Renesas UPD46185182BF1-E40Y-EQ1-A
- Part No.:
- UPD46185182BF1-E40Y-EQ1-A
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- -
- Datasheet:
-
UPD46185182BF1-E40Y-EQ1-A.pdf
- Description:
- QDR SRAM, 1MX18, 0.45NS
- Quantity:
- Payment:

- Shipping:

Inventory:2,724
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
UPD46185182BF1-E40Y-EQ1-A from Renesas Electronics is a 1,048,576-word × 18-bit synchronous QDR II SRAM with 4.0 ns clock cycle time (250 MHz), 1.8 V core supply, HSTL interface, and 165-pin plastic BGA (13 × 15) packaging. It supports concurrent read/write ports, burst-2 operation, and clock-stop mode for low-power standby in high-bandwidth networking buffers and packet memory applications.
For engineers reviewing the UPD46185182BF1-E40Y-EQ1-A datasheet, UPD46185182BF1-E40Y-EQ1-A pinout, UPD46185182BF1-E40Y-EQ1-A application, or UPD46185182BF1-E40Y-EQ1-A equivalent, key selection considerations include its −40°C to +85°C industrial temperature rating, user-programmable output impedance (35–70 Ω), JTAG 1149.1 test access, and dual-clock timing architecture using K/K# inputs and C/C# outputs for precise flight-time matching.
Technical Context
This QDR II SRAM implements separate independent read and write data ports with concurrent transaction capability, enabling full 100% bus utilization during DDR READ and WRITE operations. Its internal PLL provides a wide output data valid window and supports future frequency scaling up to 300 MHz.
The device uses two input clocks (K and K#) for precise DDR timing at rising edges only, and two output clocks (C and C#) to deliver clock and data together to the receiving device-ensuring tight skew matching. Internally self-timed write control and clock-stop capability (20 μs recovery) further optimize system-level timing and power management.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Organization | 1,048,576-word × 18-bit (18 Mbit total density) |
| Clock frequency | 250 MHz - enables 500 MT/s per data pin in burst-2 mode |
| Core supply voltage | 1.8 ± 0.1 V - compatible with modern low-voltage SoC interfaces |
| Operating temperature | −40°C to +85°C - qualified for industrial embedded and telecom infrastructure |
| Interface standard | HSTL Class I - ensures signal integrity at high-speed DDR data rates |
| Package | 165-pin plastic BGA (13 × 15 mm) - supports high-density PCB layouts |
| Output impedance | User-programmable 35–70 Ω via ZQ pin - enables dynamic bus termination calibration |
Pinout & Package
Package: 165-pin plastic BGA (13 × 15 mm), lead-free, top-view layout with index mark per package dimensions.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A[0:18] | Synchronous address input | Registered on K rising edge for READ, K# rising edge for WRITE; enables 1M-word addressing |
| D0–D17 | Synchronous data input | 18-bit parallel write data registered on K/K# rising edges; supports byte-write via BW0#/BW1# |
| Q0–Q17 | Synchronous data output | 18-bit parallel read data synchronized to C/C# rising edges; echo-clocked via CQ/CQ# |
| K, K# | Input clock pair | 180° out-of-phase clocks; K latches READ controls/addresses, K# latches WRITE addresses/data |
| C, C# | Output clock pair | Deliver timing reference for Q outputs; C# clocks first data word, C clocks second word |
| R#, W# | Read/write strobes | Active-low synchronous commands; both high = NOP (high-Z outputs) |
| BW0#, BW1# | Byte write enables | Independent 9-bit segment control: BW0# → D0–D8, BW1# → D9–D17 |
| ZQ | Impedance calibration input | Connects to external resistor to ground to set Q/CQ/CQ# output impedance to 0.2 × RQ |
| DLL# | PLL disable | Pull HIGH for normal operation; pull LOW to bypass PLL for debug at sub-120 MHz frequencies |
| VDD, VDDQ | Power supplies | VDD = 1.8 V core; VDDQ = 1.4–1.8 V I/O supply - isolated for noise reduction |
| VREF | HSTL reference | Nominally VDDQ/2; sets input threshold for all HSTL-compatible control/data signals |
| TMS, TDI, TCK, TDO | JTAG 1149.1 port | Fully compliant boundary-scan test interface operating at 1.8 V I/O level |
Key Features
| Feature | Design Value |
|---|---|
| Concurrent read/write ports | Enables simultaneous access to same memory array without arbitration delay - critical for packet buffering in switches/routers |
