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Texas Instruments SCANSTA112VS
- Part No.:
- SCANSTA112VS
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 100-TQFP
- Datasheet:
-
SCANSTA112VS.pdf
- Description:
- IC INTERFACE SPECIALIZED 100TQFP
- Quantity:
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Inventory:3,034
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Product details
Overview
SCANSTA112VS from Texas Instruments is a 7-port IEEE 1149.1 (JTAG) multidrop multiplexer IC designed to extend boundary-scan test access across backplane-connected boards. It supports hierarchical and addressable scan chain routing, provides bidirectional backplane/LSP0 slave/master port interchangeability, enables up to 249 unique slot addresses, and operates from 3.0–3.6 V for industrial systems requiring board-level structural test and FPGA/ASIC programming.
For engineers reviewing the SCANSTA112VS datasheet, SCANSTA112VS pinout, SCANSTA112VS application, or SCANSTA112VS equivalent, this device serves as a critical infrastructure component in high-density JTAG test architectures-particularly where live insertion, TRST-aware local TAP control, transparent mode vector compatibility, and 7 independent local scan port management are required.
Technical Context
The SCANSTA112VS implements dual-level IEEE 1149.1 protocol extension: Level-1 addressing selects individual or multicast groups of devices on a shared backplane bus using 8-slot inputs, while Level-2 configuration routes one or more of its seven local scan ports (LSP0–LSP6) into the active scan chain. Its TAP controller manages instruction register loading, mode register access (Mode Register 0), and stitcher/transparent mode activation via dedicated pins.
It integrates bidirectional master/slave logic for B0/B1 backplane ports, supports TRST gating per local port, includes a 32-bit TCK counter for self-test synchronization, and features 16-bit LFSR signature compaction. The device allows local TAPs to be tri-stated via OE input, enabling alternate test masters to seize control without hardware reconfiguration.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| IEEE Standard Compliance | Fully compliant with IEEE Std. 1149.1 (JTAG) for both backplane and local scan ports |
| Local Scan Ports | 7 configurable IEEE 1149.1-compatible ports (LSP0–LSP6) with independent TCK/TMS/TDO/TDI and TRST outputs |
| Addressing Capacity | Supports up to 249 unique slot addresses via 8-slot inputs (S0–S7), plus interrogation, broadcast, and 4 multicast group addresses |
| Supply Voltage Range | 3.0 V to 3.6 V - ensures compatibility with 3.3 V industrial logic families and stable operation across temperature |
| Operating Temperature | −40°C to +85°C - qualified for extended industrial environments including telecom and embedded control chassis |
| Max Clock Frequency | 25 MHz in ScanBridge mode - defines maximum vector throughput for real-time boundary-scan testing and FPGA configuration |
| Package Type | 100-pin NFBGA (NZD) - compact footprint suitable for high-density backplane interface cards and modular test fixtures |
Pinout & Package
SCANSTA112VS is housed in a 100-pin NFBGA (NZD) package with 0.8 mm ball pitch, optimized for automated assembly and thermal performance in multi-board test systems. Pin functions are validated per TI SNLS161I datasheet Figures 4–5 and PIN DESCRIPTIONS section.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| VCC (10 pins) | Power supply input | Distributed power rail connections ensure low-noise, stable 3.3 V operation across all internal logic blocks and I/O drivers |
| GND (10 pins) | Ground reference | Multiple ground balls minimize impedance and reduce crosstalk between scan signal paths and clock domains |
| TCKB0 / TCKB1 | Backplane test clock input/output | Bidirectional TRI-STATE pins with hysteresis support master/slave clock distribution and system-level timing synchronization |
| TMSB0 / TMSB1 | Backplane test mode select | 24 mA drive strength enables robust TAP state control across long backplane traces under noisy conditions |
| TDIB0 / TDIB1 | Backplane test data input | 25 kΩ internal pull-up allows reliable idle-state detection without external biasing in multidrop configurations |
| TDOB0 / TDOB1 | Backplane test data output | 12 mA TRI-STATE output drives return scan data toward master controller with controlled slew rate |
| S0–S7 | Slot identification inputs | Hardwired address pins define unique device identity for Level-1 multidrop selection in backplane networks |
| OE | Output enable (active low) | Global control to tri-state all local scan port outputs, permitting external test resources to directly access LSP-connected devices |
