Winbond Electronics Corporation W634GU8QB11I
- Part No.:
- W634GU8QB11I
- Manufacturer:
- Winbond Electronics Corporation
- Category:
- Memory
- Package:
- 78-VFBGA
- Datasheet:
-
W634GU8QB11I.pdf
- Description:
- IC DRAM 4GBIT PAR 78VFBGA
- Quantity:
- Payment:

- Shipping:

Inventory:1,817
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
W634GU8QB11I from Winbond is a 4Gb (64M × 8) DDR3L SDRAM with 8 internal banks, 1.35V nominal supply, and industrial temperature support (−40°C to +95°C). It operates at DDR3L-1866 speed (13-13-13 CL-tRCD-tRP), delivers up to 1866 MT/s data rates, and implements ZQ calibration, programmable CWL/AL, and dynamic ODT for high-signal-integrity memory subsystems in embedded controllers and networking equipment.
For engineers reviewing the W634GU8QB11I datasheet, W634GU8QB11I pinout, W634GU8QB11I application, or W634GU8QB11I equivalent, key selection factors include its industrial-grade thermal range, DDR3L-1866 timing compliance, VFBGA78 package compatibility, and support for write leveling and MPR-based system calibration.
Technical Context
This DDR3L SDRAM uses an 8-bit prefetch architecture synchronized to differential CK/CK# inputs, with all commands latched on CK rising edge and data aligned via bi-directional DQS/DQS# strobes. Its DLL aligns DQ and DQS transitions to clock edges, enabling precise timing control across temperature and voltage variations.
The device supports asynchronous RESET#, programmable mode registers (MR0–MR3) for CAS latency, additive latency, CWL, PASR, and ASR, plus dynamic ODT (Rtt_WR) and ZQ calibration using an external 240Ω reference resistor - all critical for stable operation in thermally demanding industrial platforms.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 4 Gb (64M words × 8 banks × 8 bits) |
| Data Rate | 1866 MT/s (DDR3L-1866, 13-13-13 timing) |
| Supply Voltage | VDD/VDDQ = 1.283V to 1.45V (1.35V typical); backward-compatible to 1.5V ±0.075V |
| Operating Temperature | −40°C ≤ TCASE ≤ +95°C (industrial grade) |
| Burst Length | BL8 fixed or BC4 selectable on-the-fly via mode register |
| CAS Latency (CL) | Programmable: 5, 6, 7, 8, 9, 10, 11, 13, 14 |
| CAS Write Latency (CWL) | Programmable: 5–9 (DDR3L-1866 supports CWL=5–7) |
| Package | VFBGA78 (8 mm × 10.5 mm, 1.0 mm height, RoHS-compliant lead-free) |
Pinout & Package
VFBGA78 package with 8×10.5 mm² footprint, 1.0 mm thickness, and ball pitch of 0.8 mm. Ball map conforms to JEDEC MO-270AC standard for DDR3L SDRAM.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A15 | Address Inputs | Row/column address during ACT, READ, WRITE, PRECHARGE; multiplexed with bank address BA0–BA2 |
| BA0–BA2 | Bank Address | Select one of eight internal banks; sampled with A0–A15 on ACT command |
| CK, CK# | Differential Clock | Edge-aligned command/address latch reference; all inputs sampled at CK rising / CK# falling crossing point |
| DQ0–DQ7 | Data I/O | Bi-directional 8-bit data bus; source-synchronous with DQS/DQS#; supports DM masking |
| DQS, DQS# | Differential Data Strobe | Center-aligned with write data, edge-aligned with read data; used for timing capture and write leveling |
| DM | Data Mask | Per-byte mask for write operations; active-high, one bit per DQ byte |
| RESET# | Asynchronous Reset | Active-low initialization signal; triggers power-up sequence and mode register reset |
| ODT | On-Die Termination Control | Dynamic enable/disable of termination resistors on DQ/DQS/DM lines per MR1/MR2 settings |
| WE#, RAS#, CAS# | Command Control | Standard DDR3 command pins; decoded with A0–A15/BA0–BA2 to generate ACT, READ, WRITE, PRECHARGE, REFRESH |
| VDD, VDDQ | Power Supplies | Separate 1.35V supplies for core (VDD) and I/O (VDDQ); decoupling required per JEDEC layout guidelines |
Key Features
| Feature | Design Value |
|---|---|
| ZQ Calibration | Uses external 240Ω resistor to calibrate output driver strength and ODT impedance for consistent signal integrity across voltage/temperature |
| Write Leveling | Enables system-level timing margin optimization by adjusting DQS delay relative to CK to compensate for board skew |
