STMicroelectronics 74LVQ573MTR

Overview

74LVQ573MTR from STMicroelectronics is a low-voltage CMOS octal D-type latch with non-inverting 3-state outputs, operating from 2V to 3.6V. It features 5.8 ns typical propagation delay at 3.3V, ±12 mA symmetrical output drive, and 75Ω transmission line driving capability-ideal for 3.3V bus interface and data latching in industrial control systems.

For engineers reviewing the 74LVQ573MTR datasheet, 74LVQ573MTR pinout, 74LVQ573MTR application, or 74LVQ573MTR equivalent, key selection criteria include latch enable (LE) and output enable (OE) timing margins, 3-state output leakage (<5 µA), PCI-bus-level 24 mA drive guarantee, and ESD immunity (2 kV).

Technical Context

The device implements an edge-triggered latch architecture controlled by LE: when LE is HIGH, Q outputs follow D inputs transparently; when LE transitions LOW, Q latches the instantaneous D value. OE independently controls output state-LOW enables normal logic levels, HIGH places all eight outputs in high-impedance mode.

Designed for noise-sensitive 3.3V systems, it delivers 0.5 V typical dynamic quiet output noise (VOLP) and balanced tPLH/tPHL propagation delays. Its sub-micron C2MOS process ensures latch-up immunity and supports operation from –55°C to +125°C with 1.2V data retention.

Key Specifications

Pinout & Package

74LVQ573MTR is housed in a 20-pin SOIC (Small Outline Integrated Circuit) package with tape-and-reel delivery (MTR suffix). Pin layout separates inputs (D0–D7, LE, OE, VCC, GND) on one side and outputs (Q0–Q7) on the opposite side to simplify PCB routing and reduce crosstalk.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar octal latch applications.

Compared with SN74LVTH573PW and 74LVC573APW, the 74LVQ573MTR uniquely balances extended temperature operation (–55°C to +125°C), 2 kV ESD immunity, and guaranteed PCI-compliant drive-making it optimal for mission-critical industrial and automotive control nodes where reliability outweighs marginal speed gains.

Availability

74LVQ573MTR is available at Aetrix Electronics and suitable for industrial PLC backplanes, automotive body control modules, medical patient monitor data acquisition, and automated test equipment requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for 74LVQ573MTR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

STMicroelectronics is a global semiconductor leader headquartered in Geneva, Switzerland, designing and manufacturing microcontrollers, power management ICs, sensors, and discrete components for industrial, automotive, and consumer markets.

The 74LVQ series targets low-voltage, low-noise 3.3V system interfacing-specifically engineered for noise-sensitive data acquisition, bus isolation, and high-reliability industrial control applications where ESD robustness and extended temperature stability are critical.

FAQ

What is the minimum pulse width required on the LE input to reliably capture data?

The LE input requires a minimum HIGH pulse width of 1.5 ns at VCC = 3.3 V (–40°C to +85°C range). This ensures sufficient setup time for internal latch sampling. At extended temperature (–55°C to +125°C), the minimum widens to 4.0 ns. Designers must verify timing margins using worst-case propagation values from Table 7, especially when LE is derived from a clock divider or slow-edge controller.

Can 74LVQ573MTR be used with 2.5V logic systems?

Yes-its 2.0 V to 3.6 V operating range fully covers 2.5V nominal systems. Input thresholds (VIH = 2.0 V min, VIL = 0.8 V max at VCC = 2.5 V) remain compatible with standard 2.5V CMOS outputs. However, output drive strength drops to ~±8 mA at 2.5V, so verify 75Ω line termination and signal integrity with IBIS simulation before deployment.

How does the 3-state output disable timing behave when OE and LE are asserted simultaneously?

When OE transitions HIGH while LE is HIGH, outputs enter high-impedance mode after tPHZ (7.5 ns typ. at 3.3V), regardless of D-input state. If OE goes HIGH while LE is LOW (latched state), the same tPHZ applies-no race condition occurs. The device guarantees monotonic disable behavior; no glitch or intermediate voltage state appears on Q outputs during transition.

Is there a recommended PCB layout practice to minimize VOLP noise?

Place a 100 nF X7R ceramic capacitor between VCC and GND within 3 mm of pins 20 and 10, use solid ground plane beneath the IC, and route Q0–Q7 traces with controlled 75Ω impedance and equal length. Avoid routing D or LE signals adjacent to Q outputs. STMicroelectronics' AN2012 recommends separating input and output power planes and using dedicated GND vias per output pin to suppress ground bounce.