Renesas UPD44644362AF5-E40-FQ1
- Part No.:
- UPD44644362AF5-E40-FQ1
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- -
- Datasheet:
-
UPD44644362AF5-E40-FQ1.pdf
- Description:
- 72-MBIT DDR II SRAM
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Product details
Overview
UPD44644362AF5-E40-FQ1 from NEC Electronics is a 2,097,152-word × 36-bit synchronous double data rate (DDR) SRAM with HSTL interface, 1.8 V core supply, and pipelined DDR operation. It delivers 250 MHz clock frequency (4.0 ns cycle time), supports two-word burst transfers, and integrates DLL circuitry for output timing control-used in high-bandwidth memory buffering for network packet processors and FPGA-based compute accelerators.
For engineers reviewing the UPD44644362AF5-E40-FQ1 datasheet, UPD44644362AF5-E40-FQ1 pinout, UPD44644362AF5-E40-FQ1 application, or UPD44644362AF5-E40-FQ1 equivalent, key selection criteria include its 36-bit wide I/O bus, 165-pin plastic BGA (15 × 17 mm) package, HSTL Class I compliance, DLL-enabled clock-to-data alignment, and support for byte-write masking via BW0#–BW3# signals.
Technical Context
This device implements a fully synchronous DDR architecture with dual input clocks (K/K#) latching all control and address inputs on rising edges, and dual output clocks (C/C#) delivering data with matched flight time. Its internal burst counter advances A0 to generate linear two-word bursts, enabling efficient sequential access without external address incrementing.
The memory core uses full-CMOS six-transistor cells and integrates a DLL for wide output data valid windows, user-programmable output impedance via ZQ calibration, and JTAG boundary scan (IEEE 1149.1) for testability. Clock-stop capability allows power-down with recovery in ≤1,024 cycles upon resumption.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 2,097,152 words × 36 bits = 72 Mbit total capacity; enables single-cycle access to 36-bit parallel data paths in telecom and packet-switching systems. |
| Clock Frequency / Cycle Time | 250 MHz / 4.0 ns; defines maximum sustained transaction rate for burst-2 read/write operations under 1.8 V ±0.1 V supply. |
| Interface Standard | HSTL Class I; ensures signal integrity at high speeds with controlled slew, 1.5 V VDDQ-compatible termination, and VREF-referenced inputs. |
| Supply Voltages | VDD = 1.7–1.9 V (core logic); VDDQ = 1.4–1.8 V (I/O buffers); separation prevents noise coupling between logic and data paths. |
| Burst Mode | Fixed 2-word linear burst; reduces address bus overhead and simplifies controller design for streaming applications like video frame buffering. |
| Write Granularity | Four independent byte-write enables (BW0#–BW3#); allows selective 8-bit updates within 36-bit word without read-modify-write cycles. |
| DLL Support | DLL# pin disables DLL for low-frequency debug; when enabled, DLL locks in ≤1,024 cycles to align C/C# outputs with data for precise timing closure. |
Pinout & Package
UPD44644362AF5-E40-FQ1 is housed in a 165-pin plastic BGA package with 15 × 17 mm footprint and 0.8 mm ball pitch. The package supports standard reflow profiles and provides dedicated power/ground distribution for HSTL signaling integrity.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A | Synchronous Address Inputs | Registered on K/K# rising edges; A0 selects starting address within 2-word burst; unused when LD# = HIGH (NOP). |
| DQ0–DQ35 | Synchronous Data I/Os | 36-bit bidirectional bus; data registered on K/K# rising edges (write) or delivered synchronized to C/C# rising edges (read). |
| BW0#–BW3# | Byte Write Enables | Active-low signals controlling write enable per 8-bit byte; four signals support full 36-bit granularity (DQ0–7, 8–15, 16–23, 24–35). |
| K, K# | Input Clock Pair | Differential clock inputs registering all control/address/data on rising edges; 180° phase relationship required for timing margin. |
| C, C# | Output Clock Pair | User-controlled timing reference for output data; C# rising edge clocks first data, C rising edge clocks second data in burst. |
| CQ, CQ# | Echo Clock Outputs | Tightly matched to DQ valid/hold windows; used as data-strobe replacement in point-to-point links without separate strobes. |
| ZQ | Impedance Calibration Input | Connects to external 240 Ω resistor to ground; sets DQ/CQ output impedance to 0.2 × RQ ≈ 48 Ω for controlled-impedance PCB routing. |
| LD# | Synchronous Load | Active-low signal initiating bus cycle; latches address and R/W# state on next K rising edge to define burst transaction. |
| R, W# | Read/Write Direction | When LD# = LOW, HIGH = read, LOW = write; must meet setup/hold relative to K rising edge. |
