Winbond Electronics Corporation W971GG8SB-25
- Part No.:
- W971GG8SB-25
- Manufacturer:
- Winbond Electronics Corporation
- Category:
- Memory
- Package:
- 60-TFBGA
- Datasheet:
-
W971GG8SB-25.pdf
- Description:
- IC DRAM 1GBIT PARALLEL 60WBGA
- Quantity:
- Payment:

- Shipping:

Inventory:4,227
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
W971GG8SB-25 from Winbond is a 1G-bit DDR2 SDRAM organized as 16M × 8 banks × 8 bits, supporting DDR2-800 (5-5-5 or 6-6-6) operation at 400 MHz clock frequency with 1.8 V supply. It delivers 6.4 Gb/s aggregate bandwidth across 8 data pins and integrates on-die termination (ODT), off-chip driver (OCD) impedance adjustment, and programmable CAS latency (CL = 3–6) for high-signal-integrity memory subsystems in embedded controllers and industrial SoC platforms.
For engineers reviewing the W971GG8SB-25 datasheet, W971GG8SB-25 pinout, W971GG8SB-25 application, or W971GG8SB-25 equivalent, key selection considerations include its WBGA-60 package compatibility, SSTL_18 interface compliance, tRCD/tRP/tRC timing requirements at 400 MHz, and support for auto-precharge, self-refresh, and differential DQS strobing in source-synchronous read/write operations.
Technical Context
This DDR2 SDRAM implements a double-data-rate architecture with DLL-aligned DQ/DQS transitions synchronized to differential CLK/CLK inputs. It supports burst lengths of 4 or 8, posted CAS with additive latency (AL = 0–2), and write latency WL = RL − 1, enabling efficient command/data bus utilization in multi-bank interleaved access patterns.
Functional control includes mode register (MR) and three extended mode registers (EMR1–EMR3) for configuring ODT states, OCD calibration, DLL enable/disable, RDQS/DQS differential strobe mode, and temperature-compensated refresh intervals. All commands are sampled on the crossing of CLK rising and CLK falling edges, and I/Os operate under SSTL_18 voltage thresholds with VREF referenced to VDDQ/2.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 1 Gbit (16,777,216 words × 8 banks × 8 bits) |
| Data Rate | DDR2-800: 400 MHz clock → 800 MT/s per pin |
| Supply Voltage | VDD/VDDQ/VDDL = 1.8 V ± 0.1 V - requires tight regulation for SSTL_18 compliance |
| CAS Latency | Programmable CL = 3, 4, 5, or 6 - determines minimum read access delay after column address |
| Burst Length | Configurable BL = 4 or 8 - defines number of consecutive data transfers per read/write command |
| Refresh Interval | tREFI = 7.8 µS at 0–85°C - mandates periodic auto-refresh every 7.8 µS per bank for data retention |
| Package | WBGA-60 (8 mm × 12.5 mm, 0.8 mm pitch) - RoHS-compliant, lead-free, ball-grid array |
Pinout & Package
W971GG8SB-25 uses a 60-ball WBGA package with 8×12.5 mm² footprint and 0.8 mm ball pitch. Power and ground balls are distributed across corners and edges to minimize noise coupling; VDDQ/VSSQ pairs isolate I/O power domains, while VDDL/VSSDL separately supply the DLL circuitry.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A13 | Address Input | Row/column address bus; A10 controls auto-precharge activation during read/write commands |
| BA0–BA2 | Bank Select | 3-bit field selecting one of eight internal banks for active, read, write, or precharge operations |
| DQ0–DQ7 | Data I/O | 8-bit bidirectional data bus; supports source-synchronous reads/writes aligned to DQS/DQS edges |
| DQS / DQS | Differential Data Strobe | Source-synchronous strobe pair - edge-aligned with read data, center-aligned with write data |
| CLK / CLK | Differential Clock Input | Commands latched at CLK/CLK crossing; all timing referenced to this differential clock domain |
| CKE | Clock Enable | Asynchronous enable/disable of internal clock circuitry - controls power-down entry/exit |
| CS, RAS, CAS, WE | Command Inputs | Encoded command bus - CS enables rank selection; RAS/CAS/WE define core DRAM operations |
| ODT | On-Die Termination Control | Registered HIGH enables internal termination resistors on DQ/DQS lines to reduce signal reflections |
| DM/RDQS | Data Mask / Read Strobe | DM masks write data on both DQS edges; RDQS enabled via EMR(1)[A11] for differential read strobe |
| VREF | Input Reference Voltage | Reference for all address/control inputs - must track VDDQ/2 ± 300 mV for valid logic threshold |
Key Features
| Feature | Design Value |
|---|---|
| On-Die Termination (ODT) | Configurable termination resistance on DQ/DQS lines reduces PCB routing complexity and improves signal integrity without external resistors |
