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Texas Instruments SCANSTA112SMX
- Part No.:
- SCANSTA112SMX
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 100-LFBGA
- Datasheet:
-
SCANSTA112SMX.pdf
- Description:
- IC INTERFACE SPECIALIZED 100FBGA
- Quantity:
- Payment:
- Shipping:
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Product details
Overview
SCANSTA112SMX from Texas Instruments is a 7-port IEEE 1149.1 (JTAG) multidrop multiplexer IC designed for hierarchical test bus management in complex embedded systems. It supports up to 249 unique slot addresses, provides bidirectional backplane and LSP0 ports, enables transparent mode buffering, and operates from 3.0–3.6 V over −40°C to +85°C - used in board-level JTAG chain partitioning and system-level structural test access.
For engineers reviewing the SCANSTA112SMX datasheet, SCANSTA112SMX pinout, SCANSTA112SMX application, or SCANSTA112SMX equivalent, this device serves as a critical infrastructure component for scalable boundary-scan architecture - particularly where live insertion, TRST-aware port control, 32-bit TCK counting, and LFSR signature compaction are required in high-density test environments.
Technical Context
The SCANSTA112SMX implements dual-level IEEE 1149.1 protocol extension: Level-1 addressing selects individual or multicast groups of devices on a shared backplane; Level-2 configuration routes signals to one or more of its seven local scan ports (LSP0–LSP6). Its TAP controller manages instruction register loading, mode register access, and state transitions per IEEE Std. 1149.1.
It supports three operational modes: ScanBridge (full two-level protocol), Stitcher (bypasses Level-1/2 via pins), and Transparent (no internal registers in scan path). Bidirectional B0/B1 ports allow master/slave role switching, while OE input tri-states all local scan outputs to enable alternate test masters.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - ensures compatibility with 3.3 V logic systems and stable operation under industrial supply variation. |
| Operating Temperature | −40°C to +85°C - qualified for industrial-grade embedded and telecom equipment deployment. |
| Max Clock Frequency | 25 MHz - defines maximum vector throughput in ScanBridge mode; higher frequencies permitted in one-way programming paths. |
| TCK Counter | 32-bit - enables precise timing control and built-in self-test sequencing across selected scan ports. |
| LFSR Compactor | 16-bit - compresses test response data for efficient fault detection without full response capture. |
| Slot Address Inputs | 8-bit (S0–S7) - supports up to 249 unique addresses via configurable mask (ADDMASK) and reserved address handling. |
| Local Scan Ports | 7 (LSP0–LSP6) - each provides full TDI/TDO/TMS/TCK/TRST signals, individually controllable via LSPsel[0:6] and Mode Register 0. |
Pinout & Package
NFBGA-100 package (NZD variant), 10 mm × 10 mm, 0.8 mm pitch, RoHS-compliant (lead finish SNAGCU), MSL Level-4 (260°C peak reflow, 72 hr floor life).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TCKB0 / TCKB1 | Backplane Test Clock Input/Output | Bidirectional master clock interface; determines active backplane port via MPselB1/B0; 24 mA drive, hysteresis enabled. |
| TMSB0 / TMSB1 | Backplane Test Mode Select | Bidirectional TAP state control signal; 24 mA drive, internal 25 kΩ pull-up; controls both STA112 and downstream local TAPs. |
| TDIB0 / TDIB1 | Backplane Test Data Input | Primary scan data ingress point; 25 kΩ internal pull-up; capacitive load behavior when VCC = 0 V aids hot-swap safety. |
| TDOB0 / TDOB1 | Backplane Test Data Output | Bidirectional scan data egress; 12 mA drive; sampled during interrogation addressing for slot identification. |
| S0–S7 | Slot Identification Inputs | Defines unique address (0–248); ADDMASK allows masking lower bits to support address grouping or legacy compatibility. |
| LSPsel0–LSPsel6 | Local Scan Port Selection | Digital inputs selecting which of 7 LSPs participate in current scan chain; enables serial, parallel, or grouped configurations. |
| OE | Output Enable (active low) | Tri-states all local scan port outputs (TDO/TMS/TCK/TRST), allowing external test resources to directly drive local chains. |
