My Inquiry
My Account
Nexperia USA Inc. BAW56W-QF
- Part No.:
- BAW56W-QF
- Manufacturer:
- Nexperia USA Inc.
- Category:
- Diode Arrays
- Package:
- SC-70, SOT-323
- Datasheet:
-
BAW56W-QF.pdf
- Description:
- DIODE ARRAY GP 90V 150MA SOT-323
- Quantity:
- Payment:
- Shipping:
Inventory:4,223
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
BAW56W-QF from Nexperia is a dual high-speed switching diode in SOT323 (SC-70) package, configured as a common-anode pair with reverse voltage rating of 90 V, reverse recovery time ≤ 4 ns, and junction capacitance ≤ 2 pF - used for signal routing and clamping in automotive infotainment power management stages.
For engineers reviewing the BAW56W-QF datasheet, BAW56W-QF pinout, BAW56W-QF application, or BAW56W-QF equivalent, this page delivers verified electrical parameters, AEC-Q101 qualification status, thermal resistance values, and validated automotive-grade switching performance metrics without generic assumptions.
Technical Context
This dual diode integrates two independent P-N junctions sharing a common anode terminal, enabling bidirectional clamping or complementary switching in compact space-constrained layouts. Its trr ≤ 4 ns and Cd ≤ 2 pF support >100 MHz signal integrity in RF front-end bias networks and ESD-protected I/O interfaces.
The device operates across −65 °C to +150 °C ambient range with Rth(j-a) = 625 K/W on FR4 PCB, and is rated for IF = 130 mA continuous per diode and IFSM = 4 A (1 µs pulse), meeting automotive transient surge requirements per ISO 7637-2.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Reverse Voltage (VR) | 90 V - supports 24 V automotive systems with 3× safety margin against load-dump transients |
| Reverse Recovery Time (trr) | ≤ 4 ns - enables clean switching at ≥100 MHz clock rates in digital logic interface protection |
| Junction Capacitance (Cd) | ≤ 2 pF at 0 V - minimizes signal loading in high-frequency RF detector and mixer bias paths |
| Forward Voltage (VF) | 855 mV at 10 mA - ensures low conduction loss in low-power level-shifting and clamp circuits |
| Reverse Leakage (IR) | 0.5 µA at 80 V, 25 °C - maintains signal fidelity in precision analog sampling and sensor conditioning |
| Junction Temperature (Tj) | 150 °C max - sustains operation in under-hood ECUs and ADAS camera modules without derating |
Pinout & Package
SOT323 (SC-70) plastic surface-mount package: 3-pin, 1.3 mm pitch, 2.0 mm × 1.25 mm × 0.95 mm body height, optimized for reflow soldering on FR4 PCBs with standard footprint per Figure 8.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1 (K1) | Cathode of Diode 1 | Provides dedicated cathode path for first diode; routed separately for asymmetric clamping or dual-rail protection |
| 2 (K2) | Cathode of Diode 2 | Independent cathode node enables differential signal steering or redundant fault detection paths |
| 3 (CA) | Common Anode | Shared anode simplifies bias network design and reduces component count in dual-channel ESD protection |
Key Features
| Feature | Design Value |
|---|---|
| AEC-Q101 qualified | Validated for automotive use per stress test standard - eliminates need for additional qualification testing in Tier-1 designs |
| trr ≤ 4 ns | Enables fast edge transitions in CAN FD and LIN bus termination networks without overshoot or ringing |
| Cd ≤ 2 pF | Preserves bandwidth in 5 GHz Wi-Fi 6E antenna switch control lines and GNSS L1/L5 front-end biasing |
| Common-anode dual configuration | Reduces board area by 40% vs. discrete diodes; supports mirrored signal paths in stereo audio codec I/O protection |
Applications
| Automotive Infotainment Power Sequencing | USB 2.0 Data Line ESD Protection |
|---|---|
Use Scenario: Managing power-up/down sequencing between head unit MCU and display driver ICs while suppressing supply rail coupling noise. IC Role / Device Role / Timing Role: Dual-diode clamp placed between VDDIO rails to prevent backfeed and latch-up during staggered enable timing. Use Value: Common-anode topology allows single-point bias control; 4 ns trr prevents false triggering during 10–50 ms power ramp transitions. |
Use Scenario: Protecting D+ and D− lines from ±15 kV HBM ESD events in vehicle-mounted USB host ports. IC Role / Device Role / Timing Role: Bidirectional clamping diode pair referenced to VBUS, leveraging low Cd to avoid signal distortion at 480 Mbps. Use Value: 2 pF capacitance meets USB 2.0 eye diagram mask; AEC-Q101 rating ensures reliability over 15-year vehicle lifetime. |
| ADAS Camera Module Bias Control | Industrial PLC Digital Input Conditioning |
Use Scenario: Providing stable bias current to CMOS image sensor analog front-end while rejecting EMI from nearby motor drivers. IC Role / Device Role / Timing Role: High-speed switching diode used in active bias network with low-leakage hold-off during sensor reset phase. Use Value: 0.5 µA IR at 80 V preserves DC accuracy in 12-bit ADC reference paths; 150 °C Tj rating matches camera SoC thermal envelope. |
Use Scenario: Level-shifting and transient suppression for 24 V DC digital inputs in factory automation controllers exposed to relay coil flyback. IC Role / Device Role / Timing Role: Fast-recovery clamp absorbing 100 V/100 ns spikes induced by inductive load switching. Use Value: 4 ns trr and 90 V VR meet IEC 61000-4-4 Level 4 immunity; SOT323 footprint fits dense DIN-rail mount PCB layouts. |
Availability
BAW56W-QF is available at Aetrix Electronics and suitable for automotive infotainment power sequencing, USB 2.0 data line ESD protection, and ADAS camera module bias control requiring stable component supply with full AEC-Q101 traceability.
