My Inquiry
My Account
Texas Instruments SCANSTA112SM/NOPB
- Part No.:
- SCANSTA112SM/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 100-LFBGA
- Datasheet:
-
SCANSTA112SM/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 100FBGA
- Quantity:
- Payment:
- Shipping:
Inventory:329
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
SCANSTA112SM/NOPB from Texas Instruments is a 7-port IEEE 1149.1 (JTAG) multidrop multiplexer IC designed for hierarchical board-level test bus management. It supports up to 249 unique slot addresses, provides bidirectional backplane and LSP0 ports, enables transparent mode buffering, and operates at 3.0–3.6 V for industrial applications including system-level boundary-scan programming of FPGAs and ASICs.
For engineers reviewing the SCANSTA112SM/NOPB datasheet, SCANSTA112SM/NOPB pinout, SCANSTA112SM/NOPB application, or SCANSTA112SM/NOPB equivalent, this device delivers addressable scan chain selection, TRST-aware local TAP control, 32-bit TCK counter-based self-test, 16-bit LFSR signature compaction, and live insertion support in NFBGA-100 packaging.
Technical Context
The SCANSTA112SM/NOPB implements dual-level IEEE 1149.1 protocol extension: Level-1 for multidrop addressing across backplane-connected units, and Level-2 for per-device local scan port (LSP0–LSP6) selection or serial grouping. Its TAP controller manages instruction register loading, mode register configuration (Mode Register 0), and stitcher/transparent mode activation via dedicated pins.
It features bidirectional master/slave logic on B0/B1 ports, TRI-STATE-capable local outputs with notification signals (TRISTB0–TRISTB1, TRIST01–TRIST03), and configurable pass-through I/O (A0B0/A1B0/Y0B0/Y1B0 etc.) for flash programming pulses or status monitoring-enabling concurrent scan operations across isolated chains without bus contention.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Supply Range | 3.0 V to 3.6 V - ensures compatibility with 3.3 V industrial logic families and stable operation under rail-tolerant test conditions. |
| Operating Temperature | −40°C to +85°C - qualified for extended industrial environments including telecom chassis and embedded control systems. |
| Max Clock Frequency | 25 MHz - defines maximum vector throughput in ScanBridge mode; higher frequencies permitted only for one-way programming (e.g., FPGA config). |
| TCK Propagation Delay | 7.5 ns to 13.5 ns - determines minimum achievable test cycle time between backplane and local scan ports. |
| Slot Address Capacity | 249 unique addresses - achieved via 8-slot inputs with reserved address 000000, enabling scalable backplane networks. |
| Local Scan Ports | 7 configurable ports (LSP0–LSP6) - supports independent or grouped access to downstream JTAG devices such as processors, FPGAs, and flash memory. |
| TRI-STATE Notification | Dedicated TRISTB0/TRISTB1 and TRIST01–TRIST03 outputs - provides real-time visibility into TDO driver state for synchronized multi-device test sequencing. |
Pinout & Package
NFBGA-100 package (NZD variant), 7 mm × 7 mm, 0.5 mm pitch, RoHS-compliant SNAGCU ball finish, MSL Level-4 (260°C peak, 72 hr floor life).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TCKB0 / TCKB1 | Backplane Test Clock Input/Output | Bidirectional master/slave clock interface; drives local TCK outputs (TCK01–TCK06) with 24 mA drive strength and hysteresis. |
| TMSB0 / TMSB1 | Backplane Test Mode Select | Bidirectional TAP state control signal; controls both SCANSTA112's internal TAP and downstream local TAPs. |
| TDIB0 / TDIB1 | Backplane Test Data Input | Primary scan data ingress path; includes 25 kΩ pull-up, no ESD diode, capacitive load behavior during power-off. |
| TDOB0 / TDOB1 | Backplane Test Data Output | Bidirectional scan data egress; TRI-STATE capable (12 mA), sampled during interrogation addressing. |
| S0–S7 | Slot Identification Inputs | 8-bit address input defining unique backplane identity; used by Level-1 protocol to enable selective device participation. |
| LSPsel0–LSPsel6 | Local Scan Port Selection | Direct hardware control for enabling individual LSPs in Stitcher Mode; bypasses instruction register for deterministic port routing. |
| OE | Output Enable (active low) | Global TRI-STATE control for all local scan port outputs (TDO01–TDO06, TMS01–TMS06, etc.), enabling alternate test masters. |
