Winbond Electronics Corporation W29N02GVBIAA
- Part No.:
- W29N02GVBIAA
- Manufacturer:
- Winbond Electronics Corporation
- Category:
- Memory
- Package:
- 63-VFBGA
- Datasheet:
-
W29N02GVBIAA.pdf
- Description:
- IC FLASH 2GBIT 63-FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:2,479
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
W29N02GVBIAA from Winbond is a 2G-bit (256MB) SLC NAND Flash memory operating at 2.7V–3.6V, organized into 2,048 blocks of 135,168 bytes each (64 pages × 2,112 bytes/page), with x8 multiplexed I/O interface and standard NAND command set including Cache Read, Copy Back, and Two-Plane operations - deployed in embedded storage for code shadowing, media buffering, and industrial data logging.
For engineers reviewing the W29N02GVBIAA datasheet, W29N02GVBIAA pinout, W29N02GVBIAA application, or W29N02GVBIAA equivalent, this page delivers verified package mapping (63-ball VFBGA), real-world timing values (25μs random read, 250μs page program), endurance (100K P/E cycles), and functional alternatives aligned to ONFI-compliant SLC NAND use cases in resource-constrained systems.
Technical Context
The W29N02GVBIAA implements a two-plane NAND architecture enabling concurrent operations across even/odd block groups, reducing effective latency for sequential and random access. Its command-latch protocol uses CLE/ALE control lines with #CE, #WE, and #RE to manage multiplexed address/data/command transfers over the same 8-bit I/O bus.
It supports ONFI 1.0–compatible features including GET/SET FEATURES (EFh/EEh), parameter page reads (ECh), and enhanced status reporting (78h), while maintaining full compatibility with legacy NAND controllers via standard command set (00h/30h read, 80h/10h program, 60h/D0h erase). The device includes OTP area and block lock functionality per Winbond specification.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density | 2 G-bit / 256 MB total capacity - supports firmware image storage or multi-track audio/video buffers in space-constrained designs. |
| Page size | 2,112 bytes (2,048 + 64 spare) - enables ECC implementation with 1-bit/528-byte correction for reliable long-term data retention. |
| Block size | 135,168 bytes (64 × 2,112) - defines minimum erasable unit; impacts wear leveling granularity and bad-block management overhead. |
| Random read time | 25 μs max - determines latency for small metadata or configuration lookups without sequential prefetch penalty. |
| Page program time | 250 μs typical - sets write throughput ceiling for log-based file systems or real-time data capture applications. |
| Block erase time | 2 ms typical - governs background garbage collection speed and sustained write performance in managed NAND environments. |
| Endurance | 100,000 program/erase cycles - ensures >5 years of daily 10-write-cycle operation under industrial temperature (-40°C to +85°C). |
| Data retention | 10 years at 85°C - validated for automotive infotainment or industrial HMI storage where data integrity must persist through thermal stress. |
Pinout & Package
W29N02GVBIAA is packaged in a 63-ball Fine-Pitch Ball Grid Array (VFBGA) with 0.8 mm pitch, footprint 9 mm × 11 mm, and top-view ball-down orientation. All Vcc and Vss balls must be connected; DNU balls are unassigned and N.C. balls are internally unused.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| #CE | Chip Enable | Active-low global enable: high = standby (10 μA), low = active; allows power gating per chip select in multi-die configurations. |
| #WE | Write Enable | Rising-edge latch control for commands, addresses, and data - synchronizes all input transfers to NAND bus protocol timing windows. |
| #RE | Read Enable | Falling-edge triggered serial output strobe; tREA ≤ 25 μs defines minimum delay before valid data appears on I/O[7:0]. |
| ALE | Address Latch Enable | High during address cycles: latches column/row addresses from I/O bus on #WE rising edge per cycle (1st–5th addressing phases). |
| CLE | Command Latch Enable | High during command cycles: latches opcodes (e.g., 00h, 80h, 60h) from I/O bus on #WE rising edge to initiate device state transitions. |
| RY/#BY | Ready/Busy Output | Open-drain status signal: low = internal operation active (read/program/erase), high = ready; requires external pull-up resistor. |
| #WP | Write Protect | Active-low hardware lock: low disables all program/erase commands - prevents accidental corruption during power transients or firmware updates. |
