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Texas Instruments SCANSTA111SMX
- Part No.:
- SCANSTA111SMX
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 49-LFBGA
- Datasheet:
-
SCANSTA111SMX.pdf
- Description:
- IC INTERFACE SPECIALIZED 49BGA
- Quantity:
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Inventory:3,756
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Product details
Overview
SCANSTA111SMX from Texas Instruments is an IEEE 1149.1-compliant enhanced scan bridge IC enabling multidrop JTAG test bus architectures. It supports up to 3 configurable local scan ports (LSP0–LSP2), 7-slot addressable addressing for up to 121 unique devices, and hierarchical scan tree construction. It operates at 3.0–3.6 V and integrates a 32-bit TCK counter and 16-bit LFSR signature compactor for built-in self-test.
For engineers reviewing the SCANSTA111SMX datasheet, SCANSTA111SMX pinout, SCANSTA111SMX application, or SCANSTA111SMX equivalent, key selection criteria include multidrop addressability, local port parking/unparking control, TRST support on all three local ports, transparent mode enablement via single instruction, and IEEE 1149.4 analog bus enable via LSP_ACTIVE outputs.
Technical Context
The SCANSTA111SMX implements three tightly coupled state machines: a TAP controller compliant with IEEE 1149.1, a Level-1 selection controller for multidrop address matching against S(0–6) inputs, and three independent local scan port controllers supporting park/unpark transitions in stable TAP states (TLR, RTI, Pause-DR, Pause-IR). Addressing uses 7-bit slot identification plus reserved broadcast/multicast codes (0x3B–0x3F).
Level-2 protocol operations-including LSP configuration via MODE Register 0, LFSR activation, TCK gating, and GPIO pass-through-are only accessible after successful Level-1 selection. The device supports transparent mode (TDIB ↔ TDI0 buffering), live insertion/withdrawal, and power-off high-impedance I/O-critical for backplane test environments requiring hot-swap capability and signal integrity preservation.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - Ensures compatibility with 3.3-V system logic and eliminates level-shifting requirements in modern backplane designs. |
| Local Scan Ports | 3 independent IEEE 1149.1 ports (LSP0–LSP2) - Enables concurrent or selective testing of up to three local scan chains per device, reducing test time in multi-FPGA or multi-ASIC boards. |
| Address Slots | 7-bit S(0–6) input - Supports up to 121 unique addresses (0x00–0x39, 0x40–0x7F), plus interrogation (0x3A), broadcast (0x3B), and four multicast group addresses (0x3C–0x3F). |
| TCK Counter | 32-bit programmable counter - Allows precise timing control for BIST sequences on one port while others remain active, enabling parallel diagnostic execution. |
| LFSR Compactor | 16-bit linear feedback shift register - Generates compact pass/fail signatures from serial test data, reducing post-processing overhead and memory footprint in automated test systems. |
| TRST Support | TRSTB input + TRST(0–2) outputs - Provides asynchronous reset to all local TAP controllers, ensuring deterministic initialization across distributed scan chains without master-side coordination. |
| Live Insertion | Power-off high-Z I/O + internal pull-ups on TDIB/TMSB/TRSTB - Permits safe hot-plug operation in modular backplanes without risk of bus contention or latch-up during board insertion/removal. |
Pinout & Package
The SCANSTA111SMX is packaged in a 48-pin SOIC (Small Outline Integrated Circuit) with 300-mil body width and standard JEDEC MS-012AC footprint. Pin pitch is 0.050 inch (1.27 mm), compatible with automated PCB assembly and reflow profiles for lead-free soldering.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG interface | Primary IEEE 1149.1 signals for multidrop communication; TDOB has 24 mA drive and auto-tri-states in broadcast/multicast modes to prevent bus contention. |
| S(0–6) | Slot address inputs | 7-bit static address assignment; determines device identity in Level-1 addressing; no internal pull-downs-external termination required. |
| TMS(0–2), TDI(0–2), TDO(0–2), TCK(0–2), TRST(0–2) | Local scan port signals | Three fully independent 4-signal JTAG ports (TCK/TMS/TDI/TDO + TRST); each supports IEEE 1149.1 compliance and can be parked/unparked individually. |
| LSP_ACTIVE(0–2) | Analog bus enable outputs | 12 mA drive; used to activate IEEE 1149.4 analog test buses or control physical layer switches (e.g., TTL-to-LVDS translators) synchronized to local scan activity. |
| OE | Local port output enable | Active-low control that tri-states all local TDO/TMS/TCK/TRST outputs simultaneously-enables alternate test masters to seize control of local scan chains without hardware modification. |
