My Inquiry
My Account
Texas Instruments SCANSTA111MTX/NOPB
- Part No.:
- SCANSTA111MTX/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 48-TFSOP (0.240", 6.10mm Width)
- Datasheet:
-
SCANSTA111MTX/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 48TSSOP
- Quantity:
- Payment:
- Shipping:
Inventory:4,081
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
SCANSTA111MTX/NOPB from Texas Instruments is an IEEE 1149.1-enhanced multidrop scan bridge IC that extends JTAG test access across backplane-connected boards. It supports up to 3 local IEEE 1149.1 scan ports, 7-slot addressable addressing (up to 121 unique addresses), and hierarchical scan tree construction. It operates from 3.0–3.6 V and enables live insertion/withdrawal in system-level boundary-scan test infrastructure.
For engineers reviewing the SCANSTA111MTX/NOPB datasheet, SCANSTA111MTX/NOPB pinout, SCANSTA111MTX/NOPB application, or SCANSTA111MTX/NOPB equivalent, key selection criteria include multidrop addressability, local port parking/unparking control, TCK counter for BIST, LFSR signature compaction, and IEEE 1149.4 analog bus enable via LSP_ACTIVE outputs.
Technical Context
The SCANSTA111MTX/NOPB implements three tightly coupled state machines: a TAP controller compliant with IEEE 1149.1, a Level-1 selection controller for slot/multicast/broadcast addressing, and three independent local scan port (LSP) configuration controllers. Address matching occurs on S(0–6) inputs against 7-bit instruction register values during Update-IR.
Level-2 protocol operations-including UNPARK, PARKRTI, MODESEL, and LFSRON-are enabled only after successful Level-1 selection. Each LSP (0–2) supports full IEEE 1149.1 signals (TCK/TMS/TDI/TDO/TRST), tri-state control via OE, and analog bus enable via LSP_ACTIVE outputs compliant with IEEE 1149.4.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - Ensures compatibility with 3.3-V system logic and robust noise margin in backplane environments. |
| Local Scan Ports | 3 independent LSPs (LSP0–LSP2) - Enables concurrent or selective testing of up to three local scan chains per device. |
| Address Slots | 7-bit slot inputs (S0–S6) - Supports up to 121 unique addresses including broadcast (0x3B), multicast groups (0x3C–0x3F), and interrogation (0x3A). |
| TCK Counter | 32-bit programmable counter - Enables precise timing control and built-in self-test (BIST) execution on individual ports without halting other scan activity. |
| LFSR Compactor | 16-bit linear feedback shift register - Generates compact pass/fail signatures from serial test data, reducing result readback overhead. |
| Live Insertion | Power-off high-impedance I/O - Allows safe hot-plug operation in modular backplane systems without disrupting adjacent modules. |
| IEEE Standards | Fully compliant with IEEE 1149.1 (JTAG) and supports IEEE 1149.4 analog bus signaling via LSP_ACTIVE outputs. |
Pinout & Package
SCANSTA111MTX/NOPB is housed in a 48-pin TSSOP (Thin Shrink Small Outline Package) with 0.5-mm pitch, RoHS-compliant and lead-free (NOPB suffix). The package supports automated optical inspection and fine-pitch PCB assembly in high-density backplane applications.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG interface | Primary IEEE 1149.1 signals connecting to system test master; TDOB has 24 mA drive for bus termination. |
| S0–S6 | Slot identification inputs | Hardwired 7-bit address defining unique identity in multidrop network; no pull-ups required. | OE | Local port output enable | Active-low signal forcing all LSP0–LSP2 outputs into high-impedance, enabling alternate test resource takeover. |
| TCK0–TCK2, TMS0–TMS2, TDI0–TDI2, TDO0–TDO2, TRST0–TRST2 | Local scan port signals | Full 4-signal (plus TRST) JTAG interfaces per port; each TCK output is buffered from TCKB. |
| LSP_ACTIVE0–LSP_ACTIVE2 | Analog bus enable outputs | 12 mA drive signals activating IEEE 1149.4-compliant analog test busses or LVDS/TTL level translators. |
| TRISTB, TRIST0–TRIST2 | Tri-state notification outputs | Indicate when associated TDO pins enter high-Z state-critical for coordinating multi-master arbitration. |
Key Features
| Feature | Design Value |
|---|---|
| Multidrop hierarchical addressing | Enables scalable test architecture across dozens of boards using single backplane JTAG bus-no daisy-chaining required. |
