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Home > Products > Integrated Circuits (ICs) > Power Management (PMIC) > Current Regulation/Management

Texas Instruments TPS7H2140-SEP

Name: TPS7H2140-SEP
Brand: Texas Instruments
SKU: TPS7H2140-SEP
Price: 2.40 USD
Availability: InStock
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Part No.:: TPS7H2140-SEP

Manufacturer:: Texas Instruments

Category:: Current Regulation/Management

Package:: -

Datasheet:: TPS7H2140-SEP.pdf

Description:: RADIATION-TOLERANT, 32-V 160-M Q

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Product details

Overview

TPS7H2140-SEP from Texas Instruments is a radiation-tolerant quad-channel eFuse IC with four integrated 160-mΩ NMOS high-side switches, 4.5 V to 32 V input range, ±15% current-sense accuracy at ≥25 mA load, ultra-low 500 nA standby current, and full diagnostics including analog current-sense output and global open-drain FAULT pin - deployed in satellite electrical power systems for controlled rail switching and solenoid driving.

For engineers reviewing the TPS7H2140-SEP datasheet, TPS7H2140-SEP pinout, TPS7H2140-SEP application, or TPS7H2140-SEP equivalent, this page delivers verified radiation-hardened eFuse specifications, HTSSOP-28 pin mapping with thermal pad, SEL/SEH channel multiplexing, THER latch-off control, and space-grade alternatives meeting TID = 30 krad(Si) and SEL/SEB immunity up to 43 MeV·cm²/mg.

Technical Context

The TPS7H2140-SEP integrates a charge pump to drive four independent NMOS high-side FETs with matched on-resistance (165 mΩ typ. at 25°C, ≤280 mΩ at 125°C) and active inductive-load clamp with optimized slew rate. Its diagnostics subsystem includes a shared current-sense mux (SEL/SEH-controlled), 300× current mirror ratio (KCS), and fault reporting via FAULT pin and CS voltage shift to VCS_FAULT (4.5–6.5 V).

Protection logic implements dual current-limit modes - internal fixed 11 A limit and external resistor-adjustable limit (±15% accuracy ≥500 mA) - plus thermal shutdown (160–175°C threshold, 10°C hysteresis), loss-of-GND detection, and fast-trip response (<1 µs) for hard short-to-GND events. All functions operate across –55°C to 125°C in Space Enhanced Plastic (SEP) packaging.

Key Specifications

Parameter	Value and Actual Design Meaning
Input Voltage Range	4.5 V to 32 V - supports wide-range spacecraft bus rails including 28 V nominal EPS and 12 V auxiliary supplies.
On-Resistance (R_ON)	165 mΩ typical at 25°C - enables low conduction loss and <1.35 A continuous per channel without forced cooling.
Current Sense Accuracy	±15% at I_LOAD ≥ 25 mA - provides calibrated real-time load monitoring without system-level calibration.
Standby Current	< 500 nA - minimizes quiescent drain in deep-sleep satellite modes where power budget is critical.
Radiation Tolerance	TID = 30 krad(Si); SEL/SEB/SEGR immune to LET = 43 MeV·cm²/mg - qualified for LEO/MEO orbit operation without derating.
Operating Temperature	–55°C to 125°C - meets MIL-STD-883 temperature grade requirements for space-grade plastic packages.
Package	28-pin HTSSOP (PWP) with exposed thermal pad - 6.4 mm × 9.7 mm footprint optimized for thermal dissipation in confined PCB layouts.

Pinout & Package

TPS7H2140-SEP uses a thermally enhanced 28-pin HTSSOP (PWP) package with exposed copper thermal pad (connected to GND or left floating). Pin numbering follows standard top-view orientation with pin 1 at bottom-left corner.

