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Texas Instruments SCANSTA111MTX
- Part No.:
- SCANSTA111MTX
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 48-TFSOP (0.240", 6.10mm Width)
- Datasheet:
-
SCANSTA111MTX.pdf
- Description:
- IC INTERFACE SPECIALIZED 48TSSOP
- Quantity:
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Product details
Overview
SCANSTA111MTX from Texas Instruments is an IEEE 1149.1-compliant multidrop addressable SCAN bridge IC that extends JTAG test access across backplane-based modular systems. It supports up to three local scan ports (LSP0–LSP2), 7-slot addressing for up to 121 unique device addresses, and operates from 3.0–3.6V. It enables hierarchical boundary-scan tree architectures in telecom and industrial backplane systems.
For engineers reviewing the SCANSTA111MTX datasheet, SCANSTA111MTX pinout, SCANSTA111MTX application, or SCANSTA111MTX equivalent, key selection criteria include its Level-1/Level-2 protocol support, 32-bit TCK counter for BIST, 16-bit LFSR signature compactor, TRST on all local ports, and transparent mode for backplane-to-local port buffering.
Technical Context
The SCANSTA111MTX implements three tightly coupled state machines: a TAP controller compliant with IEEE 1149.1, a slot-address selection controller supporting direct/multicast/broadcast addressing via S(0–6) inputs, and three independent local scan port controllers (LSPC) for per-port parking/unparking. Each LSP supports full boundary-scan signals (TCK/TMS/TDI/TDO/TRST) with 24mA drive strength.
Its architecture enables dynamic scan-chain reconfiguration: parked LSPs hold local TAPs in stable states (e.g., Parked-RTI), while unparked LSPs insert their local scan rings serially into the active chain (TDIB → SCANSTA111 IR → local TAP registers → PAD → TDOB). The 32-bit TCK counter and 16-bit LFSR operate independently per selected port to support concurrent BIST and result compaction.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - Ensures compatibility with 3.3V system logic and eliminates level-shifting in backplane JTAG interfaces. |
| Local Scan Ports | 3 independent IEEE 1149.1 ports (LSP0–LSP2) - Enables concurrent or selective testing of up to three local scan chains per board. |
| Address Slots | 7-bit slot inputs (S0–S6) supporting 121 unique addresses - Allows scalable multidrop networks without external address decoding logic. |
| TCK Counter | 32-bit programmable counter - Enables precise clock-gated BIST execution on individual LSPs without halting other scan operations. |
| LFSR Compactor | 16-bit linear feedback shift register - Generates compact pass/fail signatures from serial test data, reducing post-test analysis overhead. |
| TRST Support | Asynchronous active-low TRST on all local ports (TRST0–TRST2) - Provides synchronized reset of local TAP controllers during system-level test initialization. |
| Transparent Mode | Enabled via single instruction - Directly buffers backplane TDI/TDO/TMS/TCK to one selected LSP, simplifying debug and bring-up without scan chain reconfiguration. |
Pinout & Package
TSSOP-48 package (7.0 mm × 4.4 mm, 0.5 mm pitch) with exposed thermal pad; RoHS-compliant, lead-free finish.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG interface | Primary IEEE 1149.1 signals for multidrop master communication; TDOB has 24mA drive and tri-states in broadcast/multicast modes. |
| TMS0–2, TDI0–2, TDO0–2, TCK0–2, TRST0–2 | Local scan port signals | Full 5-signal JTAG outputs per LSP; all outputs rated for 24mA drive to directly drive local scan chains without buffers. |
| S0–S6 | Slot identification inputs | Hardwired 7-bit address for Level-1 selection; determines which SCANSTA111MTX responds to scanned address instructions. |
| OE | Local port output enable | Active-low control that tri-states all LSP outputs (TDO/TMS/TCK/TRST), enabling alternate test masters to seize control of local scan chains. |
| LSP_ACTIVE0–2 | Analog bus enable | Open-drain outputs with 12mA drive used to enable IEEE 1149.4 analog test buses or LVDS transceivers on backplane layers. |
| TRISTB, TRIST0–2 | Tri-state notification | Indicate when associated TDO outputs are in high-impedance state - critical for coordinating bus sharing in mixed-signal test environments. |
Key Features
| Feature | Design Value |
|---|---|
| Hierarchical scan tree support | Enables cascading SCANSTA111MTX devices (e.g., root-layer LSP → second-tier backplane) to build multi-level test architectures without protocol translation. |
