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Texas Instruments SCANSTA111SM/NOPB
- Part No.:
- SCANSTA111SM/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 49-LFBGA
- Datasheet:
-
SCANSTA111SM/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 49BGA
- Quantity:
- Payment:
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Product details
Overview
SCANSTA111SM/NOPB from Texas Instruments is an IEEE 1149.1-enhanced multidrop scan bridge IC supporting hierarchical JTAG test architecture. It provides three configurable local scan ports (LSP0–LSP2), 7-bit slot addressing for up to 121 unique devices, and Level 1/Level 2 protocol support for selective access in backplane-based test systems. Used in high-availability telecom and industrial backplanes requiring live insertion and modular board-level test isolation.
For engineers reviewing the SCANSTA111SM/NOPB datasheet, SCANSTA111SM/NOPB pinout, SCANSTA111SM/NOPB application, or SCANSTA111SM/NOPB equivalent, key selection criteria include multidrop addressability, TRST-enabled local TAP control, transparent mode buffering, LSP_ACTIVE analog bus enable outputs, and 3.3V-compatible I/O with power-off high-impedance behavior.
Technical Context
The SCANSTA111SM/NOPB implements three coupled state machines: a TAP controller compliant with IEEE 1149.1, a Level-1 selection controller for 7-slot address matching (S0–S6), and three independent local port configuration controllers (one per LSP) enabling individual park/unpark transitions into stable TAP states (TLR, RTI, Pause-DR, Pause-IR). Addressing uses scanned instruction register bits 6:0 compared against hardwired slot inputs.
Level-2 protocol operates only after successful Level-1 selection and supports IEEE 1149.1 instructions (EXTEST, SAMPLE/PRELOAD, IDCODE) plus proprietary commands (UNPARK, PARKRTI, MCGRSEL, LFSRON). Each LSP delivers full boundary-scan signals (TCK/TMS/TDI/TDO/TRST) with 24mA drive strength, while TDOB provides 24mA buffered backplane output with TRI-STATE capability during broadcast/multicast operations.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - Ensures compatibility with 3.3V system logic and eliminates level-shifting in mixed-voltage backplanes. |
| Local Scan Ports | 3 independent IEEE 1149.1-compliant ports (LSP0–LSP2) - Enables concurrent or isolated testing of up to three local scan chains per device. |
| Slot Address Inputs | 7-pin binary address (S0–S6) - Supports up to 121 uniquely addressable SCANSTA111SM/NOPB units on one backplane. |
| TCK Counter | 32-bit programmable counter - Enables precise clock-gated BIST execution on selected LSPs without halting other scan operations. |
| LFSR Compactor | 16-bit linear feedback shift register - Provides signature analysis for compact pass/fail result reporting across multiple boards in broadcast mode. |
| TRST Support | Asynchronous active-low TRSTB input + gated TRST0–TRST2 outputs - Allows synchronized reset of local TAP controllers while preserving backplane master control. |
| Live Insertion | Power-off high-impedance I/O with capacitive-load behavior at VCC = 0V - Permits hot-plug operation in carrier-grade systems without bus contention. |
Pinout & Package
SCANSTA111SM/NOPB is housed in a 48-pin SOIC (Small Outline Integrated Circuit) package with 300-mil body width and standard 0.050" lead pitch. The package supports surface-mount reflow and meets JEDEC MS-012AC specifications.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG interface | Primary IEEE 1149.1 signals for multidrop communication; TDOB provides 24mA drive and TRI-STATE during broadcast. |
| S0–S6 | Slot identification inputs | Hardwired 7-bit address determining device identity in Level-1 addressing; no pull resistors required. |
| TCK0–TCK2, TMS0–TMS2, TDI0–TDI2, TDO0–TDO2, TRST0–TRST2 | Local scan port signals | Three fully independent JTAG ports, each with 24mA drive strength and dedicated TRST gating. |
| LSP_ACTIVE0–LSP_ACTIVE2 | Analog bus enable outputs | 12mA open-drain–compatible outputs used to enable IEEE 1149.4 analog test busses or LVDS physical layer switches. |
| OE | Local port output enable | Active-low input that places all LSP outputs (TDO/TMS/TCK/TRST) into high-impedance state, allowing alternate test masters to seize control. |
| TRISTB, TRIST0–TRIST2 | TRI-STATE notification outputs | Indicate real-time high-Z status of TDOB and local TDOs - critical for coordinating multi-master arbitration and bus sharing. |
Key Features
| Feature | Design Value |
|---|---|
