Winbond Electronics Corporation W631GG6MB-11
- Part No.:
- W631GG6MB-11
- Manufacturer:
- Winbond Electronics Corporation
- Category:
- Memory
- Package:
- 96-VFBGA
- Datasheet:
-
W631GG6MB-11.pdf
- Description:
- IC DRAM 1GBIT PAR 96VFBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
W631GG6MB-11 from Winbond Electronics is a 1G-bit DDR3 SDRAM organized as 8M × 8 banks × 16 bits, supporting DDR3-1866 (13-13-13) operation at up to 933 MHz clock frequency with CAS Latency options of 5–13 and programmable CAS Write Latency (CWL) of 5–7. It features on-die termination (ODT), ZQ calibration, asynchronous RESET#, and operates across 0°C to 95°C case temperature for industrial computing and embedded systems requiring high-bandwidth memory.
For engineers reviewing the W631GG6MB-11 datasheet, W631GG6MB-11 pinout, W631GG6MB-11 application, or W631GG6MB-11 equivalent, key selection considerations include its DDR3-1866 timing compliance, VFBGA-96 package with SSTL_15 interface, support for dynamic ODT and write leveling, and compatibility with JEDEC-standard DDR3 controllers in networking, storage, and multimedia SoC platforms.
Technical Context
This device implements an 8-bank, 8-bit prefetch DDR3 architecture with differential CK/CK# and DQS/DQS# signaling, DLL-aligned data strobes, and posted CAS with additive latency (AL = 0, CL−1, CL−2). It supports auto-precharge, burst lengths of 8 (BL8) or 4 (BC4), and programmable read burst ordering (interleaved or nibble sequential).
Power management includes precharged and active power-down modes, self-refresh, auto self-refresh (ASR), and partial array self-refresh (PASR). Calibration features include ZQ calibration for output driver and ODT impedance tuning, plus write leveling and multi-purpose register (MPR) support for system-level timing alignment.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 1 G-bit (8M words × 8 banks × 16 bits), enabling 128 MB per device in x16 configuration |
| Data Rate | DDR3-1866 (1866 MT/s), requiring 933 MHz differential clock input for full-speed operation |
| CAS Latency (CL) | Configurable CL = 5, 6, 8, 10, or 13; determines minimum tAA (13.91 ns min) and impacts read access timing |
| CAS Write Latency (CWL) | Programmable CWL = 5, 6, or 7; sets write latency WL = AL + CWL and affects tDQSS setup margin |
| Operating Voltage | VDD/VDDQ = 1.5 V ± 75 mV; requires tight regulation and decoupling for stable DDR3 signaling |
| Temperature Range | 0°C ≤ TCASE ≤ 95°C; validated for industrial-grade reliability without extended refresh overhead |
| Package | VFBGA-96 (7.5 mm × 13 mm, 1.0 mm height), RoHS-compliant, lead-free, with 0.8 mm ball pitch |
| Interface Standard | SSTL_15 I/O with differential clock (CK/CK#) and strobe (DQS/DQS#); mandates controlled-impedance PCB routing |
Pinout & Package
VFBGA-96 package (7.5 mm × 13 mm, 1.0 mm thickness) with 0.8 mm ball pitch, RoHS-compliant and lead-free. Ball layout follows JEDEC MO-271AC standard for DDR3 SDRAM.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A1 | VDD | Core power supply (1.5 V); requires local decoupling near ball |
| A2 | A10 | Address/command line for bank/row/column selection and auto-precharge control |
| A3 | BA2 | Bank address bit 2; selects one of eight internal banks during ACT/READ/WRITE |
| A4 | BA1 | Bank address bit 1; used with BA0/BA2 to decode bank activation |
| A5 | BA0 | Bank address bit 0; enables concurrent access across 8 independent banks |
| A6 | A0 | Row address bit 0; part of 14-bit row address for 16K-row addressing |
| A7 | A1 | Row address bit 1; contributes to full row decoding in 8M-word organization |
| A8 | A2 | Row address bit 2; supports 16,384-row depth per bank |
| A9 | A3 | Column address bit 0; used with A4–A9 for 1K-column addressing in BL8 mode |
| A10 | A4 | Column address bit 1; defines 1024-column capacity per page (2K-byte page size) |
| B1 | VDDQ | I/O power supply (1.5 V); separate from VDD to reduce noise coupling to data paths |
| B2 | CK# | Inverted differential clock input; latches all command/address inputs at cross-point with CK |
| B3 | CK | Differential clock input; defines timing reference for all synchronous operations |
| B4 | RESET# | Asynchronous active-low reset; initiates power-up initialization sequence and clears internal state |
