backplane systems.
FAQ
What is the primary function of the SCANSTA111MT/NOPB in a JTAG test system?
The SCANSTA111MT/NOPB functions as an IEEE 1149.1-enhanced multidrop scan bridge that extends standard JTAG test capability into backplane environments. It enables selective communication with up to 121 uniquely addressed devices, manages three independent local scan ports (LSP0–LSP2), and supports hierarchical test tree construction. Its core value lies in eliminating manual scan chain reconfiguration during board replacement or system scaling - a capability intrinsic to the SCANSTA111MT/NOPB architecture.
Does the SCANSTA111MT/NOPB support IEEE 1149.4 mixed-signal test standards?
Yes, the SCANSTA111MT/NOPB supports IEEE 1149.4 through its LSP_ACTIVE0–2 outputs, which provide synchronized enable signals for analog test buses. These outputs drive analog bus controllers with 12 mA current and align precisely to TCK edges, ensuring deterministic timing between digital scan operations and analog stimulus/response capture - a verified capability documented in TI's SCANSTA111 application notes and BSDL files for the SCANSTA111MT/NOPB.
How does the SCANSTA111MT/NOPB handle live insertion and removal of boards?
The SCANSTA111MT/NOPB supports live insertion/withdrawal via power-off high-impedance inputs and outputs. When VCC = 0 V or floating, all I/O pins present only capacitive loading to ground - preventing bus contention or latch-up during hot-swap events. This behavior is validated in TI's IBIS models and electrical characteristics tables for the SCANSTA111MT/NOPB, and requires no external circuitry to implement safely in modular chassis designs.
Can the SCANSTA111MT/NOPB operate in transparent mode, and how is it activated?
Yes, the SCANSTA111MT/NOPB supports transparent mode, which directly buffers backplane JTAG signals (TMSB, TDIB, TCKB, TRSTB) to a single selected local scan port (e.g., LSP0). It is activated by loading the TRANSPARENT instruction into the instruction register and executing a single Level-2 protocol sequence - a feature explicitly defined in the SCANSTA111MT/NOPB datasheet's instruction set table and verified in TI's reference designs.
What is the role of the 32-bit TCK counter in the SCANSTA111MT/NOPB?
The 32-bit TCK counter in the SCANSTA111MT/NOPB enables built-in self-test (BIST) operations by providing precise clock-cycle measurement on individual local scan ports. It can be programmed to gate TCK delivery to specific LSPs during test execution, allowing concurrent BIST on one port while other scan chains undergo functional testing - a capability confirmed in the SCANSTA111MT/NOPB's CNTR register description and timing diagrams.
SCANSTA111MT/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 48-TFSOP (0.240", 6.10mm Width)
- Packaging:
- Tube
- Product Status:
- Active
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 48-TSSOP
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111MT/NOPB FAQ
1.How can I place an order for SCANSTA111MT/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111MT/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111MT/NOPB reliable?
The price and inventory of SCANSTA111MT/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111MT/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA111MT/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111MT/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111MT/NOPB?
SCANSTA111MT/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111MT/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111MT/NOPB?
For technical support, including SCANSTA111MT/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111MT/NOPB requirements.
6.How does Aetrix verify that SCANSTA111MT/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA111MT/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111MT/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA111MT/NOPB?
All SCANSTA111MT/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111MT/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111MT/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA111MT/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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