| Per-port parking/unparking | Allows dynamic isolation or inclusion of individual local scan chains (LSP0–LSP2) into active scan path without resetting entire system. |
| Transparent mode activation | Single-instruction buffer pass-through from backplane pins (TDIB/TMSB/TCKB/TRSTB) to one selected LSP-simplifies debug and FPGA programming. |
| General-purpose pass-through bits | A0/A1 and Y0/Y1 support FPGA configuration pulses or status monitoring between backplane and local devices-no extra GPIO IC needed. |
| Known power-up state | Guaranteed reset to Wait-For-Address + Parked-TLR states ensures deterministic initialization-eliminates boot-time scan uncertainty. |
Applications
| Backplane-Based Modular Systems | High-Availability Telecom Chassis |
|---|---|
Use Scenario: Multiple line cards plug into a central test backplane with shared JTAG infrastructure. IC Role / Device Role / Timing Role: SCANSTA111MTX/NOPB acts as addressable scan bridge, routing test data between backplane master and local card-level scan chains. Use Value: Enables board-level test continuity during field replacement-removing one card does not break scan access to others. | Use Scenario: Carrier-grade chassis with redundant switching and processing modules requiring in-service diagnostics. IC Role / Device Role / Timing Role: SCANSTA111MTX/NOPB provides IEEE 1149.4-compliant analog bus enable (via LSP_ACTIVE) for mixed-signal health monitoring. Use Value: Supports live insertion/withdrawal while maintaining boundary-scan visibility across all active modules-no service interruption. |
| Automated Test Equipment (ATE) Integration | FPGA-Based Reconfigurable Computing Racks |
Use Scenario: ATE system tests multiple DUT boards simultaneously using a single JTAG controller. IC Role / Device Role / Timing Role: SCANSTA111MTX/NOPB serves as Level-1 address decoder and Level-2 register controller for parallel scan chain management. Use Value: Reduces test time by enabling broadcast-initiated BIST (via 32-bit TCK counter) followed by individual result readback. | Use Scenario: Rack-mounted FPGA accelerators require post-configuration boundary-scan validation and runtime reprogramming support. IC Role / Device Role / Timing Role: SCANSTA111MTX/NOPB delivers transparent mode pass-through (AB/YB, A0/Y0) for FPGA configuration pulses and status feedback. Use Value: Eliminates need for separate level-shifting or pulse-generation circuitry-saves board space and improves signal integrity. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop scan bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112MTX/NOPB | Same pinout and core functionality; adds enhanced diagnostic registers and improved glitch filtering on slot inputs. | Preferred for new designs requiring higher reliability in electrically noisy backplanes. | Select SCANSTA112MTX/NOPB if long-term obsolescence mitigation and extended diagnostics are prioritized over cost. |
| SN74ACT573N | Octal transparent latch-not IEEE 1149.1-compliant; no scan bridging, addressing, or TAP control logic. | Only suitable for basic signal buffering-not a functional alternative for JTAG multidrop extension. | Not recommended as direct alternative; use only for non-scan digital glue logic where JTAG features are irrelevant. |
Compared with SCANSTA111MTX/NOPB, SCANSTA112MTX/NOPB offers backward-compatible enhancements for noise immunity and diagnostics, while SN74ACT573N lacks all scan bridge functionality and cannot replace it in IEEE 1149.1 test architectures.
Availability
SCANSTA111MTX/NOPB is available at Aetrix Electronics and suitable for backplane-based modular systems, high-availability telecom chassis, and automated test equipment requiring stable component supply and long-lifecycle support.
Supply support for SCANSTA111MTX/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies with over 50 years of innovation in test and measurement ICs.
The SCANSTA111MTX/NOPB belongs to TI's IEEE 1149.x boundary-scan infrastructure product line, designed specifically to solve multidrop JTAG scalability, hierarchical test partitioning, and live-insertion challenges in carrier-grade and industrial backplane systems.
FAQ
What is the primary function of the SCANSTA111MTX/NOPB in a JTAG test system?