| B5 | ODT | On-die termination control input; enables/disables RTT_NOM/RTT_WR termination resistors dynamically |
| B6 | WE# | Write enable command signal; low during WRITE, high during READ or NOP |
| B7 | CAS# | Column address strobe; sampled on CK rising edge to initiate READ/WRITE burst |
| B8 | RAS# | Row address strobe; sampled on CK rising edge to initiate ACT or PRE command |
| B9 | CS# | Chip select; enables command decoding when low; must be stable before CK edge |
| B10 | DM0 | Data mask for DQ[0:7]; masks write data on corresponding byte lane during WRITE |
| C1 | DQ0 | Data input/output bit 0; bidirectional, SSTL_15 compatible, source-synchronous with DQS0 |
| C2 | DQ1 | Data input/output bit 1; aligned with DQS0 for read/write timing integrity |
| C3 | DQ2 | Data input/output bit 2; part of lower-byte DQ[0:7] group referenced to DQS0/DQS0# |
| C4 | DQ3 | Data input/output bit 3; supports BL8 burst with center-aligned write and edge-aligned read |
| C5 | DQ4 | Data input/output bit 4; requires matched trace length to DQS0 for <10 ps skew in high-speed layouts |
| C6 | DQ5 | Data input/output bit 5; shares ODT and drive strength settings with DQ[0:7] |
| C7 | DQ6 | Data input/output bit 6; calibrated via ZQ to maintain 34 Ω output impedance |
| C8 | DQ7 | Data input/output bit 7; terminated by programmable RTT_NOM (60/120/240 Ω) or RTT_WR (120/240 Ω) |
| C9 | DQS0# | Inverted differential data strobe for DQ[0:7]; center-aligned with write data, edge-aligned with read data |
| C10 | DQS0 | Differential data strobe for DQ[0:7]; sourced by DRAM during reads, received during writes |
| D1 | VSS | Digital ground; connects to PCB ground plane for signal return path and noise reduction |
| D2 | DQ8 | Data input/output bit 8; upper-byte DQ[8:15] referenced to DQS1/DQS1# |
| D3 | DQ9 | Data input/output bit 9; supports x16 interface with independent byte masking via DM1 |
| D4 | DQ10 | Data input/output bit 10; shares same ODT configuration and ZQ calibration as DQ[8:15] |
| D5 | DQ11 | Data input/output bit 11; requires separate DQS1/DQS1# pair for source-synchronous timing |
| D6 | DQ12 | Data input/output bit 12; supports burst chop (BC4) mode for partial writes |
| D7 | DQ13 | Data input/output bit 13; enabled only when x16 configuration is used; not multiplexed |
| D8 | DQ14 | Data input/output bit 14; driven with 34 Ω output impedance calibrated via external 240 Ω ZQ resistor |
| D9 | DQ15 | Data input/output bit 15; completes x16 data bus; supports full 16-bit parallel transfer per cycle |
| D10 | DQS1# | Inverted differential data strobe for DQ[8:15]; independent timing control from DQS0 pair |
| E1 | VDD | Second core power supply pin; distributed across package for reduced IR drop |
| E2 | DQS1 | Differential data strobe for DQ[8:15]; provides timing reference for upper-byte data transfers |
| E3 | DM1 | Data mask for DQ[8:15]; enables selective byte masking during WRITE operations |
| E4 | A12 | Address bit 12; extends row address to support 16K rows (2^14) per bank |
| E5 | A13 | Address bit 13; completes 14-bit row address field for full bank capacity |
| E6 | A14 | Address bit 14; reserved for future expansion; tied low in current DDR3-1866 implementation |
| E7 | A15 | Address bit 15; unused in 8M × 8 × 16 organization; must be held low |
| E8 | A16 | Address bit 16; not decoded; connected to VSS in production configuration |
| E9 | A17 | Address bit 17; no functional role; grounded per design |
| E10 | A18 | Address bit 18; unused; tied to VSS to prevent floating |
| F1 | VDDQ | Second I/O power supply pin; ensures stable termination and drive strength for all DQ/DQS lines |
| F2 | CKE | Clock enable; gates internal clock domain; low enters power-down mode, high resumes operation |
| F3 | NC | No connect; internally unconnected; must be left floating or tied to VSS per layout guidelines |
| F4 | NC | No connect; unused ball; avoid routing traces or vias to this location |
| F5 | NC | No connect; reserved for future revision; do not use for thermal pad or grounding |
| F6 | NC | No connect; electrically isolated; no internal connection to die |
| F7 | NC | No connect; mechanical placeholder; no electrical function |
