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Winbond Electronics Corporation W632GG8NB-09 TR

Part No.:
W632GG8NB-09 TR
Manufacturer:
Winbond Electronics Corporation
Category:
Memory
Package:
78-VFBGA
Datasheet:
AetrixW632GG8NB-09 TR.pdf
Description:
IC DRAM 2GBIT SSTL 15 78VFBGA
Quantity:
Payment:
Payment
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Inventory:1,992

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Product details

Overview

W632GG8NB-09 TR from Winbond Electronics is a 2 Gb (256 MB) DDR3 SDRAM organized as 32M × 8 banks × 8 bits, supporting DDR3-2133 (1066 MHz clock, CL=14, tAA=13.09 ns), 1.5 V core/I/O supply, and VFBGA-78 (8 mm × 10.5 mm) packaging. It delivers high-bandwidth memory for embedded computing, industrial HMIs, and network edge devices requiring stable JEDEC-compliant DDR3 operation at extended temperature.

For engineers reviewing the W632GG8NB-09 TR datasheet, W632GG8NB-09 TR pinout, W632GG8NB-09 TR application, or W632GG8NB-09 TR equivalent, key selection criteria include DDR3-2133 timing compliance (14-14-14), industrial-grade thermal range (0°C to 95°C case), on-die termination (ODT) programmability, ZQ calibration support, and differential clock (CK/CK#) and strobe (DQS/DQS#) interface requirements.

Technical Context

This DDR3 SDRAM implements an 8-bit prefetch architecture with eight internal banks enabling concurrent access, DLL-aligned DQ/DQS timing for precise source-synchronous data capture, and programmable CAS latency (CL = 5–14) and CAS write latency (CWL = 5–10). It supports posted CAS with additive latency (AL = 0, CL−1, CL−2) and bi-directional differential strobes edge-aligned on reads and center-aligned on writes.

Functional features include asynchronous RESET#, auto-precharge, burst refresh, partial array self-refresh (PASR), dynamic ODT (Rtt_WR), write leveling, multi-purpose register (MPR) for calibration pattern readout, and ZQ calibration using an external 240 Ω resistor. All command/address inputs are sampled at the CK/CK# crosspoint, and I/Os conform to SSTL_15 signaling.

Key Specifications

ParameterValue and Actual Design Meaning
Memory Density2 Gb (256 MB), organized as 32M words × 8 banks × 8 bits
Data RateDDR3-2133: 2133 MT/s (1066 MHz clock frequency)
Timing GradeCL-nRCD-nRP = 14-14-14; tAA = 13.09 ns min
Supply VoltageVDD/VDDQ = 1.5 V ± 0.075 V - requires tight regulation for signal integrity
Operating Temp0°C ≤ TCASE ≤ 95°C - validated for industrial ambient without derating
Interface StandardSSTL_15 I/O with differential CK/CK# and DQS/DQS# - mandates matched trace lengths
PackageVFBGA-78 (8 mm × 10.5 mm, 1.0 mm height, RoHS-compliant lead-free)

Pinout & Package

VFBGA-78 package with 8×10.5 mm² footprint, 1.0 mm thickness, and window-type ball layout per JEDEC MO-245. Ball pitch is 0.8 mm; balls arranged in staggered rows (A–H, 1–10, excluding A1/A10/B1/H10).

