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Texas Instruments SCANSTA112SMX/NOPB
- Part No.:
- SCANSTA112SMX/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 100-LFBGA
- Datasheet:
-
SCANSTA112SMX/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 100FBGA
- Quantity:
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Product details
Overview
SCANSTA112SMX/NOPB from Texas Instruments is a 7-port IEEE 1149.1 (JTAG) multidrop multiplexer IC used to manage hierarchical scan chain architectures in system-level test and programming. It supports up to 249 unique slot addresses, provides bidirectional backplane and LSP0 ports, enables transparent mode buffering, and operates at 3.0–3.6 V for industrial applications including board-level FPGA configuration and ASIC boundary-scan access.
For engineers reviewing the SCANSTA112SMX/NOPB datasheet, SCANSTA112SMX/NOPB pinout, SCANSTA112SMX/NOPB application, or SCANSTA112SMX/NOPB equivalent, key selection criteria include its 7 configurable local scan ports, 32-bit TCK counter for built-in self-test, support for stitcher/transparent modes, TRST-bypass capability on backplane port, and NFBGA-100 package with MSL-4 reflow rating.
Technical Context
The SCANSTA112SMX/NOPB implements dual-level IEEE 1149.1 protocol extension: Level-1 addressing selects individual or multicast groups of devices on a shared backplane bus, while Level-2 port selection configures which of its seven local scan ports (LSP0–LSP6) are serially or individually connected to the backplane. Its TAP controller manages instruction register loading, mode register access, and state transitions per IEEE Std. 1149.1.
It features bidirectional master/slave logic enabling either backplane port (B0/B1) or LSP0 to act as master, supports live insertion/withdrawal, includes a 16-bit LFSR signature compactor, and allows local TAPs to enter tri-state via OE input-enabling alternate test masters to take control without PCB layout changes.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - ensures compatibility with 3.3-V system rails and stable operation across industrial temperature range. |
| Operating Temperature | −40°C to +85°C - qualified for industrial-grade embedded test infrastructure and rack-mounted backplane systems. |
| Max Clock Frequency | 25 MHz - defines maximum vector shift rate in ScanBridge mode; higher rates permitted in one-way programming paths. |
| Local Scan Ports | 7 independent IEEE 1149.1-compliant ports (LSP0–LSP6) - enables concurrent or selective access to multiple JTAG chains on a single board. |
| Address Inputs | 8-slot identification pins (S0–S7) - supports up to 249 unique addresses for multidrop backplane scalability. |
| TCK Counter | 32-bit counter - enables deterministic timing for built-in self-test operations during scan chain diagnostics. |
| LFSR Compactor | 16-bit linear feedback shift register - compresses test response data for efficient fault detection without full signature analysis. |
Pinout & Package
NFBGA-100 package (NZD variant), 7-mm × 7-mm body, 0.5-mm pitch, MSL Level-4 (260°C peak, 72-hour floor life), lead-free (SnAgCu), RoHS-compliant.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TCKB0 / TCKB1 | Backplane test clock input/output | Bidirectional master/slave clock interface; determines active backplane port based on MPselB1/B0 setting. |
| TMSB0 / TMSB1 | Backplane test mode select | Controls TAP state machine sequencing for both device and downstream local TAPs; pull-up enabled. |
| TDIB0 / TDIB1 | Backplane test data input | Primary scan data ingress path; internal 25-kΩ pull-up enables robust floating-input behavior during power-off. |
| TDOB0 / TDOB1 | Backplane test data output | Tri-stateable output driving upstream test controller; sampled during interrogation addressing. |
| S0–S7 | Slot identification inputs | Defines unique address for multidrop selection; ADDMASK allows partial pin masking for group addressing. |
| LSPsel0–LSPsel6 | Local scan port enable inputs | Selects which of 7 LSPs participate in current scan chain; supports individual, paired, or triple-port serial grouping. |