| Multi-Purpose Register (MPR) | Provides predefined calibration bit pattern for automated read timing setup without requiring user-defined data patterns |
| Dynamic ODT (Rtt_WR) | Activates ODT only during write bursts, reducing standby power while maintaining write signal integrity |
| Partial Array Self-Refresh (PASR) | Reduces self-refresh current by refreshing only selected banks, extending battery life in low-power modes |
| Posted CAS with AL | Improves command bus efficiency by decoupling column access from row activation; AL = 0, CL−1, or CL−2 configurable |
Applications
| Industrial PLC Controllers | Network Edge Routers |
|---|---|
Use Scenario: Real-time deterministic control logic execution with persistent data buffering under wide ambient temperature swings. IC Role / Device Role / Timing Role: Main program/data memory supporting burst reads/writes and low-latency interrupt response via DDR3L-1866 bandwidth. Use Value: −40°C to +95°C operation ensures reliability in uncontrolled cabinet environments; dynamic ODT maintains signal fidelity across variable load conditions. | Use Scenario: High-throughput packet buffering and forwarding in compact fanless routing hardware deployed at cell towers. IC Role / Device Role / Timing Role: Shared packet buffer memory interfaced to multi-core SoC with strict tRCD/tRP timing requirements. Use Value: Write leveling and MPR calibration simplify PCB layout and reduce system-level timing validation effort for 1866 MT/s operation. |
| Medical Imaging Front-Ends | Automated Test Equipment (ATE) |
Use Scenario: Acquisition and preprocessing of ultrasound or X-ray sensor data streams requiring sustained burst bandwidth and thermal stability. IC Role / Device Role / Timing Role: Frame buffer memory supporting continuous 8-bit parallel data ingestion at >1.5 GB/s aggregate throughput. Use Value: BL8 and interleaved burst ordering maximize sequential bandwidth; PASR lowers idle power during image reconstruction phases. | Use Scenario: High-speed digital pattern memory for stimulus/response generation in boundary-scan and functional test systems. IC Role / Device Role / Timing Role: Low-latency, high-reliability memory for deterministic vector storage and playback synchronized to test clock domains. Use Value: Asynchronous RESET# enables clean reinitialization between test sequences; ZQ calibration ensures repeatable timing margins across production units. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar DDR3L SDRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| IS43TR16256B-125KBL | 16-bit bus width, 2Gb density, 1250 MHz max clock (DDR3L-2500), 96-ball BGA | Higher bandwidth but wider interface; requires PCB redesign for x16 vs x8 data path | Choose when system SoC supports x16 interface and needs >1.866 GT/s aggregate throughput |
| MT41K256M8DA-125:A | Micron part; same x8 configuration and DDR3L-1866 speed grade; 78-ball VFBGA, −40°C to +95°C rating | Identical pinout and timing; JEDEC-compliant drop-in replacement with validated industrial qualification | Preferred for dual-sourcing where identical mechanical and electrical compatibility is mandatory |
Compared with W634GU8QB11I, IS43TR16256B-125KBL offers higher density and bandwidth but demands x16 interface support, whereas MT41K256M8DA-125:A provides true pin- and timing-compatible redundancy without layout changes - making it ideal for supply chain risk mitigation in industrial designs.
Availability
W634GU8QB11I is available at Aetrix Electronics and suitable for industrial PLC controllers, network edge routers, medical imaging front-ends, and automated test equipment requiring stable component supply across extended temperature ranges and long product lifecycles.
Supply support for W634GU8QB11I includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Winbond Electronics is a Taiwan-based semiconductor company specializing in specialty memory solutions including NOR/NAND Flash, SRAM, and DRAM products for industrial, automotive, and communications markets.
