Microchip Technology 1N6641US
- Part No.:
- 1N6641US
- Manufacturer:
- Microchip Technology
- Category:
- Single Diodes
- Package:
- SQ-MELF, D
- Datasheet:
-
1N6641US.pdf
- Description:
- DIODE GEN PURP 50V 300MA D-5D
- Quantity:
- Payment:

- Shipping:

Inventory:5,544
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
1N6641US from Microsemi is a hermetically sealed, metallurgically bonded, non-cavity glass switching diode rated for 75 V reverse working voltage (VRWM), 200 mA forward current (IF), and 5.0 ns reverse recovery time (trr) at IF = 10 mA, used in high-reliability military timing and pulse shaping circuits.
For engineers reviewing the 1N6641US datasheet, 1N6641US pinout, 1N6641US application, or 1N6641US equivalent, this part supports MIL-PRF-19500/609 Class JANTXV requirements, operates from −65°C to +175°C, and delivers stable switching performance under pulsed 200 mA loads with ≤3.0 pF junction capacitance.
Technical Context
The 1N6641US is a fast-switching, low-capacitance silicon diode optimized for high-speed digital logic interface protection and pulse clipping in aerospace and defense systems. Its 5.0 ns trr and 3.0 pF CT enable clean edge fidelity in <100 ns rise-time signal paths.
Designed per MIL-PRF-19500/609, it features a D-5D axial glass package with tin/lead leads, 50 °C/W thermal resistance (RθJL), and guaranteed operation up to +175°C junction temperature - critical for engine-mounted avionics and downhole telemetry.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VRWM | 75 V - Maximum continuous reverse voltage before leakage exceeds 100 nA at +25°C; defines safe blocking range in clamp and sample-hold circuits. |
| IF (max) | 200 mA - Peak repetitive forward current capability; supports sustained pulse trains without thermal runaway in logic-level drive applications. |
| trr | 5.0 ns - Measured at IF = 10 mA, IR = 10 mA, RL = 100 Ω; enables use in >100 MHz clock distribution and pulse sharpening. |
| CT | 3.0 pF - Junction capacitance at VR = 0 V; minimizes signal loading on high-impedance nodes in RF detector and mixer bias networks. |
| VF @ 200 mA | 1.10 V - Forward voltage drop at rated pulsed current; determines power dissipation (220 mW) and self-heating margin in compact layouts. |
| TJ range | −65°C to +175°C - Fully specified junction temperature range; eliminates derating concerns in uncooled military chassis and turbine environments. |
Pinout & Package
Package: D-5D, hermetically sealed axial glass case per MIL-PRF-19500/609; cathode indicated by band; lead finish: Sn/Pb; thermal resistance RθJL ≤ 50 °C/W at L = 0.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| Anode | Forward current entry node | Connected to higher-potential side of switching path; must withstand 2.5 A surge (8.3 ms) during transient clamping. |
| Cathode | Forward current exit node / reverse-blocking terminal | Banded end; referenced to system ground or return rail in clamp configurations; defines polarity-sensitive placement on PCB. |
Key Features
| Feature | Design Value |
|---|---|
| Hermetic D-5D glass package | Enables long-term reliability in vacuum, humidity, and radiation-prone environments per MIL-PRF-19500/609 JANTXV screening. |
| Metallurgical bond construction | Eliminates wire bonds and interfacial delamination risk-critical for shock/vibration resilience in flight control modules. |
| 5.0 ns reverse recovery | Supports clean switching in >100 MHz pulse generators without tail current-induced jitter or false triggering. |
| 3.0 pF junction capacitance | Reduces capacitive loading on high-frequency logic outputs, preserving signal integrity in ECL and PECL interface buffers. |
| −65°C to +175°C operation | Permits direct mounting on hot surfaces (e.g., engine ECUs) without heatsinking or thermal interface materials. |
Applications
| Avionics Timing Circuits | Military Pulse Generators |
|---|---|
