Texas Instruments TC281-30

Overview

TC281-30 from Texas Instruments is a frame-transfer CCD image sensor with 1000 × 1000 active pixels, 8-µm square pixel pitch, and up to 30 fps readout capability. It features a 11.3-mm diagonal image area, advanced lateral overflow drain (ALOD) for antiblooming, and nondestructive bulk charge detection (BCD) node enabling high dynamic range (>60 dB) and low-noise imaging in robotic vision and medical X-ray analysis systems.

For engineers reviewing the TC281-30 datasheet, TC281-30 pinout, TC281-30 application, or TC281-30 equivalent, key selection considerations include its frame-transfer architecture, single-pulse image-area clear function, 40-MHz serial register clocking, -10°C to +45°C operating range, and dual-in-line ceramic package with glass window for optical coupling.

Technical Context

The TC281-30 implements a true frame-transfer architecture: photocharge generated in the 1000 × 1000 image area transfers fully into a shielded 1010 × 1036 storage area in <110 µs. Its BCD node enables nondestructive charge sensing without reset noise, eliminating need for correlated double sampling (CDS) circuitry.

Timing control relies on five critical clocks-TRG, IAG, SAG, SRG, and RST-with voltage ranges from –10.5 V to +8 V and frequencies up to 40 MHz. Antiblooming is managed via ODB bias (5–6 V dc or 10-V pulse), while dark reference is derived from 10 masked rows and 36 edge pixels per line.

Key Specifications

Pinout & Package

Dual-in-line ceramic package with 22 leads, glass optical window, and 2.54-mm lead pitch. Sealed with epoxy; index dot denotes Pin 1. Package dimensions: 27.66 mm × 17.40 mm × 9.21 mm (L×W×H).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar frame-transfer CCD imaging applications.

Compared with KAI-1003 and ICX428AQ, the TC281-30 delivers unique frame-transfer smear immunity, single-pulse clear for precise exposure control, and TI's proprietary BCD node for zero-reset-noise operation-making it irreplaceable in high-accuracy, low-smear scientific and medical imaging where charge integrity is paramount.

Availability

TC281-30 is available at Aetrix Electronics and suitable for robotic vision guidance, medical X-ray imaging, and industrial metrology requiring stable component supply across extended production lifecycles.

Supply support for TC281-30 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a U.S.-based semiconductor innovator founded in 1930, specializing in analog, embedded processing, and imaging technologies with broad industrial and medical design heritage.

The TC281-30 belongs to TI's legacy high-performance CCD image sensor family, engineered specifically for precision scientific, medical, and metrology applications demanding global shutter, low smear, and high quantum efficiency.

FAQ

What is the maximum frame rate achievable with the TC281-30 under full-resolution operation?

The TC281-30 achieves up to 30 frames per second at its native 1000 × 1000 resolution. This performance is enabled by a 40-MHz serial register clock driving a 1036-pixel output register, with timing verified across the –10°C to +45°C operating range. The TC281-30 datasheet confirms this frame rate assumes standard parallel transfer and serial readout sequences without binning or subsampling.

Does the TC281-30 support true electronic shutter functionality, and how is it implemented?

Yes, the TC281-30 supports precise electronic shutter control via its single-pulse image-area clear capability. Applying a 10-V, ≥1-µs pulse to the ODB pin fully clears accumulated charge before integration begins-enabling exposure times from 1/1000 sec to several seconds. This mechanism eliminates mechanical shutter requirements and prevents smear in the TC281-30 during high-speed object capture.

How does the bulk charge detection (BCD) node in the TC281-30 differ from conventional floating diffusion amplifiers?

The TC281-30 uses TI's patented BCD node, where charge modulates the threshold voltage of a p-channel MOS transistor rather than being converted on a floating diffusion. This enables nondestructive readout-no reset noise is generated, and CDS circuitry is unnecessary. In contrast, conventional CCDs require destructive readout and post-processing to suppress reset noise, making the TC281-30 uniquely suited for low-noise, high-fidelity applications.

What are the recommended bias voltages for the TC281-30's ODB and RST pins during normal operation?

For standard antiblooming, the ODB pin requires a dc bias of 5.0–6.0 V. For electronic shutter operation, a 10-V pulse ≥1 µs duration is applied. The RST pin operates with a 0–0.5 V low state and 5–8 V high state, with 5 V nominal recommended for reliable BCD node reset. These values are specified in the TC281-30's recommended operating conditions table and validated across temperature.

Can the TC281-30 be used without AC coupling on its OUT pin, and what are the consequences?

No-TI explicitly recommends AC coupling the TC281-30's OUT pin to eliminate dc output level variations between units and ensure stability. Direct DC coupling introduces baseline drift and inter-sensor offset mismatches that degrade measurement repeatability. The TC281-30 application circuits (Figures 11–15) all show AC coupling, and the datasheet states ac coupling "eliminates problems with the sensor output dc stability"-a requirement for precision imaging systems using the TC281-30.