My Inquiry
My Account
Texas Instruments SNJ54ABT18245AWD
- Part No.:
- SNJ54ABT18245AWD
- Manufacturer:
- Texas Instruments
- Package:
- -
- Datasheet:
-
SNJ54ABT18245AWD.pdf
- Description:
- 54ABT18245A SCAN TEST DEVICES WI
- Quantity:
- Payment:
- Shipping:
Inventory:2,099
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
SNJ54ABT18245AWD from Texas Instruments is a military-grade 18-bit scan-testable bus transceiver with IEEE 1149.1 (JTAG) boundary-scan support, noninverting logic, dual 9-bit or single 18-bit data flow control, and operation across –55°C to 125°C. It serves as a test-accessible interface between A- and B-buses in high-reliability avionics and defense computing backplanes.
For engineers reviewing the SNJ54ABT18245AWD datasheet, SNJ54ABT18245AWD pinout, SNJ54ABT18245AWD application, or SNJ54ABT18245AWD equivalent, key selection criteria include JTAG-compliant test architecture, WD-package thermal/mechanical compatibility with MIL-PRF-38535 assemblies, DIR/OE-controlled bidirectional data routing, and boundary-scan register (44-bit) visibility into I/O states without functional interruption.
Technical Context
The SNJ54ABT18245AWD implements a full IEEE Std 1149.1-1990 TAP controller with 16-state synchronous finite-state machine, supporting EXTEST, SAMPLE/PRELOAD, IDCODE, HIGHZ, CLAMP, and RUNT instructions. Its boundary-scan register (BSR) contains 44 bits mapped to 18 I/O pairs plus 4 output-enable controls (1OEA/1OEB/2OEA/2OEB), direction controls (1DIR/2DIR), and output enables (1OE/2OE).
Test operations are synchronized to TCK (rising-edge capture, falling-edge update), with internal pullups on TMS and TDI. The device integrates EPIC-IIB BiCMOS design for reduced power dissipation while maintaining TTL-compatible voltage thresholds and drive strength - critical for legacy military bus interoperability.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Logic Type | Noninverting 18-bit bus transceiver, configurable as two independent 9-bit sections |
| Temperature Range | –55°C to +125°C - qualified per MIL-PRF-38535 for space and defense systems |
| JTAG Compliance | Fully compliant with IEEE Std 1149.1-1990 and 1149.1a-1993 (HIGHZ/CLAMP) |
| Boundary-Scan Register | 44-bit BSR with dedicated cells for all 36 I/O pins and 8 control signals (DIR/OE) |
| Supply Voltage | VCC = 4.5 V to 5.5 V - supports standard 5-V TTL bus environments |
| Propagation Delay | Typical tPD = 4.3 ns at VCC = 5 V - ensures timing closure in high-speed backplane designs |
| Output Drive | ±64 mA output drive - compatible with terminated and unterminated 50-Ω transmission lines |
Pinout & Package
Packaged in 380-mil fine-pitch ceramic flat (WD) package, compliant with MIL-PRF-38535 mechanical and thermal specifications for high-reliability mounting.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1A1–1A9, 2A1–2A9 | A-bus I/O ports | Normal-function inputs/outputs for first and second 9-bit A-side channels |
| 1B1–1B9, 2B1–2B9 | B-bus I/O ports | Normal-function inputs/outputs for first and second 9-bit B-side channels |
| 1DIR, 2DIR | Direction control | Controls data flow direction per 9-bit section: L = B→A, H = A→B |
| 1OE, 2OE | Output enable | Active-low enables transceiver function; H = high-impedance isolation |
| TCK, TMS, TDI, TDO | JTAG test access port | IEEE 1149.1 serial interface: clock, mode select, data in, data out |
| VCC, GND | Power supply | Single 5-V supply with multiple VCC/GND pairs for noise suppression and current distribution |
Key Features
| Feature | Design Value |
|---|---|
| Full IEEE 1149.1 Boundary-Scan | Enables in-system test of PCB interconnects without physical probe access - reduces test fixture cost and improves fault coverage |
| Dual 9-bit or Single 18-bit Mode | Provides layout flexibility: one wide data path or two independent channels sharing control logic |
| Test-Mode Noninterference | TAP activation in normal mode does not disrupt A/B bus data flow - allows concurrent functional operation and test readiness |
| EPIC-IIB BiCMOS Process | Delivers TTL-compatible drive with CMOS-level static power - essential for thermally constrained military enclosures |
| MIL-STD-883 Qualified | Meets screening, burn-in, and environmental stress requirements for Class B and Class S applications |
Applications
| Avionics Backplane Interfacing | Defense Radar Signal Processing |
|---|---|