| Park/unpark per-LSP control | Each local port can be independently parked in stable TAP states (TLR/RTI/Pause-DR/Pause-IR), isolating unused scan chains and preventing interference during targeted testing. |
| Multi-cast group addressing | Four programmable multi-cast groups (via MCGR register) allow selective activation of subsets of SCANSTA111MTX devices, improving test efficiency over full broadcast. |
| Live insertion/withdrawal support | Power-off high-impedance I/O and capacitive-load behavior on power-down pins enable hot-plug operation in carrier-card systems without disrupting backplane JTAG integrity. |
| Known power-up state | Guaranteed reset to Wait-For-Address state with all LSPs parked in Parked-TLR - ensures deterministic initialization and eliminates boot-time scan chain corruption. |
Applications
| Telecom Line Card Test | Industrial PLC Backplane Diagnostics |
|---|---|
Use Scenario: Testing multiple FPGA- and ASIC-based line cards plugged into a central switch fabric backplane. IC Role / Device Role / Timing Role: SCANSTA111MTX acts as a JTAG multiplexer and address router, allowing the central test controller to selectively access each card's local scan chains without physical reconnection. Use Value: Reduces system-level test time by enabling parallel scan chain execution across 121 uniquely addressed cards and eliminating manual probe setup. | Use Scenario: Performing field-service diagnostics on modular PLC I/O carrier boards with mixed-vendor modules. IC Role / Device Role / Timing Role: SCANSTA111MTX serves as a hierarchical test access node, bridging the backplane JTAG bus to individual module-level scan chains while supporting live card replacement. Use Value: Enables hot-swap-capable boundary-scan verification of analog/digital I/O modules using IEEE 1149.4 LSP_ACTIVE signaling for analog bus enable coordination. |
| Aerospace Avionics LRUs | Medical Imaging Subsystem Validation |
Use Scenario: Validating configuration and interconnect integrity of line-replaceable units (LRUs) in redundant flight control computers. IC Role / Device Role / Timing Role: SCANSTA111MTX provides deterministic, addressable JTAG access to safety-critical LRUs via a shared backplane, with broadcast-mode LFSR signature capture for rapid health checks. Use Value: Supports DO-254 compliance through repeatable, traceable scan-path validation and built-in self-test using the 32-bit TCK counter and 16-bit LFSR. | Use Scenario: Verifying FPGA configuration and sensor interface integrity in multi-board MRI subsystems with strict EMI constraints. IC Role / Device Role / Timing Role: SCANSTA111MTX isolates local scan traffic to shielded daughterboards while routing JTAG commands over low-noise backplane traces using transparent mode for debug. Use Value: Maintains signal integrity at >10 MHz scan rates via PAD-bit synchronization and eliminates cross-talk between imaging and control boards during production test. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112MTX | Same pinout and core functionality; adds 8th address bit (S7) for 256-slot addressing and HDL-configurable GPIO registers. | Required only when >121 devices must be addressed or dedicated/shared GPIO control beyond SCANSTA111MTX's fixed feature set is needed. | Select SCANSTA112MTX if future system scalability beyond 121 slots or enhanced GPIO flexibility is mandated; otherwise SCANSTA111MTX suffices. |
| SN74ABT16244DGGR | Non-JTAG 16-bit buffer with 3-state control; no protocol awareness, addressing, or scan chain management logic. | Only suitable for simple signal buffering where IEEE 1149.1 extension, multidrop control, or hierarchical test architecture is not required. | Choose SN74ABT16244DGGR only for basic level-shifting or fanout - not as a functional replacement for SCANSTA111MTX's JTAG bridge capabilities. |
Compared with SCANSTA111MTX, SCANSTA112MTX extends address space and GPIO configurability but shares identical timing, packaging, and core scan bridge behavior; SN74ABT16244DGGR lacks all JTAG protocol logic and cannot implement multidrop selection, parking, or Level-1/Level-2 command processing.
Availability
SCANSTA111MTX is available at Aetrix Electronics and suitable for telecom line card test, industrial PLC backplane diagnostics, and aerospace avionics LRU validation requiring stable component supply and long-term lifecycle support.
