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Texas Instruments SCANSTA112VSX/NOPB
- Part No.:
- SCANSTA112VSX/NOPB
- Manufacturer:
- Texas Instruments
- Category:
- Specialized
- Package:
- 100-TQFP
- Datasheet:
-
SCANSTA112VSX/NOPB.pdf
- Description:
- IC INTERFACE SPECIALIZED 100TQFP
- Quantity:
- Payment:
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Product details
Overview
SCANSTA112VSX/NOPB from Texas Instruments is a 7-port IEEE 1149.1 (JTAG) multidrop multiplexer supporting hierarchical test bus architecture, 3.0–3.6 V operation, −40°C to +85°C industrial temperature range, and up to 25 MHz TCK frequency. It enables system-level boundary-scan access across multiple PCBs via addressable backplane connectivity.
For engineers reviewing the SCANSTA112VSX/NOPB datasheet, SCANSTA112VSX/NOPB pinout, SCANSTA112VSX/NOPB application, or SCANSTA112VSX/NOPB equivalent, this device serves as a critical infrastructure component for board-level JTAG chain management, live-insertion-capable backplane test systems, and FPGA/ASIC programming isolation in high-density embedded platforms.
Technical Context
The SCANSTA112VSX/NOPB implements dual-level IEEE 1149.1 protocol extension: Level-1 supports up to 249 unique slot addresses (including broadcast/multicast), while Level-2 enables per-port selection of its seven local scan ports (LSP0–LSP6) for serial or grouped insertion into the active scan chain. Its bidirectional backplane ports (B0/B1) support master/slave reconfiguration without hardware change.
It integrates a 32-bit TCK counter for built-in self-test timing, 16-bit LFSR signature compactor for response compression, and transparent mode that bypasses internal registers to maintain legacy vector compatibility. The device supports stitcher mode (skipping Level-1/2 protocols via pins) and supports TRST gating on all local ports with known power-up state.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 3.0 V to 3.6 V - Ensures compatibility with 3.3 V logic systems and avoids level-shifting circuitry. |
| Operating Temp | −40°C to +85°C - Qualified for industrial-grade embedded and telecom equipment deployment. |
| Max TCK Frequency | 25 MHz - Supports high-speed JTAG programming of FPGAs and flash memory without timing violation. |
| Local Scan Ports | 7 configurable ports (LSP0–LSP6) - Enables independent access to up to seven device clusters per board. |
| Slot Address Space | Up to 249 unique addresses - Allows scalable multidrop backplane with interrogation, broadcast, and 4 multicast groups. |
| Pass-through Bits | General-purpose A/Y pairs on B0/B1 and LSP0/LSP1 - Delivers write pulses for flash programming or monitors status signals during scan. |
| TCK Counter | 32-bit - Enables precise timing control for on-chip self-test sequences without external clock sources. |
Pinout & Package
NFBGA-100 package (NZD variant), 10 mm × 10 mm, 0.8 mm pitch, RoHS-compliant SNAGCU ball finish, MSL Level-4 (260°C peak, 72 hr floor life).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| TCKB0 / TCKB1 | Backplane Test Clock Input/Output | Bidirectional master/slave clock interface; drives buffered TCK(01–06) outputs to local scan chains. |
| TMSB0 / TMSB1 | Backplane Test Mode Select | Controls TAP sequencing for both SCANSTA112 and downstream local TAP controllers. |
| TDIB0 / TDIB1 | Backplane Test Data Input | Primary data entry point for scan instructions and vectors; includes 25 kΩ pull-up, no ESD diode. |
| TDOB0 / TDOB1 | Backplane Test Data Output | Tri-state output returning captured responses; sampled during interrogation addressing. |
| S0–S7 | Slot Identification Inputs | 8-bit address configuration defining unique identity in multidrop backplane (e.g., S0–S7 = 00000000 reserved). |
| LSPsel0–LSPsel6 | Local Scan Port Selection | Direct hardware control for enabling individual or grouped LSPs in stitcher mode. |
| OE | Output Enable (active low) | Tri-states all local scan port outputs (TDO/TMS/TCK/TRST) to allow alternate test master takeover. |
| TRISTB0 / TRISTB1 | Tri-State Notification Output | Asserts high when associated TDOBn is tri-stated - provides visibility into port enable state for system diagnostics. |
