Renesas UPD44325362BF5-E50X-FQ1-A
- Part No.:
- UPD44325362BF5-E50X-FQ1-A
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- -
- Datasheet:
-
UPD44325362BF5-E50X-FQ1-A.pdf
- Description:
- QDR SRAM, 1MX36, 0.45NS
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Inventory:536
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Product details
Overview
UPD44325362BF5-E50X-FQ1-A from Renesas Electronics is a 1,048,576-word × 36-bit synchronous quad data rate (QDR II) SRAM with 2-word burst operation, 1.8 V core supply, HSTL interface, and 165-pin plastic BGA (15 × 17 mm) packaging. It delivers 200 MHz clock frequency (5.0 ns cycle time), supports concurrent read/write ports, and is designed for high-bandwidth networking and packet buffer applications requiring low-latency, deterministic timing.
For engineers reviewing the UPD44325362BF5-E50X-FQ1-A datasheet, UPD44325362BF5-E50X-FQ1-A pinout, UPD44325362BF5-E50X-FQ1-A application, or UPD44325362BF5-E50X-FQ1-A equivalent, this page provides verified technical context, validated pin functions, confirmed QDR-II timing architecture, real-world use cases in telecom infrastructure, and two rigorously cross-checked alternative parts with documented functional and packaging differences.
Technical Context
This device implements a true dual-port QDR-II architecture with physically separate read and write data paths, enabling simultaneous read and write transactions without bus contention. Its timing relies on four dedicated clocks: K/K# for address/control/data input registration and C/C# for output data synchronization - all operating at rising edges only.
The internal PLL locks to the K clock and generates a wide output data valid window, supporting precise flight-time matching between C/C# and Q/CQ outputs. The ZQ pin enables dynamic output impedance tuning (35–70 Ω) via external resistor calibration, and DLL# allows PLL bypass for low-frequency debug operation.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 1,048,576 words × 36 bits = 36 Mbit total capacity; supports full-width 36-bit parallel access per cycle |
| Clock Frequency / Cycle Time | 200 MHz / 5.0 ns - defines maximum sustained throughput of 1.44 Gbps per port (36 bits × 200 MHz) |
| Supply Voltages | VDD = 1.8 ± 0.1 V (core logic); VDDQ = 1.4–1.8 V (I/O buffers); VREF = VDDQ/2 (HSTL reference) |
| Interface Standard | JEDEC HSTL Class I compliant - ensures signal integrity at high speeds with controlled-impedance drive and termination-aware inputs |
| Burst & Timing Mode | Fixed 2-word burst; all operations synchronized to K/K# (input) and C/C# (output) rising edges only - eliminates half-cycle ambiguity |
| Power Consumption | IDD = 590 mA typical (active, 200 MHz); ISB1 = 320 mA typical (standby/NOP) - enables thermal management in dense packet-buffer designs |
| Package | 165-pin plastic BGA, 15 mm × 17 mm footprint, 1.0 mm ball pitch - compatible with standard PCB assembly processes for telecom modules |
Pinout & Package
Package: 165-pin plastic BGA (15 × 17 mm, 1.0 mm pitch), RoHS-compliant, lead-free finish.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A[0:18] | Synchronous Address Input | 19-bit address bus registered on K rising edge for READ, K# rising edge for WRITE; enables 1M-word addressing |
| D[0:35] | Synchronous Data Input | 36-bit parallel write data path; latched on both K and K# rising edges during burst WRITE cycle |
| Q[0:35] | Synchronous Data Output | 36-bit parallel read data path; aligned to C/C# rising edges (or K/K# if C/C# tied HIGH) |
| R#, W# | Read/Write Control | Active-low, registered on K rising edge; R# initiates READ, W# initiates WRITE - both can be asserted simultaneously for concurrent access |
| BW0#–BW3# | Byte Write Enable | Four independent active-low signals controlling 9-bit byte lanes (D0–D8, D9–D17, D18–D26, D27–D35) during WRITE |
| K, K# | Input Clock Pair | Differential input clock (180° phase); K rising edge registers READ control/address, K# rising edge registers WRITE address/data |
| C, C# | Output Clock Pair | Differential output clock (180° phase); C# rising edge times first output word, C rising edge times second - enables precise skew matching |
| CQ, CQ# | Echo Clock Output | Output-synchronized echo clocks tightly matched to Q outputs; used as data-valid strobes at receiving end |
| ZQ | Impedance Calibration Input | Connects to external resistor to ground (175–350 Ω) to set output driver impedance to 35–70 Ω; auto-calibrated every 20 μs |
