Send an Inquiry

To receive a quote for your project, please fill in the following information, and we’ll get back to you promptly.

Name*
Company*
Email Address*
Phone/WhatsApp
Part Number*
Quantity*
Message
Submit Inventory List

Please fill in the following information, and we’ll get back to you promptly.

Name*
Company*
Email Address*
Phone/WhatsApp
Upload My List
Message

Winbond Electronics Corporation W25N01GWTBIG TR

Part No.:
W25N01GWTBIG TR
Manufacturer:
Winbond Electronics Corporation
Category:
Memory
Package:
24-TBGA
Datasheet:
AetrixW25N01GWTBIG TR.pdf
Description:
IC FLASH 1GBIT SPI/QUAD 24TFBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:1,713

Please send an inquiry. Send us your inquiry, and we will respond immediately.

Part Number
Quantity*
Price
Name*
Company
Email*
Comments

Product details

Overview

W25N01GWTBIG TR from Winbond is a 1.8V serial SLC NAND flash memory IC with 1G-bit (128MB) capacity, organized as 65,536 × 2,048-byte pages and 1,024 × 128KB erasable blocks. It supports Standard/Dual/Quad SPI interfaces up to 104MHz clock (416MHz equivalent Quad I/O), delivers 40MB/s continuous read throughput, and features on-chip 1-bit ECC, hardware/software write protection, and dual boot-mode configuration (BUF=1 default). It serves as non-volatile storage for code shadowing, XIP execution, and firmware/data logging in space-constrained embedded systems.

For engineers reviewing the W25N01GWTBIG TR datasheet, W25N01GWTBIG TR pinout, W25N01GWTBIG TR application, or W25N01GWTBIG TR equivalent, key selection considerations include its WSON-8 (8×6mm) package, 1.7–1.95V supply range, -40°C to +85°C operation, continuous vs. buffer read mode behavior, and compatibility with JEDEC-standard SPI command sets including Fast Read Quad I/O and 4-byte addressing.

Technical Context

The W25N01GWTBIG TR implements a true SLC NAND architecture with internal page buffer management, supporting both Buffer Read (default power-up mode) and Continuous Read modes-enabling single-command sequential access across the full 128MB array without intermediate Page Data Read instructions. Its command set includes dedicated Bad Block Management (A1h), BBM Look-Up Table access (A5h), and Last ECC Failure Page reporting (A9h).

It integrates configurable protection registers (SR-1/SR-2) with OTP-lockable bits for block protection (BP3–BP0), write-enable control (WP-E), status register lock (SRP1/SRP0), ECC enable (ECC-E), and buffer mode selection (BUF). The device uses bidirectional IO0–IO3 pins for Dual/Quad SPI, while /WP and /HOLD revert to data I/O roles in Quad mode unless WP-E=1 enables hardware lock-down.

Key Specifications

Parameter Value and Actual Design Meaning
Memory TypeSLC NAND Flash - provides higher endurance (>100k P/E cycles) and reliability than MLC/TLC, suitable for firmware storage requiring long-term integrity.
Total Capacity1 G-bit (128 MB) - organized as 65,536 pages × 2,048 bytes, enabling efficient sector-aligned firmware updates and large parameter tables.
InterfaceStandard/Dual/Quad SPI - supports legacy SPI commands plus high-speed Dual/Quad I/O protocols (e.g., Fast Read Quad I/O at 104MHz CLK), reducing bus bandwidth pressure.
Read Throughput40 MB/s continuous - achieved via Continuous Read Mode, eliminating inter-page command overhead for linear code/data streaming.
Erase Granularity128 KB uniform blocks - simplifies wear leveling and bad block management; 1,024 total blocks allow predictable lifetime modeling.
Voltage Range1.70–1.95 V - matches low-power SoC I/O rails; eliminates level-shifting in 1.8V systems and reduces active current to 25mA.
Data Retention10 years at +85°C - validated under worst-case thermal stress, ensuring firmware persistence in industrial temperature environments.

Pinout & Package

W25N01GWTBIG TR is packaged in an 8-pad WSON (8×6 mm, package code ZE), with exposed pad for thermal dissipation and no lead finish restrictions. Pin assignments are fully defined per Figure 1a of the datasheet.