| RESET | Asynchronous Reset Input | Forces device reset regardless of current TAP state; overrides TRSTB and initializes instruction/data registers. |
Key Features
| Feature | Design Value |
|---|---|
| IEEE 1149.1 Hierarchical Multidrop | Enables system-level test bus sharing across multiple boards using Level-1 (device address) and Level-2 (port selection) protocols. |
| Bidirectional Backplane/LSP0 Ports | Allows LSP0 to act as alternate master port while backplane becomes slave - critical for redundant test controller failover. |
| Stitcher Mode Bypass | Skips Level-1/Level-2 protocol handshake via SB/S pin, reducing setup latency for fixed-configuration scan chains. |
| Transparent Mode Buffering | Removes SCANSTA112 registers from scan path via TRANSENABLE bit, enabling reuse of legacy ATPG vectors without recompilation. |
| General Purpose Pass-Through Bits | A0B0/A1B0/Y0B0/Y1B0 and A001/A101/Y001/Y101 support non-JTAG functions like flash write pulses or status monitoring alongside scan. |
| 32-bit TCK Counter + 16-bit LFSR | Enables built-in self-test (BIST) on selected ports while others undergo concurrent structural testing - improves test coverage efficiency. |
Applications
| Board-Level JTAG Partitioning | Backplane-Based System Test |
|---|---|
|
Use Scenario: Isolating FPGA, processor, and flash memory on a single PCB into independent scan chains for parallel programming and fault isolation. IC Role / Device Role / Timing Role: SCANSTA112SM/NOPB acts as a programmable JTAG switch, routing backplane TCK/TMS/TDI/TDO to selected LSPs while maintaining TRST synchronization. Use Value: Reduces total test time by 40–60% versus daisy-chained topology and enables targeted reprogramming without disturbing adjacent devices. |
Use Scenario: Connecting multiple plug-in cards (each with its own SCANSTA112SM/NOPB) to a shared backplane test bus in a telecom shelf. IC Role / Device Role / Timing Role: SCANSTA112SM/NOPB serves as an addressable node in a multidrop network, responding only when its S0–S7 match the interrogated slot address. Use Value: Enables hot-swap board replacement while preserving test access to remaining modules - critical for carrier-grade system uptime. |
| Hierarchical Scan Tree | FPGA Configuration Support |
|
Use Scenario: Constructing a three-tier JTAG hierarchy where root-layer SCANSTA112SM/NOPBs connect to mid-tier units via LSP-to-backplane links. IC Role / Device Role / Timing Role: SCANSTA112SM/NOPB functions as both leaf node (exposing LSPs to downstream devices) and branch node (accepting backplane commands from upstream). Use Value: Allows granular test access to specific subsystems (e.g., power module vs. signal processing module) without full-system scan overhead. |
Use Scenario: Delivering configuration bitstreams to Xilinx or Intel FPGAs using LSP0–LSP6 while simultaneously monitoring flash readiness via pass-through Y001/Y101 signals. IC Role / Device Role / Timing Role: SCANSTA112SM/NOPB routes JTAG vectors to target FPGA and forwards general-purpose control pulses (e.g., nCONFIG/nSTATUS) through A001/Y001 path. Use Value: Eliminates need for separate GPIO headers or CPLD glue logic - integrates boundary-scan and configuration signaling in one IC. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop multiplexer applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA111SM/NOPB | 6-port version; lacks LSP6, 32-bit TCK counter, and LFSR compactor; supports only 127 slot addresses. | Suitable for smaller backplane systems with ≤6 downstream JTAG devices and no requirement for concurrent BIST. | Select when cost sensitivity outweighs need for seventh port or advanced diagnostics - footprint-compatible but functionally reduced. |
| SCANPSC110SM/NOPB | Legacy predecessor; no stitcher mode, no transparent mode, no pass-through I/O, no TRIST notification outputs. | Applicable only in legacy designs requiring basic multidrop switching without dynamic port reconfiguration or auxiliary signaling. | Choose only for backward compatibility; not recommended for new designs due to missing diagnostic and flexibility features. |
Compared with SCANSTA112SM/NOPB, SCANSTA111SM/NOPB offers lower channel count and reduced diagnostic capability, while SCANPSC110SM/NOPB lacks modern operational modes and real-time status feedback - making SCANSTA112SM/NOPB the optimal choice for scalable, maintainable, and feature-rich JTAG infrastructure.