Key Features
| Feature | Design Value |
|---|---|
| True IEEE 1149.1 Hierarchical & Multidrop Addressing | Enables system-level test bus sharing across multiple boards without physical chain reconfiguration - reduces test time by >40% in multi-board systems. |
| Bi-directional Backplane & LSP0 Ports | Allows LSP0 to act as alternate master port while backplane becomes slave - eliminates need for dedicated test controller hardware on every board. |
| Stitcher Mode Bypass | Skips Level-1/2 protocol handshake via SB/S pin - cuts initialization latency by ~3× versus standard ScanBridge mode for rapid debug access. |
| Transparent Mode Enable | Removes all internal registers and pad-bits from scan path via TRANS pin - ensures backward compatibility with ATPG vectors generated for direct-connected devices. |
| General Purpose Pass-Through Bits (A/Y pairs) | Supports flash programming pulses (A→Y) or status monitoring (Y←A) on selected LSPs - eliminates need for separate GPIO routing in JTAG-based firmware update flows. |
Applications
| Board-Level JTAG Chain Partitioning | Multi-Board Backplane Test Access |
|---|---|
Use Scenario: A single PCB contains FPGA, ASIC, and microcontroller - each with IEEE 1149.1 TAP - requiring independent test and programming sequences. IC Role / Device Role / Timing Role: SCANSTA112SMX acts as a programmable scan chain switch, isolating each device onto dedicated LSPs while maintaining shared backplane control. Use Value: Enables concurrent programming of FPGA and flash memory without interference; reduces total test time by enabling parallel vector application per port. |
Use Scenario: Rack-mounted telecom chassis with 8 line cards, each hosting a SCANSTA112SMX and multiple JTAG-capable devices. IC Role / Device Role / Timing Role: SCANSTA112SMX serves as addressable node in multidrop backplane, responding only to its assigned slot ID (S0–S7) during system-level test. Use Value: Allows full structural test of any card without removing it from the chassis - supports field diagnostics and zero-downtime maintenance. |
| Hierarchical Boundary-Scan Tree | Live Insertion/Withdrawal Support |
Use Scenario: High-availability server with cascaded SCANSTA112SMX devices forming 3-tier scan hierarchy: root layer → mid-layer → leaf-layer LSPs. IC Role / Device Role / Timing Role: SCANSTA112SMX functions as hierarchical node - root-layer LSP connects to mid-layer backplane; mid-layer LSP connects to leaf-layer devices. Use Value: Permits selective testing of subsystems (e.g., storage module only) without scanning entire system - improves diagnostic precision and vector efficiency. |
Use Scenario: Modular industrial PLC base unit accepting hot-swappable I/O modules, each with JTAG-accessible FPGAs and ADCs. IC Role / Device Role / Timing Role: SCANSTA112SMX manages local scan chains on each module and handles TRST isolation during insertion/removal events. Use Value: Prevents bus contention and false resets during hot-swap; maintains test access continuity to remaining modules via backplane arbitration. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop multiplexer applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA111SMX | 6-port version; lacks LSP6, 32-bit TCK counter, and LFSR compactor; no TRISTB1 output. | Supports smaller scan networks; not suitable for systems requiring >6 local chains or signature-based compression. | Select when cost sensitivity outweighs need for seventh port or advanced diagnostics features. |
| SCANPSC110SMX | Legacy 4-port predecessor; no multidrop addressing; fixed 4-LSP configuration; no stitcher or transparent mode. | Limited to flat-chain topologies; requires manual jumpering for port selection; no backplane arbitration capability. | Choose only for legacy redesigns where backward pin compatibility with PSC110 footprint is mandatory. |
Compared with SCANSTA111SMX and SCANPSC110SMX, SCANSTA112SMX delivers expanded scalability (7 ports, 249-slot addressing), deterministic diagnostics (32-bit counter + 16-bit LFSR), and flexible operational modes - making it the only option supporting hierarchical trees, live insertion, and broadcast/multicast group testing in modern high-density systems.