Pin/Terminal Circuit Role Design Meaning
/CSChip Select InputActive-low enable; must transition high→low after power-up before accepting instructions; places DO in high-Z when deasserted.
DO (IO1)Data Output / Bidirectional I/OUnidirectional output in Standard SPI; bidirectional data lane (IO1) in Dual/Quad SPI; requires external pull-up if shared with other devices.
/WP (IO2)Write Protect Input / Bidirectional I/OHardware lock for SR-1 when WP-E=1; otherwise functions as IO2 in Quad mode; tied to GND to disable all writes including OTP and registers.
GNDGround ReferencePrimary return path for VCC and I/O signals; must be low-inductance connection to minimize noise during fast read/write transitions.
DI (IO0)Data Input / Bidirectional I/OUnidirectional input in Standard SPI; bidirectional data lane (IO0) in Dual/Quad SPI; used for instruction/address/data loading on CLK rising edge.
CLKSerial Clock InputMaster-generated clock up to 104MHz; timing-critical path; requires controlled impedance routing and minimal skew relative to /CS and I/O lines.
/HOLD (IO3)Hold Input / Bidirectional I/OPauses ongoing Standard/Dual SPI transfers when low; becomes IO3 in Quad mode; not functional during active Quad Read/Load operations.
VCCPower Supply1.7–1.95V supply; requires local 1µF ceramic decoupling adjacent to pin; ripple must stay within ±50mV during 104MHz bursts.

Key Features

Feature Design Value
Continuous Read Mode (BUF=1 default)Enables single-command sequential access across entire 128MB array - eliminates need for repeated Page Data Read (13h) commands, reducing CPU overhead by >40% in code shadowing use cases.
On-chip 1-bit ECCCorrects single-bit errors per 528-byte sector without host intervention - reduces firmware validation complexity and extends usable life of NAND blocks beyond raw endurance limits.
Configurable Write ProtectionCombines volatile BP[3:0] bits, OTP-lockable SRP[1:0], and WP-E bit to support flexible protection schemes - from partial block locking to full-device read-only lockdown via /WP pin.
Dual Boot ConfigurationW25N01GWTBIG TR powers up in Buffer Read mode (BUF=1); W25N01GWxxIT variants default to Continuous Read - allows hardware-selectable boot behavior without firmware rework.
Bad Block Management (BBM)Includes dedicated A1h instruction and LUT-accessible BBM table (A5h) - enables host to identify, map out, and skip factory-invalid or field-worn blocks during initialization.

Applications

Industrial HMI Firmware Storage Medical Device Parameter Logging

Use Scenario: Storing boot firmware, UI assets, and calibration profiles in panel-mounted HMIs operating continuously in factory environments with wide ambient temperature swings.

IC Role / Device Role / Timing Role: Non-volatile code and data repository with deterministic read latency; executes XIP from Dual SPI interface during boot sequence.

Use Value: 10-year data retention at +85°C ensures firmware integrity over product lifetime; 128KB erase blocks align with typical OTA update packet sizes.

Use Scenario: Capturing time-stamped sensor calibration data, device usage logs, and regulatory audit trails in portable diagnostic equipment with battery-backed operation.

IC Role / Device Role / Timing Role: High-reliability data logger using on-chip ECC and BBM to guarantee log integrity despite frequent small-block writes and potential power-loss events.

Use Value: 1-bit ECC corrects bit flips induced by radiation or voltage droop; OTP pages securely store cryptographic keys and device-specific identifiers.

Automotive Infotainment Boot Memory Smart Meter Firmware Repository

Use Scenario: Hosting primary bootloader and OS kernel images in automotive infotainment head units requiring AEC-Q100-compliant components and fast cold-boot performance.

IC Role / Device Role / Timing Role: Low-latency serial flash providing 40MB/s continuous read for rapid code shadowing into DDR; supports Quad SPI for parallelized fetch during startup.

Use Value: Continuous Read Mode cuts boot time by ~200ms vs. buffer-read alternatives; -40°C to +85°C rating meets automotive cabin temperature requirements.

Use Scenario: Storing firmware, tariff tables, and communication stack binaries in utility smart meters deployed in uncontrolled outdoor enclosures with seasonal thermal cycling.

IC Role / Device Role / Timing Role: Long-life, tamper-resistant storage with hardware write-protection (WP-E=1) to prevent unauthorized firmware modification during field deployment.

Use Value: /WP pin hardwired to GND enforces permanent read-only mode post-certification; 1.7–1.95V operation matches meter SoC I/O voltage domain.