Key Features
| Feature | Design Value |
|---|---|
| True IEEE 1149.1 Hierarchical & Multidrop Addressing | Enables scalable test architecture across dozens of boards using single backplane bus - eliminates serial daisy-chain bottlenecks |
| Bidirectional Backplane & LSP0 Port Interchangeability | Allows LSP0 to act as alternate master port when backplane becomes slave - supports redundant test path failover |
| Stitcher Mode Bypassing Level-1/2 Protocols | Reduces test setup latency by skipping address decode and port selection steps - accelerates FPGA programming sequences |
| Transparent Mode Activation | Removes SCANSTA112 registers from scan chain - enables reuse of legacy ATPG vectors generated for direct-connected devices |
| 32-bit TCK Counter + 16-bit LFSR Compactor | Supports built-in self-test (BIST) execution on selected ports while others undergo concurrent scan operations |
| TRST Control Per Local Port | Independent TRST gating (TRST01–TRST06) prevents unintended reset of adjacent devices during targeted boundary-scan sessions |
Applications
| Telecom Line Card Test | Modular Industrial PLC Chassis |
|---|---|
Use Scenario: Testing multiple FPGAs, ASICs, and flash memory on hot-swappable line cards connected to a central backplane. IC Role / Device Role / Timing Role: SCANSTA112VS acts as addressable JTAG switch, isolating each card's scan chain for parallel fault isolation and firmware update. Use Value: Enables live insertion/removal without disrupting test access to remaining modules - reduces system downtime during field maintenance. |
Use Scenario: Verifying inter-board connectivity and programming configuration bitstreams across distributed I/O modules in programmable logic controllers. IC Role / Device Role / Timing Role: SCANSTA112VS serves as hierarchical scan bridge, cascading local ports to build multi-tier boundary-scan trees spanning CPU, communication, and sensor modules. Use Value: Improves test coverage by partitioning complex systems into manageable sub-chains - cuts vector generation time by >40% versus flat scan chains. |
| High-Density Server Baseboard Validation | Avionics LRUs with Dual-Redundant Test Paths |
Use Scenario: Structural test of CPU, memory controller, PCIe switches, and BMC on dense server baseboards with limited physical test access points. IC Role / Device Role / Timing Role: SCANSTA112VS provides 7 local scan ports to route JTAG signals to discrete ICs while maintaining IEEE 1149.1 compliance at each node. Use Value: Eliminates need for manual jumpering or probe-based access - achieves 100% netlist coverage with automated test equipment. |
Use Scenario: Ensuring test continuity across primary and backup avionics line-replaceable units (LRUs) sharing a common backplane bus. IC Role / Device Role / Timing Role: SCANSTA112VS implements dual-mode operation: ScanBridge for routine diagnostics and Stitcher mode for rapid reprogramming during mission-critical updates. Use Value: Guarantees deterministic test path behavior under EMI stress - meets DO-254 design assurance level A requirements for safety-critical systems. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar IEEE 1149.1 multidrop multiplexing applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA111 | Lacks LSP6 port and 32-bit TCK counter; supports only 6 local scan ports and no built-in self-test capability | Not suitable for systems requiring 7-device fanout or concurrent BIST execution | Select SCANSTA111 only when cost sensitivity outweighs need for full feature set and future scalability |
| SCANPSC110 | Predecessor with no Level-2 port grouping (no serial/parallel LSP selection), no transparent mode, and no TRST per-port control | Cannot support modern FPGA programming workflows requiring vector reuse or selective reset isolation | Use SCANPSC110 only for legacy designs already deployed with fixed toolchain constraints |
Compared with SCANSTA111 and SCANPSC110, SCANSTA112VS delivers expanded port count, deterministic transparent mode, and integrated test acceleration features - making it the only option supporting full IEEE 1149.1 hierarchical test deployment in new industrial and aerospace platforms.
Availability
SCANSTA112VS is available at Aetrix Electronics and suitable for telecom line card validation, modular PLC chassis testing, and high-density server baseboard structural test requiring stable component supply and long-term lifecycle support.
Supply support for SCANSTA112VS includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies with over 50 years of innovation in test and measurement ICs.
