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Texas Instruments SCANSTA111SM
- Part No.:
- SCANSTA111SM
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 49-LFBGA
- Datasheet:
-
SCANSTA111SM.pdf
- Description:
- IC INTERFACE SPECIALIZED 49BGA
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Product details
Overview
SCANSTA111SM from Texas Instruments is an IEEE 1149.1-compliant multidrop addressable SCAN bridge IC that extends JTAG test access across backplane-based modular systems. It supports up to three local scan ports (LSP0–LSP2), 7-bit slot addressing for up to 121 unique devices, and transparent mode for backplane-to-local port buffering. It enables hierarchical boundary-scan tree architectures in telecom and industrial backplane test systems.
For engineers reviewing the SCANSTA111SM datasheet, SCANSTA111SM pinout, SCANSTA111SM application, or SCANSTA111SM equivalent, key selection criteria include multidrop addressability, local TAP parking/unparking control, LSP active enable signaling for IEEE 1149.4 analog busses, 32-bit TCK counter for BIST, and TRIST notification outputs for tri-state coordination during alternate master takeover.
Technical Context
The SCANSTA111SM implements three tightly coupled state machines: a 16-state IEEE 1149.1 TAP controller, a Level-1 selection controller for 7-bit slot address matching (S0–S6), and three independent local scan port controllers (LSPC) managing park/unpark states per port. Address validation occurs in Update-IR, triggering transition from Wait-For-Address to Selected-Single or Selected-Multicast.
Level-2 protocol operations-including UNPARK, PARKRTI, MODESEL, and LFSRON-are executed only after successful Level-1 selection. Each LSP supports full IEEE 1149.1 signals (TCK/TMS/TDI/TDO/TRST), with TCK(0–2) buffered from TCKB, and LSP_ACTIVE(0–2) outputs enabling analog test busses per IEEE 1149.4. The 16-bit LFSR performs signature compaction on scanned data.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - ensures compatibility with 3.3-V system logic and eliminates level-shifting in backplane JTAG interfaces. |
| Slot Inputs | 7-pin (S0–S6) - provides 121 unique device addresses plus interrogation, broadcast, and four multicast group codes. |
| Local Scan Ports | 3 independent LSPs (LSP0–LSP2) - each delivers full TCK/TMS/TDI/TDO/TRST with 24-mA drive strength for direct connection to local TAPs. |
| TCK Counter | 32-bit - enables precise built-in self-test timing and deterministic clock-gating control per local port during concurrent scan operations. |
| LFSR | 16-bit linear feedback shift register - compresses serial test response data into compact signatures for pass/fail evaluation without full data capture. |
| Live Insertion | Supported - power-off high-impedance I/Os and capacitive-load behavior on TMSB/TDIB/TRSTB allow hot-plug operation in modular chassis environments. |
| TRIST Outputs | 4 total (TRISTB + TRIST0–TRIST2) - signal when associated TDO pins enter high-impedance state, enabling safe arbitration between primary and alternate test masters. |
Pinout & Package
SCANSTA111SM is housed in a 48-pin SOIC (Small Outline Integrated Circuit) package with 300-mil body width and standard JEDEC MS-012AC footprint. Pin assignments are validated per TI SNLS060K Rev. April 2013 datasheet.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG Interface | Master-level IEEE 1149.1 signals connecting to system test controller; TDOB provides 24-mA drive for daisy-chained backplane topology. |
| S0–S6 | Slot Address Inputs | Hardwired 7-bit address defining unique identity in multidrop network; no pull-ups required - internal configuration determines selection eligibility. |
| TDO0–TDO2, TDI0–TDI2, TMS0–TMS2, TCK0–TCK2, TRST0–TRST2 | Local Scan Port Signals | Three fully isolated IEEE 1149.1 ports driving local board-level scan chains; all outputs rated for 24-mA drive to meet VIH/VIL margins of downstream TAPs. |
| LSP_ACTIVE0–LSP_ACTIVE2 | Analog Bus Enable | Open-drain or push-pull outputs (12-mA) used to activate IEEE 1149.4 analog test busses or control physical layer translators (e.g., TTL-to-LVDS). |
| OE | Local Port Output Enable | Active-low global control forcing all LSP outputs into high-impedance - allows external test resource to seize control of local scan chains without hardware reconfiguration. |
| TRISTB, TRIST0–TRIST2 | Tri-State Notification | Asserted-high indicators confirming when TDOB or local TDOx pins enter high-Z state - critical for synchronizing multi-master handoff sequences. |
