Texas Instruments TLE2161MJGB

Overview

TLE2161MJGB from Texas Instruments is a JFET-input, decompensated, high-output-drive µPower operational amplifier designed for precision analog signal conditioning in harsh environments. It delivers ±12.5 V min output swing into 600 Ω at ±15 V supplies, achieves 10 V/µs typical slew rate and 6.5 MHz typical gain-bandwidth product, and operates across –55°C to +125°C with 500 µV max input offset voltage at 25°C - enabling use in military-grade sensor front-ends and high-reliability data acquisition systems.

For engineers reviewing the TLE2161MJGB datasheet, TLE2161MJGB pinout, TLE2161MJGB application, or TLE2161MJGB equivalent, key selection criteria include its military-temperature-rated JG ceramic DIP package, JFET-input ultra-low bias current (≤4 pA typ), low 280 µA supply current, and minimum closed-loop gain requirement of 5 for stability - critical for high-impedance transducer interfaces and low-power precision amplification stages.

Technical Context

The TLE2161MJGB employs Texas Instruments' Excalibur JFET process to combine low input bias current (≤4 pA typ) with exceptional parametric stability over temperature and time - including 0.04 µV/month long-term offset drift. Its decompensated architecture mandates ≥5 closed-loop gain for stability, enabling higher bandwidth than unity-gain-stable op-amps at equivalent power.

It features dual offset-null pins (N1/N2), rail-to-rail input common-mode range (e.g., –11 V to +13 V at ±15 V supplies), and robust output drive (±80 mA short-circuit current, ±12.5 V into 600 Ω), making it suitable for driving capacitive loads and moderate-impedance networks without external buffers.

Key Specifications

Pinout & Package

Ceramic Dual-In-Line Package (JG), 8-pin, hermetically sealed, with lead finish rated for 300°C soldering (60 s). Pin 1 = OFFSET N1, Pin 2 = IN–, Pin 3 = IN+, Pin 4 = VCC–, Pin 5 = NC, Pin 6 = VCC+, Pin 7 = OUT, Pin 8 = OFFSET N2.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar precision JFET-input op-amp applications.

Compared with OPA2134UA and AD822ARZ, the TLE2161MJGB uniquely combines military-temperature operation, offset-null pins, and high-output-drive in a hermetic ceramic package - making it irreplaceable in applications demanding long-term DC precision under extreme environmental stress.

Availability

TLE2161MJGB is available at Aetrix Electronics and suitable for avionics sensor interfaces, downhole instrumentation, and high-reliability power supply monitoring requiring stable component supply across extended temperature ranges and multi-year production cycles.

Supply support for TLE2161MJGB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog and embedded processing technologies, with decades of heritage in high-reliability op-amp design.

The TLE2161 family was engineered for precision analog signal conditioning in mission-critical systems - emphasizing parametric stability, low power, and robust output drive across extended temperature extremes.

FAQ

What is the minimum closed-loop gain required for stable operation of the TLE2161MJGB?

The TLE2161MJGB is decompensated and requires a minimum closed-loop gain of 5 for stable operation. This is a hard design constraint - using it in unity-gain or gain-of-2 configurations risks oscillation. The TLE2161MJGB datasheet specifies phase margin ≥70° only when AVD ≥5, verified under load conditions including 100 pF capacitance. Always confirm stability with actual PCB layout parasitics.

Does the TLE2161MJGB support offset voltage nulling, and how is it implemented?

Yes, the TLE2161MJGB provides dedicated offset-null pins (Pin 1 and Pin 8) for manual trimming. A 10-kΩ potentiometer is connected between these pins, with its wiper grounded; adjusting the potentiometer balances internal input stage mismatches. This capability is retained across all temperature extremes and is essential for achieving sub-mV total system offset in precision measurement chains using the TLE2161MJGB.

What is the maximum output current capability of the TLE2161MJGB, and how does it behave under short-circuit conditions?

The TLE2161MJGB delivers ±80 mA continuous output current and supports unlimited short-circuit duration at or below 25°C, per absolute maximum ratings. Its output stage is internally current-limited and thermally protected. At elevated temperatures (>25°C), safe short-circuit duty cycle decreases due to power dissipation limits - e.g., at 125°C ambient, sustained short-circuit operation requires derating per the JG package's 210 mW max power rating at TA = 125°C. The TLE2161MJGB remains functional after fault clearance without latch-up.

How does the input bias current of the TLE2161MJGB compare across temperature, and why does it matter for high-impedance circuits?

The TLE2161MJGB exhibits ≤4 pA typical input bias current at 25°C, rising to ≤40 nA maximum across –55°C to +125°C. This 10,000× increase at temperature extremes directly impacts voltage error in high-Z circuits: for example, a 100 MΩ source impedance generates up to 4 mV offset at 125°C. Designers must account for this in strain gauge or piezoelectric sensor interfaces using the TLE2161MJGB - guard rings and low-leakage PCB materials are strongly advised.

Can the TLE2161MJGB be used with ±3.5 V supplies, and what performance trade-offs occur at minimum voltage?

Yes, the TLE2161MJGB is fully specified down to ±3.5 V supply. At this minimum, output swing reduces to ±2.5 V into 100 Ω (vs. ±12.5 V at ±15 V), slew rate drops to ≥5 V/µs (vs. 10 V/µs typ), and large-signal gain (AVD) falls to ≥0.5 V/mV. However, input offset voltage (500 µV max) and bias current (≤4 pA typ) remain unchanged. The TLE2161MJGB retains full functionality in low-voltage portable test equipment where power efficiency outweighs dynamic range.