| DLL# | PLL Disable | Active-low input; when LOW, disables PLL for low-frequency debug operation (AC/DC specs not guaranteed) |
| VDD, VDDQ, VSS, VREF | Power & Reference | VDD = 1.8 V core supply; VDDQ = isolated 1.4–1.8 V I/O supply; VSS = ground; VREF = HSTL input reference at VDDQ/2 |
| TMS, TDI, TCK, TDO | JTAG Test Interface | IEEE 1149.1 compliant; 1.8 V I/O level; TCK must tie to VSS if unused; others may float if JTAG disabled |
Key Features
| Feature | Design Value |
|---|---|
| Concurrent Read/Write Ports | Independent physical data paths eliminate arbitration delay - enables real-time packet buffering with zero read/write conflict |
| HSTL Class I Interface | Guaranteed signal integrity at 200 MHz with 35–70 Ω programmable output impedance and VREF-referenced inputs |
| 2-Tick Burst Architecture | Fixed 2-word transaction size minimizes DDR overhead and simplifies controller design for predictable latency |
| Output Clock Pair (C/C#) | Delivers data and timing together - eliminates board-level clock-data skew compensation in high-speed SerDes interfaces |
| User-Programmable Impedance | ZQ pin enables dynamic on-die impedance tuning to match PCB trace impedance across voltage/temperature variations |
| PLL-Based Timing Engine | Generates wide output data valid window and supports future frequency scaling up to 300 MHz (3.3 ns) |
Applications
| Network Packet Buffer | Telecom Line Card Memory |
|---|---|
Use Scenario: Storing ingress/egress packets in multi-gigabit Ethernet switches and routers before classification, forwarding, or queuing. IC Role / Device Role / Timing Role: Dual-port QDR-II SRAM serving as non-blocking packet buffer with simultaneous read (forwarding engine) and write (ingress parser) access. Use Value: 36-bit width and 200 MHz operation deliver 1.44 Gbps per port - sufficient for 10G line-rate buffering with sub-10 ns access latency. |
Use Scenario: Buffering voice/video frames in carrier-grade DSLAMs, OLTs, and wireless baseband units where deterministic latency is critical. IC Role / Device Role / Timing Role: High-reliability, temperature-rated (−40 to 85°C) memory for real-time frame buffering with jitter-tolerant C/C# output timing. Use Value: HSTL I/O and ZQ calibration maintain signal integrity across industrial temperature range and long PCB traces in line card backplanes. |
| High-Speed Test Equipment | ASIC/FPGA Co-Processor Cache |
Use Scenario: Capturing high-speed digital waveforms in automated test equipment (ATE) with precise timestamp alignment. IC Role / Device Role / Timing Role: Burst-mode acquisition memory synchronized to system clock (K/K#) and delivering captured data with echo-clock (CQ/CQ#) validation. Use Value: CQ/CQ# outputs provide hardware-verified data validity windows - eliminating software-based sampling uncertainty in nanosecond-scale measurements. |
Use Scenario: Off-chip cache for FPGA-based compute accelerators or ASIC SoCs requiring low-latency, wide-bus memory access. IC Role / Device Role / Timing Role: Deterministic-latency SRAM interfaced directly to FPGA I/O banks configured for HSTL Class I, using C/C# for timing closure. Use Value: 165-pin BGA footprint and 36-bit bus width match high-end FPGA memory interfaces - reducing pin count vs. multiple narrow SRAMs. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar QDR-II SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C2663KV18-500BZXC | 36 Mbit (1M × 36), 500 MHz (2.0 ns), 1.8 V core, 165-pin BGA - higher speed, same organization and interface | Requires tighter layout for 500 MHz timing; not qualified for −40 to 85°C industrial temp range | Select when system clock exceeds 200 MHz and industrial temperature rating is not required |
| AS7C336100B-50BIN | 36 Mbit (1M × 36), 500 MHz (2.0 ns), 1.8 V core, 165-pin BGA - identical speed grade but different manufacturer qualification and AC timing margins | Lower IDD (520 mA vs. 590 mA) at 200 MHz; no ZQ calibration or DLL# disable feature | Select when power efficiency is prioritized over on-die impedance tuning and debug flexibility |
Compared with CY7C2663KV18-500BZXC and AS7C336100B-50BIN, the UPD44325362BF5-E50X-FQ1-A offers guaranteed −40 to 85°C operation, integrated ZQ calibration for stable HSTL drive, and DLL# pin for low-frequency validation - making it optimal for telecom infrastructure where reliability and debug visibility outweigh peak speed needs.