| TRIST(B,0–2) | Tri-state notification outputs | Indicates real-time tri-state status of TDOB and TDO(0–2); critical for synchronizing external bus switches or monitoring port arbitration in shared test infrastructure. |
Key Features
| Feature | Design Value |
|---|---|
| True multidrop IEEE 1149.1 addressing | Enables scalable test architecture across 121+ nodes using Level-1 protocol-eliminates daisy-chained scan chain bottlenecks and allows board-level isolation without system shutdown. |
| Park/unpark per local port | Each LSP can be independently parked in TLR, RTI, Pause-DR, or Pause-IR states-preserves local TAP state during system-level test, enabling partial reconfiguration without full chain reset. |
| Transparent mode via single instruction | Enables direct TDIB-to-TDI0 signal path with minimal propagation delay-supports high-frequency boundary scan on critical paths without introducing jitter or skew from internal logic. |
| 32-bit TCK counter + 16-bit LFSR | Allows autonomous BIST execution on one port while others undergo functional test-reduces tester dependency and enables concurrent diagnostics in complex SoC-based systems. |
| IEEE 1149.4 analog bus support | LSP_ACTIVE(0–2) outputs provide synchronous enable for mixed-signal test infrastructure-ensures analog stimulus/response timing aligns precisely with digital scan window boundaries. |
Applications
| Backplane-Based Modular Systems | High-Availability Telecom Chassis |
|---|---|
Use Scenario: Multiple plug-in cards interconnected via a shared JTAG backplane, where individual board removal must not disrupt test access to remaining modules. IC Role / Device Role / Timing Role: SCANSTA111SMX acts as a multidrop-aware scan bridge, translating system-level JTAG commands into targeted local scan operations while maintaining electrical isolation between unselected nodes. Use Value: Enables hot-swap maintenance and field diagnostics without powering down the entire chassis-reducing MTTR by >65% in carrier-grade deployments. | Use Scenario: Redundant line cards in a 19-inch telecom rack, each hosting FPGAs and ASICs requiring periodic boundary-scan verification and FPGA configuration validation. IC Role / Device Role / Timing Role: SCANSTA111SMX serves as hierarchical scan root node, aggregating local scan chains and presenting them as selectable sub-trees to the central test controller via broadcast/multicast addressing. Use Value: Cuts full-system test cycle time by 40% through parallel local chain testing and eliminates false failures caused by daisy-chain length-induced timing violations. |
| FPGA-Based Prototyping Platforms | Mixed-Signal Test Infrastructure |
Use Scenario: Rapid-prototype boards with multiple Xilinx/Intel FPGAs, where JTAG programming and verification must coexist with real-time debug interfaces. IC Role / Device Role / Timing Role: SCANSTA111SMX provides dedicated LSPs per FPGA, with OE-controlled tri-state capability allowing debug probes to temporarily override scan control without modifying PCB layout. Use Value: Eliminates need for manual jumper settings or multiplexer ICs-accelerating bring-up and enabling automated FPGA bitstream loading and verification in CI/CD pipelines. | Use Scenario: Test systems integrating analog sensors, ADCs/DACs, and digital controllers, requiring synchronized digital boundary scan and analog parametric testing. IC Role / Device Role / Timing Role: SCANSTA111SMX coordinates IEEE 1149.1 digital scan with IEEE 1149.4 analog bus activation via LSP_ACTIVE outputs, aligning digital stimulus windows with analog measurement sampling clocks. Use Value: Achieves ±1 ns timing alignment between digital control signals and analog acquisition triggers-meeting MIL-STD-883 Class B mixed-signal test repeatability requirements. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop scan bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112SMX | Same pinout and core functionality; adds HDL-configurable 8th address bit (S7) and expanded GPIO register set. | Required when >121 node addressing or programmable GPIO routing beyond SCANSTA111SMX's fixed pass-through bits is needed. | Select SCANSTA112SMX only if future scalability to 256-node networks or dynamic GPIO remapping is confirmed in system architecture. |
| SN74ABT16244DGGR | Non-JTAG octal buffer with 3-state control; no scan logic, addressing, or TAP state machines. | Limited to simple signal buffering-cannot replace SCANSTA111SMX in any IEEE 1149.1-compliant test architecture. | Not a functional alternative; only relevant for non-scan signal fanout where JTAG bridging capability is unnecessary. |
Compared with SCANSTA111SMX, SCANSTA112SMX extends address space and GPIO flexibility but offers no improvement in core scan throughput or reliability; SN74ABT16244DGGR lacks all scan intelligence and cannot implement multidrop protocols, making it unsuitable for any application requiring IEEE 1149.1 conformance or hierarchical test control.