| VDD, VDDQ, VSS | Power/Ground | VDD (1.8 V core), VDDQ (1.5 V I/O), and multiple VSS balls provide low-inductance return paths for DDR switching noise suppression. |
| TMS, TDI, TCK, TDO | JTAG Boundary Scan | IEEE 1149.1 compliant test interface; operates at 1.8 V I/O level; TCK must tie to VSS if unused. |
| VREF | HSTL Reference | Nominally VDDQ/2 (0.7–0.95 V); supplies bias for HSTL input receivers; requires stable low-noise decoupling. |
| DLL# | DLL Disable | Active-low pin disabling DLL for sub-TKHKH clock frequencies during debug; AC/DC specs not guaranteed in this mode. |
Key Features
| Feature | Design Value |
|---|---|
| Pipelined DDR Operation | Enables concurrent address registration and data transfer across successive clock cycles, increasing effective bandwidth without raising clock frequency. |
| Two-Tick Burst Architecture | Reduces command overhead by fetching two words per LD# assertion, ideal for burst-oriented protocols like PCI Express memory-mapped I/O. |
| User-Programmable Output Impedance | ZQ calibration allows dynamic matching to PCB trace impedance, minimizing reflections and improving signal integrity on long memory buses. |
| Integrated DLL Circuitry | Compensates for process/voltage/temperature variation to maintain tight C/C#–DQ skew (< ±0.1 ns), critical for timing closure at 250 MHz. |
| Clock-Stop Capability | Enters low-power state with zero current draw on clocks; resumes normal operation within 1,024 cycles after clock restart-no reset required. |
| JTAG Boundary Scan | Supports IEEE 1149.1 testing of interconnects and I/O pins, reducing test development time and enabling in-system validation. |
Applications
| Network Packet Buffering | FPGA-Based Compute Acceleration |
|---|---|
Use Scenario: Storing ingress/egress packet headers and payloads in multi-gigabit Ethernet switches and routers. IC Role / Device Role / Timing Role: High-speed, low-latency DDR SRAM serving as line-rate packet buffer with 36-bit parallel interface to ASIC packet parser. Use Value: 250 MHz burst-2 operation sustains >1.8 Gbps throughput per device; HSTL interface ensures clean signal integrity over backplane traces. | Use Scenario: Providing local scratchpad memory for FPGA-accelerated AI inference engines processing video streams. IC Role / Device Role / Timing Role: Synchronous DDR SRAM acting as configurable on-chip memory extension for Xilinx Virtex or Intel Stratix FPGA fabric. Use Value: Byte-write enables (BW0#–BW3#) allow partial word updates without full-word reads, reducing memory traffic and latency in sparse tensor operations. |
| Telecom Baseband Processing | High-Performance Test Equipment |
Use Scenario: Real-time buffering of IQ samples in 5G massive MIMO baseband units requiring deterministic latency. IC Role / Device Role / Timing Role: Deterministic-latency DDR SRAM interfacing directly to ADC/DAC controllers via HSTL I/O banks. Use Value: DLL-synchronized CQ/CQ# echo clocks eliminate need for external strobes, simplifying timing analysis and PCB layout. | Use Scenario: Capturing high-speed digital waveforms in automated test equipment (ATE) with multi-GHz sampling rates. IC Role / Device Role / Timing Role: High-density, low-jitter memory buffer capturing parallel bus data from DUTs into deep memory arrays. Use Value: 72 Mbit capacity and 4.0 ns cycle time support sustained capture of >100 million samples/sec with minimal dead time between acquisitions. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar DDR SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1565KV18 | 4M × 18-bit organization; 200 MHz max speed; QDR-II+ interface instead of DDR; different pinout and control protocol. | Targets QDR-II+ controller ecosystems (e.g., legacy networking ASICs); lacks burst-2 simplicity and HSTL Class I compatibility. | Select only when existing system uses QDR-II+ timing and 18-bit bus width; not drop-in compatible due to protocol and pin mismatch. |
| IS42S32400F | 2M × 32-bit SDRAM (not SRAM); 166 MHz clock; requires refresh cycles; different command set and timing model. | Suitable for cost-sensitive, non-real-time applications where refresh overhead is acceptable; no DLL or echo clock features. | Choose for lower-cost, higher-density DRAM use cases; avoid where deterministic latency, no-refresh operation, or echo-clock synchronization is required. |
Compared with CY7C1565KV18 and IS42S32400F, UPD44644362AF5-E40-FQ1 offers true synchronous DDR SRAM behavior with zero refresh, fixed 2-word burst, integrated DLL, and HSTL Class I compliance-making it uniquely suited for real-time, low-latency, high-integrity memory buffering in telecom and test systems.
