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Texas Instruments SN74ABT16853DGGR

Part No.:
SN74ABT16853DGGR
Manufacturer:
Texas Instruments
Category:
Buffers, Drivers, Receivers, Transceivers
Package:
56-TFSOP (0.240", 6.10mm Width)
Datasheet:
AetrixSN74ABT16853DGGR.pdf
Description:
IC TXRX NON-INVERT 5.5V 56TSSOP
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:3,993

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Product details

Overview

SN74ABT16853 from Texas Instruments is a dual 8-bit to 9-bit parity bus transceiver with integrated parity generator/checker, latch-enabled error flag (ERR), and high-drive outputs (–32 mA IOH, 64 mA IOL) for bidirectional data bus communication in 5-V systems. It operates from –40°C to 85°C and features flow-through architecture, distributed VCC/GND pins, and true data output logic.

For engineers reviewing the SN74ABT16853 datasheet, SN74ABT16853 pinout, SN74ABT16853 application, or SN74ABT16853 equivalent, key selection considerations include its dual-bus parity checking capability, ERR flag latching/clearing control (LE/CLR), open-collector ERR output, and compatibility with Widebus™-optimized PCB layouts requiring low ground bounce (<1 V VOLP).

Technical Context

The SN74ABT16853 implements two independent 8-bit transceivers, each with a 9th parity bit path. Parity generation occurs on A→B transfers (odd parity), while parity checking occurs on B→A transfers using the PARITY input alongside B1–B8 - triggering ERR assertion on mismatch. The ERR signal is sampled, stored, or cleared via LE and CLR inputs, enabling diagnostic flag retention across bus cycles.

Its EPIC-II™B BiCMOS process delivers high-speed switching (tPLH/tPHL ≤ 4.2 ns typical) with low power dissipation and latch-up immunity >500 mA per JEDEC JESD-17. Output-enable (OEA/OEB) controls isolate buses, and OE tie-high via pullup ensures defined high-Z state during power sequencing.

Key Specifications

Parameter Value and Actual Design Meaning
Supply Voltage 4.5 V to 5.5 V - supports standard 5-V TTL-compatible system rails with margin for ripple and drop.
Operating Temperature –40°C to +85°C - qualified for industrial-grade embedded and computing applications.
Output Drive –32 mA IOH / 64 mA IOL - drives heavy capacitive loads and multiple TTL inputs without external buffers.
Propagation Delay tPLH/tPHL ≤ 4.2 ns (max) - enables reliable operation in high-speed backplane and memory bus timing budgets.
Ground Bounce (VOLP) <1 V at VCC = 5 V, TA = 25°C - minimizes noise coupling into adjacent signals during simultaneous switching.
Parity Function Odd-parity generation on A→B; parity checking on B→A with ERR flag - provides hardware-level data integrity verification.
ERR Output Type Open-collector - allows wired-OR fault signaling across multiple transceivers on shared diagnostic bus.

Pinout & Package

SN74ABT16853 is packaged in a 56-pin Thin Shrink Small-Outline (DGG) package with 0.5-mm pitch, optimized for high-density PCB layouts and thermal performance (θJA = 81°C/W).

Pin/Terminal Circuit Role Design Meaning
1OEA, 2OEA, 1OEB, 2OEB Output Enable (A/B side) Active-low controls enable/disable of respective 8-bit transceiver direction; both low enables A→B transfer.
1LE, 2LE Latch Enable Active-high samples and stores current ERR state into internal register for diagnostic readback.
1CLR, 2CLR Clear Input Active-low resets ERR latch to logic high, clearing prior parity error indication.
1ERR, 2ERR Parity Error Flag Open-collector output asserted low when B-bus parity check fails; requires external pullup.
1PARITY, 2PARITY Parity Output/Input Generated odd parity bit on A→B; used as reference input for B→A parity validation.
A1–A8, B1–B8 (per side) Data I/O Ports Bidirectional 8-bit data paths; true (non-inverted) data routing between buses.
VCC, GND (multiple) Power Distribution Distributed VCC/GND pins reduce simultaneous switching noise and improve signal integrity.

Key Features

Feature Design Value
Flow-through architecture Input and output pins aligned on opposite sides of package - simplifies layer routing and reduces trace crossovers.
Latched parity-error flag ERR state persists after transient bus errors - enables asynchronous fault detection and system-level diagnostics.
Inverted parity mode When both OEA/OEB low, forced even parity generates known error condition - aids system bring-up and test coverage.
High-noise-immunity BiCMOS EPIC-II™B process delivers TTL-compatible thresholds with CMOS-like low static power and robust latch-up performance (>500 mA).
Distributed power/ground Multiple VCC/GND pins minimize ground bounce and supply rail collapse during fast edge transitions.

Applications

Backplane Data Integrity Industrial Control Bus

Use Scenario: Bidirectional data exchange between CPU and peripheral modules across a 16-slot VMEbus backplane with parity protection.

IC Role / Device Role / Timing Role: Dual transceiver routes 8-bit data + parity between slot-specific A and B buses; ERR flags parity mismatches per slot.

Use Value: Hardware-level error detection eliminates need for software CRC overhead and enables real-time fault isolation per bus segment.

Use Scenario: Interfacing PLC I/O modules to a central controller over a noise-prone 24-V industrial fieldbus.

IC Role / Device Role / Timing Role: SN74ABT16853 isolates controller and module buses while validating parity on all status/command transfers.

Use Value: Open-collector ERR outputs wire-OR to a single fault interrupt line, reducing GPIO count and simplifying failure response.