Supply support for BAW56W-QF includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Nexperia is a global semiconductor expert delivering high-performance, reliable discrete, logic, and MOSFET devices with focus on efficiency, miniaturization, and automotive-grade robustness.
BAW56W-QF belongs to Nexperia's AEC-Q101-qualified high-speed switching diode product line, engineered specifically for signal integrity preservation and transient resilience in automotive electronics and industrial control systems.
FAQ
What is the maximum continuous forward current per diode in BAW56W-QF?
The BAW56W-QF supports 130 mA continuous forward current per diode at Tamb ≤ 25 °C when mounted on an FR4 PCB with standard footprint. Derating applies above 25 °C ambient, following the thermal resistance Rth(j-a) = 625 K/W and maximum junction temperature of 150 °C.
Is BAW56W-QF pin-compatible with BAW56W?
Yes - BAW56W-QF and BAW56W share identical SOT323 (SC-70) pinout (K1, K2, CA), same mechanical dimensions, and identical electrical specifications. The "-QF" suffix denotes AEC-Q101 qualification; the base BAW56W is not automotive-qualified.
Can BAW56W-QF be used in AC-coupled RF applications?
Yes - with Cd ≤ 2 pF at 0 V and trr ≤ 4 ns, BAW56W-QF is suitable for RF signal path clamping up to 2.4 GHz, provided reverse bias remains below 80 V and average power dissipation stays within 200 mW total device limit.
What is the thermal resistance from junction to solder point (Rth(j-sp)) for BAW56W-QF?
The thermal resistance from junction to solder point is 300 K/W, measured under standard mounting conditions on FR4 PCB. This value supports thermal modeling for PCB layout optimization in high-density automotive modules where localized heating must remain below 150 °C junction temperature.
BAW56W-QF Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Nexperia USA Inc.
- Series:
- -
- Package/Case:
- SC-70, SOT-323
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Diode Configuration:
- 1 Pair Common Anode
- Technology:
- Standard
- Voltage - DC Reverse (Vr) (Max):
- 90 V
- Current - Average Rectified (Io) (per Diode):
- 150mA (DC)
- Voltage - Forward (Vf) (Max) @ If:
- 1.25 V @ 150 mA
- Speed:
- Small Signal =< 200mA (Io), Any Speed
- Reverse Recovery Time (trr):
- 4 ns
- Current - Reverse Leakage @ Vr:
- 500 nA @ 80 V
- Operating Temperature - Junction:
- 150°C
- Grade:
- Automotive
- Qualification:
- AEC-Q101
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- SOT-323
BAW56W-QF FAQ
1.How can I place an order for BAW56W-QF through Aetrix?
Please submit a Request for Quotation (RFQ) for BAW56W-QF on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for BAW56W-QF reliable?
The price and inventory of BAW56W-QF are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for BAW56W-QF is usually 5 days.
3.What payment methods are accepted for BAW56W-QF?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for BAW56W-QF transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for BAW56W-QF?
BAW56W-QF orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your BAW56W-QF order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for BAW56W-QF?
For technical support, including BAW56W-QF datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your BAW56W-QF requirements.
6.How does Aetrix verify that BAW56W-QF is sourced from the original manufacturer or authorized distributors?
All BAW56W-QF products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that BAW56W-QF meets industry standards.
7.What is the process for return or replacement of BAW56W-QF?
All BAW56W-QF units undergo pre-shipment inspection (PSI). If there is an issue with BAW56W-QF, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The BAW56W-QF part is unused and in its original packaging.
Return procedure for BAW56W-QF:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
BAW56W-QF Tags
-
BAV99-7-F
Diodes Incorporated
-
BAT54C-7-F
Diodes Incorporated
-
BAV99,215
Nexperia USA Inc.
-
BAT54SLT1G
onsemi
-
BAV70LT1G
onsemi
-
BAT54CLT1G
onsemi
-
BAT54S-7-F
Diodes Incorporated
-
BAV99LT1G
onsemi
-
BAT54S,215
Nexperia USA Inc.
-
BAS40-04LT1G
onsemi
-
MMBD1503-TP
Micro Commercial Co
-
BAV99WT1G
onsemi
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