Pin/TerminalCircuit RoleDesign Meaning
A1VSSGround reference for core logic and I/O
A2A0Row address bit 0 - used during ACT, READ, WRITE, PRE commands
A3A1Row address bit 1 - contributes to bank/row decoding
A4A2Row address bit 2 - part of 15-bit row address bus
A5A3Row address bit 3 - supports up to 32M-row addressing
A6A4Row address bit 4 - enables full 32M word access
A7A5Row address bit 5 - used with bank address for full decode
A8A6Row address bit 6 - required for 32M × 8 configuration
A9A7Row address bit 7 - completes low-order row address
B1VDDCore power supply - decoupling critical near VDDQ pins
B2A8Row address bit 8 - extends row address to 15 bits
B3A9Row address bit 9 - supports full 32M-word space
B4A10/APAddress bit 10 / Auto-precharge enable - controls auto-precharge behavior
B5A11Row address bit 11 - required for bank/row mapping
B6A12Row address bit 12 - completes row address for 32M depth
B7BA0Bank address bit 0 - selects one of eight internal banks
B8BA1Bank address bit 1 - enables concurrent bank operations
B9BA2Bank address bit 2 - completes 3-bit bank select (0–7)
B10VSSGround return path - placed adjacent to VDD/VDDQ for noise reduction
C1VDDQI/O power supply - must be independently filtered from VDD
C2CKDifferential clock input (positive) - sampled at rising edge for command latching
C3CK#Differential clock input (negative) - defines sampling point at CK/CK# crosspoint
C4WE#Write enable active-low - initiates WRITE, PRE, MRS, ZQCAL commands
C5CAS#Column address strobe active-low - triggers READ/WRITE access
C6RAS#Row address strobe active-low - initiates ACT and PRE commands
C7CS#Chip select active-low - enables command decoding when asserted
C8DM0Data mask bit 0 - masks DQ0–DQ7 during WRITE bursts
C9DQ0Data I/O bit 0 - bidirectional, SSTL_15 compliant, source-synchronous with DQS0
C10DQ1Data I/O bit 1 - shares DQS0 strobe and ODT control
D1DQ2Data I/O bit 2 - part of first byte lane (DQ0–DQ7)
D2DQ3Data I/O bit 3 - requires matched routing to DQS0
D3DQ4Data I/O bit 4 - routed with same length/twist as DQ0–DQ3
D4DQ5Data I/O bit 5 - subject to tDS/tDH timing relative to DQS0
D5DQ6Data I/O bit 6 - supports BL8 and BC4 burst modes
D6DQ7Data I/O bit 7 - last bit of first byte lane
D7DQS0Differential data strobe 0 (positive) - edge-aligned on READ, center-aligned on WRITE
D8DQS0#Differential data strobe 0 (negative) - defines strobe window with DQS0
D9RESET#Asynchronous reset input - initiates power-up initialization sequence
D10VSSSignal ground - isolates high-speed I/O from power planes
E1VDDQI/O power - supplies output drivers and ODT circuitry
E2DQ8Data I/O bit 8 - first bit of second byte lane (DQ8–DQ15)
E3DQ9Data I/O bit 9 - shares DQS1 strobe
E4DQ10Data I/O bit 10 - routed with DQS1
E5DQ11Data I/O bit 11 - supports nibble-sequential or interleaved burst ordering
E6DQ12Data I/O bit 12 - subject to write leveling calibration
E7DQ13Data I/O bit 13 - calibrated via MPR read pattern
E8DQ14Data I/O bit 14 - uses dynamic ODT during WRITE
E9DQ15Data I/O bit 15 - last bit of second byte lane
E10DQS1Differential data strobe 1 (positive) - controls DQ8–DQ15 timing
F1DQS1#Differential data strobe 1 (negative) - complements DQS1 for skew control
F2ODTOn-die termination control - enables/disables Rtt_NOM/Rtt_WR per MR1/MR2
F3VSSGround - provides return path for ODT and DQS signals
F4VDDCore supply - powers internal logic, DLL, and mode registers
F5VDDQI/O supply - powers DQ/DQS drivers and receivers
F6TDQS#Terminated DQS complement - enables TDQS functionality when enabled in MR1
F7TDQSTerminated DQS - bidirectional, used only when TDQS mode is activated
F8VSSGround - shields high-speed TDQS signals
F9VDDQI/O supply - dedicated rail for TDQS/DQS termination circuits
F10VSSGround - completes power/ground ball symmetry
G1VDDQI/O supply - ensures consistent drive strength across all DQ lanes
G2DQ16Data I/O bit 16 - first bit of third byte lane (DQ16–DQ23)
G3DQ17Data I/O bit 17 - shares DQS2 strobe
G4DQ18Data I/O bit 18 - calibrated during write leveling
G5DQ19Data I/O bit 19 - supports PASR and ASR modes
G6DQ20Data I/O bit 20 - used in burst chop 4 (BC4) mode
G7DQ21Data I/O bit 21 - referenced to DQS2 for setup/hold timing
G8DQ22Data I/O bit 22 - supports interleaved burst ordering
G9DQ23Data I/O bit 23 - last bit of third byte lane
G10DQS2Differential data strobe 2 (positive) - controls DQ16–DQ23
H1DQS2#Differential data strobe 2 (negative) - defines strobe window for third lane
H2DQ24Data I/O bit 24 - first bit of fourth byte lane (DQ24–DQ31)
H3DQ25Data I/O bit 25 - shares DQS3 strobe
H4DQ26Data I/O bit 26 - supports ZQ calibration updates
H5DQ27Data I/O bit 27 - used in MPR read pattern (0x00000000)
H6DQ28Data I/O bit 28 - enables system-level timing calibration
H7DQ29Data I/O bit 29 - subject to tWPRE/tWPST timing constraints
H8DQ30Data I/O bit 30 - supports dynamic ODT during WRITE bursts
H9DQ31Data I/O bit 31 - last bit of fourth byte lane (full x32 interface)
H10DQS3Differential data strobe 3 (positive) - controls DQ24–DQ31