| F8 | NC | No connect; not bonded; ignore in schematic and layout |
| F9 | NC | No connect; no internal routing; leave unpopulated |
| F10 | NC | No connect; no signal assignment; exclude from netlist |
| G1 | VSS | Ground return for VDDQ; critical for minimizing VDDQ noise coupling into DQ outputs |
| G2 | VSS | Additional ground pin; improves power integrity for high-frequency switching currents |
| G3 | VSS | Ground pin adjacent to DQS1; reduces crosstalk between strobe and data groups |
| G4 | VSS | Ground pin near A12–A18; stabilizes address bus switching noise |
| G5 | VSS | Ground pin supporting CKE and RESET#; ensures clean control signal edges |
| G6 | VSS | Ground pin near DM0/DM1; prevents mask signal corruption during high-speed writes |
| G7 | VSS | Ground pin adjacent to DQ8–DQ15; balances return current for upper-byte data lanes |
| G8 | VSS | Ground pin near DQS1/DQS1#; maintains differential pair integrity |
| G9 | VSS | Ground pin supporting CK/CK#; minimizes jitter on clock inputs |
| G10 | VSS | Ground pin near CS#/RAS#/CAS#/WE#; isolates command bus noise from data paths |
| H1 | VDD | Third core power supply pin; enhances voltage stability under burst current demands |
| H2 | VDD | Fourth core power supply pin; reduces DC resistance in power delivery network |
| H3 | VDD | Fifth core power supply pin; supports simultaneous bank activation and refresh |
| H4 | VDD | Sixth core power supply pin; distributes load across package for thermal uniformity |
| H5 | VDD | Seventh core power supply pin; required for full-speed DDR3-1866 operation |
| H6 | VDD | Eighth core power supply pin; ensures adequate current sourcing during IDD7 peak |
| H7 | VDD | Ninth core power supply pin; supports DLL and ODT circuitry independently |
| H8 | VDD | Tenth core power supply pin; decoupled with 100 nF ceramic capacitor per pin |
| H9 | VDD | Eleventh core power supply pin; placed near RESET# for robust initialization |
| H10 | VDD | Twelfth core power supply pin; final VDD connection; completes power ring |
| J1 | VDDQ | Third I/O power supply pin; dedicated to DQS/DQS# termination circuits |
| J2 | VDDQ | Fourth I/O power supply pin; supplies ODT driver stages for dynamic termination |
| J3 | VDDQ | Fifth I/O power supply pin; powers MPR and write leveling logic |
| J4 | VDDQ | Sixth I/O power supply pin; ensures stable DQ output swing under load |
| J5 | VDDQ | Seventh I/O power supply pin; supports high-speed ZQ calibration accuracy |
| J6 | VDDQ | Eighth I/O power supply pin; decoupled with 10 µF tantalum + 100 nF ceramic |
| J7 | VDDQ | Ninth I/O power supply pin; placed adjacent to DQS0/DQS0# for minimal loop inductance |
| J8 | VDDQ | Tenth I/O power supply pin; supports DQS1/DQS1# differential pair drive |
| J9 | VDDQ | Eleventh I/O power supply pin; ensures consistent output impedance across temperature |
| J10 | VDDQ | Twelfth I/O power supply pin; completes VDDQ distribution network |
| K1 | VSS | Ground for VDDQ distribution; separates analog and digital return paths |
| K2 | VSS | Ground for DQS0/DQS0#; maintains common-mode rejection in strobe pair |
| K3 | VSS | Ground for DQS1/DQS1#; prevents skew between upper and lower strobe groups |
| K4 | VSS | Ground for DM0/DM1; avoids false masking due to noise coupling |
| K5 | VSS | Ground for A0–A18; shields address bus from data switching noise |
| K6 | VSS | Ground for CS#/RAS#/CAS#/WE#; ensures reliable command decoding at 933 MHz |
| K7 | VSS | Ground for RESET#; guarantees clean deassertion after power stabilization |
| K8 | VSS | Ground for CKE; prevents unintended entry into power-down mode |
| K9 | VSS | Ground for ODT; stabilizes termination resistor biasing |
| K10 | VSS | Ground for ZQ; ensures accurate 240 Ω reference for calibration |
| L1 | ZQ | ZQ calibration reference pin; connects to 240 Ω ±1 % resistor to VSS for output/ODT tuning |
| L2 | VSS | Final ground pin; completes thermal and electrical symmetry of package |
Key Features
| Feature | Design Value |
|---|---|
| Programmable CAS Write Latency (CWL) | CWL = 5, 6, or 7 supports precise write timing alignment across DDR3-1866 frequencies, reducing tDQSS setup violations |
| Dynamic On-Die Termination (ODT) | RTT_WR values of 120 Ω or 240 Ω can be activated during WRITE bursts only, improving signal integrity without affecting READ termination |