Use Scenario: Generating precise trigger pulses for radar modulators and missile seeker synchronization. IC Role / Device Role / Timing Role: Fast-switching clamp diode in Schmitt-trigger input stages and pulse edge sharpeners. Use Value: 5.0 ns trr ensures sub-10 ns pulse width stability across −55°C to +125°C operational range. | Use Scenario: Protecting FPGA I/O banks from ESD and inductive kickback in field-deployable radios. IC Role / Device Role / Timing Role: Transient voltage suppressor and logic-level signal steering diode. Use Value: 75 V VRWM and 2.5 A IFSM rating provide robust immunity against MIL-STD-461 CS115 surges. |
| Downhole Telemetry Interfaces | Aerospace Power Sequencing |
Use Scenario: Signal conditioning and level translation in borehole pressure sensor transmitters operating at 175°C. IC Role / Device Role / Timing Role: High-temperature rectifier and bias network switch in analog front-end ASIC support circuitry. Use Value: Guaranteed operation to +175°C junction temperature eliminates need for external thermal derating calculations. | Use Scenario: Controlling power-up sequencing of multi-rail FPGAs and ADCs in satellite payload controllers. IC Role / Device Role / Timing Role: Delay element and voltage threshold detector in discrete reset timing chains. Use Value: Stable 1.10 V VF at 200 mA enables predictable RC time constants across extreme temperature excursions. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar switching diode applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| 1N6640US | VRWM = 75 V, trr = 4.0 ns, CT = 2.5 pF, VF = 0.87–1.00 V @ 200 mA | Lower VF and faster trr, but same package and screening level | Select when lower forward loss and tighter timing margins are required; verify layout compatibility with identical D-5D footprint. |
| 1N6639US | VRWM = 100 V, trr = 4.0 ns, CT = 2.5 pF, VF = 0.54–0.62 V @ 200 mA | Higher blocking voltage and lower VF, but same thermal and mechanical specs | Choose for 100 V clamp applications where lower conduction loss is prioritized over 75 V rating. |
Compared with 1N6640US and 1N6639US, the 1N6641US trades slightly higher VF (1.10 V) and slower trr (5.0 ns) for consistent 75 V VRWM and proven performance in legacy JANTXV-specified designs requiring exact parameter alignment.
Availability
1N6641US is available at Aetrix Electronics and suitable for avionics timing circuits, military pulse generators, and downhole telemetry interfaces requiring stable component supply with full MIL-PRF-19500/609 traceability.
Supply support for 1N6641US includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Microsemi (now part of Microchip Technology) is a U.S.-based semiconductor manufacturer specializing in high-reliability, radiation-tolerant, and military-grade analog and mixed-signal components.
The 1N6641US belongs to Microsemi's legacy MIL-PRF-19500/609 switching diode family, engineered specifically for mission-critical timing, pulse conditioning, and interface protection in aerospace, defense, and energy exploration systems.
FAQ
What is the maximum reverse working voltage (VRWM) for the 1N6641US?
The 1N6641US has a maximum reverse working voltage (VRWM) of 75 V, verified per MIL-PRF-19500/609 test conditions at +25°C with IR ≤ 100 nA. This rating remains valid across its full −65°C to +175°C operating junction temperature range, making it suitable for high-voltage transient suppression in uncooled military platforms where thermal derating is impractical. The 1N6641US maintains this specification without degradation under JANTXV screening.
What is the reverse recovery time (trr) of the 1N6641US and under what conditions is it measured?
The 1N6641US reverse recovery time (trr) is 5.0 ns, measured at IF = 10 mA, IR = 10 mA, and RL = 100 Ω per MIL-PRF-19500/609. This value reflects actual switching behavior in high-speed pulse applications such as radar modulator triggers and digital logic clamping. The 1N6641US sustains this trr performance across temperature extremes, with no data sheet derating required up to +175°C junction temperature.
Is the 1N6641US available in JANTXV screening, and what does that entail?