| Off-Chip Driver (OCD) Calibration | Dynamic impedance tuning of output drivers matches trace impedance, minimizing overshoot/undershoot in high-speed layouts |
| Programmable Additive Latency (AL) | AL = 0–2 allows pipelining of CAS commands ahead of row activation, increasing command bus efficiency in burst-heavy workloads |
| Auto-Precharge Support | Automatic bank precharge triggered by burst read/write commands eliminates explicit PRECHARGE overhead in sequential accesses |
| Self-Refresh Mode | Internal refresh controller maintains data retention at IDD6 ≤ 8 mA - critical for low-power suspend states in battery-backed systems |
Applications
| Industrial HMI Controllers | Network Edge Routers |
|---|---|
|
Use Scenario: Real-time display buffering and GUI rendering in panel-mounted HMIs operating in factory environments with ambient temperatures up to 85°C. IC Role / Device Role / Timing Role: Primary working memory for ARM Cortex-A series processors, interfacing via 16-bit DDR2 bus with tRCD = 12.5 ns and tRP = 12.5 ns timing budget. Use Value: DDR2-800 bandwidth meets 640×480@60Hz framebuffer throughput; ODT and OCD ensure stable operation despite noisy 24 VDC industrial power rails. |
Use Scenario: Packet buffering and forwarding table storage in fanless Layer 3 switches deployed in telecom cabinets. IC Role / Device Role / Timing Role: Shared system memory for dual-core MIPS-based network processors, supporting concurrent packet ingress/egress with bank-interleaved access. Use Value: 8-bank architecture enables tRC = 52.5 ns minimum cycle time for sustained 1.2 GB/s read/write throughput; self-refresh mode maintains state during thermal throttling events. |
| Medical Imaging Gateways | Automated Test Equipment (ATE) |
|
Use Scenario: DICOM image caching and real-time DICOM-to-JPEG2000 transcoding in portable ultrasound gateways. IC Role / Device Role / Timing Role: Low-latency frame buffer for FPGA-accelerated image processing pipelines, requiring CL = 4 and BL = 8 burst reads. Use Value: Programmable CAS latency and posted CAS allow fine-grained timing optimization; SSTL_18 interface ensures compatibility with medical-grade FPGA I/O banks. |
Use Scenario: High-throughput pattern memory for digital IC test systems requiring deterministic 100+ MHz vector streaming. IC Role / Device Role / Timing Role: Dedicated waveform memory for pattern generators, accessed via burst writes with DM masking for partial updates. Use Value: Write data mask (DM) enables selective byte-level updates without full-word overwrites; tREFI = 7.8 µS guarantees data retention during long test sequences. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar DDR2 SDRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| MT47H128M8HQ-25E | Same density (1 Gbit), same 60-ball FBGA package, but rated for DDR2-800 (5-5-5) at −40°C to +105°C industrial range | Supports wider temperature range and higher reliability screening (e.g., burn-in); requires different VREF tracking and ODT initialization sequence | Preferred for extended-temperature deployments where W971GG8SB-25's 0–85°C rating is insufficient |
| IS42S16160F-25BLI | 16-bit bus width (vs. 8-bit), same DDR2-800 speed grade, 84-ball TSOP-II package - not pin-compatible | Higher per-cycle bandwidth but incompatible layout; lacks OCD calibration and has fixed ODT settings | Consider only when board redesign permits wider bus and larger footprint; not a drop-in replacement |
Compared with MT47H128M8HQ-25E and IS42S16160F-25BLI, W971GG8SB-25 offers optimized cost and layout efficiency for 8-bit DDR2 interfaces within commercial temperature range, with unique OCD calibration for signal integrity tuning not available in the Micron part and superior flexibility versus the ISSI part's fixed-impedance design.
Availability
W971GG8SB-25 is available at Aetrix Electronics and suitable for industrial HMI controllers, network edge routers, medical imaging gateways, and automated test equipment requiring stable component supply with consistent parametric performance across production lots.
Supply support for W971GG8SB-25 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Winbond Electronics is a Taiwan-based semiconductor company specializing in specialty memory solutions including NOR/NAND Flash, SRAM, and DDR SDRAM for industrial, automotive, and computing markets.