| OE | Output enable (active low) | Tri-states all local scan port outputs (TDO/TMS/TCK/TRST) to allow external test resource takeover. |
| RESET | Asynchronous reset input | Forces device into known state regardless of TAP controller position; overrides ongoing scan operations. |
Key Features
| Feature | Design Value |
|---|---|
| True IEEE 1149.1 hierarchical & multidrop addressing | Enables scalable system-level test architecture with broadcast, multicast, and individual device targeting. |
| Bi-directional backplane and LSP0 ports | Allows LSP0 to assume master role when backplane port becomes slave-eliminating need for dedicated test master hardware. |
| Stitcher Mode bypassing Level-1/2 protocols | Reduces test setup latency by skipping address decoding and port configuration steps via external pin control. |
| Transparent Mode buffering | Removes SCANSTA112 registers from scan chain, enabling reuse of legacy ATPG vectors generated for direct-connected devices. |
| General-purpose pass-through bits (A/Y pairs) | Supports flash programming pulses or status monitoring by routing signals between backplane and selected LSP without JTAG involvement. |
Applications
| Board-Level FPGA Configuration | Multi-Board System Test |
|---|---|
|
Use Scenario: Programming Xilinx or Intel FPGAs across multiple PCBs in a chassis using a single JTAG controller. IC Role / Device Role / Timing Role: SCANSTA112SMX/NOPB acts as addressable scan chain switch, routing configuration bitstreams from backplane to specific LSP-connected FPGAs. Use Value: Eliminates need for separate JTAG headers per board; reduces test time by enabling parallel or targeted programming sequences. |
Use Scenario: Performing structural test on ASICs and processors distributed across hot-swappable line cards in telecom equipment. IC Role / Device Role / Timing Role: SCANSTA112SMX/NOPB serves as hierarchical node in multi-tier scan tree, allowing root-level tester to selectively activate leaf-level scan chains. Use Value: Enables live insertion/withdrawal testing without disrupting other modules; improves fault isolation granularity across physical boards. |
| ASIC Boundary-Scan Debug | Flash Memory Programming Support |
|
Use Scenario: Isolating and diagnosing interconnect faults between high-speed SerDes PHYs and host processors on dense compute blades. IC Role / Device Role / Timing Role: SCANSTA112SMX/NOPB partitions long scan chains into manageable segments per ASIC cluster, reducing vector memory requirements. Use Value: Cuts ATPG vector size by >60% versus flat-chain approach; accelerates fault coverage convergence during production test. |
Use Scenario: Delivering write-enable pulses and verifying status signals during in-system programming of NOR/NAND flash on embedded controllers. IC Role / Device Role / Timing Role: SCANSTA112SMX/NOPB uses A0/A1/Y0/Y1 pass-through bits to route non-JTAG control signals alongside scan data on LSP0. Use Value: Avoids adding discrete logic or GPIO expanders; maintains single-cable JTAG connectivity while supporting flash bring-up workflows. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop multiplexer applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA111SM/NOPB | 6-port version; lacks LSP6 and 32-bit TCK counter; no TRST-bypass on backplane port. | Supports smaller scan networks; not suitable for systems requiring 7-LSP topology or BIST timing validation. | Choose when cost sensitivity outweighs port count and diagnostic feature requirements. |
| SCANPSC110SM/NOPB | Legacy 4-port predecessor; no stitcher mode, no transparent mode, no pass-through bits, no LFSR compactor. | Limited to basic multidrop switching; incompatible with modern ATPG tools requiring advanced mode support. | Select only for legacy system maintenance where backward compatibility with older designs is mandatory. |
Compared with SCANSTA112SMX/NOPB, SCANSTA111SM/NOPB offers reduced channel count and diagnostic capability but lower unit cost, while SCANPSC110SM/NOPB omits critical features like transparent mode and pass-through signaling-making it unsuitable for new designs requiring flexibility or flash programming integration.