Key Features
| Feature | Design Value |
|---|---|
| Hierarchical & Multidrop Addressing | Supports system-level JTAG tree construction with root-tier SCANSTA112s selecting second-tier devices via cascaded LSP connections. |
| Bi-directional Backplane Ports | B0/B1 ports dynamically switch between master and slave roles - eliminates need for fixed-direction buffers in backplane layout. |
| Stitcher Mode Bypass | Skips Level-1/2 protocol handshake using SB/S pin - reduces test setup latency for pre-configured scan paths. |
| Transparent Mode | Removes SCANSTA112's internal registers from scan chain via single instruction - preserves legacy ATPG vector compatibility. |
| Live Insertion Support | Robust I/O structure with controlled power-off leakage (±200 µA on pull-up pins) enables hot-plug capability in modular backplanes. |
Applications
| Board-Level JTAG Partitioning | Modular Backplane Testing |
|---|---|
|
Use Scenario: Isolating FPGA, ASIC, and processor JTAG chains on a single PCB to reduce test vector size and improve fault isolation. IC Role / Device Role / Timing Role: Acts as a programmable JTAG switch that routes backplane TCK/TMS/TDI/TDO to selected local scan ports while buffering signals. Use Value: Reduces average test time by 40% versus flat-chain approach and enables concurrent programming of multiple FPGAs. |
Use Scenario: Enabling system-level structural test across 12+ plug-in cards sharing one IEEE 1149.1 backplane bus. IC Role / Device Role / Timing Role: Provides slot-addressed access to each card's local scan network, supporting broadcast, multicast, and individual targeting. Use Value: Eliminates need for dedicated test connectors per board and maintains test access after field replacement of failed modules. |
| FPGA Configuration Isolation | Flash Memory Programming |
|
Use Scenario: Programming Xilinx and Intel FPGAs independently without interference from adjacent devices on shared JTAG daisy chain. IC Role / Device Role / Timing Role: Inserts itself between backplane controller and target FPGA, presenting only one logical scan chain per LSP. Use Value: Prevents configuration corruption during partial reconfiguration and allows bitstream verification before committing to flash. |
Use Scenario: Delivering timed write pulses to NOR/NAND flash devices during in-system programming via JTAG boundary-scan. IC Role / Device Role / Timing Role: Uses general-purpose A/Y pass-through bits (A0B0→Y0B0, etc.) to generate precise strobes synchronized to TCK edges. Use Value: Enables reliable flash programming without adding discrete pulse generators or modifying FPGA logic. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar JTAG multiplexer applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SCANSTA111SM/NOPB | 6-port version, no LSP6, lacks 32-bit TCK counter and LFSR compactor. | Supports smaller-scale systems with ≤6 local chains; not suitable for 7-device partitioning or BIST timing. | Select when cost sensitivity outweighs port count and diagnostic feature requirements. |
| SCANPSC110SM/NOPB | Legacy 4-port predecessor; no multidrop addressing, no stitcher mode, no transparent mode. | Limited to point-to-point JTAG muxing; requires full protocol stack for every operation. | Only for legacy redesigns where backward compatibility with PSC110-based infrastructure is mandatory. |
Compared with SCANSTA111SM/NOPB and SCANPSC110SM/NOPB, SCANSTA112VSX/NOPB delivers expanded scalability (7 ports, 249-slot addressing), enhanced diagnostics (32-bit counter, LFSR), and operational flexibility (stitcher/transparent modes), making it the only option for new high-density modular test architectures.
Availability
SCANSTA112VSX/NOPB is available at Aetrix Electronics and suitable for board-level JTAG partitioning, modular backplane testing, FPGA configuration isolation, flash memory programming, and live-insertion-capable system diagnostics requiring stable component supply across industrial lifecycle durations.
Supply support for SCANSTA112VSX/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and connectivity technologies, with decades of investment in test and debug infrastructure for complex electronic systems.
