Renesas UPD44645362AF5-E50X-FQ1
- Part No.:
- UPD44645362AF5-E50X-FQ1
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- -
- Datasheet:
-
UPD44645362AF5-E50X-FQ1.pdf
- Description:
- STANDARD SRAM, 2MX36, 0.45NS
- Quantity:
- Payment:

- Shipping:

Inventory:2,989
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
UPD44645362AF5-E50X-FQ1 from Renesas Electronics is a 2,097,152-word × 36-bit synchronous Quad Data Rate II (QDR II) SRAM with HSTL interface, 1.8 V core supply, and 5.0 ns clock cycle time (200 MHz). It features dual independent read/write ports, DLL/PLL timing control, and 165-pin plastic BGA packaging. This device serves as high-speed buffer memory in network packet processors and telecom line cards requiring burst-mode DDR operation.
For engineers reviewing the UPD44645362AF5-E50X-FQ1 datasheet, UPD44645362AF5-E50X-FQ1 pinout, UPD44645362AF5-E50X-FQ1 application, or UPD44645362AF5-E50X-FQ1 equivalent, key selection criteria include its 2M×36 organization, 200 MHz QDR II timing, HSTL I/O compatibility, 165-pin BGA footprint, and support for concurrent read/write transactions with echo clocks CQ/CQ#.
Technical Context
The UPD44645362AF5-E50X-FQ1 implements a true dual-port QDR II architecture with separate K/K# input clocks for address/control registration and C/C# output clocks for data timing alignment. Its internal burst counter enables fixed two-word burst transfers on every transaction, achieving 100% bus utilization in both read and write directions.
It integrates a DLL/PLL circuit synchronized to K clock for jitter-tolerant output data valid window generation, supports user-programmable output impedance (35–70 Ω) via ZQ pin, and provides IEEE 1149.1 JTAG test access. The device uses full-CMOS six-transistor memory cells and operates with independent VDD (1.8 V) and VDDQ (1.4–1.8 V) supplies.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 2,097,152 words × 36 bits - supports wide-data-path buffering for 32-bit+ parallel interfaces with byte-selectable writes via BW0#–BW3#. |
| Clock Cycle Time | 5.0 ns - enables 200 MHz QDR II operation with precise timing margins for high-speed networking ASICs. |
| Core Supply Voltage | 1.8 V ± 0.1 V - matches standard low-voltage logic domains and reduces dynamic power vs. older 3.3 V SRAMs. |
| I/O Interface | HSTL Class I - ensures signal integrity at 200 MHz with controlled-impedance drive and VREF-referenced inputs. |
| Package | 165-pin plastic BGA (15 mm × 17 mm) - industry-standard footprint compatible with automated PCB assembly and thermal management. |
| Burst Mode | Fixed 2-word burst - eliminates address overhead per transfer, delivering deterministic latency and maximizing bandwidth efficiency. |
| Output Clocks | C/C# pair - delivers data synchronized to rising edges of C# (first word) and C (second word), enabling flight-time matching to receiving logic. |
Pinout & Package
UPD44645362AF5-E50X-FQ1 is housed in a 165-pin plastic BGA (15 mm × 17 mm) with 0.8 mm ball pitch. Pin assignments follow JEDEC MO-245AC standard layout, with dedicated HSTL I/O banks, differential clock pairs (K/K#, C/C#, CQ/CQ#), and four byte-write enable signals (BW0#–BW3#) for granular 9-bit write control.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A19 | Synchronous Address Inputs | Registered on K rising edge for READ, K# rising edge for WRITE; 20-bit address space selects 2M locations. |
| D0–D35 | Synchronous Data Inputs | 36-bit parallel write data registered on K/K# rising edges; aligned with BW0#–BW3# for 9-bit byte masking. |
| Q0–Q35 | Synchronous Data Outputs | 36-bit parallel read data delivered on C#/C rising edges; echo-aligned with CQ/CQ# for timing validation. |
| R#, W# | Read/Write Command Inputs | Active-low synchronous controls; initiate burst transactions on K rising edge with setup/hold timing referenced to K. |
| BW0#–BW3# | Byte Write Select Inputs | Four active-low signals enabling independent 9-bit write segments (D0–D8, D9–D17, D18–D26, D27–D35). |
| K, K# | Differential Input Clock | Primary timing reference: K rising edge latches READ commands/addresses; K# rising edge latches WRITE addresses/data. |
| C, C# | Differential Output Clock | User-controlled timing reference: C# rising edge clocks first output word; C rising edge clocks second word. |
| CQ, CQ# | Echo Clock Outputs | Output-synchronized clocks tightly matched to Q outputs; used as data-valid strobes when C/C# are active. |
| ZQ | Impedance Calibration Input | Connects to external resistor to ground to set Q/CQ/CQ# output impedance to 0.2 × RQ; enables system-level termination tuning. |