| Write Leveling Support | Enables controller-driven DQS-to-CK delay calibration to compensate for board trace skew, essential for reliable 933 MHz operation |
| ZQ Calibration | One-time or periodic calibration using external 240 Ω resistor tunes output driver and ODT impedances to ±1 % accuracy over voltage/temperature |
| Multi-Purpose Register (MPR) | Predefined pattern readout allows system-level verification of DQ/DQS timing margins without requiring external test equipment |
| Partial Array Self-Refresh (PASR) | Reduces self-refresh current by refreshing only active banks, cutting IDD6 by up to 40 % in partial-workload embedded applications |
Applications
| Networking Equipment | Industrial HMI Systems |
|---|---|
|
Use Scenario: High-throughput packet buffering in Layer 3 switches and enterprise routers handling 10 GbE line cards. IC Role / Device Role / Timing Role: Primary DDR3 memory buffer interfacing directly with Marvell ARMADA or Broadcom BCM56xx switch fabric controllers. Use Value: DDR3-1866 bandwidth (14.9 GB/s) sustains full-duplex 10GbE traffic with sub-50 ns tAA latency, eliminating packet loss under sustained load. |
Use Scenario: Real-time graphics rendering and multitouch response in panel-mounted HMIs for factory automation PLCs. IC Role / Device Role / Timing Role: Frame buffer memory for NXP i.MX6ULL or Renesas RZ/G1H GPU subsystems operating at −20°C to 70°C ambient. Use Value: 0°C to 95°C case rating and PASR support reduce thermal throttling and power consumption by 35 % compared to commercial-grade DDR3 in sealed enclosures. |
| Video Surveillance DVR/NVR | Medical Imaging Edge Devices |
|
Use Scenario: Concurrent 16-channel HD video encode/decode and motion detection analytics in AI-enabled NVR appliances. IC Role / Device Role / Timing Role: Shared system memory for Rockchip RK3399 or Amlogic S922X SoCs running Linux-based video processing stacks. Use Value: BL8 burst mode and auto-precharge minimize command overhead, delivering 92 % memory bus utilization during 4K@30fps encode pipelines. |
Use Scenario: DICOM image preprocessing and real-time display buffering in portable ultrasound and X-ray edge analyzers. IC Role / Device Role / Timing Role: Low-latency working memory for TI Jacinto 7 or Intel Atom x6000E processors executing FDA-cleared algorithms. Use Value: Asynchronous RESET# and guaranteed tREFI ≤ 7.8 µs at 85°C ensure deterministic boot timing and uninterrupted imaging sessions exceeding 8 hours. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar DDR3 SDRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| MT41K256M16HA-125:A | Same density (1G-bit x16), DDR3L-1600 (800 MHz), 1.35 V operation; lower speed grade, different power envelope | Targets ultra-low-power embedded designs where thermal headroom is constrained and 1600 MT/s suffices | Select when system voltage rail is fixed at 1.35 V and DDR3-1866 bandwidth is unnecessary |
| IS43TR16128B-125KBL | Same VFBGA-96 package, DDR3-1600 (800 MHz), 1.5 V, but supports only CL=11 and lacks PASR/ASR features | Suitable for cost-sensitive consumer electronics where extended temperature and advanced power modes are not required | Choose for legacy designs already using IS43TR16128B footprint and where industrial temp range is not needed |
Compared with MT41K256M16HA-125:A and IS43TR16128B-125KBL, W631GG6MB-11 delivers higher bandwidth (1866 vs. 1600 MT/s), broader CL/CWL flexibility, and industrial-temperature support - making it optimal for performance-critical, thermally demanding embedded systems requiring JEDEC-compliant DDR3-1866 timing.
Availability
W631GG6MB-11 is available at Aetrix Electronics and suitable for networking equipment, industrial HMI systems, video surveillance DVR/NVR, and medical imaging edge devices requiring stable component supply, long-term lifecycle assurance, and JEDEC-compliant DDR3-1866 performance.
Supply support for W631GG6MB-11 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Winbond Electronics is a Taiwan-based semiconductor company specializing in specialty memory solutions including NOR/NAND Flash, SRAM, and DDR SDRAM for industrial, automotive, and communications markets.
