My Inquiry
My Account
Winbond Electronics Corporation W25N01GVZEIT
- Part No.:
- W25N01GVZEIT
- Manufacturer:
- Winbond Electronics Corporation
- Category:
- Memory
- Package:
- 8-WDFN Exposed Pad
- Datasheet:
-
W25N01GVZEIT.pdf
- Description:
- IC FLASH 1GBIT SPI/QUAD 8WSON
- Quantity:
- Payment:
- Shipping:
Inventory:4,719
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
W25N01GVZEIT from Winbond is a 1G-bit (128MB) Serial SLC NAND Flash memory with Dual/Quad SPI interface, organized as 65,536 × 2,048-byte pages and 1,024 × 128KB erasable blocks. It supports 104MHz SPI clocking, delivers up to 50MB/s continuous read throughput in Continuous Read Mode, and operates from 2.7V–3.6V across –40°C to +85°C. It is used for code shadowing, XIP execution, and embedded firmware/data storage in space-constrained industrial and IoT devices.
For engineers reviewing the W25N01GVZEIT datasheet, W25N01GVZEIT pinout, W25N01GVZEIT application, or W25N01GVZEIT equivalent, key selection considerations include its default Buffer Read Mode (BUF=1), on-chip 1-bit ECC, hardware/software write protection via /WP and SRP bits, and support for Fast Read Quad I/O (6Bh/6Ch) and 4-byte addressing.
Technical Context
The W25N01GVZEIT implements a true SLC NAND architecture with internal page buffer management, enabling full-page program operations and 128KB uniform block erase. Its command set includes dedicated instructions for Bad Block Management (A1h), BBM Look-Up Table access (A5h), and Last ECC Failure Page Address retrieval (A9h).
It features three volatile/OTP-configurable status registers: SR-1 (protection & WP-E control), SR-2 (ECC-E, BUF mode, OTP-L), and SR-3 (ECC-1/0, P-FAIL/E-FAIL, BUSY). The device supports both Standard SPI (DI/DO) and multiplexed Dual/Quad I/O modes using IO0–IO3, with /WP and /HOLD repurposed as IO2/IO3 in Quad mode when WP-E=0.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 1 G-bit (128 MByte), organized as 65,536 pages × 2,048 bytes |
| Interface | Dual/Quad SPI with standard instruction compatibility; supports Fast Read Quad I/O (6Bh/6Ch) |
| Max Clock Frequency | 104 MHz SPI clock; enables 416 MHz equivalent quad-data-rate transfer |
| Data Transfer Rate | 50 MB/s sustained in Continuous Read Mode (BUF=0), eliminating inter-command latency |
| Erase/Program Endurance | ≥100,000 cycles with on-chip 1-bit ECC correction (1 bit per 528 bytes) |
| Data Retention | ≥10 years at +85°C, guaranteed under JEDEC JESD22-A117 stress conditions |
| Operating Voltage | 2.7 V to 3.6 V single supply; active current ≤25 mA, standby ≤10 µA |
| Temperature Range | –40°C to +85°C industrial grade; qualified per JEDEC JESD22-A104 and A119 |
Pinout & Package
W25N01GVZEIT uses the 8-pad WSON 8×6-mm package (JEDEC MO-252, package code ZE), optimized for high-density PCB layouts with exposed thermal pad. Pin 4 is GND and Pin 8 is VCC; all I/O pins are 3.3V-tolerant with internal pull-downs on /CS, /WP, and /HOLD.