| VDD, VDDQ, VSS | Power/Ground Supplies | VDD = 1.8 V core supply; VDDQ = 1.4–1.8 V I/O supply; separate planes minimize noise coupling between logic and drivers. |
| VREF | HSTL Reference Input | Nominally VDDQ/2; provides threshold reference for all HSTL inputs, ensuring consistent switching points across voltage/temperature. |
| DLL# | DLL/PLL Disable Input | Active-low; forces bypass of DLL/PLL for low-frequency debug; must be HIGH (tied to VDDQ) for normal 200 MHz operation. |
| TMS, TDI, TCK, TDO | JTAG Test Interface | IEEE 1149.1 compliant; supports boundary-scan testing and in-system programming; 1.8 V I/O level compatible. |
Key Features
| Feature | Design Value |
|---|---|
| Concurrent Read/Write Ports | Independent address/data paths allow simultaneous access-critical for pipeline buffering in packet forwarding engines. |
| Two-Tick Burst Operation | Fixed 2-word transfers eliminate address bus contention and guarantee deterministic 2-cycle latency per transaction. |
| HSTL Class I Interface | Guarantees signal integrity at 200 MHz with 1.8 V swing and VREF-referenced receivers, reducing timing skew vs. LVTTL. |
| User-Programmable Output Impedance | ZQ pin enables dynamic adjustment of Q/CQ/CQ# driver strength (35–70 Ω) to match PCB trace impedance without external resistors. |
| DLL/PLL Timing Control | Generates wide output data valid window and supports future frequency scaling up to 300 MHz (E33 variant). |
| Clock-Stop Capability | Enters low-power standby within 20 μs of clock halt; resumes full operation in ≤20 μs after clock restart-ideal for bursty traffic patterns. |
Applications
| Network Packet Buffering | Telecom Line Card Memory |
|---|---|
Use Scenario: Storing ingress/egress packet headers and payloads in multi-gigabit Ethernet switches. IC Role / Device Role / Timing Role: Dual-port QDR II SRAM acting as shared buffer between ingress parser and egress scheduler, using concurrent read/write to sustain line-rate throughput. Use Value: 2M×36 organization provides 9 MB capacity with 200 MHz QDR bandwidth (14.4 GB/s effective), eliminating bottlenecks in 10G/40G switch fabric designs. | Use Scenario: Frame buffering in OC-192/STM-64 SONET/SDH line interface units. IC Role / Device Role / Timing Role: High-speed scratchpad memory for framer ASICs, accepting serialized data bursts and aligning them into fixed-length ATM or GFP frames. Use Value: Echo clocks CQ/CQ# enable precise data-valid timing relative to receive clock domain, reducing setup/hold margin requirements in retiming circuits. |
| Baseband Processing Cache | Test Equipment Pattern Memory |
Use Scenario: Temporary storage of channelized IQ samples in 4G/LTE femtocell baseband processors. IC Role / Device Role / Timing Role: Low-latency buffer between ADC/DAC interfaces and FFT/IFFT accelerators, leveraging burst mode for contiguous sample blocks. Use Value: 5.0 ns cycle time and HSTL interface ensure sub-10 ns access latency, meeting tight real-time constraints for OFDMA symbol processing. | Use Scenario: Storing stimulus/response vectors in high-speed ATE systems performing DDR4/LPDDR4 memory testing. IC Role / Device Role / Timing Role: Programmable pattern generator memory synchronized to tester clock, using C/C# to align vector delivery with DUT timing windows. Use Value: Clock-stop capability allows power gating between test sequences, reducing average power by >40% in production test environments. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar QDR II SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C2665KV18-500BZXC | 2M×36, 500 MHz (2.0 ns), 1.8 V core, 165-pin BGA - higher speed grade but requires tighter layout control and higher power. | Targeted at 40G/100G optical transport where 500 MHz timing margin is required; less suitable for cost-sensitive 1G/10G systems. | Select when system clock exceeds 250 MHz and jitter budget permits aggressive timing closure. |
| AS7C3256A-50JCIN | 256K×36, 50 ns async SRAM, 3.3 V, 100-pin TQFP - asynchronous interface, lower density, no burst or DLL. | Used in legacy control-plane microcode storage where deterministic latency matters more than bandwidth; incompatible with QDR timing protocols. | Choose only for non-burst, low-speed control memory where pin count and voltage compatibility outweigh bandwidth needs. |
Compared with CY7C2665KV18-500BZXC and AS7C3256A-50JCIN, UPD44645362AF5-E50X-FQ1 delivers optimal balance of 200 MHz QDR II performance, HSTL signal integrity, and 165-pin BGA manufacturability for mid-range networking equipment-avoiding over-specification while maintaining upgrade path to E40/E33 variants.
