Winbond Electronics Corporation W25N01GWTCIT TR
- Part No.:
- W25N01GWTCIT TR
- Manufacturer:
- Winbond Electronics Corporation
- Category:
- Memory
- Package:
- 24-TBGA
- Datasheet:
-
W25N01GWTCIT TR.pdf
- Description:
- IC FLASH 1GBIT SPI/QUAD 24TFBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
W25N01GWTCIT TR from Winbond is a 1.8V serial SLC NAND flash memory IC with 1G-bit (128MB) capacity, organized as 65,536 × 2,048-byte pages and 1,024 × 128KB erasable blocks. It supports Standard/Dual/Quad SPI interfaces up to 104MHz clock, delivers 40MB/s continuous read throughput in Continuous Read Mode (BUF=0 default), and integrates on-chip 1-bit ECC, bad block management, and OTP/Unique ID pages. It serves as non-volatile storage for code shadowing, XIP execution, and firmware/data logging in space-constrained embedded systems.
For engineers reviewing the W25N01GWTCIT TR datasheet, W25N01GWTCIT TR pinout, W25N01GWTCIT TR application, or W25N01GWTCIT TR equivalent, key selection considerations include its 8-pad WSON 8×6-mm (ZE) package, dual/quad I/O compatibility, hardware/software write protection via /WP and /HOLD pins, 1.70–1.95V supply range, and -40°C to +85°C industrial temperature rating.
Technical Context
The W25N01GWTCIT TR implements a true serial NAND architecture with dedicated internal 2,048-byte buffer for page programming and read operations. Its command set includes Fast Read Quad I/O (6Bh/6Ch), 128KB block erase (D8h), Bad Block Management (A1h), and configurable Buffer Read (BUF bit in SR-2) versus Continuous Read modes - both enabled by volatile register control without external logic.
It features three status registers: SR-1 (volatile/OTP-lockable protection bits BP3–BP0, WP-E, SRP1/SRP0), SR-2 (volatile configuration including ECC-E, BUF, ODS-1/ODS-0), and SR-3 (read-only flags for ECC failure, BUSY, P-FAIL/E-FAIL). All SPI instructions follow JEDEC-standard opcodes and support 3- or 4-byte addressing depending on mode.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Type | SLC NAND Flash - single-level cell architecture enabling >100,000 program/erase cycles and >10-year data retention at 85°C. |
| Total Capacity | 1 G-bit (128 M-byte) - organized as 65,536 pages × 2,048 bytes, grouped into 1,024 uniform 128KB erasable blocks. |
| Interface | Standard/Dual/Quad SPI - supports CLK up to 104MHz; enables 208MHz (Dual) or 416MHz (Quad) effective throughput using Fast Read Dual/Quad I/O instructions. |
| Read Mode | Continuous Read Mode (default for W25N01GWxxIT) - allows sequential access across full array with single Read command, eliminating need for repeated Page Data Read (13h) issuance. |
| Voltage Range | 1.70 V to 1.95 V - single-supply operation optimized for low-power portable and industrial applications; 25mA active / 10µA standby current. |
| ECC & Reliability | On-chip 1-bit ECC per 528-byte sector - corrects single-bit errors transparently; ECC status bits (ECC-1/ECC-0 in SR-3) report correction events and failures. |
| Operating Temp | -40°C to +85°C - qualified for industrial-grade deployment in automotive infotainment, networking equipment, and edge IoT gateways. |
Pinout & Package
W25N01GWTCIT TR is packaged in an 8-pad WSON 8×6-mm (JEDEC MO-252, package code ZE), with exposed thermal pad (not electrically connected). Pin assignments are fully defined in Figure 1a of the datasheet and validated for this specific variant.