Key Features
| Feature | Design Value |
|---|---|
| Multidrop Addressing | Supports up to 121 uniquely addressed SCANSTA111SM units on one backplane via 7-slot inputs, enabling scalable system-level test without serial chain bottlenecks. |
| Park/Unpark Control | Each LSP can be independently parked in stable TAP states (TLR, RTI, Pause-DR/IR) to isolate local scan chains or unparked to insert them into active scan path - essential for partitioned testing. |
| Transparent Mode | Single-instruction activation routes backplane JTAG signals (TCKB/TMSB/TDIB) directly to one selected LSP's outputs - simplifies debug and FPGA programming without full scan chain traversal. |
| IEEE 1149.4 Support | LSP_ACTIVE outputs provide synchronized enable signals for analog test busses, satisfying timing and voltage requirements of mixed-signal boundary-scan standards. |
| Alternate Master Handoff | OE input + TRIST outputs allow seamless transfer of local scan port control to secondary test resources - avoids bus contention and enables hybrid test strategies. |
Applications
| Telecom Line Card Test | Industrial Backplane Diagnostics |
|---|---|
Use Scenario: Testing multiple line cards plugged into a central switching chassis using shared backplane JTAG infrastructure. IC Role / Device Role / Timing Role: SCANSTA111SM acts as addressable bridge between chassis-level test controller and card-specific scan chains, enabling selective activation of individual cards' boundary-scan logic. Use Value: Eliminates need to disconnect cards for test; preserves system-level connectivity while delivering per-card fault isolation and programmable FPGA configuration via LSP0–LSP2. | Use Scenario: Validating inter-board communication integrity and power sequencing in modular PLC or DCS rack systems. IC Role / Device Role / Timing Role: SCANSTA111SM serves as hierarchical node in multi-tier scan tree - root-layer devices route test traffic to second-tier SCANSTA111SMs on expansion modules. Use Value: Enables incremental test coverage: first verify backplane wiring, then validate local module functionality, all under unified IEEE 1149.1 protocol without custom firmware. |
| High-Availability Server Blade Validation | FPGA-Based Accelerator Board Bring-Up |
Use Scenario: Performing in-system JTAG verification of hot-swappable server blades in carrier-grade compute platforms. IC Role / Device Role / Timing Role: SCANSTA111SM manages live insertion detection and isolates blade-level scan chains during insertion/removal using OE-controlled tri-state and power-off high-Z I/Os. Use Value: Maintains test access to remaining blades during maintenance; prevents backplane signal corruption during dynamic reconfiguration events. | Use Scenario: Programming and verifying Xilinx/Intel FPGAs on PCIe accelerator cards using boundary-scan and pass-through GPIO for configuration pulses. IC Role / Device Role / Timing Role: SCANSTA111SM provides dedicated LSP for FPGA JTAG interface and uses A0/A1/Y0/Y1 pass-through bits to deliver precise write strobes and monitor status flags. Use Value: Replaces discrete logic for FPGA config control; integrates JTAG routing, status monitoring, and pulse generation within single IC - reducing board area and routing complexity. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112SM | Same pinout and core architecture but adds eighth address bit (S7) support and HDL-configurable GPIO registers not present in SCANSTA111SM. | Required only when >121 device addresses or programmable shared/dedicated GPIO are needed; otherwise functionally identical for standard multidrop use. | Select SCANSTA112SM only if future scalability beyond 7-bit addressing or enhanced GPIO flexibility is confirmed in system architecture. |
| SN74ABT16244 | Non-JTAG 16-bit buffer with 3-state control - lacks IEEE 1149.1 compliance, address decoding, LSP control, or TAP state management logic. | Only suitable for basic signal buffering where no scan-chain extension, parking, or hierarchical test features are required. | Use SN74ABT16244 only for non-boundary-scan signal fanout; it cannot replace SCANSTA111SM in any IEEE 1149.1-compliant test architecture. |
Compared with SCANSTA111SM, SCANSTA112SM offers expanded addressing headroom and configurable GPIO at identical pinout and cost, while SN74ABT16244 provides only passive buffering - making it unsuitable for any application requiring JTAG protocol extension, multidrop selection, or scan chain orchestration.