Pin/Terminal	Circuit Role	Design Meaning
EN1–EN4	Channel enable inputs	Independent TTL-compatible control signals (VIH = 2 V, VIL = 0.8 V) with internal 100–350 kΩ pulldown - allow staggered power-up sequencing per load.
OUT1–OUT4	High-side switch outputs	Paired pins per channel (e.g., OUT1 on pins 27/28) - deliver switched power to loads with integrated body diode (VF = 0.3–0.9 V) and clamp protection.
IN	Main power input	Connected to pins 20–23 - accepts 4.5–32 V supply with reverse polarity tolerance (–36 V, 60 s max) and UVLO (3.2–3.7 V rising).
FAULT	Global fault indicator	Open-drain output (VOL_OFF = 0.2 V @ 2 mA) - ORs all channel faults (overcurrent, open-load, thermal) for system-level interrupt signaling.
CS	Current-sense analog output	Shared mux output (KCS = 300) - delivers scaled load current as voltage across external RCS; linear range 0–4 V (VIN ≥ 6.5 V).
SEL / SEH	Channel select bits	2-bit address (SEH:MSB, SEL:LSB) - selects which channel's current flows to CS pin; internal pulldown enables default single-channel readout.
CL	External current-limit set	Connects to GND for internal 11 A limit or to RCL for adjustable limit (ICL = 0.8 V / RCL × 2500) - sets trip threshold before thermal shutdown engages.
THER	Thermal behavior control	Configures shutdown mode: logic-high = auto-retry, logic-low = latch-off - prevents uncontrolled cycling during sustained overtemperature.
DIAG_EN	Diagnostics enable	Activates current-sense mux and FAULT reporting; internal pulldown ensures diagnostics disabled at power-on until explicitly enabled.
GND	Ground reference	Pins 1 and 12 - primary return path; thermal pad may be connected to GND plane for improved θ_JA (27°C/W) and θ_JB (8°C/W).

Key Features

Feature	Design Value
Quad-channel radiation-hardened eFuse	Four independent 160-mΩ NMOS high-side switches qualified to 30 krad(Si) TID and 43 MeV·cm²/mg LET - enables fault-isolated power distribution in EPS.
Multi-channel current sensing	Single CS pin with 2-bit SEL/SEH mux and KCS = 300 ratio - reduces BOM count and routing complexity versus discrete sense amplifiers per channel.
Adjustable + internal current limit	External RCL sets precise trip point (±15% ≥500 mA); internal 11 A default - eliminates need for external current-sense resistors in transient-heavy applications.
Inductive load clamp with slew control	Active drain-source clamp (57–63 V) with optimized turn-off slew rate - suppresses EMI and prevents voltage overshoot when driving solenoids/valves.
Loss-of-GND and loss-of-power detection	Dedicated circuitry monitors GND integrity and input collapse - triggers FAULT before downstream damage occurs in faulted grounding scenarios.

Applications

Satellite Electrical Power System (EPS)	Spacecraft Solenoid Actuation
Use Scenario: Distributing and protecting 28 V bus power to avionics modules, telemetry transceivers, and attitude control units in LEO satellites. IC Role / Device Role / Timing Role: Quad-channel high-side switch providing individually controllable, radiation-hardened power rails with real-time current monitoring and fault isolation. Use Value: Enables hot-swap capability and graceful degradation during single-point failures while meeting 30 krad(Si) TID and SEL immunity requirements.	Use Scenario: Driving fuel valves, deployment mechanisms, and thermal louvers requiring controlled inrush and safe turn-off in vacuum environments. IC Role / Device Role / Timing Role: High-side eFuse with active inductive clamp and programmable slew rate managing energy dissipation during solenoid de-energization. Use Value: Prevents destructive voltage spikes and EMI emissions during coil collapse, eliminating need for external flyback diodes or snubbers.
Radiation-Tolerant Power Tree	Controlled Power-Up/Down Sequencing
Use Scenario: Constructing hierarchical power distribution networks in planetary landers and deep-space probes where cumulative radiation dose exceeds 100 krad(Si). IC Role / Device Role / Timing Role: Radiation-qualified quad eFuse serving as primary branch protection node with diagnostic feedback to central power management unit. Use Value: Delivers deterministic fault response (fast-trip <1 µs, FAULT assertion <220 µs) under heavy ion bombardment, ensuring mission-critical continuity.	Use Scenario: Managing startup/shutdown order of FPGA, memory, and RF subsystems to prevent backfeed, ground bounce, or inrush-induced brownouts. IC Role / Device Role / Timing Role: Four independently enabled channels with precise tON/tOFF (20–90 µs) and tRISE/tFALL (66–125 µs) enabling sub-millisecond sequencing windows. Use Value: Eliminates external timing RC networks and discrete MOSFET drivers, reducing layout area and qualification effort for flight hardware.