Equivalent & Alternatives

The following parts are listed as comparable options for similar serial NAND flash memory applications.

Alternative Part Technical Difference Application Difference Selection Advice
Macronix MX35LF1GE4AB1G-bit SLC NAND, 1.8V, SOIC-16 package only; supports only Standard/Dual SPI (no Quad I/O); lacks Continuous Read Mode and OTP pages.Lower interface bandwidth (max 80MHz Dual SPI); no hardware-based full-device lockdown; limited field-upgrade flexibility due to missing BBM LUT access.Choose when board layout already uses SOIC-16 footprint and Quad SPI bandwidth is unnecessary; verify ECC implementation resides entirely in host controller.
Micron MT29F1G08ABBDAH41G-bit SLC NAND, 3.3V supply; parallel NAND interface (not SPI); requires external controller for ECC, BBM, and command translation.Higher pin count (48-ball TSOP), larger PCB footprint, and mandatory external controller increase BOM cost and design complexity.Prefer only if existing platform uses parallel NAND controllers and 3.3V rail is available; avoid for new 1.8V SPI-based designs due to voltage and interface mismatch.

Compared with W25N01GWTBIG TR, MX35LF1GE4AB offers lower-cost SOIC packaging but sacrifices Quad SPI speed, continuous read efficiency, and integrated OTP security; MT29F1G08ABBDAH4 delivers higher raw bandwidth but demands external controller resources and violates the 1.8V system constraint - making W25N01GWTBIG TR the optimal balance of integration, voltage compliance, and SPI-native performance.

Availability

W25N01GWTBIG TR is available at Aetrix Electronics and suitable for industrial HMI firmware storage, medical device parameter logging, automotive infotainment boot memory, smart meter firmware repositories, and embedded code shadowing applications requiring stable component supply, long-term lifecycle support, and guaranteed traceable sourcing.

Supply support for W25N01GWTBIG TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Winbond Electronics is a Taiwan-based semiconductor manufacturer specializing in specialty memory solutions, including SPI NOR/NAND flash, RAM, and mobile DRAM, with global manufacturing and quality certifications.

The W25N SpiFlash family was designed specifically to bring NAND density and cost advantages to SPI-based embedded systems - bridging the gap between traditional SPI NOR flash and parallel NAND, with integrated ECC, BBM, and multi-I/O support for seamless integration.

FAQ

What is the default read mode for W25N01GWTBIG TR at power-up?

W25N01GWTBIG TR powers up in Buffer Read mode (BUF=1), as indicated by the "IG" suffix in its part number. This means the device expects explicit Page Data Read (13h) commands to load data from the internal 2,048-byte buffer before subsequent Read Data (03h) instructions return valid output. Continuous Read mode (BUF=0) is available via Status Register-2 configuration but is not the default state for W25N01GWTBIG TR.

Does W25N01GWTBIG TR support Quad SPI commands and what are the pin requirements?

Yes, W25N01GWTBIG TR supports full Quad SPI operation using IO0–IO3 pins (mapped to DI, DO, /WP, and /HOLD respectively in WSON-8). Quad instructions like Fast Read Quad I/O (EBh) and Quad Load Program Data (32h) require all four I/O lines active simultaneously. Note that /WP and /HOLD lose their hardware protection functions in Quad mode unless WP-E=1 is set - then Quad reads are disabled entirely.

How does the on-chip ECC in W25N01GWTBIG TR function and where are error reports visible?

W25N01GWTBIG TR implements automatic 1-bit error correction per 528-byte sector using on-die logic. Correctable errors do not interrupt normal operation, but cumulative ECC status (ECC-1/ECC-0 bits) and per-page failure flags are reported in Status Register-3 (Cxh). Host software can poll these bits after read operations to detect uncorrectable errors or track ECC event frequency for predictive wear analysis.

Can W25N01GWTBIG TR be used as a direct replacement for standard SPI NOR flash in existing designs?

W25N01GWTBIG TR is not a pin-compatible or command-compatible drop-in replacement for SPI NOR flash. While it shares SPI clocking and basic instruction opcodes (e.g., 03h Read Data), it requires distinct NAND-specific commands (e.g., A1h BBM, 13h Page Data Read), different erase granularity (128KB blocks vs. 4KB sectors), and relies on host-managed bad block handling. Migration requires firmware and driver-level redesign.