| Pin | Circuit Role | Design Meaning |
|---|---|---|
| 1 /CS | Chip Select Input | Active-low enable: drives device into high-impedance output and standby current when high; must transition high→low before accepting new instruction after power-up. |
| 2 DO (IO1) | Data Output / I/O1 | Unidirectional output in Standard SPI (03h/0Bh); bidirectional I/O in Dual/Quad SPI (3Bh/6Bh); shares function with IO1 in multi-I/O modes. |
| 3 /WP (IO2) | Write Protect Input / I/O2 | In Hardware Protection mode (WP-E=1), tied low disables all writes/erases; in Software mode (WP-E=0), functions as Quad SPI I/O2 and protects SR-1 only. |
| 4 GND | Ground Reference | Primary signal and power return path; requires low-impedance connection to system ground plane for noise immunity and timing integrity. |
| 5 DI (IO0) | Data Input / I/O0 | Unidirectional input in Standard SPI (instruction/address/data load); bidirectional I/O in Dual/Quad SPI; primary serial data ingress path. |
| 6 CLK | Serial Clock Input | Edge-triggered master clock (up to 104MHz); rising edge latches input, falling edge samples output; requires clean, monotonic transitions. |
| 7 /HOLD (IO3) | Hold Input / I/O3 | Active-low pause signal during Standard/Dual SPI; becomes Quad SPI I/O3 when Quad Read/Load command is active; no HOLD function during Quad ops. |
| 8 VCC | Power Supply | 1.70–1.95V core supply; requires local 1µF ceramic decoupling capacitor placed within 5mm of pin for stable read/write timing. |
Key Features
| Feature | Design Value |
|---|---|
| Continuous Read Mode (BUF=0) | Enables linear, command-efficient access across entire memory array - eliminates inter-page latency and reduces host CPU overhead in boot/code-shadowing use cases. |
| Configurable ECC Enable (ECC-E) | Volatile bit in SR-2 that activates on-chip 1-bit error correction per 528-byte sector - required for reliable operation in noisy environments or extended temperature cycling. |
| Dual/Quad SPI Compatibility | Shares same pinout and instruction set across Standard/Dual/Quad modes - allows bandwidth scaling without PCB redesign; IO0–IO3 repurpose /WP and /HOLD in Quad mode. |
| Hardware Write Protection | When WP-E=1 and /WP grounded, entire device (memory, registers, OTP) becomes read-only - prevents accidental firmware corruption during field updates or brown-out conditions. |
| Bad Block Management (BBM) | Integrated LUT-based BBM with A1h/A5h instructions - enables host-independent detection and remapping of factory or field-invalidated blocks, improving field reliability without external controller logic. |
| OTP & Unique ID Pages | Ten 2KB OTP pages (write-once) plus one 2KB Unique ID page - supports secure device binding, calibration data storage, and cryptographic key seeding in production and field service workflows. |
Applications
| Industrial HMI Boot Storage | Edge Gateway Firmware Image |
|---|---|
|
Use Scenario: Storing boot loader and Linux kernel image for ARM-based human-machine interface panels deployed in factory automation. IC Role / Device Role / Timing Role: Non-volatile code storage with XIP-capable Dual SPI interface; executes directly from flash during cold start with <50ms initialization latency. Use Value: Eliminates external NOR flash and reduces BOM count; Continuous Read Mode ensures deterministic 40MB/s sequential fetch for fast UI rendering and OTA update staging. |
Use Scenario: Holding signed firmware binaries and rollback images in cellular-connected edge gateways operating in remote infrastructure monitoring sites. IC Role / Device Role / Timing Role: Secure, field-upgradeable storage with OTP pages for signature keys and Unique ID for device attestation; supports atomic 128KB block erase for safe dual-bank updates. Use Value: On-chip ECC and BBM reduce uncorrectable bit error risk over 10+ year deployments; hardware write protection prevents malicious or accidental overwrite during power-interrupted updates. |
| Automotive Infotainment Cache | Medical Diagnostic Data Logger |
|
Use Scenario: Caching map tiles, voice recognition models, and UI assets in automotive head units where space and thermal envelope are constrained. IC Role / Device Role / Timing Role: High-bandwidth serial NAND acting as secondary storage tier between DRAM and eMMC; accessed via Quad SPI at 416MHz equivalent rate. Use Value: 1.8V operation and -40°C to +85°C rating meet automotive AEC-Q100 Class 2 requirements; 8-pad WSON package saves >60% board area vs. legacy parallel NAND solutions. |
Use Scenario: Recording time-stamped sensor waveforms and diagnostic logs in portable ultrasound and ECG devices requiring long-term data integrity. IC Role / Device Role / Timing Role: Reliable, low-power non-volatile buffer with 10-year data retention; uses ECC-E and SR-3 status flags to validate log integrity before transmission. Use Value: Integrated 1-bit ECC and cumulative ECC status reporting eliminate need for external error-checking logic; 10µA standby current extends battery life in always-on monitoring modes. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar serial NAND flash memory applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Macronix MX35LF1GE4AB | 1G-bit SLC NAND, 1.8V, SOIC-16 and TFBGA packages; supports only Standard/Dual SPI (no Quad I/O); max CLK = 100MHz; no Continuous Read Mode. | Lacks Quad SPI bandwidth and BUF-mode flexibility; suitable for cost-sensitive designs where 40MB/s throughput is not required. | Select when Quad I/O and Continuous Read are unnecessary, and SOIC-16 footprint is preferred over WSON. |
| Micron MT29F1G01ABAGDWB | 1G-bit SLC NAND, 3.3V supply (not 1.8V); supports x8 parallel interface and ONFI 2.3; no native SPI interface - requires external SPI-to-ONFI bridge IC. | Requires additional silicon and layout complexity; incompatible voltage domain; not drop-in replaceable for SPI-native designs. | Choose only if existing platform uses ONFI NAND controllers and 3.3V rail is available; not suitable for direct W25N01GWTCIT TR replacement. |
Compared with MX35LF1GE4AB, W25N01GWTCIT TR delivers higher bandwidth via Quad SPI and simplifies host firmware with Continuous Read Mode; compared with MT29F1G01ABAGDWB, it eliminates interface bridging complexity and supports 1.8V-only systems - making it optimal for compact, low-power, SPI-native embedded storage.
Availability
W25N01GWTCIT TR is available at Aetrix Electronics and suitable for industrial HMI boot storage, edge gateway firmware image storage, and automotive infotainment cache applications requiring stable component supply, long-lifecycle support, and guaranteed traceability.