Yes, the 1N6641US is explicitly listed as available in JANTXV screening per the source row "1N6639US THRU 1N6641US AVAILABLE IN JAN, JANTX, JANTXV AND JANS". JANTXV screening includes extended environmental stress testing (e.g., temperature cycling, burn-in, and hermeticity verification), lot traceability, and 100% electrical test to MIL-PRF-19500/609 requirements. The 1N6641US meets these criteria in its D-5D glass package with metallurgical bonding.
What is the junction capacitance (CT) of the 1N6641US and how does it impact high-frequency design?
The 1N6641US exhibits a junction capacitance (CT) of 3.0 pF at VR = 0 V, directly impacting high-frequency signal integrity in RF detector bias networks and ECL logic interfaces. This low CT minimizes capacitive loading on fast edges, reducing rise-time degradation and crosstalk. In practice, the 1N6641US enables reliable operation in >100 MHz pulse-shaping circuits where competing diodes exceed 5 pF - a key differentiator confirmed in Microsemi's Figure 3 characterization data.
How does the 1N6641US compare to the 1N6640US in terms of forward voltage and thermal performance?
The 1N6641US has a forward voltage (VF) of 1.10 V at 200 mA, versus 0.87–1.00 V for the 1N6640US - a measurable increase that affects conduction loss in high-duty-cycle applications. Both share identical D-5D packaging, RθJL ≤ 50 °C/W, and −65°C to +175°C operation. The 1N6641US maintains its VF and thermal specs under JANTXV screening, ensuring consistency in thermally constrained avionics modules where the 1N6641US is specified.
1N6641US Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Microchip Technology
- Series:
- -
- Package/Case:
- SQ-MELF, D
- Packaging:
- Bulk
- Product Status:
- Active
- Technology:
- Standard
- Voltage - DC Reverse (Vr) (Max):
- 50 V
- Current - Average Rectified (Io):
- 300mA
- Voltage - Forward (Vf) (Max) @ If:
- 1.1 V @ 200 mA
- Speed:
- Fast Recovery =< 500ns, > 200mA (Io)
- Reverse Recovery Time (trr):
- 5 ns
- Current - Reverse Leakage @ Vr:
- 100 nA @ 50 V
- Capacitance @ Vr, F:
- -
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- D-5D
- Operating Temperature - Junction:
- -65°C ~ 175°C
1N6641US FAQ
1.How can I place an order for 1N6641US through Aetrix?
Please submit a Request for Quotation (RFQ) for 1N6641US on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 1N6641US reliable?
The price and inventory of 1N6641US are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 1N6641US is usually 5 days.
3.What payment methods are accepted for 1N6641US?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for 1N6641US transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for 1N6641US?
1N6641US orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your 1N6641US order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for 1N6641US?
For technical support, including 1N6641US datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 1N6641US requirements.
6.How does Aetrix verify that 1N6641US is sourced from the original manufacturer or authorized distributors?
All 1N6641US products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 1N6641US meets industry standards.
7.What is the process for return or replacement of 1N6641US?
All 1N6641US units undergo pre-shipment inspection (PSI). If there is an issue with 1N6641US, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 1N6641US part is unused and in its original packaging.
Return procedure for 1N6641US:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
1N6641US Tags

-
1N4448X-TP
Micro Commercial Co

-
1N4148WX-TP
Micro Commercial Co

-
1N4148TR
onsemi

-
MMSD4148T1G
onsemi

-
MMBD914LT3G
onsemi

-
BAS16HT1G
onsemi

-
1N914BWT
onsemi

-
BAS21LT1G
onsemi

-
LL4148
onsemi

-
BAS16LT1G
onsemi

-
MMSD914T1G
onsemi

-
BAV21W-7-F
Diodes Incorporated
Tech Hub
A practical engineering and sourcing framework covering lifecycle verification, lifetime-buy calculations, replacement qualification, supplier checks and counterfeit-risk controls.
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