Supply support for SCANSTA111MTX includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor company specializing in analog, embedded processing, and connectivity technologies with over 50 years of innovation in test and measurement ICs.
The SCANSTA111MTX belongs to TI's IEEE 1149.x boundary-scan infrastructure product line, designed specifically to solve multidrop JTAG test challenges in modular, backplane-based systems requiring hierarchical test access and live-insertion capability.
FAQ
What is the primary function of the SCANSTA111MTX in a JTAG test system?
The SCANSTA111MTX functions as a multidrop addressable IEEE 1149.1 SCAN bridge that extends JTAG test access across backplane-connected boards. It enables selective communication with up to 121 uniquely addressed devices using Level-1 addressing and controls up to three local scan ports per device via Level-2 protocol. Its design allows partitioning complex systems into testable blocks without modifying existing JTAG chains, making it essential for scalable, hierarchical boundary-scan architectures in SCANSTA111MTX-based systems.
How does the SCANSTA111MTX support hierarchical test tree configurations?
The SCANSTA111MTX supports hierarchical test trees by allowing cascading connections: a root-layer SCANSTA111MTX's local scan port (e.g., LSP0) connects to the backplane port of a second-tier SCANSTA111MTX, forming a multi-level scan hierarchy. Each layer retains independent Level-1 addressing and Level-2 port control, enabling the test master to navigate and activate specific terminal scan chains (e.g., FPGA or ASIC boundary-scan chains) deep within the tree. This architecture is explicitly documented in the SCANSTA111MTX datasheet's APPLICATION OVERVIEW section and validated in TI's reference designs.
What are the key differences between SCANSTA111MTX and SCANSTA112MTX?
The SCANSTA112MTX is a direct enhancement of the SCANSTA111MTX, adding an eighth slot input (S7) to support 256 unique addresses instead of 121, and including HDL-configurable dedicated/shared GPIO registers not present in SCANSTA111MTX. Both share identical pinout, 3.0–3.6V operation, 3-local-port architecture, and core Level-1/Level-2 protocol implementation. The SCANSTA111MTX remains optimal for systems with ≤121 devices and no requirement for extended GPIO control, while SCANSTA112MTX targets larger-scale or more flexible future-proofed deployments.
Does the SCANSTA111MTX support live insertion and removal in powered backplanes?
Yes, the SCANSTA111MTX explicitly supports live insertion/withdrawal as stated in its official datasheet features list. Its inputs and outputs exhibit power-off high-impedance behavior with controlled capacitive loading when VCC = 0V or floating, preventing bus contention or latch-up during hot-plug events. This capability is verified in TI's IBIS models and applied in carrier-card systems where modules are serviced without powering down the entire backplane - a critical requirement confirmed for SCANSTA111MTX in production telecom and industrial applications.
Can the SCANSTA111MTX operate in transparent mode, and what is its purpose?
Yes, the SCANSTA111MTX supports transparent mode, enabled via a single instruction that directly buffers backplane JTAG signals (TCKB/TMSB/TDIB) to one selected local scan port (e.g., LSP0). This bypasses internal scan chain logic, allowing real-time debug, FPGA programming, or bring-up without reconfiguring parked/unparked states. The mode is particularly valuable during development when engineers need unobstructed access to local devices before full boundary-scan integration - a documented capability in the SCANSTA111MTX datasheet's FEATURES and APPLICATION OVERVIEW sections.
SCANSTA111MTX Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 48-TFSOP (0.240", 6.10mm Width)
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 48-TSSOP
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111MTX FAQ
1.How can I place an order for SCANSTA111MTX through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111MTX on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111MTX reliable?
The price and inventory of SCANSTA111MTX are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111MTX is usually 5 days.
3.What payment methods are accepted for SCANSTA111MTX?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111MTX transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111MTX?
SCANSTA111MTX orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111MTX order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111MTX?
For technical support, including SCANSTA111MTX datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111MTX requirements.
6.How does Aetrix verify that SCANSTA111MTX is sourced from the original manufacturer or authorized distributors?
All SCANSTA111MTX products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111MTX meets industry standards.
7.What is the process for return or replacement of SCANSTA111MTX?
All SCANSTA111MTX units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111MTX, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111MTX part is unused and in its original packaging.
Return procedure for SCANSTA111MTX:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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