The SCANSTA112VS belongs to TI's IEEE 1149.1 infrastructure product line, engineered specifically for scalable, addressable boundary-scan test systems in telecom, industrial automation, and aerospace applications.
FAQ
What is the primary function of the SCANSTA112VS in a JTAG test architecture?
The SCANSTA112VS functions as an addressable IEEE 1149.1 multidrop multiplexer that extends boundary-scan access across backplane-connected boards. It enables hierarchical test network construction by supporting Level-1 device addressing and Level-2 local port selection. SCANSTA112VS allows engineers to isolate specific scan chains for parallel testing, accelerate FPGA programming via Stitcher mode, and maintain system-level test continuity during live board insertion - all while preserving full IEEE 1149.1 compliance at every interface.
Does SCANSTA112VS support both ScanBridge and Stitcher modes, and how do they differ?
Yes, SCANSTA112VS supports both ScanBridge and Stitcher modes. ScanBridge mode requires sequential Level-1 (device address) and Level-2 (port selection) protocol execution before scan data transfer, ensuring strict hierarchical control. Stitcher mode bypasses both levels via SB/S pin assertion, directly enabling operational mode - reducing setup latency for time-critical tasks like FPGA configuration. Both modes support Transparent mode, but activation method differs: instruction-based in ScanBridge, pin-driven in Stitcher. SCANSTA112VS implements both per TI SNLS161I specification.
How many local scan ports does SCANSTA112VS provide, and what signals do they deliver?
SCANSTA112VS provides seven fully independent local scan ports (LSP0 through LSP6), each delivering IEEE 1149.1-compliant TCK, TMS, TDI, TDO, and TRST signals to downstream devices. Each port includes dedicated TRI-STATE drivers with specified output current (24 mA for TCK/TMS/TRST; 12 mA for TDO), internal pull-ups on input pins, and optional pass-through functionality (A/Y pins on LSP0/LSP1). This 7-port capability enables simultaneous test access to diverse ICs - such as FPGAs, microcontrollers, and flash memory - within a single board or module.
What packaging and thermal specifications apply to SCANSTA112VS?
SCANSTA112VS is supplied in a 100-pin NFBGA (NZD) package with 0.8 mm ball pitch, rated for −40°C to +85°C industrial operation. Its thermal resistance is θJA = 35°C/W, and max package power capacity is 3.57 W at 25°C ambient. Derating is 28.57 mW/°C above 25°C. The package supports JEDEC-standard reflow (MSL Level-4, peak 260°C), and RoHS-compliant variants (e.g., SCANSTA112SM/NOPB) use SNAGCU ball finish. These specs ensure reliable thermal performance in densely packed backplane test fixtures and convection-cooled chassis.
Can SCANSTA112VS operate with 3.3 V logic families, and what are its voltage tolerances?
Yes, SCANSTA112VS is designed for 3.3 V operation with a recommended supply range of 3.0 V to 3.6 V. Input voltage tolerance spans 0 V to VCC, and output swing is rail-to-rail (0 V to VCC) with guaranteed VOH ≥ 2.4 V at 12 mA sink and VOL ≤ 0.4 V at 12 mA source. VIH minimum is 2.1 V and VIL maximum is 0.8 V - fully compatible with standard 3.3 V LVTTL and LVCMOS interfaces. Absolute maximum ratings cap VCC at +4.0 V, protecting against overvoltage transients in shared backplane environments.
SCANSTA112VS Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 100-TQFP
- Packaging:
- Tray
- Product Status:
- Obsolete
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 100-TQFP (14x14)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA112VS FAQ
1.How can I place an order for SCANSTA112VS through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA112VS on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA112VS reliable?
The price and inventory of SCANSTA112VS are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA112VS is usually 5 days.
3.What payment methods are accepted for SCANSTA112VS?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA112VS transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA112VS?
SCANSTA112VS orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA112VS order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA112VS?
For technical support, including SCANSTA112VS datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA112VS requirements.
6.How does Aetrix verify that SCANSTA112VS is sourced from the original manufacturer or authorized distributors?
All SCANSTA112VS products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA112VS meets industry standards.
7.What is the process for return or replacement of SCANSTA112VS?
All SCANSTA112VS units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA112VS, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA112VS part is unused and in its original packaging.
Return procedure for SCANSTA112VS:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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