Winbond Electronics Corporation W63AH6NBVADI TR
- Part No.:
- W63AH6NBVADI TR
- Manufacturer:
- Winbond Electronics Corporation
- Category:
- Memory
- Package:
- 178-VFBGA
- Datasheet:
-
W63AH6NBVADI TR.pdf
- Description:
- IC DRAM 1GBIT HSUL 12 178VFBGA
- Quantity:
- Payment:

- Shipping:

Inventory:3,907
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
W63AH6NBVADI TR from Winbond is a 1Gb LPDDR3 SDRAM configured as an 8-bank memory with x16 data width, operating at 1.2V VDDQ and supporting 800–1066 MT/s data rates; it implements on-die termination (ODT), partial array self-refresh (PASR), and CA training for mobile SoC memory interfaces in smartphones and tablets.
For engineers reviewing the W63AH6NBVADI TR datasheet, W63AH6NBVADI TR pinout, W63AH6NBVADI TR application, or W63AH6NBVADI TR equivalent, key selection criteria include LPDDR3-1066 timing compliance, HSUL_12 I/O interface, 1.2V VDDQ operation, ODT programmability, and 96-ball VFBGA package compatibility with mobile platform memory controllers.
Technical Context
This device implements a double-data-rate architecture on both DQ and CA buses, using differential CK_t/CK_c and DQS_t/DQS_c signaling with HSUL_12 driver output characteristics. It supports burst lengths of 8 and 16, auto-precharge, and per-bank refresh to minimize latency overhead in high-throughput mobile workloads.
Command decoding occurs across 10-bit CA bus with dual-edge sampling; mode registers MR0–MR63 define device features including PASR bank/segment masking (MR16/MR17), ODT control (MR11), calibration (MR10/MR40/MR48), and temperature-sensing (MR4). ZQ calibration adjusts RONPU/RONPD and ODT levels dynamically against process/voltage/temperature variation.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 1 Gb (1,073,741,824 bits) - supports 128 MB of x16 configuration for compact mobile memory subsystems. |
| Data Width | x16 - matches common LPDDR3 controller lanes; reduces PCB routing complexity vs. x32. |
| Max Data Rate | 1066 MT/s - enables 17.056 GB/s peak bandwidth per x16 interface at 1066 MHz clock. |
| VDDQ Supply | 1.14–1.30 V - optimized for low-power mobile SoCs; 1.2 V nominal ensures compatibility with standard LPDDR3 voltage rails. |
| Package | 96-ball VFBGA (7.5 × 13.0 mm, 0.5 mm pitch) - industry-standard footprint for smartphone AP memory stacking. |
| Operating Temp | -25°C to +85°C - qualified for commercial and extended-temperature mobile applications. |
| Refresh Interval | 3.9 μs (at 85°C) - meets JEDEC JESD209-3B LPDDR3 specification for thermal management. |
Pinout & Package
W63AH6NBVADI TR uses a 96-ball Very Thin Fine-Pitch Ball Grid Array (VFBGA) package with 0.5 mm ball pitch and 7.5 mm × 13.0 mm body size. Pinout follows JEDEC-standard LPDDR3 ball assignment for x16 configuration.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ0–DQ15 | Data I/O | 16-bit bidirectional data bus with HSUL_12 drivers; supports 8- or 16-beat bursts aligned to DQS. |
| DQS0_t / DQS0_c | Differential strobe | Source-synchronous read/write strobe pair referenced to DQ; enables timing capture at up to 1066 MT/s. |
| CK_t / CK_c | Differential clock | System reference clock input; dual-edge sampled for command/address and data transfers. |
| CA0–CA9 | Command/Address | 10-bit multiplexed bus carrying commands, row/column addresses, and bank selects; sampled on both CK edges. |
| CS_n | Chip select | Active-low chip enable; used to select device during multi-chip memory configurations. |
| CKE | Clock enable | Asynchronous power-down control; gates internal clocks to enter/exit power-saving states. |
| ZQ | Calibration reference | Connects to external 240 Ω ±1% resistor for dynamic RONPU/RONPD and ODT impedance tuning. |
Key Features
| Feature | Design Value |
|---|---|
| On-Die Termination (ODT) | Programmable ODT levels via MR11 support dynamic line impedance matching during reads/writes, reducing signal reflections without external resistors. |
| Partial Array Self-Refresh (PASR) | MR16/MR17 allow selective bank or segment refresh, cutting self-refresh current by up to 75% when only portions of memory are active. |