Use Scenario: Bidirectional data exchange between flight computer modules and sensor I/O cards in ARINC-429 or custom parallel bus architectures. IC Role / Device Role / Timing Role: Bus transceiver providing level-shifted, direction-controlled, scan-testable coupling between subsystems operating under DO-254 compliance. Use Value: Enables boundary-scan verification of solder joints and trace continuity pre-flight, reducing field failure risk without adding test points. | Use Scenario: High-integrity data routing between FPGA-based signal processors and analog-to-digital converter (ADC) arrays in phased-array radar front ends. IC Role / Device Role / Timing Role: JTAG-accessible interface managing time-critical 18-bit sample streams while supporting built-in self-test via PSA/PRPG modes. Use Value: Allows real-time validation of I/O integrity during system power-up and periodic health checks - critical for mission-critical redundancy. |
| Secure Military Communications | Spacecraft Onboard Data Handling |
Use Scenario: Isolating and monitoring encrypted data paths between crypto modules and radio transceivers in SATCOM terminals. IC Role / Device Role / Timing Role: Scan-testable bus buffer ensuring deterministic latency and fault containment between security domains. Use Value: Supports tamper-evident boundary-scan logging of I/O state transitions - aids in cryptographic module certification (e.g., NSA Type 1). | Use Scenario: Interfacing radiation-hardened microprocessors with mass memory controllers in satellite command/data handling units. IC Role / Device Role / Timing Role: Radiation-tolerant 18-bit transceiver with JTAG diagnostics for post-launch validation of interconnect reliability in LEO orbit. Use Value: Provides remote, non-invasive verification of bus integrity after launch-induced vibration and thermal cycling - extends mission life assurance. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar 18-bit scan-testable bus transceiver applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SNJ54ABT18245AW | Same functionality and pinout; WD package variant without suffix 'D' - identical mechanical and electrical specs per SCBS110H rev F | No difference in use case; both qualified to MIL-PRF-38535 Class B | Select SNJ54ABT18245AWD when ordering requires explicit 'D' suffix per procurement documentation or lot traceability requirement |
| SNJ54ABT18245AJ | Same core logic; packaged in ceramic DIP (J) instead of WD - larger footprint, lower pin density, different thermal profile | Suitable for legacy board designs with through-hole assembly or manual rework constraints | Choose SNJ54ABT18245AJ only if WD package thermal/mechanical constraints cannot be met; verify PCB pad layout and reflow profile compatibility |
Compared with SNJ54ABT18245AW and SNJ54ABT18245AJ, the SNJ54ABT18245AWD offers identical boundary-scan capability and military temperature performance but delivers superior board-area efficiency and thermal management in fine-pitch surface-mount assemblies required by modern avionics and missile guidance electronics.
Availability
SNJ54ABT18245AWD is available at Aetrix Electronics and suitable for avionics backplane interfacing, defense radar signal processing, and secure military communications requiring stable component supply across extended lifecycle programs.
Supply support for SNJ54ABT18245AWD includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a U.S.-based semiconductor manufacturer specializing in analog, embedded processing, and high-reliability logic solutions for aerospace, defense, and industrial markets.
The SNJ54ABT18245AWD belongs to TI's SCOPE™ family of testability products, designed specifically to meet MIL-PRF-38535 requirements for boundary-scan testability in mission-critical electronic systems.
FAQ
What is the operating temperature range of the SNJ54ABT18245AWD?
The SNJ54ABT18245AWD is characterized for operation from –55°C to +125°C and is fully qualified per MIL-PRF-38535 for use in extreme-environment applications including airborne, spaceborne, and ground-mobile defense platforms. This range exceeds commercial (–40°C to +85°C) and industrial (–40°C to +105°C) grades, enabling deployment in uncooled avionics bays and engine-near electronics compartments where thermal cycling is severe.
Does the SNJ54ABT18245AWD support IEEE 1149.1a-1993 instructions like HIGHZ and CLAMP?