Availability
UPD44644362AF5-E40-FQ1 is available at Aetrix Electronics and suitable for network packet buffering, FPGA-based compute acceleration, and telecom baseband processing requiring stable component supply, long-term lifecycle support, and traceable sourcing.
Supply support for UPD44644362AF5-E40-FQ1 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
NEC Electronics (now part of Renesas Electronics) is a Japanese semiconductor manufacturer specializing in high-performance memory, microcontrollers, and analog ICs for industrial and communications infrastructure.
The μPD44644xx2 family was designed specifically for synchronous DDR SRAM applications demanding deterministic latency, HSTL-compliant signaling, and burst-2 efficiency in telecom switching, packet processing, and high-speed test equipment.
FAQ
What is the memory organization and total capacity of UPD44644362AF5-E40-FQ1?
UPD44644362AF5-E40-FQ1 has a 2,097,152-word × 36-bit organization, yielding 72 Mbit (9 MB) total capacity. This configuration supports 36-bit parallel data transfers and is optimized for high-throughput buffering in packet-processing and FPGA-accelerated systems where wide data paths reduce transaction count.
Does UPD44644362AF5-E40-FQ1 require an external clock source for both input and output timing?
Yes, UPD44644362AF5-E40-FQ1 requires two differential clock pairs: K/K# for input registration (address, control, data-in) and C/C# for output timing (data-out, echo clocks). When C/C# are tied HIGH, K/K# serve as output references-but DLL-assisted timing alignment is only active when C/C# are driven.
How does the byte-write functionality work on UPD44644362AF5-E40-FQ1?
UPD44644362AF5-E40-FQ1 provides four active-low byte-write enables (BW0#–BW3#) that independently gate write operations to each 8-bit segment of the 36-bit DQ bus. Asserting specific BWx# combinations allows selective updating of DQ0–7, DQ8–15, DQ16–23, or DQ24–35 without disturbing other bytes in the same word.
What is the role of the ZQ pin on UPD44644362AF5-E40-FQ1, and how should it be connected?
The ZQ pin on UPD44644362AF5-E40-FQ1 calibrates output driver impedance. It must be connected to a precision 240 Ω resistor to ground, setting DQ/CQ/CQ# output impedance to ~48 Ω (0.2 × 240 Ω). Direct connection to VDDQ minimizes impedance; leaving ZQ unconnected or tying to GND violates specification and degrades signal integrity.
Can UPD44644362AF5-E40-FQ1 operate without the DLL enabled, and what are the implications?
Yes, UPD44644362AF5-E40-FQ1 can operate with DLL disabled by holding DLL# LOW. In this mode, the device functions at reduced clock frequencies (<200 MHz), but AC/DC electrical characteristics-including setup/hold times and output timing-are not guaranteed. DLL must be enabled (DLL# HIGH) for full-spec operation at 250 MHz.
UPD44644362AF5-E40-FQ1 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- *
- Package/Case:
- -
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- -
- Memory Format:
- -
- Technology:
- -
- Memory Size:
- -
- Memory Organization:
- -
- Memory Interface:
- -
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- -
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- -
- Supplier Device Package:
- -
UPD44644362AF5-E40-FQ1 FAQ
1.How can I place an order for UPD44644362AF5-E40-FQ1 through Aetrix?
Please submit a Request for Quotation (RFQ) for UPD44644362AF5-E40-FQ1 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
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The price and inventory of UPD44644362AF5-E40-FQ1 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for UPD44644362AF5-E40-FQ1 is usually 5 days.
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Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for UPD44644362AF5-E40-FQ1?
For technical support, including UPD44644362AF5-E40-FQ1 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your UPD44644362AF5-E40-FQ1 requirements.
6.How does Aetrix verify that UPD44644362AF5-E40-FQ1 is sourced from the original manufacturer or authorized distributors?
All UPD44644362AF5-E40-FQ1 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that UPD44644362AF5-E40-FQ1 meets industry standards.
7.What is the process for return or replacement of UPD44644362AF5-E40-FQ1?
All UPD44644362AF5-E40-FQ1 units undergo pre-shipment inspection (PSI). If there is an issue with UPD44644362AF5-E40-FQ1, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The UPD44644362AF5-E40-FQ1 part is unused and in its original packaging.
Return procedure for UPD44644362AF5-E40-FQ1:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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