Availability
SCANSTA112SM/NOPB is available at Aetrix Electronics and suitable for industrial backplane test systems, telecom equipment manufacturing, FPGA-based embedded development, and high-reliability board-level programming requiring stable component supply and long-term lifecycle support.
Supply support for SCANSTA112SM/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with decades of investment in test and debug infrastructure for complex electronic systems.
The SCANSTA112SM/NOPB belongs to TI's IEEE 1149.1 boundary-scan support product line, engineered specifically to solve scalability, modularity, and interoperability challenges in large-scale JTAG test architectures.
FAQ
What is the primary function of the SCANSTA112SM/NOPB in a JTAG test system?
The SCANSTA112SM/NOPB functions as an addressable IEEE 1149.1 multidrop multiplexer that extends a single test bus to manage up to seven independent local scan chains. It enables hierarchical test access, slot-based device selection on shared backplanes, and concurrent scan operations - directly improving test throughput and fault isolation in complex PCB assemblies and modular systems.
Does the SCANSTA112SM/NOPB support live insertion and removal in powered backplane systems?
Yes, the SCANSTA112SM/NOPB explicitly supports live insertion/withdrawal per its datasheet. Its I/O structure-including power-off leakage limits (±200 µA on pull-up pins), capacitive load behavior during VCC=0V, and robust ESD handling (2500V HBM)-ensures safe hot-plug operation in carrier-grade backplane environments without disrupting adjacent nodes.
How does Transparent Mode in the SCANSTA112SM/NOPB affect existing ATPG vector sets?
When enabled via the TRANS pin or instruction register, Transparent Mode removes all SCANSTA112SM/NOPB internal registers and pad-bits from the scan chain. This allows legacy ATPG vectors generated for direct device connections to be reused unchanged - eliminating vector regeneration effort while preserving test coverage integrity across upgraded hardware.
Can the SCANSTA112SM/NOPB operate as both master and slave on the same physical port?
Yes - the SCANSTA112SM/NOPB implements bidirectional master/slave logic on both B0 and B1 ports. Using MPselB1/B0, either port can be configured as the active backplane master while the other becomes LSP00; this enables seamless handover to an alternate test controller without hardware modification or PCB layout changes.
What is the role of the TRISTB0 and TRIST01–TRIST03 outputs on the SCANSTA112SM/NOPB?
TRISTB0, TRISTB1, and TRIST01–TRIST03 are dedicated TRI-STATE notification outputs that assert high when their corresponding TDO pins (TDOB0, TDOB1, TDO01–TDO03) enter high-impedance state. These signals provide precise timing visibility into port arbitration events, enabling synchronized test sequencing across multiple SCANSTA112SM/NOPB devices in shared-bus configurations.
SCANSTA112SM/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 100-LFBGA
- Packaging:
- Tray
- Product Status:
- Not For New Designs
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 100-FBGA (10x10)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA112SM/NOPB FAQ
1.How can I place an order for SCANSTA112SM/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA112SM/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA112SM/NOPB reliable?
The price and inventory of SCANSTA112SM/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA112SM/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA112SM/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA112SM/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA112SM/NOPB?
SCANSTA112SM/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA112SM/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA112SM/NOPB?
For technical support, including SCANSTA112SM/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA112SM/NOPB requirements.
6.How does Aetrix verify that SCANSTA112SM/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA112SM/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA112SM/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA112SM/NOPB?
All SCANSTA112SM/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA112SM/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA112SM/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA112SM/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
SCANSTA112SM/NOPB Tags
-
NVT4857UKAZ
NXP Semiconductors
-
TCA8418RTWR
Texas Instruments
-
PCA9546APWR
Texas Instruments
-
MD0100N8-G
Microchip Technology
-
PCA9548APW,118
NXP Semiconductors
-
PCA9540BDP,118
NXP Semiconductors
-
PCA9548APWR
Texas Instruments
-
PCA9546APW,118
NXP Semiconductors
-
PTN3360DBS,518
NXP Semiconductors
-
PCA9546ABS,118
NXP Semiconductors
-
PCA9518PWR
Texas Instruments
-
PCA9545APW,118
NXP Semiconductors
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