Satellite Electrical Power System (EPS)

Spacecraft Solenoid Actuation

Use Scenario: Distributing and protecting 28 V bus power to avionics modules, telemetry transceivers, and attitude control units in LEO satellites.

IC Role / Device Role / Timing Role: Quad-channel high-side switch providing individually controllable, radiation-hardened power rails with real-time current monitoring and fault isolation.

Use Value: Enables hot-swap capability and graceful degradation during single-point failures while meeting 30 krad(Si) TID and SEL immunity requirements.

Use Scenario: Driving fuel valves, deployment mechanisms, and thermal louvers requiring controlled inrush and safe turn-off in vacuum environments.

IC Role / Device Role / Timing Role: High-side eFuse with active inductive clamp and programmable slew rate managing energy dissipation during solenoid de-energization.

Use Value: Prevents destructive voltage spikes and EMI emissions during coil collapse, eliminating need for external flyback diodes or snubbers.

Radiation-Tolerant Power Tree

Controlled Power-Up/Down Sequencing

Use Scenario: Constructing hierarchical power distribution networks in planetary landers and deep-space probes where cumulative radiation dose exceeds 100 krad(Si).

IC Role / Device Role / Timing Role: Radiation-qualified quad eFuse serving as primary branch protection node with diagnostic feedback to central power management unit.

Use Value: Delivers deterministic fault response (fast-trip <1 µs, FAULT assertion <220 µs) under heavy ion bombardment, ensuring mission-critical continuity.

Use Scenario: Managing startup/shutdown order of FPGA, memory, and RF subsystems to prevent backfeed, ground bounce, or inrush-induced brownouts.

IC Role / Device Role / Timing Role: Four independently enabled channels with precise tON/tOFF (20–90 µs) and tRISE/tFALL (66–125 µs) enabling sub-millisecond sequencing windows.

Use Value: Eliminates external timing RC networks and discrete MOSFET drivers, reducing layout area and qualification effort for flight hardware.

Equivalent & Alternatives

The following parts are listed as comparable options for similar quad-channel radiation-tolerant eFuse applications.

Alternative Part	Technical Difference	Application Difference	Selection Advice
TPS7H2201-SEP	Single-channel 160-mΩ eFuse with identical radiation specs (30 krad TID, 43 MeV·cm²/mg SEE immunity) and same PWP package; lacks multi-channel integration and CS mux.	Requires four devices + external logic for quad functionality; suitable only when channel independence outweighs board area and BOM cost.	Select when needing highest per-channel reliability margin or modular replacement strategy rather than integrated quad solution.
LM74700-Q1	Automotive-grade single-channel ideal diode controller (not radiation-hardened); no TID/SEE characterization; supports higher voltage (45 V) but lacks FAULT/CS diagnostics.	Not qualified for space use; limited to terrestrial harsh-environment applications like EV battery disconnects or industrial UPS.	Consider only for non-radiation environments requiring lower R_ON (12 mΩ) and higher voltage rating - not a drop-in or functional substitute for TPS7H2140-SEP.

Compared with TPS7H2140-SEP, TPS7H2201-SEP offers identical radiation performance but requires duplication for quad operation, increasing PCB area and interconnect complexity; LM74700-Q1 provides superior automotive-grade surge handling but lacks space qualification, diagnostics, and multi-channel capability - making TPS7H2140-SEP the sole integrated, radiation-hardened quad eFuse with full system visibility.

Availability

TPS7H2140-SEP is available at Aetrix Electronics and suitable for satellite electrical power systems, spacecraft solenoid actuation, and radiation-tolerant power tree applications requiring stable component supply across extended mission lifetimes.

Supply support for TPS7H2140-SEP includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and space-grade ICs, with decades of heritage in radiation-hardened product development for NASA, ESA, and defense programs.