Availability
UPD44645362AF5-E50X-FQ1 is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, baseband processing cache, and test equipment pattern memory requiring stable component supply and long-term industrial lifecycle support.
Supply support for UPD44645362AF5-E50X-FQ1 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Renesas Electronics Corporation is a global semiconductor leader specializing in microcontrollers, analog, power, and memory solutions for automotive, industrial, and infrastructure markets.
The UPD44645362AF5-E50X-FQ1 belongs to Renesas' QDR II SRAM product line, engineered specifically for high-bandwidth, low-latency buffering in networking and communications equipment operating at 200–300 MHz.
FAQ
What is the memory organization and clock speed of UPD44645362AF5-E50X-FQ1?
UPD44645362AF5-E50X-FQ1 has a 2,097,152-word × 36-bit organization and operates at 200 MHz with a 5.0 ns clock cycle time. This configuration delivers 14.4 GB/s effective bandwidth using QDR II's double-data-rate architecture on both read and write ports. The device is optimized for burst-mode applications requiring wide data paths and deterministic latency, such as packet buffering in telecom infrastructure.
Does UPD44645362AF5-E50X-FQ1 support concurrent read and write operations?
Yes, UPD44645362AF5-E50X-FQ1 supports fully concurrent read and write operations through physically independent address and data paths. Its dual-port architecture allows initiation of a read transaction on one port while simultaneously executing a write on the other, enabling seamless pipeline buffering in network processors and framer ASICs without arbitration delay.
What interface standard does UPD44645362AF5-E50X-FQ1 use and what are its voltage requirements?
UPD44645362AF5-E50X-FQ1 uses an HSTL Class I interface with 1.8 V core supply (VDD = 1.8 ± 0.1 V) and 1.4–1.8 V I/O supply (VDDQ). Input thresholds are referenced to VREF (nominally VDDQ/2), ensuring robust noise immunity at 200 MHz. This interface is compatible with FPGA and ASIC I/O banks supporting HSTL-18 signaling.
How is timing controlled on UPD44645362AF5-E50X-FQ1-does it use DLL or PLL?
UPD44645362AF5-E50X-FQ1 integrates a DLL/PLL circuit synchronized to the K input clock, generating a wide output data valid window and enabling precise clock skew matching. The DLL# pin must be held HIGH (tied to VDDQ) for normal operation; asserting DLL# LOW disables the DLL/PLL for low-frequency debugging but invalidates AC specifications.
What package type and pin count does UPD44645362AF5-E50X-FQ1 use?
UPD44645362AF5-E50X-FQ1 uses a 165-pin plastic BGA package with 15 mm × 17 mm body size and 0.8 mm ball pitch. This JEDEC MO-245AC-compliant footprint supports automated assembly and thermal dissipation in high-density networking PCBs, and includes dedicated balls for HSTL I/O, differential clocks (K/K#, C/C#, CQ/CQ#), and JTAG test access.
UPD44645362AF5-E50X-FQ1 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- *
- Package/Case:
- -
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- -
- Memory Format:
- -
- Technology:
- -
- Memory Size:
- -
- Memory Organization:
- -
- Memory Interface:
- -
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- -
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- -
- Supplier Device Package:
- -
UPD44645362AF5-E50X-FQ1 FAQ
1.How can I place an order for UPD44645362AF5-E50X-FQ1 through Aetrix?
Please submit a Request for Quotation (RFQ) for UPD44645362AF5-E50X-FQ1 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for UPD44645362AF5-E50X-FQ1 reliable?
The price and inventory of UPD44645362AF5-E50X-FQ1 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for UPD44645362AF5-E50X-FQ1 is usually 5 days.
3.What payment methods are accepted for UPD44645362AF5-E50X-FQ1?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for UPD44645362AF5-E50X-FQ1 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for UPD44645362AF5-E50X-FQ1?
UPD44645362AF5-E50X-FQ1 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your UPD44645362AF5-E50X-FQ1 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for UPD44645362AF5-E50X-FQ1?
For technical support, including UPD44645362AF5-E50X-FQ1 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your UPD44645362AF5-E50X-FQ1 requirements.
6.How does Aetrix verify that UPD44645362AF5-E50X-FQ1 is sourced from the original manufacturer or authorized distributors?
All UPD44645362AF5-E50X-FQ1 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that UPD44645362AF5-E50X-FQ1 meets industry standards.
7.What is the process for return or replacement of UPD44645362AF5-E50X-FQ1?
All UPD44645362AF5-E50X-FQ1 units undergo pre-shipment inspection (PSI). If there is an issue with UPD44645362AF5-E50X-FQ1, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The UPD44645362AF5-E50X-FQ1 part is unused and in its original packaging.
Return procedure for UPD44645362AF5-E50X-FQ1:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
UPD44645362AF5-E50X-FQ1 Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…