Supply support for W25N01GWTCIT TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Winbond Electronics is a Taiwan-based semiconductor company specializing in specialty memory solutions, including SPI NOR/NAND flash, RAM, and TrustME secure memory products.
The W25N SpiFlash family was designed specifically to bring NAND density and cost-efficiency to SPI-based microcontroller platforms - enabling code execution, firmware storage, and data logging without parallel bus complexity or external ECC controllers.
FAQ
What is the default read mode for W25N01GWTCIT TR at power-up?
W25N01GWTCIT TR powers up in Continuous Read Mode (BUF = 0), as indicated by the "IT" suffix in its part number. This mode enables efficient linear access across the full memory array using a single Read command (03h/0Bh), eliminating the need for repeated Page Data Read (13h) instructions between pages. The BUF bit resides in Status Register-2 and can be reconfigured via Write Status Register (1Fh) if Buffer Read Mode is preferred for specific workloads.
Does W25N01GWTCIT TR support Quad SPI operation, and how are the I/O pins assigned?
Yes, W25N01GWTCIT TR supports Quad SPI operation using IO0–IO3. In Quad mode, pins 2 (DO), 3 (/WP), 5 (DI), and 7 (/HOLD) become bidirectional I/O lines IO1, IO2, IO0, and IO3 respectively. Standard and Dual SPI use only IO0 and IO1; Quad SPI requires all four, and /WP and /HOLD lose their dedicated protection functions when Quad instructions are active. Pin mapping is fixed per WSON-8 package and verified in Figure 1a of the datasheet.
How does hardware write protection work on W25N01GWTCIT TR?
Hardware write protection on W25N01GWTCIT TR is enabled by setting the WP-E bit (bit 7 of Status Register-1) to 1. When WP-E = 1 and the /WP pin is driven low, all write, program, and erase operations - including memory array, status registers, OTP pages, and Unique ID - are disabled. The device becomes fully read-only, and even Quad SPI read commands are blocked. This provides robust, voltage-level–based protection against unintended firmware corruption during power transients or software faults.
What is the role of the on-chip ECC in W25N01GWTCIT TR, and how is it controlled?
The on-chip ECC in W25N01GWTCIT TR performs automatic 1-bit error correction per 528-byte sector during read operations. It is enabled or disabled via the ECC-E bit (bit 4 of Status Register-2), which is volatile and reset on power-up. When enabled, corrected errors are logged in SR-3's ECC-1/ECC-0 bits; uncorrectable multi-bit errors trigger P-FAIL/E-FAIL flags. ECC-E must be set explicitly - it is not enabled by default - and operates independently of host-side error handling.
Can W25N01GWTCIT TR be used for Execute-in-Place (XIP) applications?
Yes, W25N01GWTCIT TR supports XIP via Dual and Quad SPI interfaces, with Fast Read Dual I/O (BBh) and Fast Read Quad I/O (EBh) instructions delivering up to 208MHz and 416MHz effective throughput. Its Continuous Read Mode further enhances XIP performance by enabling seamless, low-latency sequential instruction fetch across page boundaries. However, XIP implementation requires MCU SPI controller support for Dual/Quad modes and proper address alignment - no external glue logic is needed due to native SPI NAND architecture.
W25N01GWTCIT TR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Winbond Electronics Corporation
- Series:
- SpiFlash®
- Package/Case:
- 24-TBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Non-Volatile
- Memory Format:
- FLASH
- Technology:
- FLASH - NAND (SLC)
- Memory Size:
- 1Gbit
- Memory Organization:
- 128M x 8
- Memory Interface:
- SPI - Quad I/O
- Clock Frequency:
- 104 MHz
- Write Cycle Time - Word, Page:
- 700µs
- Access Time:
- 8 ns
- Voltage - Supply:
- 1.7V ~ 1.95V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 24-TFBGA (8x6)
W25N01GWTCIT TR FAQ
1.How can I place an order for W25N01GWTCIT TR through Aetrix?
Please submit a Request for Quotation (RFQ) for W25N01GWTCIT TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for W25N01GWTCIT TR reliable?
The price and inventory of W25N01GWTCIT TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W25N01GWTCIT TR is usually 5 days.
3.What payment methods are accepted for W25N01GWTCIT TR?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W25N01GWTCIT TR transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for W25N01GWTCIT TR?
W25N01GWTCIT TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your W25N01GWTCIT TR order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for W25N01GWTCIT TR?
For technical support, including W25N01GWTCIT TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W25N01GWTCIT TR requirements.
6.How does Aetrix verify that W25N01GWTCIT TR is sourced from the original manufacturer or authorized distributors?
All W25N01GWTCIT TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W25N01GWTCIT TR meets industry standards.
7.What is the process for return or replacement of W25N01GWTCIT TR?
All W25N01GWTCIT TR units undergo pre-shipment inspection (PSI). If there is an issue with W25N01GWTCIT TR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The W25N01GWTCIT TR part is unused and in its original packaging.
Return procedure for W25N01GWTCIT TR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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