The TPS7H2140-SEP belongs to TI's Space Enhanced Plastic (SEP) portfolio - engineered specifically for high-reliability space applications demanding TID tolerance, single-event effect immunity, and extended temperature operation without ceramic packaging penalties.

FAQ

What radiation hardness specifications does the TPS7H2140-SEP meet?

The TPS7H2140-SEP is characterized to 30 krad(Si) total ionizing dose (TID) with RLAT to 20 krad(Si), and is immune to single-event latch-up (SEL), burnout (SEB), and gate rupture (SEGR) up to 43 MeV·cm²/mg linear energy transfer. Single-event transients (SET) and functional interrupts (SEFI) are also characterized to the same LET level. These values are measured and documented in the official TI datasheet SLVSH46A.

How does the TPS7H2140-SEP implement current sensing across four channels with only one CS pin?

The TPS7H2140-SEP uses an internal 2-bit multiplexer controlled by SEL and SEH pins to route the current-sense signal from any one of the four channels to the shared CS pin. The current mirror ratio KCS = 300 is constant across temperature and supply voltage, enabling accurate load-current measurement (±15% at ≥25 mA) without calibration. This architecture reduces pin count and simplifies PCB routing versus discrete sensing per channel.

Can the TPS7H2140-SEP drive inductive loads like solenoids safely?

Yes - the TPS7H2140-SEP includes an integrated active drain-to-source clamp that limits negative voltage excursions to 57–63 V during inductive turn-off, combined with optimized slew-rate control to minimize EMI. This eliminates the need for external flyback diodes or RC snubbers in solenoid-driving applications, as confirmed in Section 8.3.4 of the TPS7H2140-SEP datasheet.

What is the purpose of the THER pin on the TPS7H2140-SEP?

The THER pin configures thermal shutdown behavior: logic-low selects latch-off mode (device remains off after trip until reset), while logic-high enables auto-retry (periodic re-attempt after cooldown). This allows system designers to match fault-handling policy to mission-criticality - for example, latching off for irreversible faults in propulsion systems, or auto-retrying for transient thermal events in payload electronics.

Does the TPS7H2140-SEP support both internal and external current limiting?

Yes - the TPS7H2140-SEP supports dual current-limit modes. Connecting the CL pin to GND activates the internal fixed limit of 11 A (±20% tolerance). Connecting CL to an external resistor RCL sets an adjustable limit per Equation 6 in the datasheet (ICL = 0.8 V × 2500 / RCL), with ±15% accuracy for loads ≥500 mA. Both modes trigger FAULT and engage thermal protection if exceeded.

TPS7H2140-SEP Specifications

Product attributes: Attribute value

Manufacturer:: Texas Instruments

Series:: -

Package/Case:: -

Packaging:: Tape & Reel (TR)

Product Status:: Active

Function:: -

Sensing Method:: -

Accuracy:: -

Voltage - Input:: -

Current - Output:: -

Operating Temperature:: -

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Qualification:: -

Mounting Type:: -

Supplier Device Package:: -

TPS7H2140-SEP FAQ

1.How can I place an order for TPS7H2140-SEP through Aetrix?

Please submit a Request for Quotation (RFQ) for TPS7H2140-SEP on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for TPS7H2140-SEP reliable?

The price and inventory of TPS7H2140-SEP are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for TPS7H2140-SEP is usually 5 days.

3.What payment methods are accepted for TPS7H2140-SEP?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for TPS7H2140-SEP transactions.

Note: Certain payment methods may incur a processing fee.

4.How is shipping managed for TPS7H2140-SEP?

TPS7H2140-SEP orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your TPS7H2140-SEP order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for TPS7H2140-SEP?

For technical support, including TPS7H2140-SEP datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your TPS7H2140-SEP requirements.

6.How does Aetrix verify that TPS7H2140-SEP is sourced from the original manufacturer or authorized distributors?

All TPS7H2140-SEP products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that TPS7H2140-SEP meets industry standards.

7.What is the process for return or replacement of TPS7H2140-SEP?

All TPS7H2140-SEP units undergo pre-shipment inspection (PSI). If there is an issue with TPS7H2140-SEP, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The TPS7H2140-SEP part is unused and in its original packaging.

Return procedure for TPS7H2140-SEP:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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