| Pin | Circuit Role | Design Meaning |
|---|---|---|
| 1 (/CS) | Chip Select Input | Active-low enable; must transition high→low after power-up before accepting commands |
| 2 (DO / IO1) | Data Output / I/O1 | Unidirectional output in Standard SPI; bidirectional in Dual/Quad SPI; high-Z when /CS high |
| 3 (/WP / IO2) | Write Protect Input / I/O2 | Hardware lock for SR-1 when WP-E=1; functions as IO2 in Quad mode when WP-E=0 |
| 4 (GND) | Ground Reference | Primary signal and power return; connects to thermal pad for thermal dissipation |
| 5 (DI / IO0) | Data Input / I/O0 | Unidirectional input in Standard SPI; bidirectional in Dual/Quad SPI; used for all command/address loading |
| 6 (CLK) | Serial Clock Input | Edge-triggered master clock; rising edge for input, falling edge for output in all SPI modes |
| 7 (/HOLD / IO3) | Hold Input / I/O3 | Pauses ongoing read/write while /CS low; functions as IO3 in Quad mode when WP-E=0 |
| 8 (VCC) | Power Supply | 2.7–3.6 V core supply; requires local 1 µF ceramic decoupling adjacent to pin |
Key Features
| Feature | Design Value |
|---|---|
| Continuous Read Mode (BUF=0) | Enables seamless sequential access across page boundaries without issuing Page Data Read (13h) between reads |
| On-chip 1-bit ECC | Corrects single-bit errors per 528-byte sector; status bits ECC-1/ECC-0 report correction count per read |
| Configurable Write Protection | Combines software (BP3–BP0, SRP1/SRP0) and hardware (/WP pin) locking for granular or full-array protection |
| Bad Block Management (BBM) | Internal LUT stores invalid block addresses; accessible via A5h instruction for host-level wear leveling integration |
| OTP Configuration Space | Ten 2KB OTP pages for immutable firmware keys, calibration data, or secure boot parameters |
| Unique ID & Parameter Pages | One 2KB factory-programmed Unique ID page and one 2KB user-writable Parameter page for device identity and configuration |
Applications
| Industrial HMI Firmware Storage | IoT Edge Device Log Buffer |
|---|---|
|
Use Scenario: Storing boot firmware, UI assets, and update images in panel-mounted HMIs with limited PCB area and no external RAM. IC Role / Device Role / Timing Role: Non-volatile code storage with XIP-capable Dual/Quad SPI interface; executes directly from flash using Fast Read Quad I/O (6Bh). Use Value: Eliminates external NOR flash and RAM, reducing BOM cost by 30% while maintaining ≥50MB/s read bandwidth for GUI rendering. |
Use Scenario: Cyclic logging of sensor telemetry in battery-powered gateways where power efficiency and endurance are critical. IC Role / Device Role / Timing Role: High-endurance data logger with on-chip ECC and BBM; uses 128KB block erase to minimize write amplification. Use Value: Achieves >100,000 program/erase cycles with automatic bad-block remapping, extending field life beyond 10 years. |
| Medical Diagnostic Boot Image | Automotive Infotainment Map Cache |
|
Use Scenario: Secure storage of certified boot images and calibration tables in Class II medical imaging equipment requiring traceable firmware. IC Role / Device Role / Timing Role: Trusted firmware vault with OTP pages for cryptographic keys and parameter page for field-updatable calibration data. Use Value: Enables secure boot chain validation and regulatory-compliant firmware versioning without external secure elements. |
Use Scenario: Caching high-resolution navigation map tiles in automotive head units where fast random-access read performance is essential. IC Role / Device Role / Timing Role: Low-latency map data cache using Continuous Read Mode to stream tile sequences without page boundary stalls. Use Value: Reduces map load latency by 40% vs. traditional NAND controllers, improving perceived system responsiveness. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar serial NAND flash applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Macronix MX35LF1GE4AB | Same 1G-bit SLC NAND density, 104MHz max clock, but lacks Continuous Read Mode and uses different BBM register mapping (0x90h vs A5h) | Requires host-side BBM table parsing; no native 50MB/s continuous streaming mode | Prefer W25N01GVZEIT when Continuous Read Mode or standardized A5h BBM access is required |
| Micron MT29F1G08ABA | Parallel NAND interface (not SPI); requires NAND controller; higher pin count and PCB footprint | Not pin-compatible or protocol-compatible; mandates external ECC engine and complex driver stack | Choose W25N01GVZEIT for SPI-native designs avoiding NAND controller complexity and layout overhead |
Compared with MX35LF1GE4AB, W25N01GVZEIT provides faster sequential access via Continuous Read Mode and standardized BBM access, while versus MT29F1G08ABA it eliminates NAND controller dependency and reduces design cycle time by 6+ weeks.
Availability
W25N01GVZEIT is available at Aetrix Electronics and suitable for industrial HMI firmware storage, IoT edge device log buffering, and medical diagnostic boot image retention requiring stable component supply, long-term lifecycle assurance, and full-specification compliance.
Supply support for W25N01GVZEIT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Winbond Electronics is a Taiwan-based global semiconductor manufacturer specializing in specialty DRAM, mobile DRAM, and serial flash memory solutions since 1987.
The W25N SpiFlash family was designed specifically to bring SLC NAND density and endurance to SPI-based embedded systems-replacing parallel NAND and NOR flash in cost- and space-sensitive applications without sacrificing reliability.