The SCANSTA111MTX/NOPB functions as an IEEE 1149.1-enhanced multidrop scan bridge that enables a single test master to selectively address and control up to 121 devices across a shared backplane JTAG bus. It manages three local scan ports (LSP0–LSP2), supports hierarchical scan trees, and implements Level-1 (addressing) and Level-2 (port control) protocols-making SCANSTA111MTX/NOPB essential for scalable, modular boundary-scan test infrastructure.
Does the SCANSTA111MTX/NOPB support IEEE 1149.4 analog test bus functionality?
Yes, the SCANSTA111MTX/NOPB supports IEEE 1149.4 through its LSP_ACTIVE0–LSP_ACTIVE2 outputs, which provide 12 mA drive capability to enable analog test busses or physical-layer translators (e.g., TTL-to-LVDS). These outputs are synchronized with local TAP controller states and are explicitly documented in the SNLS060K datasheet as compliant with IEEE 1149.4 requirements-confirming SCANSTA111MTX/NOPB's role in mixed-signal test environments.
How many unique addresses can the SCANSTA111MTX/NOPB support, and how are they assigned?
The SCANSTA111MTX/NOPB supports 121 unique addresses via its 7-slot inputs (S0–S6), plus reserved addresses for interrogation (0x3A), broadcast (0x3B), and four multicast groups (0x3C–0x3F). Addresses are statically assigned by hardwiring S0–S6 to VCC or GND; no software configuration is required. The datasheet confirms address matching occurs on the 7 LSBs of the instruction register during Update-IR, making SCANSTA111MTX/NOPB's addressing scheme deterministic and layout-controlled.
Can the SCANSTA111MTX/NOPB operate during live insertion or removal of a board?
Yes, the SCANSTA111MTX/NOPB supports live insertion/withdrawal per its datasheet specification. Its inputs and outputs enter high-impedance states when VCC = 0 V or floating, preventing bus contention or back-driving. This behavior-verified in the PIN DESCRIPTIONS section for TMSB, TDIB, TDOB, and TCKB-is intrinsic to SCANSTA111MTX/NOPB's design and requires no external circuitry, enabling hot-swap capability in telecom and modular computing systems.
What is the purpose of the 32-bit TCK counter in the SCANSTA111MTX/NOPB?
The 32-bit TCK counter in the SCANSTA111MTX/NOPB enables precise clock-gating and timing control for built-in self-test (BIST) operations on individual local scan ports. It allows SCANSTA111MTX/NOPB to execute autonomous test sequences-such as toggling TCK for a defined number of cycles-while other ports remain active. This feature is documented in the FEATURES list and REGISTER SET table (CNTR register), confirming SCANSTA111MTX/NOPB's ability to offload timing-critical BIST tasks from the system test master.
SCANSTA111MTX/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 48-TFSOP (0.240", 6.10mm Width)
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 48-TSSOP
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111MTX/NOPB FAQ
1.How can I place an order for SCANSTA111MTX/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111MTX/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111MTX/NOPB reliable?
The price and inventory of SCANSTA111MTX/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111MTX/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA111MTX/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111MTX/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111MTX/NOPB?
SCANSTA111MTX/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111MTX/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111MTX/NOPB?
For technical support, including SCANSTA111MTX/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111MTX/NOPB requirements.
6.How does Aetrix verify that SCANSTA111MTX/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA111MTX/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111MTX/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA111MTX/NOPB?
All SCANSTA111MTX/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111MTX/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111MTX/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA111MTX/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
SCANSTA111MTX/NOPB Tags
-
NVT4857UKAZ
NXP Semiconductors
-
TCA8418RTWR
Texas Instruments
-
PCA9546APWR
Texas Instruments
-
MD0100N8-G
Microchip Technology
-
PCA9548APW,118
NXP Semiconductors
-
PCA9540BDP,118
NXP Semiconductors
-
PCA9548APWR
Texas Instruments
-
PCA9546APW,118
NXP Semiconductors
-
PTN3360DBS,518
NXP Semiconductors
-
PCA9546ABS,118
NXP Semiconductors
-
PCA9518PWR
Texas Instruments
-
PCA9545APW,118
NXP Semiconductors
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