The SCANSTA112VSX/NOPB belongs to TI's IEEE 1149.1 infrastructure portfolio, designed specifically to solve scalability, isolation, and system-level access challenges in high-reliability embedded, telecom, and industrial control applications.
FAQ
What is the primary function of the SCANSTA112VSX/NOPB in a JTAG test system?
The SCANSTA112VSX/NOPB functions as an addressable IEEE 1149.1 multiplexer that enables selective access to up to seven local scan chains from a shared backplane test bus. It supports hierarchical test architectures, multidrop addressing, and real-time port reconfiguration - allowing engineers to isolate, program, and diagnose specific device clusters without disrupting the entire system. Its role is foundational to scalable, modular boundary-scan implementation.
Does SCANSTA112VSX/NOPB support live insertion and removal in backplane systems?
Yes, SCANSTA112VSX/NOPB supports live insertion/withdrawal per its datasheet specification. Its I/O structure features controlled power-off leakage (±200 µA on pull-up pins), capacitive load behavior during VCC=0V conditions, and robust ESD handling - all validated for hot-plug operation in modular backplane environments. This capability ensures uninterrupted test access during field maintenance of plug-in cards.
How does the SCANSTA112VSX/NOPB handle TRST signals across its local scan ports?
SCANSTA112VSX/NOPB provides individual TRST(01–06) outputs per local port, each gated from the backplane TRSTB signal. It also includes dedicated TLR_TRST and TLR_TRST6 inputs to set driven values during TAP controller reset states. All six local TRST outputs are tri-state capable, and TRST on LSP6 is independently controllable - ensuring precise reset coordination across heterogeneous JTAG devices.
Can SCANSTA112VSX/NOPB operate in transparent mode, and what does that achieve?
Yes, SCANSTA112VSX/NOPB supports transparent mode, activated via a dedicated instruction or the TRANS pin. In this mode, all internal registers and pad-bits are excluded from the scan chain, presenting a direct electrical path between backplane and selected local port. This preserves compatibility with ATPG vectors generated for flat scan chains - eliminating retargeting effort when integrating the device into existing test flows.
What package type and RoHS status does SCANSTA112VSX/NOPB use?
SCANSTA112VSX/NOPB uses a 100-pin NFBGA (NZD) package with 10 mm × 10 mm footprint, 0.8 mm ball pitch, SNAGCU (matte tin over copper) ball finish, and RoHS-compliant construction. It carries MSL Level-4 rating (260°C peak reflow, 72-hour floor life), and is qualified for industrial temperature operation from −40°C to +85°C.
SCANSTA112VSX/NOPB Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 100-TQFP
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Not For New Designs
- Applications:
- Testing Equipment
- Interface:
- IEEE 1149.1
- Voltage - Supply:
- 3V ~ 3.6V
- Supplier Device Package:
- 100-TQFP (14x14)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
SCANSTA112VSX/NOPB FAQ
1.How can I place an order for SCANSTA112VSX/NOPB through Aetrix?
Please submit a Request for Quotation (RFQ) for SCANSTA112VSX/NOPB on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SCANSTA112VSX/NOPB reliable?
The price and inventory of SCANSTA112VSX/NOPB are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SCANSTA112VSX/NOPB is usually 5 days.
3.What payment methods are accepted for SCANSTA112VSX/NOPB?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SCANSTA112VSX/NOPB transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SCANSTA112VSX/NOPB?
SCANSTA112VSX/NOPB orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SCANSTA112VSX/NOPB order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SCANSTA112VSX/NOPB?
For technical support, including SCANSTA112VSX/NOPB datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SCANSTA112VSX/NOPB requirements.
6.How does Aetrix verify that SCANSTA112VSX/NOPB is sourced from the original manufacturer or authorized distributors?
All SCANSTA112VSX/NOPB products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SCANSTA112VSX/NOPB meets industry standards.
7.What is the process for return or replacement of SCANSTA112VSX/NOPB?
All SCANSTA112VSX/NOPB units undergo pre-shipment inspection (PSI). If there is an issue with SCANSTA112VSX/NOPB, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SCANSTA112VSX/NOPB part is unused and in its original packaging.
Return procedure for SCANSTA112VSX/NOPB:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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