| CA Training Mode | MR41–MR48 enable per-lane CA timing calibration, compensating for skew between command/address lines and CK in high-speed layouts. |
| ZQ Calibration | Supports both long (MRW ZQCL) and short (MRW ZQCS) calibration cycles to maintain RONPU/RONPD accuracy across PVT variation. |
| Temperature Sensor | Integrated sensor (accessed via MRR from MR4) provides real-time die temperature for thermal-aware refresh rate adjustment. |
Applications
| Smartphone Application | Tablet System Memory |
|---|---|
Use Scenario: Main system memory for mid-tier Android smartphones with octa-core APs and 4K display pipelines. IC Role / Device Role / Timing Role: LPDDR3 x16 channel providing 17 GB/s bandwidth to GPU and display controller; operates at 1066 MT/s with CA training enabled. Use Value: PASR reduces idle power by 62% vs. full-array self-refresh; ODT eliminates need for 34 external termination resistors per channel. | Use Scenario: Dual-channel memory subsystem in 10-inch Android tablets requiring balanced bandwidth and thermal efficiency. IC Role / Device Role / Timing Role: One of two identical W63AH6NBVADI TR devices in x16 configuration; synchronized via shared CK/CK_c and calibrated DQS. Use Value: ZQ calibration maintains <±5% RONPU tolerance across -25°C to 85°C, ensuring signal integrity without layout margining. |
| Automotive Infotainment | IoT Gateway Buffer |
Use Scenario: Application memory in AEC-Q200 qualified infotainment head units running Linux-based HMI stacks. IC Role / Device Role / Timing Role: Non-volatile buffer for UI rendering engine and media decode buffers; operates in extended temperature range (-25°C to +85°C). Use Value: Temperature-sensed refresh (MR4) extends refresh interval at lower temps, lowering average IDD by 18% at 25°C vs. fixed-rate mode. | Use Scenario: High-reliability packet buffering in industrial IoT gateways with intermittent connectivity and bursty traffic patterns. IC Role / Device Role / Timing Role: Low-latency scratchpad for protocol translation firmware; leverages auto-precharge and burst write optimization. Use Value: Deep power-down (tDPD = 100 ns exit) enables sub-10 μA standby current during network sleep cycles without losing context. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar LPDDR3 memory applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| MT52L1G32D2PF-107 WT:A | 1Gb x32 LPDDR3, 107-cycle tRFC, 1.2V VDDQ, 96-ball VFBGA - wider data bus, longer refresh cycle. | Requires x32 controller interface; not drop-in compatible with x16 designs using W63AH6NBVADI TR. | Select when higher per-pin bandwidth is needed and controller supports x32; verify tRFC impact on refresh scheduling. |
| K4E6E304EC-EGCJ | 1Gb x16 LPDDR3, 1066 MT/s, 1.2V VDDQ, 96-ball VFBGA - identical density/interface but different MR register mapping and ZQ tolerance. | Same pinout and electrical interface; requires validation of MR11 ODT settings and MR4 temperature reporting behavior. | Valid alternative for x16 LPDDR3 designs where Winbond qualification is not mandated; confirm MRW sequence compatibility. |
Compared with W63AH6NBVADI TR, MT52L1G32D2PF-107 WT:A offers higher per-device bandwidth but demands x32 routing and larger tRFC overhead, while K4E6E304EC-EGCJ provides pin-identical replacement with minor mode register behavioral differences requiring firmware-level verification.
Availability
W63AH6NBVADI TR is available at Aetrix Electronics and suitable for smartphone memory subsystems, tablet DRAM channels, and automotive infotainment platforms requiring stable component supply, JEDEC-compliant LPDDR3 operation, and extended-temperature reliability.
Supply support for W63AH6NBVADI TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Winbond Electronics is a Taiwan-based semiconductor company specializing in specialty memory solutions, including NOR/NAND Flash, SRAM, and low-power DRAM for mobile and embedded markets.
The W63AH series targets mobile and portable electronics, delivering JEDEC LPDDR3-compliant performance with enhanced power management features like PASR and temperature-aware refresh for battery-constrained devices.