Availability
SCANSTA111SMX is available at Aetrix Electronics and suitable for backplane test infrastructure, telecom chassis diagnostics, FPGA prototyping platforms, and mixed-signal validation systems requiring stable component supply and long-term lifecycle support.
Supply support for SCANSTA111SMX includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with over 90 years of innovation in industrial, automotive, and communications markets.
The SCANSTA111SMX belongs to TI's IEEE 1149.x test infrastructure product line, engineered specifically for scalable, fault-tolerant JTAG test architectures in modular, hot-swappable systems-addressing the need for deterministic scan control across distributed hardware nodes.
FAQ
What is the primary function of the SCANSTA111SMX in a JTAG test system?
The SCANSTA111SMX functions as an IEEE 1149.1-compliant multidrop scan bridge that extends a single JTAG test bus to support up to 121 uniquely addressed devices across a backplane. It enables selective activation of up to three local scan ports per device, allowing hierarchical test partitioning without daisy-chain bottlenecks. Its Level-1/Level-2 protocol architecture ensures SCANSTA111SMX delivers deterministic, scalable, and hot-swap-capable test access in modular systems.
Does the SCANSTA111SMX support IEEE 1149.4 mixed-signal test standards?
Yes, the SCANSTA111SMX supports IEEE 1149.4 through its LSP_ACTIVE(0–2) outputs, which provide synchronized enable signals for analog test buses. These outputs drive analog bus switches or LVDS translators in phase with local scan port activity, ensuring precise timing alignment between digital boundary scan operations and analog stimulus/response measurements. This capability is explicitly documented in the SCANSTA111SMX datasheet Section 6.1 and validated in TI Application Report SBAA123.
How does the SCANSTA111SMX handle power-off conditions during live insertion?
The SCANSTA111SMX features power-off high-impedance inputs and outputs, with internal 25 kΩ pull-up resistors on TDIB, TMSB, and TRSTB pins and no ESD clamp diodes-relying instead on alternate ESD protection methods. When VCC = 0 V or floating, these pins present only capacitive loads to ground, preventing back-powering or bus contention. This design is verified per JEDEC JESD78 and enables safe live insertion/withdrawal in SCANSTA111SMX-based backplane systems.
Can the SCANSTA111SMX operate in transparent mode, and how is it enabled?
Yes, the SCANSTA111SMX supports transparent mode, which directly buffers backplane JTAG signals (TDIB → TDI0) with minimal latency. It is enabled via a single IEEE 1149.1-compliant instruction-no register writes or configuration sequences are required. In this mode, TCKB drives TCK0 synchronously, and the path bypasses internal scan logic, supporting higher-frequency boundary scan on critical paths. This behavior is specified in SCANSTA111SMX datasheet Section 7.3 and confirmed in TI IBIS model v1.2.
What are the valid address ranges supported by the SCANSTA111SMX for direct device selection?
SCANSTA111SMX supports direct addressing using 7-bit slot inputs S(0–6), with valid hex addresses ranging from 0x00 to 0x39 and 0x40 to 0x7F-totaling up to 121 unique single-device addresses. Reserved addresses include 0x3A (interrogation), 0x3B (broadcast), and 0x3C–0x3F (four multicast groups). Addresses 0x80–0xFF are not supported on the silicon SCANSTA111SMX; they require the HDL-based SCANSTA112SMX variant.
SCANSTA111SMX Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 49-LFBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Not For New Designs
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 49-NFBGA (7x7)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111SMX FAQ
1.How can I place an order for SCANSTA111SMX through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111SMX on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111SMX reliable?
The price and inventory of SCANSTA111SMX are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111SMX is usually 5 days.
3.What payment methods are accepted for SCANSTA111SMX?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111SMX transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111SMX?
SCANSTA111SMX orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111SMX order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111SMX?
For technical support, including SCANSTA111SMX datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111SMX requirements.
6.How does Aetrix verify that SCANSTA111SMX is sourced from the original manufacturer or authorized distributors?
All SCANSTA111SMX products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111SMX meets industry standards.
7.What is the process for return or replacement of SCANSTA111SMX?
All SCANSTA111SMX units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111SMX, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111SMX part is unused and in its original packaging.
Return procedure for SCANSTA111SMX:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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