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Texas Instruments SCANSTA111SMX/NOPB
- Part No.:
- SCANSTA111SMX/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 49-LFBGA
- Datasheet:
-
SCANSTA111SMX/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 49BGA
- Quantity:
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Product details
Overview
SCANSTA111SMX/NOPB from Texas Instruments is an IEEE 1149.1-enhanced multidrop scan bridge IC that extends JTAG test access across backplane-connected boards. It supports up to 3 local IEEE 1149.1 scan ports, 7-slot address configuration (up to 121 unique addresses), and 3.0–3.6V operation - enabling hierarchical system-level boundary-scan testing in modular telecom and industrial backplane systems.
For engineers reviewing the SCANSTA111SMX/NOPB datasheet, SCANSTA111SMX/NOPB pinout, SCANSTA111SMX/NOPB application, or SCANSTA111SMX/NOPB equivalent, key selection criteria include multidrop addressing capability, local port parking/unparking control, LSP_ACTIVE analog bus enable outputs, transparent mode for backplane-to-local port buffering, and TRST support on all three local scan ports.
Technical Context
The SCANSTA111SMX/NOPB implements three tightly coupled state machines: a TAP controller compliant with IEEE 1149.1, a Level-1 selection controller for multidrop address matching (S0–S6), and three independent local scan port controllers (LSP0–LSP2) supporting individual park/unpark sequencing. Each LSP controller can be held in stable TAP states (TLR, RTI, Pause-DR, Pause-IR) via Park instructions.
It supports two protocol layers: Level-1 for device selection (Direct, Broadcast, Multi-Cast) and Level-2 for IEEE 1149.1-compliant register access and local port configuration. The 32-bit TCK counter enables synchronized BIST operations across active ports while others remain parked.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - ensures compatibility with 3.3V system logic and eliminates level-shifting in backplane JTAG interfaces. |
| Local Scan Ports | 3 independent IEEE 1149.1 ports (LSP0–LSP2) - allows concurrent or selective access to up to three distinct board-level scan chains. |
| Address Slots | 7-pin slot inputs (S0–S6) - supports 121 unique direct addresses plus reserved interrogation, broadcast, and four multi-cast group addresses. |
| TCK Counter | 32-bit programmable counter - enables precise timing control for built-in self-test (BIST) on one port without disrupting other parked scan chains. |
| LFSR Compactor | 16-bit linear feedback shift register - provides signature analysis of serial test data for pass/fail compression during production test. |
| TRST Support | Asynchronous active-low TRST on all local ports (TRST0–TRST2) - guarantees deterministic reset of downstream TAP controllers during system initialization. |
| Live Insertion | Power-off high-impedance I/Os - permits hot-plug operation in carrier-card systems without damaging backplane signals or adjacent modules. |
Pinout & Package
SCANSTA111SMX/NOPB is housed in a 48-pin SOIC package (SOIC-48, body width 0.300 inch, JEDEC MS-013AC), with exposed pad not present and RoHS-compliant lead finish.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TMSB, TDIB, TDOB, TCKB, TRSTB | Backplane JTAG interface | Master control/data path between system test controller and SCANSTA111SMX/NOPB; TDOB has 24mA drive for robust fanout. |
| TMS0–2, TDI0–2, TDO0–2, TCK0–2, TRST0–2 | Local scan port signals | Three fully independent IEEE 1149.1 ports - each delivers buffered clock, mode select, data in/out, and gated reset to downstream devices. |
| S0–S6 | Slot identification inputs | Hardwired 7-bit address for Level-1 selection; determines which SCANSTA111SMX/NOPB responds to broadcast/multicast commands. |
| OE | Local port output enable | Active-low signal that tri-states all local TDO/TMS/TCK/TRST outputs - allows alternate test master to seize control of local scan chains. |
| LSP_ACTIVE0–2 | Analog bus enable outputs | Drive signals for IEEE 1149.4 mixed-signal test busses or physical layer translators (e.g., TTL-to-LVDS), each with 12mA drive. |
| TRISTB, TRIST0–2 | Tri-state notification outputs | Indicate when associated TDO pins are in high-impedance state - critical for arbitration in shared backplane environments. |
Key Features
| Feature | Design Value |
|---|---|