Availability
SCANSTA111SM is available at Aetrix Electronics and suitable for telecom line card validation, industrial backplane diagnostics, and high-availability server blade testing requiring stable component supply and long-term lifecycle support.
Supply support for SCANSTA111SM includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies with over 50 years of innovation in industrial, automotive, and communications markets.
The SCANSTA111SM belongs to TI's IEEE 1149.x test infrastructure product line, engineered specifically to solve multidrop JTAG scalability, hierarchical scan tree construction, and live-insertion-aware test access in modular electronic systems.
FAQ
What is the primary function of the SCANSTA111SM in a JTAG test architecture?
The SCANSTA111SM functions as an IEEE 1149.1-compliant multidrop addressable bridge that extends JTAG test access across backplane-connected boards. It enables selective activation of up to three local scan ports per device using 7-bit slot addressing, allowing system-level test controllers to isolate and test individual modules without disrupting others. Its core value lies in replacing long serial scan chains with parallel, addressable paths - directly implemented in the SCANSTA111SM's selection controller and LSP network.
Does the SCANSTA111SM support IEEE 1149.4 mixed-signal test bus functionality?
Yes, the SCANSTA111SM supports IEEE 1149.4 through its LSP_ACTIVE(0–2) outputs, which provide synchronized enable signals for analog test busses. These outputs drive analog switches or level translators in compliance with 1149.4 timing and voltage requirements. The SCANSTA111SM does not implement analog stimulus/response circuitry itself but delivers the precise control signals needed to activate external 1149.4-compliant analog resources - a capability confirmed in TI SNLS060K Section 1.1 and Pin Descriptions.
How does the SCANSTA111SM handle live insertion and removal of boards in a chassis?
The SCANSTA111SM supports live insertion via power-off high-impedance inputs and outputs, including TMSB, TDIB, and TRSTB, which behave as capacitive loads to ground when VCC = 0 V. This prevents signal contention or latch-up during hot-plug events. Additionally, the OE input allows immediate tri-stating of all local scan ports upon insertion detection, ensuring no unintended interaction with upstream test controllers until initialization completes - a design feature explicitly documented in TI SNLS060K Section 4.
Can the SCANSTA111SM operate in transparent mode, and what is its practical use?
Yes, the SCANSTA111SM supports transparent mode, activated by a single instruction that routes backplane JTAG signals (TCKB/TMSB/TDIB) directly to one selected local scan port's outputs. This bypasses internal scan chain logic and enables real-time debugging, FPGA configuration, or device programming without loading instruction registers or managing park/unpark states. Transparent mode is especially valuable during bring-up when full boundary-scan infrastructure is not yet operational - a capability verified in TI SNLS060K Features list and Application Overview.
What is the role of the 32-bit TCK counter in the SCANSTA111SM?
The 32-bit TCK counter in the SCANSTA111SM provides precise clock-cycle tracking for built-in self-test (BIST) operations on individual local scan ports. It enables deterministic gating of TCK(0–2) outputs during concurrent testing - for example, pausing clock delivery to LSP1 while scanning LSP0 and LSP2. This capability is essential for time-sensitive diagnostic routines and is accessed via the CNTR register per TI SNLS060K Register Set section, ensuring repeatable, cycle-accurate test execution within the SCANSTA111SM.
SCANSTA111SM Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 49-LFBGA
- Packaging:
- Bulk
- Product Status:
- Not For New Designs
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 49-NFBGA (7x7)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111SM FAQ
1.How can I place an order for SCANSTA111SM through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111SM on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111SM reliable?
The price and inventory of SCANSTA111SM are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111SM is usually 5 days.
3.What payment methods are accepted for SCANSTA111SM?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111SM transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111SM?
SCANSTA111SM orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111SM order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111SM?
For technical support, including SCANSTA111SM datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111SM requirements.
6.How does Aetrix verify that SCANSTA111SM is sourced from the original manufacturer or authorized distributors?
All SCANSTA111SM products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111SM meets industry standards.
7.What is the process for return or replacement of SCANSTA111SM?
All SCANSTA111SM units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111SM, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111SM part is unused and in its original packaging.
Return procedure for SCANSTA111SM:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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