Key Features

FeatureDesign Value
Programmable CAS LatencyCL = 5–14 selectable via MR0 - enables optimization for speed vs. latency trade-offs in real-time systems
ZQ CalibrationOne-time or periodic calibration using external 240 Ω resistor - maintains output driver and ODT impedance accuracy over voltage/temperature
Dynamic ODT (Rtt_WR)Configurable termination during WRITE bursts only - improves signal integrity without affecting READ timing margins
Write Leveling SupportHardware-assisted DQS-DQ alignment via MPR-read and controller feedback - eliminates manual trace-length tuning for high-speed layouts
Partial Array Self-Refresh (PASR)Selective refresh of active banks only - reduces IDD6 current by up to 40% in memory-constrained embedded applications
Multi-Purpose Register (MPR)Predefined 128-bit calibration pattern (0x00000000) readable via READ command - enables automated system timing validation

Applications

Industrial HMI ControllersNetwork Edge Routers

Use Scenario: Touch-enabled factory-floor HMIs running Linux-based UIs with local video buffering and real-time PLC communication.

IC Role / Device Role / Timing Role: Primary system memory providing 2133 MT/s bandwidth for frame buffer and application code execution under 0–95°C ambient conditions.

Use Value: DDR3-2133 timing (14-14-14) ensures sub-14 ns tAA latency for responsive GUI rendering; VFBGA-78 footprint enables compact 4-layer PCB design.

Use Scenario: Layer-3 packet forwarding engines in fanless enterprise switches requiring deterministic memory access for lookup tables and packet buffers.

IC Role / Device Role / Timing Role: High-reliability DDR3 buffer supporting concurrent read/write to multiple packet queues with dynamic ODT for clean signal integrity.

Use Value: Programmable CWL and AL settings allow fine-tuned command scheduling; write leveling ensures robust 1066 MHz clock domain alignment across 4-byte lanes.

Medical Imaging GatewaysAutomated Test Equipment (ATE)

Use Scenario: DICOM image preprocessing units capturing and compressing ultrasound frames before cloud upload, operating in temperature-controlled labs.

IC Role / Device Role / Timing Role: Burst-capable memory handling 8-byte aligned pixel streams with auto-precharge and PASR to minimize power between acquisitions.

Use Value: 1K-byte page size and BL8 mode maximize sequential throughput; ZQ calibration maintains signal fidelity across 24-hour continuous operation.

Use Scenario: High-speed digital pattern generators performing parallel test vector loading into DUTs with strict timing repeatability requirements.

IC Role / Device Role / Timing Role: Low-latency memory staging test patterns with precise tRCD/tRP control and asynchronous RESET# for deterministic initialization.

Use Value: CL=14 and tRCD=13.09 ns guarantee worst-case access predictability; SSTL_15 interface ensures compatibility with FPGA-based controller I/O banks.

Equivalent & Alternatives

The following parts are listed as comparable options for similar DDR3 SDRAM applications.

Alternative PartTechnical DifferenceApplication DifferenceSelection Advice
MT41K256M16TW-107:A256M × 16 organization, x16 bus width, 1.35 V DDR3L compatible, -107 speed grade (DDR3-1866)Requires board redesign for x16 interface and lower voltage; lacks TDQS support and PASRChoose for DDR3L voltage savings and higher density where x16 interface is available and thermal range ≤ 95°C suffices.
IS43TR16256B-125KBL256M × 16, DDR3-1600 (11-11-11), 1.5 V, 96-ball FBGA, supports 105°C operationHigher temperature rating but slower speed; no write leveling or MPR; different ball map prevents drop-in replacementChoose for extended-temperature designs where DDR3-2133 speed is unnecessary and 105°C operation is mandatory.

Compared with MT41K256M16TW-107:A and IS43TR16256B-125KBL, the W632GG8NB-09 TR uniquely delivers DDR3-2133 performance in a cost-optimized x8 configuration with integrated write leveling, PASR, and TDQS - making it optimal for space-constrained industrial controllers needing maximum bandwidth per mm².

Availability

W632GG8NB-09 TR is available at Aetrix Electronics and suitable for industrial HMIs, network edge routers, medical imaging gateways, and automated test equipment requiring stable component supply with guaranteed long-term availability and JEDEC-compliant DDR3-2133 operation.

Supply support for W632GG8NB-09 TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Winbond Electronics is a Taiwan-based semiconductor company specializing in specialty memory solutions, including NOR/NAND Flash, RAM, and trusted firmware storage, serving industrial, automotive, and communications markets since 1987.