| I/O[0–7] | Multiplexed Data Bus | Bidirectional 8-bit bus carrying commands (1st cycle), addresses (2nd–5th cycles), and data (read/write); shared physical path reduces pin count. |
Key Features
| Feature | Design Value |
|---|---|
| Two-plane architecture | Enables concurrent read/write/erase across even/odd block planes - cuts effective latency by up to 50% for interleaved access patterns. |
| Cache Read & Cache Program | Reduces average read/write latency by buffering page data in on-chip cache register - improves sequential throughput without host controller changes. |
| Copy Back operation | Permits page-to-page relocation within same die without external data transfer - accelerates wear leveling and garbage collection in managed NAND firmware. |
| ONFI 1.0 feature set | Supports standardized GET/SET FEATURES (EFh/EEh) and parameter page (ECh) for runtime configuration of timing, ECC, and protection modes. |
| Industrial temp range | Rated -40°C to +85°C - qualified for deployment in automotive telematics, industrial PLCs, and outdoor IoT gateways without derating. |
| SLC technology | Guarantees consistent 100K P/E cycles and 10-year retention - eliminates need for complex wear-leveling algorithms in bare-metal or RTOS environments. |
Applications
| Industrial HMI Storage | Automotive Infotainment Boot |
|---|---|
|
Use Scenario: Storing firmware images, UI assets, and calibration tables in programmable logic controllers with no external storage interface. IC Role / Device Role / Timing Role: Primary non-volatile boot and configuration store interfaced directly to ARM Cortex-M7 MCU via NAND controller peripheral. Use Value: 256MB capacity accommodates dual-image OTA updates; 100K endurance supports field reprogramming over 10+ years of service life. |
Use Scenario: Hosting boot loader and base OS kernel for head-unit SoCs requiring fast cold-start (<500ms) from flash. IC Role / Device Role / Timing Role: Low-latency NAND device providing sequential read bursts at 25ns cycle time to feed DDR initialization pipeline. Use Value: Cache Read mode achieves >40 MB/s effective throughput - meets AGL (Automotive Grade Linux) boot timing requirements. |
| Medical Data Logger | Smart Meter Firmware Vault |
|
Use Scenario: Capturing timestamped sensor waveforms (ECG, SpO₂) in portable diagnostic devices with battery-backed operation. IC Role / Device Role / Timing Role: High-reliability data sink using Copy Back and Two-Plane erase to sustain 100 write cycles/hour over 5-year product lifetime. Use Value: 10-year data retention at 85°C ensures waveform archives remain intact during sterilization cycles and shelf storage. |
Use Scenario: Securing firmware and tariff tables in ANSI C12.22-compliant electricity meters exposed to wide ambient temperature swings. IC Role / Device Role / Timing Role: Tamper-resistant storage with hardware #WP lock and OTP area for cryptographic keys and regulatory certificates. Use Value: Block Lock feature prevents unauthorized overwrite of metrology-critical parameters during field firmware upgrades. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar SLC NAND flash memory applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| MT29F2G08ABAEAH4 | 2G-bit SLC NAND, 48-pin TSOP1, ONFI 2.1 compliant, 20nm process - faster random read (12μs) but lower endurance (50K cycles). | Preferred for consumer electronics with higher throughput demand and shorter product lifecycle; not rated for extended industrial temperature. | Select when board layout supports TSOP1 and system prioritizes speed over longevity or thermal robustness. |
| TC58NVG2S3ETA00 | 2G-bit SLC NAND, 48-pin TSOP1, Toshiba (Kioxia), 40nm process - identical timing specs, supports OTP but lacks Two-Plane operation. | Suitable for legacy controller designs lacking Two-Plane support; requires firmware adaptation for Copy Back and Cache Program. | Choose for drop-in replacement in existing TSOP1 footprints where concurrent plane operations are unused. |
Compared with MT29F2G08ABAEAH4 and TC58NVG2S3ETA00, W29N02GVBIAA uniquely balances industrial temperature rating, Two-Plane concurrency, and 100K-cycle endurance in VFBGA packaging - making it optimal for new designs targeting long-life, thermally demanding embedded systems.
Availability
W29N02GVBIAA is available at Aetrix Electronics and suitable for industrial HMI storage, automotive infotainment boot, medical data logging, and smart meter firmware vault applications requiring stable component supply, long-term lifecycle assurance, and traceable sourcing.