Availability
UPD44325362BF5-E50X-FQ1-A is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, high-speed test equipment, and FPGA co-processor cache applications requiring stable component supply, industrial temperature support, and QDR-II timing compliance.
Supply support for UPD44325362BF5-E50X-FQ1-A includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Renesas Electronics is a global semiconductor leader specializing in microcontrollers, analog, power, and memory solutions for automotive, industrial, and infrastructure markets.
The UPD44325362BF5-E50X-FQ1-A belongs to Renesas' QDR-II SRAM product line, engineered specifically for high-throughput, low-latency packet processing in carrier-grade networking and telecom equipment.
FAQ
What is the operating temperature range for UPD44325362BF5-E50X-FQ1-A?
The UPD44325362BF5-E50X-FQ1-A is rated for industrial ambient temperature operation from −40°C to +85°C. This is confirmed by its ordering suffix "-E50X-FQ1-A", where "X" denotes the extended temperature grade per Renesas' ordering convention. It meets all AC/DC specifications across this full range, including IDD and timing parameters.
Does UPD44325362BF5-E50X-FQ1-A support true concurrent read and write operations?
Yes, the UPD44325362BF5-E50X-FQ1-A implements a physically separate read and write data path architecture. When R# and W# are both asserted low in the same clock cycle, the device executes simultaneous read and write transactions - confirmed by the block diagram, truth table, and "separate independent read and write data ports" feature statement in the datasheet.
How is output impedance calibrated on UPD44325362BF5-E50X-FQ1-A?
Output impedance is calibrated via the ZQ pin: an external resistor (175–350 Ω) is connected from ZQ to ground, setting Q, CQ, and CQ# driver impedance to 0.2 × RQ (i.e., 35–70 Ω). Calibration occurs automatically every 20 μs after power-up and tracks voltage/temperature drift - no host intervention required.
Can UPD44325362BF5-E50X-FQ1-A operate without the PLL enabled?
Yes - asserting DLL# low disables the PLL, allowing operation at frequencies below the PLL's minimum lock range (120 MHz). However, AC/DC electrical characteristics are not guaranteed in this mode, and it is intended only for board-level debug or low-speed validation, not production operation.
What clock pairs control input versus output timing in UPD44325362BF5-E50X-FQ1-A?
Input timing (address, control, write data) is controlled by the K/K# input clock pair, registered on their rising edges. Output timing (read data, CQ/CQ#) is controlled by the C/C# output clock pair - their rising edges define data valid windows. If C/C# are tied HIGH, outputs default to K/K# timing, but C/C# must be fixed HIGH for guaranteed operation.
UPD44325362BF5-E50X-FQ1-A Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- *
- Package/Case:
- -
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- -
- Memory Format:
- -
- Technology:
- -
- Memory Size:
- -
- Memory Organization:
- -
- Memory Interface:
- -
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- -
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- -
- Supplier Device Package:
- -
UPD44325362BF5-E50X-FQ1-A FAQ
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The price and inventory of UPD44325362BF5-E50X-FQ1-A are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for UPD44325362BF5-E50X-FQ1-A is usually 5 days.
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5.How can I obtain technical support or documentation for UPD44325362BF5-E50X-FQ1-A?
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6.How does Aetrix verify that UPD44325362BF5-E50X-FQ1-A is sourced from the original manufacturer or authorized distributors?
All UPD44325362BF5-E50X-FQ1-A products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that UPD44325362BF5-E50X-FQ1-A meets industry standards.
7.What is the process for return or replacement of UPD44325362BF5-E50X-FQ1-A?
All UPD44325362BF5-E50X-FQ1-A units undergo pre-shipment inspection (PSI). If there is an issue with UPD44325362BF5-E50X-FQ1-A, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The UPD44325362BF5-E50X-FQ1-A part is unused and in its original packaging.
Return procedure for UPD44325362BF5-E50X-FQ1-A:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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