The W634GU8QB11I belongs to Winbond's DDR3L SDRAM product line, engineered for robust operation in thermally demanding embedded systems where reliability, JEDEC compliance, and industrial temperature support are mandatory design requirements.
FAQ
What is the maximum supported CAS Latency for W634GU8QB11I at DDR3L-1866 speed?
The W634GU8QB11I supports CAS Latency (CL) values of 5, 6, 7, 8, 9, 10, and 11 at DDR3L-1866 speed. CL=13 and CL=14 are not supported in this speed bin per the datasheet's Sup_CL table for -11/11I/11J grades. Valid combinations require matching CWL (e.g., CL=11 pairs with CWL=8) and must satisfy tAA and tRCD timing constraints.
Does W634GU8QB11I support both DDR3L and standard DDR3 voltage levels?
Yes, W634GU8QB11I supports dual-voltage operation: 1.35V nominal (DDR3L) with VDD/VDDQ range 1.283V–1.45V, and backward compatibility to 1.5V ±0.075V (standard DDR3). Voltage switching is allowed only during power-down states and must follow the VDD/VDDQ transition procedure defined in Section 11.4 of the datasheet to avoid latch-up or data corruption.
What package type and ball count does W634GU8QB11I use?
W634GU8QB11I uses a VFBGA78 package: 78-ball Very-thin Fine-pitch Ball Grid Array with 8 mm × 10.5 mm body size, 1.0 mm maximum height, and 0.8 mm ball pitch. It complies with JEDEC MO-270AC and is RoHS-compliant with lead-free terminations.
How is write leveling implemented on W634GU8QB11I?
W634GU8QB11I implements write leveling via its dedicated DQS/DQS# strobe pair and internal leveling logic. The host controller issues a write leveling command, and the DRAM returns a phase-shifted DQS pulse; the controller adjusts DQS delay until edge alignment with CK is achieved. This process is defined in Section 8.9 and requires MPR mode entry for feedback pattern readout.
Is W634GU8QB11I qualified for industrial temperature operation?
Yes, W634GU8QB11I is explicitly rated for industrial temperature operation from −40°C to +95°C (TCASE), as confirmed in the Order Information table and Section 10.2. This rating applies to the "11I" suffix variant and is validated across full AC/DC specifications per JEDEC JESD209-3C.
W634GU8QB11I Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Winbond Electronics Corporation
- Series:
- -
- Package/Case:
- 78-VFBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- DRAM
- Technology:
- SDRAM - DDR3L
- Memory Size:
- 4Gbit
- Memory Organization:
- 512M x 8
- Memory Interface:
- Parallel
- Clock Frequency:
- 933 MHz
- Write Cycle Time - Word, Page:
- 15ns
- Access Time:
- 20 ns
- Voltage - Supply:
- 1.283V ~ 1.45V
- Operating Temperature:
- -40°C ~ 95°C (TC)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 78-VFBGA (8x10.5)
W634GU8QB11I FAQ
1.How can I place an order for W634GU8QB11I through Aetrix?
Please submit a Request for Quotation (RFQ) for W634GU8QB11I on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for W634GU8QB11I reliable?
The price and inventory of W634GU8QB11I are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W634GU8QB11I is usually 5 days.
3.What payment methods are accepted for W634GU8QB11I?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W634GU8QB11I transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for W634GU8QB11I?
W634GU8QB11I orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your W634GU8QB11I order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for W634GU8QB11I?
For technical support, including W634GU8QB11I datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W634GU8QB11I requirements.
6.How does Aetrix verify that W634GU8QB11I is sourced from the original manufacturer or authorized distributors?
All W634GU8QB11I products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W634GU8QB11I meets industry standards.
7.What is the process for return or replacement of W634GU8QB11I?
All W634GU8QB11I units undergo pre-shipment inspection (PSI). If there is an issue with W634GU8QB11I, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The W634GU8QB11I part is unused and in its original packaging.
Return procedure for W634GU8QB11I:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
W634GU8QB11I Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
Counterfeit components can hide behind convincing markings and passing basic function tests. This engineering reference covers source traceability, external inspection, X-ray, XRF, electrical testing, …
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…