| Two-tick burst operation | Fixed 2-word burst per transaction reduces command overhead and doubles effective bandwidth vs. single-word access |
| Internally self-timed write control | Eliminates need for external write-enable timing margining - simplifies controller design and improves reliability |
| Clock-stop capability | Enters low-power state with 20 μs recovery; retains data and configuration - ideal for bursty traffic patterns |
| JTAG 1149.1 test access | Supports IEEE-standard boundary-scan testing and in-system debugging without additional test points |
| Separate VDD/VDDQ supplies | Isolates core logic noise from I/O drivers - maintains signal integrity at 250 MHz DDR rates |
Applications
| Network Packet Buffer | High-Speed Test Equipment Memory |
|---|---|
Use Scenario: Storing ingress/egress packet headers and payloads in Layer 2/3 Ethernet switches with line-rate forwarding. IC Role / Device Role / Timing Role: Dual-port QDR II SRAM acting as shared buffer between ingress parser and egress scheduler, synchronized to 250 MHz system clocks. Use Value: Concurrent read/write eliminates arbitration stalls, enabling full 500 MT/s throughput per 18-bit port - matches 10 GbE line rate requirements. | Use Scenario: Capturing high-fidelity waveform samples in automated test equipment (ATE) with nanosecond-level timing resolution. IC Role / Device Role / Timing Role: Burst-mode acquisition memory interfaced to high-speed ADCs and pattern generators via HSTL buses. Use Value: 4.0 ns cycle time and echo-clocked CQ/CQ# outputs provide deterministic 0.3 ns data-valid window - essential for sub-nanosecond sampling accuracy. |
| Telecom Baseband Processing | Real-Time Video Frame Buffer |
Use Scenario: Temporary storage of OFDM symbol data in LTE/5G baseband units during FFT/IFFT processing pipelines. IC Role / Device Role / Timing Role: Low-latency, low-jitter memory supporting parallel read/write of complex I/Q sample pairs at 250 MHz. Use Value: Clock-stop mode reduces active power by >50% during symbol guard intervals while maintaining instant wake-up - extends thermal headroom in dense RF modules. | Use Scenario: Interfacing between image sensor interface (CSI-2) and video processor in broadcast-grade cameras requiring zero-frame-drop recording. IC Role / Device Role / Timing Role: Synchronized frame buffer with independent read (processor) and write (sensor) ports operating at pixel clock rates. Use Value: User-programmable 35–70 Ω output impedance compensates for PCB trace variations - ensures clean 1.8 V HSTL eye diagrams across 18-bit parallel video buses. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar QDR II SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Cypress CY7C2663KV18 | Same 1M × 18 organization, 250 MHz speed grade, but uses 165-pin FBGA with different pinout and no ZQ calibration | Requires PCB redesign due to incompatible pin mapping and absence of programmable impedance | Select when legacy Cypress ecosystem compatibility is required and board layout flexibility exists |
| Integrated Device Technology IDT72V2115L15PF | 1M × 18 QDR II+ variant with 1.5 ns faster cycle time (167 MHz min), enhanced DLL, and identical 165-pin BGA footprint | Higher performance margin for future frequency scaling; requires updated timing constraints in controller firmware | Select when system demands tighter jitter tolerance (<0.15 ns) or longer-term roadmap alignment with QDR II+ standards |
Compared with CY7C2663KV18, UPD46185182BF1-E40Y-EQ1-A offers on-die impedance tuning via ZQ for improved signal integrity across varying board stackups; compared with IDT72V2115L15PF, it provides broader industrial temperature support (−40°C to +85°C vs. 0°C to +70°C) at lower cost, with identical pin compatibility but relaxed AC timing margins.
Availability
UPD46185182BF1-E40Y-EQ1-A is available at Aetrix Electronics and suitable for network packet buffering, high-speed test instrumentation, telecom baseband processing, and real-time video frame storage requiring stable component supply across extended temperature ranges and long production lifecycles.
Supply support for UPD46185182BF1-E40Y-EQ1-A includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Renesas Electronics Corporation is a global semiconductor manufacturer specializing in microcontrollers, analog, power, and memory solutions for automotive, industrial, and infrastructure markets.