Availability
SCANSTA112SMX/NOPB is available at Aetrix Electronics and suitable for board-level FPGA configuration, multi-board system test, ASIC boundary-scan debug, and flash memory programming requiring stable component supply across industrial temperature ranges and long-lifecycle programs.
Supply support for SCANSTA112SMX/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with decades of investment in test and debug infrastructure for complex electronic systems.
The SCANSTA112SMX/NOPB belongs to TI's IEEE 1149.1 boundary-scan support product line, designed specifically to solve scalability, partitioning, and hierarchical access challenges in high-density, multi-board test environments.
FAQ
What is the primary function of the SCANSTA112SMX/NOPB in a JTAG test architecture?
The SCANSTA112SMX/NOPB functions as an addressable IEEE 1149.1 multidrop multiplexer that extends a single backplane test bus to manage up to seven independent local scan chains. It enables hierarchical test access, slot-based device selection, and dynamic port configuration-allowing engineers to isolate, target, and program specific devices across complex multi-board systems without modifying physical JTAG cabling. Its core value lies in improving test throughput and fault isolation granularity.
Does the SCANSTA112SMX/NOPB support both ScanBridge and Stitcher operating modes?
Yes, the SCANSTA112SMX/NOPB supports both ScanBridge and Stitcher modes. ScanBridge mode uses Level-1 (device address) and Level-2 (port selection) protocols for full configurability, while Stitcher mode bypasses both levels via the SB/S pin to directly enter operational mode-reducing test setup overhead. This dual-mode capability makes SCANSTA112SMX/NOPB adaptable to legacy ATPG flows and newer high-speed programming requirements.
How does the bidirectional port capability of the SCANSTA112SMX/NOPB improve system test flexibility?
The SCANSTA112SMX/NOPB allows either backplane port (B0/B1) or LSP0 to operate as master or slave via MPselB1/B0 and internal crossover logic. This means an alternate test controller can drive the entire scan network through LSP0 while the backplane port serves as a passive endpoint-enabling flexible test topologies without redesigning backplane wiring. It also supports live insertion/withdrawal by parking local TAPs in stable states during card replacement.
Can the SCANSTA112SMX/NOPB be used to route non-JTAG signals such as flash programming pulses?
Yes, the SCANSTA112SMX/NOPB includes general-purpose pass-through bits (A0/A1/Y0/Y1) that route signals between backplane and selected LSPs outside the JTAG protocol. When a single LSP is selected, these pins deliver write-enable pulses or monitor status lines-supporting in-system flash programming without requiring additional GPIO resources or external logic. This capability is explicitly documented in the pin descriptions and application overview sections of the SCANSTA112SMX/NOPB datasheet.
What package and thermal specifications apply to the SCANSTA112SMX/NOPB?
The SCANSTA112SMX/NOPB is supplied in a 100-pin NFBGA (NZD) package measuring 7 mm × 7 mm with 0.5-mm pitch. It has a thermal resistance θJA of 35°C/W, maximum power dissipation of 3.57 W at 25°C, and MSL Level-4 rating (260°C peak reflow, 72-hour floor life). Its RoHS-compliant SnAgCu finish and industrial −40°C to +85°C operating range make it suitable for high-reliability embedded test infrastructure deployments.
SCANSTA112SMX/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 100-LFBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Not For New Designs
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 100-FBGA (10x10)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA112SMX/NOPB FAQ
1.How can I place an order for SCANSTA112SMX/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA112SMX/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA112SMX/NOPB reliable?
The price and inventory of SCANSTA112SMX/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA112SMX/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA112SMX/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA112SMX/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA112SMX/NOPB?
SCANSTA112SMX/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA112SMX/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA112SMX/NOPB?
For technical support, including SCANSTA112SMX/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA112SMX/NOPB requirements.
6.How does Aetrix verify that SCANSTA112SMX/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA112SMX/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA112SMX/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA112SMX/NOPB?
All SCANSTA112SMX/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA112SMX/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA112SMX/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA112SMX/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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