FAQ
What is the default read mode for W25N01GVZEIT at power-up?
W25N01GVZEIT powers up in Buffer Read Mode (BUF=1), meaning the Read Data (03h) instruction loads data into the internal 2,048-byte buffer before serial output. To use Continuous Read Mode (BUF=0), the Configuration Register (SR-2) must be written with BUF=0 using instruction 1Fh. This setting persists only until next power cycle unless locked in OTP.
Does W25N01GVZEIT support Quad SPI commands with 4-byte addressing?
Yes, W25N01GVZEIT supports Fast Read Quad I/O with 4-byte addressing (instruction ECh) and Quad Load Program Data with 4-byte addressing (34h). These commands are valid in both BUF=0 and BUF=1 modes and require the 4-byte address mode to be enabled via the Extended Address Register (EAR) using instruction C8h before execution.
How does hardware write protection work on W25N01GVZEIT?
Hardware write protection on W25N01GVZEIT is activated when the WP-E bit in Status Register-1 is set to 1. In this state, tying /WP to GND disables all program, erase, and status register write operations-including OTP programming-and renders the entire device read-only. Quad SPI read commands are also disabled, enforcing strict hardware-level lockdown.
What is the purpose of the BBM Look-Up Table (LUT) in W25N01GVZEIT?
The BBM Look-Up Table (LUT) in W25N01GVZEIT is a dedicated on-die table storing physical addresses of factory-marked and field-detected invalid blocks. It is accessed via instruction A5h and enables host firmware to skip defective blocks during logical-to-physical address translation, simplifying wear leveling and improving system-level reliability without external block management logic.
Can W25N01GVZEIT be used for Execute-in-Place (XIP) applications?
Yes, W25N01GVZEIT supports XIP via Fast Read Dual/Quad I/O instructions (3Bh/6Bh and variants), delivering up to 416 MHz equivalent bandwidth. Its Continuous Read Mode further enhances XIP performance by removing page-boundary delays, making it suitable for direct code execution in microcontrollers with SPI memory-mapped interfaces.
W25N01GVZEIT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Winbond Electronics Corporation
- Series:
- SpiFlash®
- Package/Case:
- 8-WDFN Exposed Pad
- Packaging:
- Tray
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Non-Volatile
- Memory Format:
- FLASH
- Technology:
- FLASH - NAND (SLC)
- Memory Size:
- 1Gbit
- Memory Organization:
- 128M x 8
- Memory Interface:
- SPI - Quad I/O
- Clock Frequency:
- 104 MHz
- Write Cycle Time - Word, Page:
- 700µs
- Access Time:
- 7 ns
- Voltage - Supply:
- 2.7V ~ 3.6V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 8-WSON (8x6)
W25N01GVZEIT FAQ
1.How can I place an order for W25N01GVZEIT through Aetrix?
Please submit a Request for Quotation (RFQ) for W25N01GVZEIT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for W25N01GVZEIT reliable?
The price and inventory of W25N01GVZEIT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W25N01GVZEIT is usually 5 days.
3.What payment methods are accepted for W25N01GVZEIT?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W25N01GVZEIT transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for W25N01GVZEIT?
W25N01GVZEIT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your W25N01GVZEIT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for W25N01GVZEIT?
For technical support, including W25N01GVZEIT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W25N01GVZEIT requirements.
6.How does Aetrix verify that W25N01GVZEIT is sourced from the original manufacturer or authorized distributors?
All W25N01GVZEIT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W25N01GVZEIT meets industry standards.
7.What is the process for return or replacement of W25N01GVZEIT?
All W25N01GVZEIT units undergo pre-shipment inspection (PSI). If there is an issue with W25N01GVZEIT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The W25N01GVZEIT part is unused and in its original packaging.
Return procedure for W25N01GVZEIT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
W25N01GVZEIT Tags
-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology
-
AT21CS01-STUM10-T
Microchip Technology
-
AT24C02C-SSHM-T
Microchip Technology
-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics
-
AT24CS02-SSHM-T
Microchip Technology
-
93LC46BT-I/OT
Microchip Technology
-
AT24C04C-SSHM-T
Microchip Technology
-
24LC01BT-I/SN
Microchip Technology
-
24AA02UIDT-I/OT
Microchip Technology
-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
Counterfeit components can hide behind convincing markings and passing basic function tests. This engineering reference covers source traceability, external inspection, X-ray, XRF, electrical testing, …
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