The UPD46185182BF1-E40Y-EQ1-A belongs to Renesas' QDR II SRAM product line, engineered specifically for high-throughput, low-latency memory subsystems in networking, test equipment, and communications infrastructure where concurrent access and precise timing control are critical.
FAQ
What is the maximum operating frequency supported by the UPD46185182BF1-E40Y-EQ1-A?
The UPD46185182BF1-E40Y-EQ1-A is rated for 250 MHz operation with a 4.0 ns clock cycle time. While the datasheet notes PLL support up to 300 MHz (3.3 ns), this speed grade is only guaranteed for the -E33Y variant. The -E40Y suffix explicitly denotes the 250 MHz specification, and operation beyond this violates AC timing guarantees.
Does the UPD46185182BF1-E40Y-EQ1-A support true simultaneous read and write operations?
Yes, the UPD46185182BF1-E40Y-EQ1-A features physically separate read and write data ports with independent address paths, allowing concurrent read and write transactions to different memory locations without arbitration delay. This is confirmed by the block diagram showing dual register banks and the truth table specifying independent R# and W# control.
How does the ZQ pin function on the UPD46185182BF1-E40Y-EQ1-A?
The ZQ pin on the UPD46185182BF1-E40Y-EQ1-A is an input used for output driver impedance calibration. When connected to a precision resistor (typically 240 Ω) to ground, it configures Q, CQ, and CQ# output impedance to 0.2 × RQ (e.g., 48 Ω). Direct connection to VDDQ minimizes impedance; it must never be left floating or tied to VSS.
What is the purpose of the DLL# pin on the UPD46185182BF1-E40Y-EQ1-A?
The DLL# pin disables the internal PLL when pulled LOW, allowing the UPD46185182BF1-E40Y-EQ1-A to operate at frequencies below 120 MHz for board-level debug. During normal operation, DLL# must be pulled HIGH (e.g., via ≤10 kΩ to VDDQ); AC/DC characteristics are not guaranteed in DLL-bypass mode.
Can the UPD46185182BF1-E40Y-EQ1-A be used in systems requiring JTAG boundary-scan testing?
Yes, the UPD46185182BF1-E40Y-EQ1-A integrates a fully compliant IEEE 1149.1 JTAG test access port (TMS, TDI, TCK, TDO) operating at 1.8 V I/O levels. These pins support boundary-scan testing and in-system programming without requiring external level shifters or additional circuitry.
UPD46185182BF1-E40Y-EQ1-A Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- *
- Package/Case:
- -
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- -
- Memory Format:
- -
- Technology:
- -
- Memory Size:
- -
- Memory Organization:
- -
- Memory Interface:
- -
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- -
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- -
- Supplier Device Package:
- -
UPD46185182BF1-E40Y-EQ1-A FAQ
1.How can I place an order for UPD46185182BF1-E40Y-EQ1-A through Aetrix?
Please submit a Request for Quotation (RFQ) for UPD46185182BF1-E40Y-EQ1-A on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for UPD46185182BF1-E40Y-EQ1-A reliable?
The price and inventory of UPD46185182BF1-E40Y-EQ1-A are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for UPD46185182BF1-E40Y-EQ1-A is usually 5 days.
3.What payment methods are accepted for UPD46185182BF1-E40Y-EQ1-A?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for UPD46185182BF1-E40Y-EQ1-A transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for UPD46185182BF1-E40Y-EQ1-A?
UPD46185182BF1-E40Y-EQ1-A orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your UPD46185182BF1-E40Y-EQ1-A order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for UPD46185182BF1-E40Y-EQ1-A?
For technical support, including UPD46185182BF1-E40Y-EQ1-A datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your UPD46185182BF1-E40Y-EQ1-A requirements.
6.How does Aetrix verify that UPD46185182BF1-E40Y-EQ1-A is sourced from the original manufacturer or authorized distributors?
All UPD46185182BF1-E40Y-EQ1-A products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that UPD46185182BF1-E40Y-EQ1-A meets industry standards.
7.What is the process for return or replacement of UPD46185182BF1-E40Y-EQ1-A?
All UPD46185182BF1-E40Y-EQ1-A units undergo pre-shipment inspection (PSI). If there is an issue with UPD46185182BF1-E40Y-EQ1-A, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The UPD46185182BF1-E40Y-EQ1-A part is unused and in its original packaging.
Return procedure for UPD46185182BF1-E40Y-EQ1-A:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
UPD46185182BF1-E40Y-EQ1-A Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…