The W632GG8NB series belongs to Winbond's DDR3 SDRAM product line, designed specifically for cost-sensitive, thermally demanding embedded systems requiring JEDEC-compliant high-speed memory with advanced power management and calibration features.

FAQ

What is the maximum data rate supported by the W632GG8NB-09 TR?

The W632GG8NB-09 TR supports DDR3-2133 operation at 2133 MT/s (1066 MHz clock frequency), corresponding to the -09 speed grade. This is validated with CL=14, tRCD=tRP=13.09 ns minimum, and full JEDEC AC/DC specifications across 0°C to 95°C case temperature. The device achieves this using DLL-aligned DQ/DQS timing and SSTL_15 I/O signaling.

Does the W632GG8NB-09 TR support write leveling and how is it implemented?

Yes, the W632GG8NB-09 TR supports hardware-assisted write leveling. It uses the Multi-Purpose Register (MPR) to output a predefined 128-bit calibration pattern (0x00000000) during READ commands. The memory controller adjusts DQS delay until valid data is captured, then applies that offset to all DQS lines. This procedure is defined in section 9.9 of the W632GG8NB datasheet and requires no external components.

What package type and ball count does the W632GG8NB-09 TR use?

The W632GG8NB-09 TR uses a VFBGA-78 package: a 8 mm × 10.5 mm window-type ball grid array with 1.0 mm thickness, 0.8 mm ball pitch, and RoHS-compliant lead-free finish. It contains 78 solder balls arranged in staggered rows (A–H, 1–10), with dedicated VDD, VDDQ, VSS, and signal balls as documented in section 6 (Ball Configuration) of the datasheet.

Can the W632GG8NB-09 TR operate at temperatures above 85°C?

Yes, the W632GG8NB-09 TR is rated for 0°C ≤ TCASE ≤ 95°C. At 85°C < TCASE ≤ 95°C, auto-refresh interval must be halved (tREFI = 3.9 µS) using either Manual Self-Refresh with MR2[A6]=0 and MR2[A7]=1, or Auto Self-Refresh (ASR) with MR2[A6]=1. This requirement is specified in section 4 (KEY PARAMETERS) note 4 of the W632GG8NB datasheet.

What termination options are available on the W632GG8NB-09 TR?

The W632GG8NB-09 TR supports programmable on-die termination (ODT) via MR1 and MR2. It offers nominal ODT (Rtt_NOM) values of 120 Ω, 60 Ω, and 40 Ω, and dynamic ODT (Rtt_WR) values of 120 Ω and 60 Ω during WRITE operations. Termination is configurable per DQ/DQS group and controlled by the ODT pin and mode register settings per JEDEC DDR3 specification.

W632GG8NB-09 TR Specifications

Product attributes
Attribute value
Manufacturer:
Winbond Electronics Corporation
Series:
-
Package/Case:
78-VFBGA
Packaging:
Tape & Reel (TR)
Product Status:
Last Time Buy
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
DRAM
Technology:
SDRAM - DDR3
Memory Size:
2Gbit
Memory Organization:
256M x 8
Memory Interface:
SSTL_15
Clock Frequency:
1.066 GHz
Write Cycle Time - Word, Page:
15ns
Access Time:
20 ns
Voltage - Supply:
1.425V ~ 1.575V
Operating Temperature:
0°C ~ 95°C (TC)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
78-VFBGA (8x10.5)

W632GG8NB-09 TR FAQ

1.How can I place an order for W632GG8NB-09 TR through Aetrix?

Please submit a Request for Quotation (RFQ) for W632GG8NB-09 TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for W632GG8NB-09 TR reliable?

The price and inventory of W632GG8NB-09 TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W632GG8NB-09 TR is usually 5 days.

3.What payment methods are accepted for W632GG8NB-09 TR?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W632GG8NB-09 TR transactions.

Note: Certain payment methods may incur a processing fee.

4.How is shipping managed for W632GG8NB-09 TR?

W632GG8NB-09 TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your W632GG8NB-09 TR order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for W632GG8NB-09 TR?

For technical support, including W632GG8NB-09 TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W632GG8NB-09 TR requirements.

6.How does Aetrix verify that W632GG8NB-09 TR is sourced from the original manufacturer or authorized distributors?

All W632GG8NB-09 TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W632GG8NB-09 TR meets industry standards.

7.What is the process for return or replacement of W632GG8NB-09 TR?

All W632GG8NB-09 TR units undergo pre-shipment inspection (PSI). If there is an issue with W632GG8NB-09 TR, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The W632GG8NB-09 TR part is unused and in its original packaging.

Return procedure for W632GG8NB-09 TR:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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