Memory Subsystem Buffering Test Equipment Data Path

Use Scenario: Buffering address/data between microcontroller and dual-port SRAM in a high-reliability avionics subsystem.

IC Role / Device Role / Timing Role: Transceiver handles A→B writes (generating parity) and B→A reads (checking parity), with LE capturing first error for post-mortem analysis.

Use Value: Latched ERR flag survives reset events, allowing root-cause correlation between memory access and detected corruption.

Use Scenario: High-speed digital pattern generator interfacing to DUT via parallel bus with built-in data integrity verification.

IC Role / Device Role / Timing Role: SN74ABT16853 validates stimulus/response parity in real time; inverted parity mode injects controlled errors for test coverage.

Use Value: Eliminates need for external parity logic or FPGA-based checking - reduces BOM count and design complexity.

Equivalent & Alternatives

The following parts are listed as comparable options for similar parity bus transceiver applications.

Alternative Part Technical Difference Application Difference Selection Advice
SN74ABT162245DGGR No parity generation/checking; dual 8-bit non-inverting transceiver only; identical DGG-56 package and drive strength. Suitable where bus isolation and level translation are required but parity is handled elsewhere (e.g., by processor or FPGA). Select when parity logic resides outside the transceiver and minimal gate count is prioritized.
74FCT16853CTPAG FCT-family CMOS; lower drive (–24 mA IOH, 48 mA IOL); same pinout but different timing (tPD ~5.5 ns max); no inverted parity mode. Compatible for basic parity checking in cost-sensitive industrial designs where slightly relaxed speed and drive are acceptable. Choose for lower power consumption and legacy FCT ecosystem compatibility, accepting reduced noise margin and feature set.

Compared with SN74ABT16853, SN74ABT162245DGGR omits parity entirely - trading diagnostic capability for simplicity - while 74FCT16853CTPAG offers pin-compatible parity functionality at lower speed and drive, making it suitable only where SN74ABT16853's BiCMOS advantages (noise immunity, latch-up rating, VOLP) are not critical.

Availability

SN74ABT16853 is available at Aetrix Electronics and suitable for industrial control systems, avionics data buses, and test equipment requiring stable component supply, long-term lifecycle support, and verified 5-V TTL-compatible bus interface performance.

Supply support for SN74ABT16853 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader delivering analog, embedded processing, and connectivity solutions with emphasis on reliability, scalability, and industrial-grade qualification.

The SN74ABT16853 belongs to TI's Widebus™ family of high-speed bus interface ICs, designed specifically for noise-resilient, high-density data routing in mission-critical computing and control infrastructure.

FAQ

What is the function of the LE and CLR pins on the SN74ABT16853?

The LE (Latch Enable) and CLR (Clear) pins control the internal parity-error flag register. LE (active-high) captures the current state of ERR into a latch for persistent fault indication, while CLR (active-low) resets the latch to logic high, clearing any previously stored error condition. This allows the SN74ABT16853 to maintain error status across bus idle periods or system interrupts, supporting robust diagnostics without continuous polling.

Does the SN74ABT16853 support both A→B and B→A parity checking?

The SN74ABT16853 supports full bidirectional parity handling: it generates odd parity on A→B transfers and checks parity on B→A transfers using the PARITY input along with B1–B8. When a mismatch occurs during B→A transfer, the ERR output asserts low. The device does not perform parity checking on A→B transfers - that path only generates parity. This asymmetric function is inherent to the SN74ABT16853 architecture and documented in its function table.

Can the SN74ABT16853 operate at 3.3 V?

No, the SN74ABT16853 is specified only for 4.5 V to 5.5 V supply operation and is not 3.3-V compatible. Its input thresholds (VIH = 2 V min, VIL = 0.8 V max) and output drive characteristics are optimized for 5-V TTL systems. Attempting 3.3-V operation risks undefined logic states, insufficient noise margin, and potential damage due to VI/VCC violation - use TI's 74LVC or ALVC families for 3.3-V parity transceivers.

How is the open-collector ERR output used in a multi-transceiver system?

The open-collector ERR output of the SN74ABT16853 allows multiple devices to share a common fault bus via wired-OR connection with a single pullup resistor. When any SN74ABT16853 detects a parity error, its ERR pin pulls the line low, signaling system-wide fault condition. This eliminates need for external logic gates or multiplexers, simplifying fault aggregation in systems with multiple data paths - a key design advantage confirmed in TI's application guidance for bus integrity monitoring.

What is the purpose of inverted parity mode in the SN74ABT16853?

Inverted parity mode - activated when both OEA and OEB are low - forces even parity instead of odd during A→B transfer, creating a deliberate parity mismatch. This feature enables deterministic fault injection for system validation, burn-in testing, and diagnostic firmware verification. It is a unique capability of the SN74ABT16853 explicitly documented in its function table and not supported by most generic transceivers.

SN74ABT16853DGGR Specifications

Product attributes
Attribute value
Manufacturer:
Texas Instruments
Series:
74ABT
Package/Case:
56-TFSOP (0.240", 6.10mm Width)
Packaging:
Tape & Reel (TR)
Product Status:
Obsolete
Logic Type:
Transceiver, Non-Inverting
Number of Elements:
2
Number of Bits per Element:
8
Input Type:
-
Output Type:
Push-Pull
Current - Output High, Low:
32mA, 64mA
Voltage - Supply:
4.5V ~ 5.5V
Operating Temperature:
-40°C ~ 85°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
56-TSSOP

SN74ABT16853DGGR FAQ

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7.What is the process for return or replacement of SN74ABT16853DGGR?

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1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The SN74ABT16853DGGR part is unused and in its original packaging.

Return procedure for SN74ABT16853DGGR:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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