| Multidrop Addressing | Supports up to 121 uniquely addressed SCANSTA111SMX/NOPB units on one backplane using S0–S6, enabling scalable system-level test architecture. |
| Park/Unpark Control | Each local scan port (LSP0–LSP2) can be individually parked in stable TAP states - isolating unused scan chains to reduce test time and avoid interference. |
| Transparent Mode | Single-instruction activation routes backplane JTAG signals directly to one selected local port - simplifies debug and bypasses internal logic for fast validation. |
| IEEE 1149.4 Support | LSP_ACTIVE0–2 outputs provide dedicated enable signals for analog test buses - extends boundary-scan to mixed-signal subsystems per IEEE 1149.4 standard. |
| Pass-Through Bits | General-purpose A/Y and AB/YB signal routing - delivers FPGA configuration pulses or monitors device status without requiring additional GPIO resources. |
Applications
| Modular Telecom Backplane Testing | Industrial PLC Carrier Card Validation |
|---|---|
Use Scenario: Multiple line cards plug into a central backplane; each card contains its own ASIC/FPGA with boundary-scan support. IC Role / Device Role / Timing Role: SCANSTA111SMX/NOPB acts as a hierarchical scan bridge - receiving system-level JTAG commands via backplane and routing them to specific local scan chains on targeted cards. Use Value: Enables selective testing of individual cards without removing them from the system, preserving test access to remaining modules and improving throughput by >40% vs. serial daisy-chain. | Use Scenario: Programmable logic controller chassis with hot-swappable I/O modules, each requiring post-deployment boundary-scan verification. IC Role / Device Role / Timing Role: SCANSTA111SMX/NOPB serves as a live-insertion-capable JTAG hub - managing TRST synchronization and local port isolation during module replacement. Use Value: Guarantees known power-up state and high-impedance I/Os during insertion, preventing bus contention and enabling safe field maintenance without system shutdown. |
| Automotive ECU Module Diagnostics | Aerospace Avionics Board-Level Debug |
Use Scenario: Distributed electronic control units connected via a fault-tolerant backplane; each ECU must undergo periodic in-system test during service intervals. IC Role / Device Role / Timing Role: SCANSTA111SMX/NOPB functions as a multidrop-addressable test access node - responding only to its assigned slot address and forwarding commands to onboard microcontrollers' JTAG interfaces. Use Value: Reduces diagnostic cable count and eliminates manual jumper reconfiguration; supports broadcast-mode signature capture for rapid health-check across all ECUs. | Use Scenario: High-reliability avionics rack with multiple mission-critical boards; each board requires traceable, repeatable boundary-scan validation before flight certification. IC Role / Device Role / Timing Role: SCANSTA111SMX/NOPB operates as a hierarchical scan tree root - cascading local ports to second-tier SCANSTA111SMX/NOPB units on daughterboards to form deep test hierarchies. Use Value: Allows partitioning of complex systems into testable sub-trees; supports Level-2 instruction execution (e.g., LFSRON/CNTRON) for on-board signature compaction and clock-gated BIST. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop scan bridge applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA112SMX/NOPB | Same pinout and core functionality; adds enhanced error detection logic and improved noise immunity on backplane inputs. | Preferred for new designs targeting higher EMI environments (e.g., motor drives, rail systems); backward-compatible but not drop-in due to revised IBIS model. | Select SCANSTA112SMX/NOPB when system-level EMC validation requires tighter input threshold margins and extended voltage tolerance. |
| SN74ACT573N | Octal transparent latch with 3-state outputs - no JTAG logic, no addressing, no TAP state machines. | Only suitable for basic signal buffering; cannot perform scan chain selection, parking, or Level-1/Level-2 protocol handling. | Use SN74ACT573N only for non-JTAG signal routing where IEEE 1149.1 compliance and multidrop control are unnecessary. |
Compared with SCANSTA111SMX/NOPB, SCANSTA112SMX/NOPB offers upgraded electrical robustness for harsh environments but requires layout review for signal integrity; SN74ACT573N lacks all scan bridge functionality and serves only as a generic logic buffer - neither qualifies as a functional replacement.
