Texas Instruments TLE2161CD

Overview

TLE2161CD from Texas Instruments is a JFET-input, decompensated, precision operational amplifier optimized for high-output-drive applications in ±5 V and ±15 V systems. It delivers ±2.5 V min output swing into 100 Ω at ±5 V supplies and ±12.5 V min into 600 Ω at ±15 V, with 10 V/µs typical slew rate, 6.5 MHz gain-bandwidth product, and 280 µA supply current - enabling use in active filters, precision sensor interfaces, and high-fidelity analog signal conditioning.

For engineers reviewing the TLE2161CD datasheet, TLE2161CD pinout, TLE2161CD application, or TLE2161CD equivalent, key selection criteria include its minimum closed-loop gain of 5, low 500 µV max input offset voltage (C-suffix, 0°C to 70°C), 5 pA typical input bias current, wide ±3.5 V to ±18 V supply range, and SOIC-8 package compatibility with space-constrained industrial and test equipment designs.

Technical Context

The TLE2161CD uses TI's Excalibur JFET process to achieve ultra-low input bias current (5 pA typ) and exceptional long-term offset stability (0.04 µV/month). Its decompensated architecture requires minimum closed-loop gain ≥5 for stability, enabling higher bandwidth than unity-gain-stable op-amps at equivalent power.

It features high open-loop gain (280 V/mV typ), excellent CMRR (82 dB typ), and supply voltage rejection (93 dB typ), supporting precision DC-coupled amplification in noisy environments. Output stage is rated for ±80 mA short-circuit current and drives 100 Ω loads directly without external buffers.

Key Specifications

Pinout & Package

Package: SOIC-8 (D package), surface-mount, 150 mil width, RoHS-compliant.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar precision, high-output-drive operational amplifier applications.

Compared with OPA2134PA and TL072CP, the TLE2161CD uniquely balances ultra-low bias current, factory-trimmable offset, and high-output-drive capability within a 280 µA quiescent envelope - making it optimal for precision, low-power, gain ≥5 analog signal chains where long-term calibration stability is mandatory.

Availability

TLE2161CD is available at Aetrix Electronics and suitable for active filter design, precision sensor interface, and high-voltage DAC buffering requiring stable component supply across extended production lifecycles.

Supply support for TLE2161CD includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog and embedded processing technologies, with decades of heritage in precision op-amp innovation.

The TLE2161 family was engineered for high-output-drive, low-power precision applications in industrial instrumentation, test equipment, and sensor signal conditioning - emphasizing parametric stability over temperature and time.

FAQ

What is the minimum closed-loop gain required for stable operation of the TLE2161CD?

The TLE2161CD is decompensated and requires a minimum closed-loop gain of 5 for stable operation. This is explicitly specified in the datasheet and enforced by internal compensation. Using it at unity or gain-of-2 will result in oscillation or excessive ringing. Gain-of-5 or higher configurations - such as non-inverting amplifiers with Rf/Rin ≥ 4 - ensure adequate phase margin (>70°) and predictable step response. Always verify stability with load and capacitive conditions in final layout.

Does the TLE2161CD support single-supply operation?

The TLE2161CD is specified for dual-supply operation (±3.5 V to ±18 V) and does not support true single-supply operation down to ground. Its input common-mode range at ±5 V is –1.6 V to 4 V, and output swing is asymmetric near rails. While it can operate with VCC+ = +10 V and VCC– = 0 V, input and output headroom limitations prevent rail-to-rail functionality. For single-supply designs, consider purpose-built rail-to-rail op-amps like the OPA333 or TLV2462 instead of the TLE2161CD.

What is the purpose of Pins 1 and 8 on the TLE2161CD?

Pins 1 and 8 on the TLE2161CD are offset null terminals (N1 and N2) that connect to an external 10 kΩ potentiometer for manual input offset voltage trimming. A 10 kΩ potentiometer is wired with its ends to Pins 1 and 8 and its wiper to VCC– (Pin 4); adjusting the wiper minimizes output DC error. This feature enables sub-100 µV system-level offset in critical applications like precision weigh scales or calibration standards - a capability not found in most general-purpose op-amps and essential for meeting tight DC accuracy requirements in the TLE2161CD's target use cases.

How does the TLE2161CD's long-term offset drift compare to standard bipolar op-amps?

The TLE2161CD exhibits 0.04 µV/month typical input offset voltage drift - over 100× better than standard bipolar op-amps (e.g., LM741: ~1–5 µV/month). This exceptional stability stems from TI's Excalibur JFET process, which minimizes oxide trap generation and interfacial charge migration. In field-deployed instrumentation operating continuously for 5 years, the TLE2161CD accumulates <2.4 µV total drift, whereas a typical bipolar device may exceed 300 µV. This makes the TLE2161CD suitable for unattended, long-duration measurement systems where recalibration intervals must exceed 12 months.

Can the TLE2161CD drive a 50 Ω coaxial cable directly?

The TLE2161CD is rated for ±2.5 V min output swing into 100 Ω at ±5 V supplies and ±12.5 V min into 600 Ω at ±15 V supplies, but it is not designed to drive 50 Ω loads continuously. Its output stage delivers ±80 mA short-circuit current, but sustained 50 Ω loading at full swing exceeds safe dissipation limits in SOIC-8 packaging. For 50 Ω cable driving, use the TLE2161CD into a series 45 Ω resistor (for impedance matching) or pair it with a dedicated line-driver IC like the THS3091. Direct 50 Ω termination is discouraged due to thermal stress and potential phase-margin degradation.