| Multidrop hierarchical addressing | Supports single-device, broadcast, and four multicast group selections via Level-1 protocol - enables scalable test partitioning across large backplane systems. |
| Configurable local port insertion | Mode Register 0 allows LSPs to be bypassed, individually inserted, or serially grouped in pairs/triples - optimizes scan chain length per test phase. |
| Transparent mode buffering | Single-instruction activation routes backplane TDI/TDO/TMS/TCK directly to one selected LSP - simplifies debug trace and FPGA programming handoff. |
| IEEE 1149.4 analog bus support | LSP_ACTIVE outputs provide synchronous enable signals for analog test bus drivers - extends boundary-scan to mixed-signal subsystems. |
| General-purpose pass-through bits | A0/A1 and Y0/Y1 pins deliver write pulses or status monitoring between backplane and local LSPs - supports FPGA configuration and device health telemetry. |
Applications
| Telecom Line Card Test | Industrial PLC Backplane Diagnostics |
|---|---|
|
Use Scenario: Modular line cards are hot-swapped in carrier-class chassis; each card contains multiple ASICs and FPGAs requiring post-insertion validation. IC Role / Device Role / Timing Role: SCANSTA111SM/NOPB acts as a backplane-resident scan bridge, enabling the central tester to selectively address individual cards and route JTAG traffic to their local scan chains without disrupting adjacent modules. Use Value: Eliminates need for per-card test connectors; reduces test time by 40% vs. daisy-chained scan via shared backplane TDO. |
Use Scenario: Programmable logic controllers use distributed I/O modules connected via ruggedized backplanes where field-replaceable units must be verified before commissioning. IC Role / Device Role / Timing Role: SCANSTA111SM/NOPB serves as a hierarchical test node, allowing the system integrator to isolate and validate specific I/O modules using multicast group addressing while maintaining overall bus integrity. Use Value: Enables deterministic fault localization to sub-module level without powering down entire rack; supports ISO 13849 functional safety diagnostics. |
| Avionics LRUs with Live Maintenance | High-Availability Server Blade Validation |
|
Use Scenario: Line-replaceable units in flight control systems require in-situ boundary-scan verification during maintenance windows without aircraft power-down. IC Role / Device Role / Timing Role: SCANSTA111SM/NOPB provides power-off high-impedance I/O and live insertion support, allowing safe backplane probing and scan chain enumeration while adjacent LRUs remain operational. Use Value: Meets DO-254 Level A hardware design assurance requirements for test accessibility without compromising system availability. |
Use Scenario: Data center server blades undergo pre-deployment burn-in and functional test on shared test fixtures with dynamic topology reconfiguration. IC Role / Device Role / Timing Role: SCANSTA111SM/NOPB functions as a fixture-side scan concentrator, aggregating JTAG access from up to 121 blade slots and enabling parallel test execution via broadcast-initiated LFSR signature collection. Use Value: Reduces fixture complexity by 70%; enables per-blade pass/fail reporting without custom cabling or multiplexing hardware. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop scan bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112SM/NOPB | Same pinout and core functionality, but adds eighth address bit (S7) for 256-slot capacity and HDL-configurable GPIO registers. | Required when >121 devices per backplane or when dedicated/shared GPIO register flexibility is needed for FPGA configuration sequencing. | Select SCANSTA112SM/NOPB only if S7 address expansion or HDL-based GPIO control is explicitly required; otherwise SCANSTA111SM/NOPB offers identical performance at lower cost. |
| SN74ABT16244DGGR | Non-JTAG 16-bit buffer with 3-state control; no protocol awareness, no addressing, no LSP management or TAP state control. | Only suitable for simple signal buffering in non-test contexts; cannot replace SCANSTA111SM/NOPB in IEEE 1149.1 environments. | Not a functional alternative - use only for generic level-shifting or fanout where JTAG protocol handling is unnecessary. |
Compared with SCANSTA111SM/NOPB, SCANSTA112SM/NOPB extends address space and GPIO configurability but shares identical LSP architecture and timing behavior; SN74ABT16244DGGR lacks all scan intelligence and cannot perform any Level-1/Level-2 protocol operations, making it unsuitable as a drop-in or functional substitute.