Availability
SCANSTA112SMX is available at Aetrix Electronics and suitable for board-level JTAG infrastructure, multi-board test bus architectures, and hierarchical boundary-scan tree deployments requiring stable component supply and long-term industrial lifecycle support.
Supply support for SCANSTA112SMX includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies - with deep expertise in test and debug infrastructure for complex electronic systems.
The SCANSTA112SMX belongs to TI's IEEE 1149.1 infrastructure product line, engineered specifically for scalable, addressable JTAG test bus expansion in telecom, industrial automation, and high-reliability computing platforms.
FAQ
What is the primary function of the SCANSTA112SMX in a JTAG test architecture?
The SCANSTA112SMX functions as an addressable IEEE 1149.1 multidrop multiplexer that extends a single test bus into up to seven independently controllable local scan chains. It enables hierarchical test access, slot-based addressing, and dynamic scan chain reconfiguration - essential for managing JTAG resources across multi-board systems and complex SoC-based designs. The SCANSTA112SMX supports both ScanBridge and Stitcher operational modes to optimize test setup latency and vector compatibility.
Does the SCANSTA112SMX support hot-swap or live insertion in backplane systems?
Yes, the SCANSTA112SMX explicitly supports live insertion/withdrawal per its datasheet specifications. Its TRST handling - including TRSTB0/B1 ignore capability and TLR_TRST/TLR_TRST6 control - prevents unintended resets during board insertion. The device's capacitive-load behavior on backplane I/O pins when VCC = 0 V further ensures safe electrical engagement. This makes SCANSTA112SMX suitable for modular telecom and industrial chassis where field-replaceable units require uninterrupted test bus continuity.
How does the bidirectional backplane port (B0/B1) operate in SCANSTA112SMX?
The SCANSTA112SMX features two bidirectional backplane ports (B0 and B1), controlled by the MPselB1/B0 pin to designate one as master and the other as LSP00. In master mode, the selected port drives TCK/TMS/TDO signals to the system test controller; in slave mode, it receives those signals from upstream sources. This dual-role capability allows SCANSTA112SMX to serve as either endpoint or intermediate node in hierarchical scan trees - eliminating dependency on fixed master-slave topology and enabling flexible test controller placement.
What are the key differences between ScanBridge mode and Stitcher mode in SCANSTA112SMX?
ScanBridge mode uses full two-level IEEE 1149.1 protocol: Level-1 selects the device via slot address, then Level-2 configures port routing. Stitcher mode bypasses both levels using the SB/S pin, directly entering operational state - reducing initialization overhead by skipping instruction register loading and address comparison. SCANSTA112SMX retains identical signal routing and timing in both modes; the difference lies solely in setup latency and ATPG tool compatibility requirements.
Can SCANSTA112SMX be used to program flash memory via JTAG?
Yes, SCANSTA112SMX supports flash programming through its General Purpose Pass-Through Bits (A0/A1/Y0/Y1). When a single LSP is selected, A inputs can deliver write strobes or command pulses to target devices, while Y outputs monitor status flags (e.g., BUSY, RDY). This capability is confirmed in the datasheet's PIN DESCRIPTIONS and APPLICATION OVERVIEW sections - enabling JTAG-based firmware updates without additional GPIO routing or dedicated programming interfaces.
SCANSTA112SMX Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 100-LFBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Not For New Designs
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 100-FBGA (10x10)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA112SMX FAQ
1.How can I place an order for SCANSTA112SMX through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA112SMX on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA112SMX reliable?
The price and inventory of SCANSTA112SMX are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA112SMX is usually 5 days.
3.What payment methods are accepted for SCANSTA112SMX?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA112SMX transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA112SMX?
SCANSTA112SMX orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA112SMX order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA112SMX?
For technical support, including SCANSTA112SMX datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA112SMX requirements.
6.How does Aetrix verify that SCANSTA112SMX is sourced from the original manufacturer or authorized distributors?
All SCANSTA112SMX products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA112SMX meets industry standards.
7.What is the process for return or replacement of SCANSTA112SMX?
All SCANSTA112SMX units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA112SMX, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA112SMX part is unused and in its original packaging.
Return procedure for SCANSTA112SMX:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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