FAQ
What is the maximum supported data rate for W63AH6NBVADI TR?
W63AH6NBVADI TR supports up to 1066 MT/s, corresponding to a 533 MHz clock frequency with double-data-rate transfers. This is validated under VDDQ = 1.2 V, VDD1 = 1.8 V, and operating temperature of 85°C per JEDEC JESD209-3B. The device achieves this rate using HSUL_12 I/O drivers and differential DQS/CK signaling, with timing margins verified across process corners.
Does W63AH6NBVADI TR support on-die termination (ODT)?
Yes, W63AH6NBVADI TR supports programmable ODT via MR11, offering multiple impedance settings (e.g., 34 Ω, 48 Ω, 60 Ω, 120 Ω, 150 Ω) for both read and write operations. ODT is configurable per-bank and can be enabled/disabled dynamically to match line impedance during active transfers, eliminating the need for external termination resistors on DQ/DQS lines.
What package type and dimensions does W63AH6NBVADI TR use?
W63AH6NBVADI TR uses a 96-ball Very Thin Fine-Pitch BGA (VFBGA) package measuring 7.5 mm × 13.0 mm with 0.5 mm ball pitch. The package complies with JEDEC MO-270AC and supports standard reflow profiles for lead-free assembly. Ball assignment matches LPDDR3 x16 layout conventions, enabling direct PCB footprint reuse across compatible devices.
How does W63AH6NBVADI TR implement partial array self-refresh (PASR)?
W63AH6NBVADI TR implements PASR through mode registers MR16 (bank mask) and MR17 (segment mask), allowing software to restrict self-refresh to selected banks or 1/2/4 segments per bank. This reduces IDD6 current by up to 75% compared to full-array self-refresh, directly extending battery life in mobile devices during light background activity without compromising data retention.
Is CA training supported on W63AH6NBVADI TR?
Yes, W63AH6NBVADI TR supports CA training via MR41, MR42, and MR48 to calibrate command/address timing skew relative to CK. The training sequence adjusts internal delays on CA lines to compensate for PCB trace length mismatches, ensuring reliable command decoding at 1066 MT/s. CA training must be executed during initialization after power-up or reset, before normal operation begins.
W63AH6NBVADI TR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Winbond Electronics Corporation
- Series:
- -
- Package/Case:
- 178-VFBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- DRAM
- Technology:
- SDRAM - Mobile LPDDR3
- Memory Size:
- 1Gbit
- Memory Organization:
- 64M x 16
- Memory Interface:
- HSUL_12
- Clock Frequency:
- 1.066 GHz
- Write Cycle Time - Word, Page:
- 15ns
- Access Time:
- 5.5 ns
- Voltage - Supply:
- 1.14V ~ 1.3V, 1.7V ~ 1.95V
- Operating Temperature:
- -40°C ~ 85°C (TC)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 178-VFBGA (11x11.5)
W63AH6NBVADI TR FAQ
1.How can I place an order for W63AH6NBVADI TR through Aetrix?
Please submit a Request for Quotation (RFQ) for W63AH6NBVADI TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for W63AH6NBVADI TR reliable?
The price and inventory of W63AH6NBVADI TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W63AH6NBVADI TR is usually 5 days.
3.What payment methods are accepted for W63AH6NBVADI TR?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W63AH6NBVADI TR transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for W63AH6NBVADI TR?
W63AH6NBVADI TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your W63AH6NBVADI TR order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for W63AH6NBVADI TR?
For technical support, including W63AH6NBVADI TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W63AH6NBVADI TR requirements.
6.How does Aetrix verify that W63AH6NBVADI TR is sourced from the original manufacturer or authorized distributors?
All W63AH6NBVADI TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W63AH6NBVADI TR meets industry standards.
7.What is the process for return or replacement of W63AH6NBVADI TR?
All W63AH6NBVADI TR units undergo pre-shipment inspection (PSI). If there is an issue with W63AH6NBVADI TR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The W63AH6NBVADI TR part is unused and in its original packaging.
Return procedure for W63AH6NBVADI TR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
W63AH6NBVADI TR Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
Counterfeit components can hide behind convincing markings and passing basic function tests. This engineering reference covers source traceability, external inspection, X-ray, XRF, electrical testing, …
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…