Availability
SCANSTA111SM/NOPB is available at Aetrix Electronics and suitable for telecom line card validation, industrial PLC backplane diagnostics, and avionics LRU maintenance requiring stable component supply, long-lifecycle support, and traceable sourcing for safety-critical deployments.
Supply support for SCANSTA111SM/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with decades of heritage in test and measurement ICs.
The SCANSTA111SM/NOPB belongs to TI's IEEE 1149.x test infrastructure product line, engineered specifically for scalable, hierarchical boundary-scan architectures in high-reliability backplane systems requiring live insertion and deterministic test partitioning.
FAQ
What is the primary function of the SCANSTA111SM/NOPB in a JTAG test system?
The SCANSTA111SM/NOPB functions as an IEEE 1149.1-enhanced multidrop scan bridge that enables hierarchical test access across backplane-connected boards. It allows a single test master to selectively address individual SCANSTA111SM/NOPB devices using Level-1 protocol, then configure their three local scan ports (LSP0–LSP2) via Level-2 instructions - supporting park/unpark, broadcast, multicast, and transparent mode operations without modifying physical cabling.
Does the SCANSTA111SM/NOPB support IEEE 1149.4 analog test bus functionality?
Yes, the SCANSTA111SM/NOPB supports IEEE 1149.4 through its LSP_ACTIVE0–LSP_ACTIVE2 outputs, which provide synchronized enable signals for analog bus drivers. These 12mA outputs coordinate analog stimulus application and response capture across local scan chains, extending boundary-scan visibility to mixed-signal components like ADCs, DACs, and sensor interfaces connected to LSP0–LSP2.
How does the SCANSTA111SM/NOPB handle power-off conditions during live insertion?
The SCANSTA111SM/NOPB features power-off high-impedance I/O: when VCC = 0V or floating, all inputs (TMSB, TDIB, TRSTB) present only capacitive load to ground, and TDOB behaves as a capacitive load without leakage current. This prevents bus contention and ensures safe hot-plug operation in carrier-grade and avionics systems where modules are inserted/removed under power.
Can the SCANSTA111SM/NOPB operate with a 2.5V backplane interface?
No - the SCANSTA111SM/NOPB requires a 3.0 V to 3.6 V VCC supply and is not 2.5V-tolerant. Its backplane I/O (TMSB, TDIB, TCKB, TRSTB) and local port drivers are designed for 3.3V logic levels. Interfacing with 2.5V systems requires external level translation; the device does not support mixed-voltage operation natively.
What is the role of the 32-bit TCK counter in SCANSTA111SM/NOPB test operations?
The 32-bit TCK counter in SCANSTA111SM/NOPB enables precise clock-gated built-in self-test (BIST) execution on selected local scan ports. When enabled via CNTRON instruction, it counts TCKB edges independently per LSP, allowing deterministic test duration control - for example, running a fixed number of clock cycles on LSP1 while simultaneously scanning data through LSP0 and LSP2 without interference.
SCANSTA111SM/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 49-LFBGA
- Packaging:
- Tray
- Product Status:
- Active
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 49-NFBGA (7x7)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111SM/NOPB FAQ
1.How can I place an order for SCANSTA111SM/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111SM/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111SM/NOPB reliable?
The price and inventory of SCANSTA111SM/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111SM/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA111SM/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111SM/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111SM/NOPB?
SCANSTA111SM/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111SM/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111SM/NOPB?
For technical support, including SCANSTA111SM/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111SM/NOPB requirements.
6.How does Aetrix verify that SCANSTA111SM/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA111SM/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111SM/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA111SM/NOPB?
All SCANSTA111SM/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111SM/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111SM/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA111SM/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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