The W631GG6MB series belongs to Winbond's industrial-grade DDR3 SDRAM product line, designed specifically for embedded systems requiring extended temperature operation, robust power management, and JEDEC-compliant high-speed interface reliability.
FAQ
What is the maximum clock frequency supported by W631GG6MB-11?
W631GG6MB-11 supports a maximum clock frequency of 933 MHz, enabling DDR3-1866 operation (1866 MT/s). This is validated under JEDEC conditions with CL=13 and tCK(AVG) ≤ 1.07 ns. The device achieves this while maintaining tRCD/tRP/tRC timing parameters at 13.91 ns minimum, ensuring compatibility with high-performance DDR3 controllers in networking and multimedia SoCs.
Does W631GG6MB-11 support write leveling and how is it implemented?
Yes, W631GG6MB-11 supports write leveling through dedicated command sequences and DQS-DQS# phase adjustment logic. During write leveling mode, the DRAM returns a known pattern on DQ pins synchronized to DQS edges, allowing the memory controller to calibrate DQS-to-CK delay per byte lane. This feature is essential for achieving timing closure at 933 MHz clock rates and is documented in Section 8.9 of the W631GG6MB-11 datasheet.
What are the supported CAS Latency (CL) and CAS Write Latency (CWL) values for W631GG6MB-11?
W631GG6MB-11 supports CAS Latency (CL) values of 5, 6, 8, 10, and 13, and CAS Write Latency (CWL) values of 5, 6, and 7. These are programmable via Mode Registers MR0 and MR2 respectively. CL and CWL combinations must satisfy WL = AL + CWL and RL = AL + CL relationships, with additive latency (AL) configurable as 0, CL−1, or CL−2 to optimize command bus efficiency.
How does the ZQ calibration function work on W631GG6MB-11?
W631GG6MB-11 uses its ZQ pin to connect to a 240 Ω ±1 % external resistor to VSS, enabling on-chip calibration of both output driver impedance and on-die termination (ODT) resistors. A ZQ calibration command triggers internal current sources to match the external reference, adjusting driver strength and RTT values to maintain 34 Ω output and 60/120/240 Ω ODT accuracy across voltage and temperature variations - critical for signal integrity at DDR3-1866 speeds.
Is W631GG6MB-11 compatible with standard DDR3 controllers and what interface standard does it use?
Yes, W631GG6MB-11 is fully JEDEC-compliant with standard DDR3 controllers such as those in NXP i.MX6, TI Sitara AM57x, and Intel Atom E3900 families. It uses the SSTL_15 interface standard with differential CK/CK# and DQS/DQS# signaling, supports all mandatory DDR3 commands (ACT, READ, WRITE, PRE, REF, ZQCAL), and meets AC timing requirements for DDR3-1866 (13-13-13) operation as defined in JESD79-3F.
W631GG6MB-11 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Winbond Electronics Corporation
- Series:
- -
- Package/Case:
- 96-VFBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- DRAM
- Technology:
- SDRAM - DDR3
- Memory Size:
- 1Gbit
- Memory Organization:
- 64M x 16
- Memory Interface:
- Parallel
- Clock Frequency:
- 933 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 20 ns
- Voltage - Supply:
- 1.425V ~ 1.575V
- Operating Temperature:
- 0°C ~ 95°C (TC)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 96-VFBGA (7.5x13)
W631GG6MB-11 FAQ
1.How can I place an order for W631GG6MB-11 through Aetrix?
Please submit a Request for Quotation (RFQ) for W631GG6MB-11 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for W631GG6MB-11 reliable?
The price and inventory of W631GG6MB-11 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W631GG6MB-11 is usually 5 days.
3.What payment methods are accepted for W631GG6MB-11?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W631GG6MB-11 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for W631GG6MB-11?
W631GG6MB-11 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your W631GG6MB-11 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for W631GG6MB-11?
For technical support, including W631GG6MB-11 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W631GG6MB-11 requirements.
6.How does Aetrix verify that W631GG6MB-11 is sourced from the original manufacturer or authorized distributors?
All W631GG6MB-11 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W631GG6MB-11 meets industry standards.
7.What is the process for return or replacement of W631GG6MB-11?
All W631GG6MB-11 units undergo pre-shipment inspection (PSI). If there is an issue with W631GG6MB-11, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The W631GG6MB-11 part is unused and in its original packaging.
Return procedure for W631GG6MB-11:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
W631GG6MB-11 Tags

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Microchip Technology
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