Yes, the SNJ54ABT18245AWD explicitly supports IEEE Std 1149.1a-1993 HIGHZ and CLAMP instructions as documented in the SCBS110H datasheet. These instructions allow safe isolation of I/O pins during system-level testing (HIGHZ) or forced logic-level control for fault injection (CLAMP), extending test coverage beyond baseline 1149.1-1990 functionality without requiring external hardware.
How is the boundary-scan register structured in the SNJ54ABT18245AWD?
The SNJ54ABT18245AWD contains a 44-bit boundary-scan register (BSR) with bit-level mapping to all 36 I/O pins (1A1–1A9, 1B1–1B9, 2A1–2A9, 2B1–2B9) and 8 control signals (1DIR, 2DIR, 1OE, 2OE, 1OEA, 1OEB, 2OEA, 2OEB). Bits 43–40 control output-enable states, ensuring benign (high-Z) default behavior upon reset - a critical safety feature for military startup sequences.
Can the SNJ54ABT18245AWD operate in both 18-bit and dual 9-bit modes simultaneously?
No - the SNJ54ABT18245AWD supports either dual 9-bit operation (using separate 1DIR/1OE and 2DIR/2OE controls) or unified 18-bit operation (using common DIR/OE signals), but not simultaneous mixed-mode operation. The functional block diagram and terminal functions confirm discrete channel control logic, meaning configuration is fixed per power-on cycle and must be selected in hardware design.
What packaging and qualification standards apply to the SNJ54ABT18245AWD?
The SNJ54ABT18245AWD uses a 380-mil fine-pitch ceramic flat (WD) package and is fully qualified to MIL-PRF-38535 Class B and Class S requirements, including screening, burn-in, and environmental stress testing. All parameters are tested per the production data sheet SCBS110H, and the device carries TI's standard military warranty with traceable lot documentation.
SNJ54ABT18245AWD Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- *
- Package/Case:
- -
- Packaging:
- Bulk
- Product Status:
- Active
- Logic Type:
- -
- Number of Elements:
- -
- Number of Bits per Element:
- -
- Input Type:
- -
- Output Type:
- -
- Current - Output High, Low:
- -
- Voltage - Supply:
- -
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- -
- Supplier Device Package:
- -
SNJ54ABT18245AWD FAQ
1.How can I place an order for SNJ54ABT18245AWD through Aetrix?
Please submit a Request for Quotation (RFQ) for SNJ54ABT18245AWD on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SNJ54ABT18245AWD reliable?
The price and inventory of SNJ54ABT18245AWD are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SNJ54ABT18245AWD is usually 5 days.
3.What payment methods are accepted for SNJ54ABT18245AWD?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SNJ54ABT18245AWD transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SNJ54ABT18245AWD?
SNJ54ABT18245AWD orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SNJ54ABT18245AWD order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SNJ54ABT18245AWD?
For technical support, including SNJ54ABT18245AWD datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SNJ54ABT18245AWD requirements.
6.How does Aetrix verify that SNJ54ABT18245AWD is sourced from the original manufacturer or authorized distributors?
All SNJ54ABT18245AWD products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SNJ54ABT18245AWD meets industry standards.
7.What is the process for return or replacement of SNJ54ABT18245AWD?
All SNJ54ABT18245AWD units undergo pre-shipment inspection (PSI). If there is an issue with SNJ54ABT18245AWD, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SNJ54ABT18245AWD part is unused and in its original packaging.
Return procedure for SNJ54ABT18245AWD:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
SNJ54ABT18245AWD Tags
-
SN74LVC1G17DBVR
Texas Instruments
-
SN74LVC1G07DCKR
Texas Instruments
-
SN74LVC1G17DCKR
Texas Instruments
-
SN74LVC1G07DBVR
Texas Instruments
-
SN74LVC1G125DCKR
Texas Instruments
-
SN74AHCT1G126DBVR
Texas Instruments
-
SN74LVC1G125DBVR
Texas Instruments
-
SN74AHCT1G125DBVR
Texas Instruments
-
SN74LVC2G17DBVR
Texas Instruments
-
SN74LVC2G07DCKR
Texas Instruments
-
SN74LVC1G34DCKR
Texas Instruments
-
SN74LVC2G17DCKR
Texas Instruments
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