Supply support for W29N02GVBIAA includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Winbond Electronics is a Taiwan-based semiconductor company specializing in specialty memory solutions, including NOR/NAND Flash, SRAM, and mobile DRAM, serving automotive, industrial, and communications markets since 1987.
W29N02GVBIAA belongs to Winbond's W29N series of SLC NAND Flash devices designed for high-reliability embedded storage where endurance, data retention, and industrial temperature operation are critical - not general-purpose mass storage.
FAQ
What is the operating voltage range for W29N02GVBIAA?
W29N02GVBIAA operates from 2.7V to 3.6V DC, with all DC and AC specifications guaranteed across this range. It draws 25mA typical during active read or program operations and only 10μA in CMOS standby mode - enabling low-power operation in battery-backed or energy-harvesting systems. The device does not support 1.8V I/O or dual-voltage operation.
Does W29N02GVBIAA support ONFI standards?
Yes, W29N02GVBIAA implements ONFI 1.0–compliant features including GET FEATURES (EEh), SET FEATURES (EFh), and READ PARAMETER PAGE (ECh), allowing runtime configuration of timing parameters, ECC settings, and protection modes. It does not support ONFI 2.x or 3.x advanced features like NV-DDR or multi-plane command chaining.
What package type is used for W29N02GVBIAA?
W29N02GVBIAA uses a 63-ball Very Fine-Pitch Ball Grid Array (VFBGA) package with 0.8 mm pitch and 9 mm × 11 mm body size (package code B). This differs from the TSOP1 variant (W29N02GVSAxx) and requires PCB layout optimized for fine-pitch BGA routing and thermal pad grounding per Winbond's recommended land pattern.
How many program/erase cycles does W29N02GVBIAA guarantee?
W29N02GVBIAA guarantees 100,000 program/erase cycles per block when used with 1-bit-per-528-byte ECC correction, as specified in the datasheet. This endurance rating is validated under industrial temperature conditions (-40°C to +85°C) and assumes proper wear-leveling firmware - exceeding typical requirements for industrial control and medical logging applications.
What is the purpose of the RY/#BY pin on W29N02GVBIAA?
The RY/#BY pin on W29N02GVBIAA is an open-drain Ready/Busy output that signals internal operation status: low indicates active read, program, or erase; high confirms completion. It must be externally pulled up to Vcc and is essential for polling-based NAND controller implementations - eliminating need for constant status register reads and reducing bus contention.
W29N02GVBIAA Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Winbond Electronics Corporation
- Series:
- -
- Package/Case:
- 63-VFBGA
- Packaging:
- Tray
- Product Status:
- Active
- Programmable:
- Verified
- Memory Type:
- Non-Volatile
- Memory Format:
- FLASH
- Technology:
- FLASH - NAND (SLC)
- Memory Size:
- 2Gbit
- Memory Organization:
- 256M x 8
- Memory Interface:
- -
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- 25ns
- Access Time:
- 25 ns
- Voltage - Supply:
- 2.7V ~ 3.6V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 63-FBGA (11x9)
W29N02GVBIAA FAQ
1.How can I place an order for W29N02GVBIAA through Aetrix?
Please submit a Request for Quotation (RFQ) for W29N02GVBIAA on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for W29N02GVBIAA reliable?
The price and inventory of W29N02GVBIAA are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W29N02GVBIAA is usually 5 days.
3.What payment methods are accepted for W29N02GVBIAA?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W29N02GVBIAA transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for W29N02GVBIAA?
W29N02GVBIAA orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your W29N02GVBIAA order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for W29N02GVBIAA?
For technical support, including W29N02GVBIAA datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W29N02GVBIAA requirements.
6.How does Aetrix verify that W29N02GVBIAA is sourced from the original manufacturer or authorized distributors?
All W29N02GVBIAA products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W29N02GVBIAA meets industry standards.
7.What is the process for return or replacement of W29N02GVBIAA?
All W29N02GVBIAA units undergo pre-shipment inspection (PSI). If there is an issue with W29N02GVBIAA, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The W29N02GVBIAA part is unused and in its original packaging.
Return procedure for W29N02GVBIAA:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
W29N02GVBIAA Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
Counterfeit components can hide behind convincing markings and passing basic function tests. This engineering reference covers source traceability, external inspection, X-ray, XRF, electrical testing, …
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…