W971GG8SB-25 belongs to Winbond's DDR2 SDRAM product line designed for cost-sensitive, thermally constrained embedded systems requiring JEDEC-compliant DDR2-800 performance with enhanced signal integrity features like OCD and configurable ODT.
FAQ
What is the maximum operating frequency supported by W971GG8SB-25?
W971GG8SB-25 supports DDR2-800 operation, meaning it operates at a 400 MHz clock frequency with effective data transfer rates of 800 MT/s per pin. This is confirmed in the datasheet's Order Information table and KEY PARAMETERS section, where the -25 speed grade is explicitly rated for DDR2-800 (5-5-5) or DDR2-800 (6-6-6) timing. The device achieves this using a differential CLK/CLK input and DLL-aligned DQ/DQS timing.
Does W971GG8SB-25 support on-die termination (ODT) and how is it controlled?
Yes, W971GG8SB-25 supports on-die termination (ODT) via the dedicated ODT pin (Ball F9). When ODT is registered HIGH, internal termination resistors are enabled on DQ and DQS lines to suppress signal reflections. ODT configuration is further refined through Extended Mode Register 1 (EMR1), allowing dynamic control of termination strength during read/write cycles - a key feature for maintaining signal integrity in high-speed DDR2 designs.
What package type and ball count does W971GG8SB-25 use?
W971GG8SB-25 uses a 60-ball Wafer-Level Ball Grid Array (WBGA) package measuring 8 mm × 12.5 mm with 0.8 mm ball pitch. This is documented in Section 2 (Features) and Section 12 (Package Specification) of the datasheet. The package is lead-free and RoHS compliant, with dedicated VDDQ/VSSQ and VDDL/VSSDL power/ground pairs to isolate I/O and DLL domains.
Can W971GG8SB-25 operate in self-refresh mode, and what is its typical current draw?
Yes, W971GG8SB-25 supports self-refresh mode to maintain data retention during system sleep or low-power states. According to the Electrical Characteristics table (Section 10.9), its maximum self-refresh current (IDD6) is 8 mA at case temperatures ≤ 85°C. This low quiescent current enables extended battery-backed operation in portable medical or industrial devices without compromising memory retention.
What is the purpose of the DM/RDQS pin (Ball B3) on W971GG8SB-25?
The DM/RDQS pin on W971GG8SB-25 serves dual functions: as Data Mask (DM) during write operations and as Read Data Strobe (RDQS) when enabled via EMR(1)[A11]. As DM, it masks individual bytes of incoming write data on both edges of DQS. As RDQS, it provides a differential strobe for read data when differential DQS mode is active - enhancing timing margin in high-noise environments. Its dual-role design conserves ball count while supporting flexible interface configurations.
W971GG8SB-25 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Winbond Electronics Corporation
- Series:
- -
- Package/Case:
- 60-TFBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- DRAM
- Technology:
- SDRAM - DDR2
- Memory Size:
- 1Gbit
- Memory Organization:
- 128M x 8
- Memory Interface:
- Parallel
- Clock Frequency:
- 200 MHz
- Write Cycle Time - Word, Page:
- 15ns
- Access Time:
- 57.5 ns
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 85°C (TC)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 60-WBGA (8x12.5)
W971GG8SB-25 FAQ
1.How can I place an order for W971GG8SB-25 through Aetrix?
Please submit a Request for Quotation (RFQ) for W971GG8SB-25 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for W971GG8SB-25 reliable?
The price and inventory of W971GG8SB-25 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for W971GG8SB-25 is usually 5 days.
3.What payment methods are accepted for W971GG8SB-25?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for W971GG8SB-25 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for W971GG8SB-25?
W971GG8SB-25 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your W971GG8SB-25 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for W971GG8SB-25?
For technical support, including W971GG8SB-25 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your W971GG8SB-25 requirements.
6.How does Aetrix verify that W971GG8SB-25 is sourced from the original manufacturer or authorized distributors?
All W971GG8SB-25 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that W971GG8SB-25 meets industry standards.
7.What is the process for return or replacement of W971GG8SB-25?
All W971GG8SB-25 units undergo pre-shipment inspection (PSI). If there is an issue with W971GG8SB-25, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The W971GG8SB-25 part is unused and in its original packaging.
Return procedure for W971GG8SB-25:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
W971GG8SB-25 Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
Counterfeit components can hide behind convincing markings and passing basic function tests. This engineering reference covers source traceability, external inspection, X-ray, XRF, electrical testing, …
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…