What package type and dimensions does W25N01GWTBIG TR use, and is thermal pad soldering required?

W25N01GWTBIG TR uses the 8-pad WSON package (8×6 mm, package code ZE) with an exposed thermal pad on the bottom side. Per Winbond's package specification (Section 11.1), the thermal pad must be soldered to a PCB copper pour for reliable thermal dissipation and mechanical stability - omission risks overheating during sustained 104MHz Quad I/O operation and may cause intermittent connectivity failures.

W25N01GWTBIG TR Specifications

Product attributes
Attribute value
Manufacturer:
Winbond Electronics Corporation
Series:
SpiFlash®
Package/Case:
24-TBGA
Packaging:
Tape & Reel (TR)
Product Status:
Active
Programmable:
Not Verified
Memory Type:
Non-Volatile
Memory Format:
FLASH
Technology:
FLASH - NAND (SLC)
Memory Size:
1Gbit
Memory Organization:
128M x 8
Memory Interface:
SPI - Quad I/O
Clock Frequency:
104 MHz
Write Cycle Time - Word, Page:
700µs
Access Time:
8 ns
Voltage - Supply:
1.7V ~ 1.95V
Operating Temperature:
-40°C ~ 85°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
24-TFBGA (8x6)

W25N01GWTBIG TR FAQ

1.How can I place an order for W25N01GWTBIG TR through Aetrix?

Please submit a Request for Quotation (RFQ) for W25N01GWTBIG TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for W25N01GWTBIG TR reliable?

The price and inventory of W25N01GWTBIG TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W25N01GWTBIG TR is usually 5 days.

3.What payment methods are accepted for W25N01GWTBIG TR?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W25N01GWTBIG TR transactions.

Note: Certain payment methods may incur a processing fee.

4.How is shipping managed for W25N01GWTBIG TR?

W25N01GWTBIG TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your W25N01GWTBIG TR order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for W25N01GWTBIG TR?

For technical support, including W25N01GWTBIG TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W25N01GWTBIG TR requirements.

6.How does Aetrix verify that W25N01GWTBIG TR is sourced from the original manufacturer or authorized distributors?

All W25N01GWTBIG TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W25N01GWTBIG TR meets industry standards.

7.What is the process for return or replacement of W25N01GWTBIG TR?

All W25N01GWTBIG TR units undergo pre-shipment inspection (PSI). If there is an issue with W25N01GWTBIG TR, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The W25N01GWTBIG TR part is unused and in its original packaging.

Return procedure for W25N01GWTBIG TR:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

W25N01GWTBIG TR Tags

  • W25N01GWTBIG TR
  • W25N01GWTBIG TR PDF
  • W25N01GWTBIG TR Datasheet
  • W25N01GWTBIG TR Specifications
  • W25N01GWTBIG TR Images
  • Winbond Electronics Corporation
  • Winbond Electronics Corporation W25N01GWTBIG TR
  • Buy W25N01GWTBIG TR
  • W25N01GWTBIG TR Price
  • W25N01GWTBIG TR Distributor
  • W25N01GWTBIG TR Supplier
  • W25N01GWTBIG TR Wholesale
Related Products
M24C02-WMN6TP
M24C02-WMN6TP

STMicroelectronics

AT24C02C-XHM-T
AT24C02C-XHM-T

Microchip Technology

AT21CS01-STUM10-T
AT21CS01-STUM10-T

Microchip Technology

AT24C02C-SSHM-T
AT24C02C-SSHM-T

Microchip Technology

24LC01BT-I/OT
24LC01BT-I/OT

Microchip Technology

M24C02-FMC6TG
M24C02-FMC6TG

STMicroelectronics

AT24CS02-SSHM-T
AT24CS02-SSHM-T

Microchip Technology

93LC46BT-I/OT
93LC46BT-I/OT

Microchip Technology

AT24C04C-SSHM-T
AT24C04C-SSHM-T

Microchip Technology

24LC01BT-I/SN
24LC01BT-I/SN

Microchip Technology

24AA02UIDT-I/OT
24AA02UIDT-I/OT

Microchip Technology

AT24C08C-STUM-T
AT24C08C-STUM-T

Microchip Technology

Tech Hub

Search

Search

PRODUCT

PRODUCT

PHONE

PHONE

USER

USER