Winbond Electronics Corporation W25N01JWZEIT TR

Overview

W25N01JWZEIT TR from Winbond is a 1.8V, 1G-bit Serial SLC NAND Flash memory with Dual/Quad SPI interface, supporting up to 166MHz STR and 80MHz DTR read speeds, 128KB uniform block erase, and on-chip 1-bit ECC - deployed in embedded boot code storage, firmware update partitions, and industrial HMI data logging.

For engineers reviewing the W25N01JWZEIT TR datasheet, W25N01JWZEIT TR pinout, W25N01JWZEIT TR application, or W25N01JWZEIT TR equivalent, key selection criteria include buffer vs. continuous read mode configuration (BUF bit), DTR timing compliance, ECC status reporting, and WSON-8x6mm package compatibility with high-density PCB layouts.

Technical Context

The W25N01JWZEIT TR implements a true NAND architecture organized into 1,024 erasable blocks (128KB each) and 65,536 pages (2,048 bytes/page), with internal 2,048-byte page buffer enabling single-command programming. It supports both Buffer Read (default at power-up for G-suffix) and Continuous Read modes - the latter eliminating inter-page command overhead for linear code shadowing.

Its SPI interface operates in Standard/Dual/Quad I/O configurations using shared pins (IO0–IO3), with DTR mode doubling data throughput by sampling on both clock edges. Write protection is implemented via /WP pin, SR bits (BP0–BP3, TB), and OTP-lockable registers, while Bad Block Management uses an on-chip LUT accessible via A5h instruction.

Key Specifications

Pinout & Package

W25N01JWZEIT TR is packaged in an 8-pad WSON 8×6 mm (JEDEC MO-252, package code ZE), with wettable flank leads for automated optical inspection. Pin 1 is marked by a dot; pin 8 is /RESET. The package supports reflow per IPC/JEDEC J-STD-020D.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar Serial NAND Flash applications.

Compared with MT29F1G01ABAGDWB-IT:C and GD5F1GQ4UCYIGR, the W25N01JWZEIT TR uniquely combines 1.8 V operation, 166 MHz STR + 80 MHz DTR, on-chip ECC with status reporting, and direct LUT access - enabling faster, more reliable, and self-managed NAND deployment in space-constrained industrial designs.

Availability

W25N01JWZEIT TR is available at Aetrix Electronics and suitable for industrial PLC firmware storage, medical device boot code partitions, and smart energy meter data logging requiring stable component supply, long-lifecycle assurance, and qualified 1.8 V NAND Flash sourcing.

Supply support for W25N01JWZEIT TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Winbond Electronics is a Taiwan-based semiconductor manufacturer specializing in specialty memory solutions, including SPI NOR/NAND Flash, RAM, and TrustME secure memory products since 1987.

The W25N SpiFlash family was designed to bring NAND density and cost efficiency to SPI-based microcontroller platforms - replacing parallel NAND and eMMC in resource-constrained embedded systems without sacrificing reliability or interface simplicity.

FAQ

What is the default read mode for W25N01JWZEIT TR at power-up?

The W25N01JWZEIT TR powers up in Buffer Read Mode (BUF = 1) as indicated by its 'G' suffix in the part numbering scheme. This mode requires explicit Page Data Read (13h) commands between sequential page accesses. To enable Continuous Read Mode, the BUF bit in Status Register-2 must be cleared via Write Status Register (1Fh) instruction.

Does W25N01JWZEIT TR support Quad I/O and DTR simultaneously?

Yes, W25N01JWZEIT TR supports Quad I/O with DTR in instructions such as EDh (DTR Fast Read Quad I/O) and EEh (DTR Fast Read Quad I/O with 4-Byte Address). These modes use all four I/O lines and sample data on both clock edges, achieving up to 80 MB/s sustained throughput without requiring external DDR logic.

How is bad block management implemented in W25N01JWZEIT TR?

W25N01JWZEIT TR implements Bad Block Management via an on-chip Look-Up Table (LUT) stored in dedicated flash area. Host software accesses this table using instruction A5h (Read BBM LUT) and updates it via A1h (Bad Block Management). The LUT persists across power cycles and is independent of external controller firmware.

Can the ECC engine in W25N01JWZEIT TR be disabled?

Yes, the ECC engine in W25N01JWZEIT TR is controlled by the ECC-E bit (bit 4) in Status Register-2. When ECC-E = 0, on-chip ECC correction is disabled and raw data is returned; when ECC-E = 1 (default), 1-bit correction per 528-byte sector is applied and ECC-1/ECC-0 status bits reflect correction activity.

What package type does W25N01JWZEIT TR use, and is it RoHS compliant?

W25N01JWZEIT TR uses an 8-pad WSON 8×6 mm package (JEDEC MO-252, package code ZE) with wettable flanks. It is RoHS compliant and halogen-free, meeting IPC/JEDEC J-STD-020D reflow profile requirements and passing MSL3 moisture sensitivity testing.