Availability
SCANSTA111SMX/NOPB is available at Aetrix Electronics and suitable for modular telecom backplane testing, industrial PLC carrier card validation, and aerospace avionics board-level debug requiring stable component supply and long-term lifecycle support.
Supply support for SCANSTA111SMX/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with decades of investment in test and diagnostics infrastructure.
The SCANSTA111SMX/NOPB belongs to TI's System Test & Emulation product line, designed specifically to solve scalability and accessibility challenges in IEEE 1149.1-based system-level test architectures for backplane and modular electronics.
FAQ
What is the primary function of the SCANSTA111SMX/NOPB in a JTAG test system?
The SCANSTA111SMX/NOPB functions as an IEEE 1149.1-enhanced multidrop scan bridge that extends boundary-scan test access across backplane-connected boards. It enables selective communication with up to 121 uniquely addressed units using Level-1 addressing, then routes Level-2 JTAG commands to up to three local scan ports per device. This architecture allows system-level test masters to isolate, configure, and test individual modules without disrupting others - a capability confirmed in TI's SNLS060K datasheet revision April 2013.
Does the SCANSTA111SMX/NOPB support live insertion and removal in powered-backplane systems?
Yes, the SCANSTA111SMX/NOPB supports live insertion and withdrawal via power-off high-impedance inputs and outputs. When VCC = 0V or floating, all I/O pins present only capacitive loading to ground - preventing bus contention or latch-up during hot-swap events. This behavior is explicitly documented in the "PIN DESCRIPTIONS" section of the SNLS060K datasheet and verified in TI's IBIS models for the SOIC-48 package.
How many local scan ports does the SCANSTA111SMX/NOPB provide, and what signals do they include?
The SCANSTA111SMX/NOPB provides three fully independent local scan ports (LSP0, LSP1, LSP2), each delivering the complete IEEE 1149.1 signal set: TCK, TMS, TDI, TDO, and TRST. All outputs feature 24mA drive strength, and each port supports individual parking/unparking control. This configuration is defined in the "FEATURES" and "PIN DESCRIPTIONS" sections of the official SNLS060K datasheet.
What addressing modes does the SCANSTA111SMX/NOPB support, and how are they configured?
The SCANSTA111SMX/NOPB supports Direct (single-device), Broadcast (all devices), and Multi-Cast (four group-selectable) addressing modes via its 7-slot inputs (S0–S6). Direct addresses range from hex 00–39 and 40–7F; reserved addresses include 3A (interrogation), 3B (broadcast), and 3C–3F (multi-cast groups 0–3). Configuration is static via hardware strapping - no software programming required - as specified in Table 3 and Figure 6 of the SNLS060K datasheet.
Can the SCANSTA111SMX/NOPB be used to support IEEE 1149.4 mixed-signal test requirements?
Yes, the SCANSTA111SMX/NOPB supports IEEE 1149.4 through its LSP_ACTIVE0–2 outputs, which serve as dedicated analog bus enable signals. These outputs drive external analog multiplexers or LVDS translators to coordinate mixed-signal test stimulus and response capture. TI's datasheet explicitly states these pins are "for analog busses supporting IEEE 1149.4" and specifies 12mA drive capability - confirming direct applicability to 1149.4-compliant test systems.
SCANSTA111SMX/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 49-LFBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 49-NFBGA (7x7)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA111SMX/NOPB FAQ
1.How can I place an order for SCANSTA111SMX/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA111SMX/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA111SMX/NOPB reliable?
The price and inventory of SCANSTA111SMX/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA111SMX/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA111SMX/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA111SMX/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA111SMX/NOPB?
SCANSTA111SMX/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA111SMX/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA111SMX/NOPB?
For technical support, including SCANSTA111SMX/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA111SMX/NOPB requirements.
6.How does Aetrix verify that SCANSTA111SMX/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA111SMX/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA111SMX/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA111SMX/NOPB?
All SCANSTA111SMX/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA111SMX/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA111SMX/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA111SMX/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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